Abstract

The well-known Swanepoel method was often used to obtain the refractive index (RI) of thin films at the wavenumber values corresponding to the extremes of the transmission interference fringes. But it is difficult to accurately obtain the RI of chalcogenide thin films, especially at an arbitrary wavenumber. So a regional approach method (RAM) was presented here to extend the Swanepoel method to an arbitrary wavenumber. In the RAM the RI at the arbitrary wavenumber was determined through dynamic matching. The calculated values were used to match the experimental transmittance. The accuracy of the RI is better than 0.5%. The RI of a well-known film was obtained by the RAM. And the results are in great agreement with the true values of the RI of the film which indicates the correctness and effectiveness of the RAM. Moreover, the transmission spectrum of Ge-Sb-Se film was measured in the ultra-broadband range of 2000-18000 cm−1 (555-5000 nm), and finally the RI of the film was obtained at the 22 wavenumbers of the spacer 600 cm−1 by the RAM.

© 2017 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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  1. A. Zakery and S. R. Elliott, “Optical properties and applications of chalcogenide glasses: a review,” J. Non-Cryst. Solids 330, 1–12 (2003).
  2. J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).
  3. T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).
  4. S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).
  5. B. J. Eggleton, B. Luther-Davies, and K. Richardson, “Chalcogenide photonics,” Nat. Photonics 5, 141–148 (2011).
  6. J. Singh, Optical properties of condensed matter and applications (John Wiley & Sons, 2006), Vol. 6.
  7. M. A. Green, “Thin-film solar cells: review of materials, technologies and commercial status,” J. Mater. Sci. Mater. Electron. 18, 15–19 (2007).
  8. J. Teteris, I. Kuzmina, and M. Reinfelde, “Application of amorphous chalcogenide thin films in optical recording technologies,” Phys. Status Solidi 2, 677–680 (2005).
  9. P. Chindaudom and K. Vedam, “Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials,” Appl. Opt. 33(13), 2664–2671 (1994).
    [PubMed]
  10. M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).
  11. M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).
  12. A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).
  13. J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).
  14. J. Cardin and D. Leduc, “Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements,” Appl. Opt. 47(7), 894–900 (2008).
    [PubMed]
  15. R. Miloua, Z. Kebbab, F. Chiker, K. Sahraoui, M. Khadraoui, and N. Benramdane, “Determination of layer thickness and optical constants of thin films by using a modified pattern search method,” Opt. Lett. 37(4), 449–451 (2012).
    [PubMed]
  16. K. B. Rodenhausen, D. Schmidt, T. Kasputis, A. K. Pannier, E. Schubert, and M. Schubert, “Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films,” Opt. Express 20(5), 5419–5428 (2012).
    [PubMed]
  17. Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).
  18. R. Swanepoel, “Determination of the thickness and optical constants of amorphous silicon,” J. Phys. E Sci. Instrum. 16, 1214–1222 (1983).
  19. D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).
  20. P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).
  21. P. P. Dey and A. Khare, “Stoichiometry-dependent linear and nonlinear optical properties of PLD SiOx thin films,” J. Alloys Compd. 706, 370–376 (2017).
  22. S. Song, J. Dua, and C. B. Arnold, “Influence of annealing conditions on the optical and structural properties of spin-coated As2S3 chalcogenide glass thin films,” Opt. Express 18(6), 5472–5480 (2010).
    [PubMed]
  23. F. M. Abdel-Rahim, K. Aly, and A. Dahshan, “Optical and photoelectrical properties of (CdTe)100-x(SbSe)x thin films,” Chalcogenide Lett. 12, 203–214 (2015).
  24. P. Kutálek and L. Tichý, “On the thickness dependence of both the optical band gap and reversible photodarkening in amorphous Ge-Se films,” Thin Solid Films 619, 336–341 (2016).
  25. M. S. Al-Kotb, J. Z. Al-Waheidi, and M. F. Kotkata, “Investigation on microstructural and optical properties of nano-crystalline CdSe thin films,” Thin Solid Films 631, 219–226 (2017).
  26. Y. Jin, B. Song, Z. Jia, Y. Zhang, C. Lin, X. Wang, and S. Dai, “Improvement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films,” Opt. Express 25(1), 440–451 (2017).
    [PubMed]
  27. M. U. A. Bromba and H. Ziegler, “Application hints for savitzky-golay digital smoothing filters,” Anal. Chem. 53, 1583–1586 (1981).
  28. A. Roth, “Savitzky-Golay Smoothing Filters,” Comput. Phys. 4, 669–672 (1990).

2017 (4)

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

P. P. Dey and A. Khare, “Stoichiometry-dependent linear and nonlinear optical properties of PLD SiOx thin films,” J. Alloys Compd. 706, 370–376 (2017).

M. S. Al-Kotb, J. Z. Al-Waheidi, and M. F. Kotkata, “Investigation on microstructural and optical properties of nano-crystalline CdSe thin films,” Thin Solid Films 631, 219–226 (2017).

Y. Jin, B. Song, Z. Jia, Y. Zhang, C. Lin, X. Wang, and S. Dai, “Improvement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films,” Opt. Express 25(1), 440–451 (2017).
[PubMed]

2016 (1)

P. Kutálek and L. Tichý, “On the thickness dependence of both the optical band gap and reversible photodarkening in amorphous Ge-Se films,” Thin Solid Films 619, 336–341 (2016).

2015 (1)

F. M. Abdel-Rahim, K. Aly, and A. Dahshan, “Optical and photoelectrical properties of (CdTe)100-x(SbSe)x thin films,” Chalcogenide Lett. 12, 203–214 (2015).

2014 (2)

D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

2013 (1)

T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).

2012 (2)

2011 (1)

B. J. Eggleton, B. Luther-Davies, and K. Richardson, “Chalcogenide photonics,” Nat. Photonics 5, 141–148 (2011).

2010 (1)

2008 (3)

J. Cardin and D. Leduc, “Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements,” Appl. Opt. 47(7), 894–900 (2008).
[PubMed]

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

2007 (1)

M. A. Green, “Thin-film solar cells: review of materials, technologies and commercial status,” J. Mater. Sci. Mater. Electron. 18, 15–19 (2007).

2005 (1)

J. Teteris, I. Kuzmina, and M. Reinfelde, “Application of amorphous chalcogenide thin films in optical recording technologies,” Phys. Status Solidi 2, 677–680 (2005).

2004 (1)

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

2003 (1)

A. Zakery and S. R. Elliott, “Optical properties and applications of chalcogenide glasses: a review,” J. Non-Cryst. Solids 330, 1–12 (2003).

2002 (1)

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

2000 (1)

M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).

1996 (1)

M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).

1994 (1)

1990 (1)

A. Roth, “Savitzky-Golay Smoothing Filters,” Comput. Phys. 4, 669–672 (1990).

1983 (1)

R. Swanepoel, “Determination of the thickness and optical constants of amorphous silicon,” J. Phys. E Sci. Instrum. 16, 1214–1222 (1983).

1981 (1)

M. U. A. Bromba and H. Ziegler, “Application hints for savitzky-golay digital smoothing filters,” Anal. Chem. 53, 1583–1586 (1981).

Abdelkader, D.

D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).

Abdel-Rahim, F. M.

F. M. Abdel-Rahim, K. Aly, and A. Dahshan, “Optical and photoelectrical properties of (CdTe)100-x(SbSe)x thin films,” Chalcogenide Lett. 12, 203–214 (2015).

Aggarwal, I. D.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Al-Kotb, M. S.

M. S. Al-Kotb, J. Z. Al-Waheidi, and M. F. Kotkata, “Investigation on microstructural and optical properties of nano-crystalline CdSe thin films,” Thin Solid Films 631, 219–226 (2017).

Al-Waheidi, J. Z.

M. S. Al-Kotb, J. Z. Al-Waheidi, and M. F. Kotkata, “Investigation on microstructural and optical properties of nano-crystalline CdSe thin films,” Thin Solid Films 631, 219–226 (2017).

Aly, K.

F. M. Abdel-Rahim, K. Aly, and A. Dahshan, “Optical and photoelectrical properties of (CdTe)100-x(SbSe)x thin films,” Chalcogenide Lett. 12, 203–214 (2015).

Arnold, C. B.

Baker, J. H.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Bashkansky, M.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Benkö, N.

M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).

Benramdane, N.

Benson, T. M.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Birgin, E. G.

M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).

Boudebs, G.

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

Bromba, M. U. A.

M. U. A. Bromba and H. Ziegler, “Application hints for savitzky-golay digital smoothing filters,” Anal. Chem. 53, 1583–1586 (1981).

Cardin, J.

Chambouleyron, I.

M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).

Cherukulappurath, S.

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

Chiker, F.

Chindaudom, P.

Convey, D.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Dahshan, A.

F. M. Abdel-Rahim, K. Aly, and A. Dahshan, “Optical and photoelectrical properties of (CdTe)100-x(SbSe)x thin films,” Chalcogenide Lett. 12, 203–214 (2015).

Dai, S.

Daniel, G. P.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Dey, P. P.

P. P. Dey and A. Khare, “Stoichiometry-dependent linear and nonlinear optical properties of PLD SiOx thin films,” J. Alloys Compd. 706, 370–376 (2017).

Dua, J.

Dutton, Z.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Eggleton, B. J.

B. J. Eggleton, B. Luther-Davies, and K. Richardson, “Chalcogenide photonics,” Nat. Photonics 5, 141–148 (2011).

Elliott, S. R.

A. Zakery and S. R. Elliott, “Optical properties and applications of chalcogenide glasses: a review,” J. Non-Cryst. Solids 330, 1–12 (2003).

Fang, Y.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Florea, C. M.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Furniss, D.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Glazunov, E. V.

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

Green, M. A.

M. A. Green, “Thin-film solar cells: review of materials, technologies and commercial status,” J. Mater. Sci. Mater. Electron. 18, 15–19 (2007).

Grofcsik, A.

M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).

Guignard, M.

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

Hilfiker, J. N.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Ilchev, P.

T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).

Ilcheva, V.

T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).

Jayasuriya, D.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Jia, Z.

Jin, Y.

Jones, W. J.

M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).

Joy, K.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Justinvictor, V. B.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Kanzari, M.

D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).

Kasputis, T.

Kebbab, Z.

Khadraoui, M.

Khare, A.

P. P. Dey and A. Khare, “Stoichiometry-dependent linear and nonlinear optical properties of PLD SiOx thin films,” J. Alloys Compd. 706, 370–376 (2017).

Khemiri, N.

D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).

Khomchenko, A. V.

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

Kostyuchenko, D. N.

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

Kotkata, M. F.

M. S. Al-Kotb, J. Z. Al-Waheidi, and M. F. Kotkata, “Investigation on microstructural and optical properties of nano-crystalline CdSe thin films,” Thin Solid Films 631, 219–226 (2017).

Kubinyi, M.

M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).

Kumar, D. D.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Kutálek, P.

P. Kutálek and L. Tichý, “On the thickness dependence of both the optical band gap and reversible photodarkening in amorphous Ge-Se films,” Thin Solid Films 619, 336–341 (2016).

Kuzmina, I.

J. Teteris, I. Kuzmina, and M. Reinfelde, “Application of amorphous chalcogenide thin films in optical recording technologies,” Phys. Status Solidi 2, 677–680 (2005).

Leduc, D.

Lin, C.

Luther-Davies, B.

B. J. Eggleton, B. Luther-Davies, and K. Richardson, “Chalcogenide photonics,” Nat. Photonics 5, 141–148 (2011).

Marchand, C.

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

Markos, C.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Marti Nez, J. M.

M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).

Miloua, R.

Mulato, M.

M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).

Nair, P. B.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Nguyen, V. Q.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Pannier, A. K.

Petkov, P.

T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).

Petkova, T.

T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).

Pureza, P.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Rabeh, M. B.

D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).

Ramakrishnan, V.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Reinfelde, M.

J. Teteris, I. Kuzmina, and M. Reinfelde, “Application of amorphous chalcogenide thin films in optical recording technologies,” Phys. Status Solidi 2, 677–680 (2005).

Richardson, K.

B. J. Eggleton, B. Luther-Davies, and K. Richardson, “Chalcogenide photonics,” Nat. Photonics 5, 141–148 (2011).

Rodenhausen, K. B.

Romanenko, A. A.

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

Roth, A.

A. Roth, “Savitzky-Golay Smoothing Filters,” Comput. Phys. 4, 669–672 (1990).

Sahraoui, K.

Sanghera, J. S.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Schmidt, D.

Schubert, E.

Schubert, M.

Seddon, A. B.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Shaw, L. B.

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

Singh, N.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Smektala, F.

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

Smith, S. M.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Sojka, L.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Song, B.

Song, S.

Sotsky, A. B.

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

Sujecki, S.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Swanepoel, R.

R. Swanepoel, “Determination of the thickness and optical constants of amorphous silicon,” J. Phys. E Sci. Instrum. 16, 1214–1222 (1983).

Tang, Z. Q.

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Teteris, J.

J. Teteris, I. Kuzmina, and M. Reinfelde, “Application of amorphous chalcogenide thin films in optical recording technologies,” Phys. Status Solidi 2, 677–680 (2005).

Thomas, P. V.

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

Tichý, L.

P. Kutálek and L. Tichý, “On the thickness dependence of both the optical band gap and reversible photodarkening in amorphous Ge-Se films,” Thin Solid Films 619, 336–341 (2016).

Tiwald, T.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Tompkins, H. G.

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

Vedam, K.

Wang, X.

Zakery, A.

A. Zakery and S. R. Elliott, “Optical properties and applications of chalcogenide glasses: a review,” J. Non-Cryst. Solids 330, 1–12 (2003).

Zhang, Y.

Ziegler, H.

M. U. A. Bromba and H. Ziegler, “Application hints for savitzky-golay digital smoothing filters,” Anal. Chem. 53, 1583–1586 (1981).

Anal. Chem. (1)

M. U. A. Bromba and H. Ziegler, “Application hints for savitzky-golay digital smoothing filters,” Anal. Chem. 53, 1583–1586 (1981).

Appl. Opt. (2)

Appl. Phys. Lett. (1)

M. Mulato, I. Chambouleyron, E. G. Birgin, and J. M. Martı Nez, “Determination of Thickness and Optical Constants of Amorphous Silicon Films From Transmittance Data,” Appl. Phys. Lett. 77, 2133–2135 (2000).

Chalcogenide Lett. (1)

F. M. Abdel-Rahim, K. Aly, and A. Dahshan, “Optical and photoelectrical properties of (CdTe)100-x(SbSe)x thin films,” Chalcogenide Lett. 12, 203–214 (2015).

Comput. Phys. (1)

A. Roth, “Savitzky-Golay Smoothing Filters,” Comput. Phys. 4, 669–672 (1990).

J. Alloys Compd. (1)

P. P. Dey and A. Khare, “Stoichiometry-dependent linear and nonlinear optical properties of PLD SiOx thin films,” J. Alloys Compd. 706, 370–376 (2017).

J. Mater. Sci. Mater. Electron. (1)

M. A. Green, “Thin-film solar cells: review of materials, technologies and commercial status,” J. Mater. Sci. Mater. Electron. 18, 15–19 (2007).

J. Non-Cryst. Solids (2)

A. Zakery and S. R. Elliott, “Optical properties and applications of chalcogenide glasses: a review,” J. Non-Cryst. Solids 330, 1–12 (2003).

J. S. Sanghera, C. M. Florea, L. B. Shaw, P. Pureza, V. Q. Nguyen, M. Bashkansky, Z. Dutton, and I. D. Aggarwal, “Non-linear properties of chalcogenide glasses and fibers,” J. Non-Cryst. Solids 354, 462–467 (2008).

J. Phys. E Sci. Instrum. (1)

R. Swanepoel, “Determination of the thickness and optical constants of amorphous silicon,” J. Phys. E Sci. Instrum. 16, 1214–1222 (1983).

Key Eng. Mater. (1)

T. Petkova, V. Ilcheva, P. Ilchev, and P. Petkov, “Ge-Chalcogenide Glasses – Properties and Application as Optical Material,” Key Eng. Mater. 538, 316–319 (2013).

Mater. Sci. Semicond. Process. (1)

D. Abdelkader, M. B. Rabeh, N. Khemiri, and M. Kanzari, “Investigation on optical properties of SnxSbySz sulfosalts thin films,” Mater. Sci. Semicond. Process. 21, 14–19 (2014).

Nat. Photonics (1)

B. J. Eggleton, B. Luther-Davies, and K. Richardson, “Chalcogenide photonics,” Nat. Photonics 5, 141–148 (2011).

Opt. Commun. (1)

S. Cherukulappurath, M. Guignard, C. Marchand, F. Smektala, and G. Boudebs, “Linear and nonlinear optical characterization of tellurium based chalcogenide glasses,” Opt. Commun. 242, 313–319 (2004).

Opt. Express (3)

Opt. Lett. (1)

Opt. Quantum Electron. (1)

Y. Fang, D. Jayasuriya, D. Furniss, Z. Q. Tang, Ł. Sojka, C. Markos, S. Sujecki, A. B. Seddon, and T. M. Benson, “Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method,” Opt. Quantum Electron. 49, 237–255 (2017).

Phys. Status Solidi (1)

J. Teteris, I. Kuzmina, and M. Reinfelde, “Application of amorphous chalcogenide thin films in optical recording technologies,” Phys. Status Solidi 2, 677–680 (2005).

Tech. Phys. Lett. (1)

A. V. Khomchenko, A. B. Sotsky, A. A. Romanenko, E. V. Glazunov, and D. N. Kostyuchenko, “Determining thin film parameters by prism coupling technique,” Tech. Phys. Lett. 28, 467–470 (2002).

Thin Solid Films (5)

J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry,” Thin Solid Films 516, 7979–7989 (2008).

P. B. Nair, V. B. Justinvictor, G. P. Daniel, K. Joy, V. Ramakrishnan, D. D. Kumar, and P. V. Thomas, “Structural, optical, photoluminescence and photocatalytic investigations on Fe doped Tio2 thin films,” Thin Solid Films 550, 121–127 (2014).

P. Kutálek and L. Tichý, “On the thickness dependence of both the optical band gap and reversible photodarkening in amorphous Ge-Se films,” Thin Solid Films 619, 336–341 (2016).

M. S. Al-Kotb, J. Z. Al-Waheidi, and M. F. Kotkata, “Investigation on microstructural and optical properties of nano-crystalline CdSe thin films,” Thin Solid Films 631, 219–226 (2017).

M. Kubinyi, N. Benkö, A. Grofcsik, and W. J. Jones, “Determination of the thickness and optical constants of thin films from transmission spectra,” Thin Solid Films 286, 164–169 (1996).

Other (1)

J. Singh, Optical properties of condensed matter and applications (John Wiley & Sons, 2006), Vol. 6.

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Figures (5)

Fig. 1
Fig. 1 Schematic of an absorbing thin film on a transparent substrate.

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Fig. 2
Fig. 2 The flowchart of the RAM for obtaining the RI of thin films at a wavenumber ka.

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Fig. 3
Fig. 3 The transmittance curve T' (black full curve) of a 1μm film. The inset shows the plot of transmittance versus interference order.

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Fig. 4
Fig. 4 The dependence of the ΔnRAM and ΔnSel on the wavenumber.

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Fig. 5
Fig. 5 The transmission spectrum T'of Ge-Sb-Se film was measured in an ultra-broadband wavenumber range of 2000-18000 cm−1 (555-5000 nm) shown as the black full curve. The broken curves are the upper and lower tangent envelopes of the transmission spectrum, respectively. The blue quadrate solid points are the RI of Ge-Sb-Se film obtained by the RAM.

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Tables (2)

Tables Icon

Table 1 Values of k, TM and Tsim from Fig. 3. The m, nRAM, ntr and ΔnRAM were obtained by the RAM. The nSel is the fitted values of the RI obtained by the improved Swanepoel method.

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Tables Icon

Table 2 Values of k, TM and Texp from Fig. 5. The m, n and α were obtained by the RAM

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Equations (3)

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T ′ = Ax ( B−Cxcosφ+D x 2 ) T s
x= E M − [ E M 2 − ( n 2 −1 ) 3 ( n 2 − s 4 ) ] 1/2 ( n−1 ) 3 ( n− s 2 )
n= 1 2dk m

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