Abstract

Ptychography has offered unparalleled high resolution in hard X-ray imaging. However, the imaging quality relies on the interaction between the object and the illumination to be well described by a mathematical model in the reconstruction algorithm. Here, we demonstrate at X-ray wavelengths a method that allows for reconstruction of the object exit wavefield without the need for the knowledge of this interaction. The incident field interacts with the object, and the exit wavefield propagates freely to the plane of an analyzer. As we translate the analyzer and measure diffraction patterns, the propagated wavefield can be reconstructed and the object exit wavefield determined by numerical backpropagation. The method broadens the impact and application of ptychography as it offers information inaccessible to conventional ptychography as well as working distances of tens of millimeters.

© 2016 Optical Society of America

Full Article  |  PDF Article
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References

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    [Crossref]

2014 (2)

2012 (4)

A. M. Maiden, M. J. Humphry, and J. M. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
[Crossref]

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

2011 (2)

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

2010 (2)

A. M. Maiden, J. M. Rodenburg, and M. J. Humphry, “Optical ptychography: a practical implementation with useful resolution,” Opt. Lett. 35, 2585–2587 (2010).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

2009 (6)

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

Y. Sung, W. Choi, C. Fang-Yen, K. Badizadegan, R. R. Dasari, and M. S. Feld, “Optical diffraction tomography for high resolution live cell imaging,” Opt. Express 17, 266–277 (2009).
[Crossref] [PubMed]

D. J. Brady, K. Choi, D. L. Marks, R. Horisaki, and S. Lim, “Compressive holography,” Opt. Express 17, 13040–13049 (2009).
[Crossref] [PubMed]

2008 (4)

M. Guizar-Sicairos, S. T. Thurman, and J. R. Fienup, “Efficient subpixel image registration algorithms,” Opt. Lett. 33, 156–158 (2008).
[Crossref] [PubMed]

M. Guizar-Sicairos and J. R. Fienup, “Phase retrieval with transverse translation diversity: a nonlinear optimization approach,” Opt. Express 16, 7264–7278 (2008).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

2007 (2)

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval of arbitrary complex-valued fields through aperture-plane modulation,” Phys. Rev. A 75, 043805 (2007).
[Crossref]

2005 (1)

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

2004 (1)

H. M. L. Faulkner and J. M. Rodenburg, “Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm,” Phys. Rev. Lett. 93, 023903 (2004).
[Crossref] [PubMed]

1969 (1)

E. Wolf, “Three-dimensional structure determination of semi-transparent objects from holographic data,” Opt. Commun. 1, 153–156 (1969).
[Crossref]

Allain, M.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Badizadegan, K.

Beetz, T.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Bergamaschi, A.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Born, M.

M. Born and E. Wolf, “Principles of optics: electromagnetic theory of propagation, interference and diffraction of light,” Cambridge University Press (1999).
[Crossref]

Brady, D. J.

Broennimann, C.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Bruley, J.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Bunk, O.

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

Capello, L.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Carbone, G.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Chamard, V.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Chapman, H. N.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Chen, G.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Choi, K.

Choi, W.

Cui, C.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Dasari, R. R.

David, C.

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

Diaz, A.

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

Dierolf, M.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

Dinapoli, R.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Eikenberry, E. F.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Fang-Yen, C.

Faulkner, H. M. L.

H. M. L. Faulkner and J. M. Rodenburg, “Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm,” Phys. Rev. Lett. 93, 023903 (2004).
[Crossref] [PubMed]

Feld, M. S.

Fienup, J. R.

Fuoss, P. H.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Godard, P.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Godden, T. M.

Gray, J.

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

Grolimund, D.

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

Guizar-Sicairos, M.

Henrich, B.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Highland, M. J.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Holler, M.

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

Holt, J.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Holt, M. V.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Holton, J. M.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Horisaki, R.

Howells, M. R.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Hruszkewycz, S. O.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Humphry, M. J.

Jacobsen, C. J.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Jefimovs, K.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

Johnson, I.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

Kewish, C. M.

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

Kirz, J.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Kobas, M.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Kraft, P.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Lim, S.

Lima, E.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Maiden, A. M.

Mantion, A.

Marchesini, S.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Marks, D. L.

Mastropietro, F.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

McNulty, I.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Menzel, A.

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, “Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging,” Opt. Express 19, 21333–21344 (2011).
[Crossref] [PubMed]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Metzger, T. H.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Miao, H.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Mozzanica, A.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Murray, C. E.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Osten, W.

F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval of arbitrary complex-valued fields through aperture-plane modulation,” Phys. Rev. A 75, 043805 (2007).
[Crossref]

Pedrini, G.

F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval of arbitrary complex-valued fields through aperture-plane modulation,” Phys. Rev. A 75, 043805 (2007).
[Crossref]

Pfeiffer, F.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

Renker, D.

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

Rodenburg, J. M.

Sakdinawat, A.

Sayreb, D.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Schatz, M.

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Schlichting, I.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

Schmitt, B.

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Shapiro, D.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Shpyrko, O. G.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Spence, J. C. H.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Stangl, J.

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

Starodube, D.

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

Suman, R.

Sung, Y.

Thibault, P.

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Thurman, S. T.

Tripathi, A.

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

van der Veen, J. F.

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

van Heel, M.

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Vila-Comamala, J.

Von Koenig, K.

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

Warren, B. E.

B. E. Warren, “X-ray Diffraction,” Courier Corporation (1969).

Wolf, E.

E. Wolf, “Three-dimensional structure determination of semi-transparent objects from holographic data,” Opt. Commun. 1, 153–156 (1969).
[Crossref]

M. Born and E. Wolf, “Principles of optics: electromagnetic theory of propagation, interference and diffraction of light,” Cambridge University Press (1999).
[Crossref]

Zhang, F.

F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval of arbitrary complex-valued fields through aperture-plane modulation,” Phys. Rev. A 75, 043805 (2007).
[Crossref]

J. Electron. Spectrosc. Relat. Phenom. (1)

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayreb, D. Shapiro, J. C. H. Spence, and D. Starodube, “An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy,” J. Electron. Spectrosc. Relat. Phenom. 170, 4–12 (2009).
[Crossref]

J. Opt. Soc. Am. A (1)

J. Struct. Biol. (1)

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Microelectron. Eng. (1)

K. Jefimovs, O. Bunk, F. Pfeiffer, D. Grolimund, J. F. van der Veen, and C. David, “Fabrication of fresnel zone plates for hard X-rays,” Microelectron. Eng. 84, 1467–1470 (2007).
[Crossref]

Nano Lett. (1)

S. O. Hruszkewycz, M. V. Holt, C. E. Murray, J. Bruley, J. Holt, A. Tripathi, O. G. Shpyrko, I. McNulty, M. J. Highland, and P. H. Fuoss, “Quantitative nanoscale imaging of lattice distortions in epitaxial semiconductor heterostructures using nanofocused X-ray Bragg projection ptychography,” Nano Lett. 12, 5148–5154 (2012).
[Crossref] [PubMed]

Nat. Commun. (1)

P. Godard, G. Carbone, M. Allain, F. Mastropietro, G. Chen, L. Capello, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional high-resolution quantitative microscopy of extended crystals,” Nat. Commun. 2, 568 (2011).
[Crossref] [PubMed]

New J. Phys. (2)

M. Dierolf, P. Thibault, A. Menzel, C. M. Kewish, K. Jefimovs, I. Schlichting, K. Von Koenig, O. Bunk, and F. Pfeiffer, “Ptychographic coherent diffractive imaging of weakly scattering specimens,” New J. Phys. 12, 035017 (2010).
[Crossref]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

Nucl. Instr. Meth. Phys. Res. A (1)

B. Henrich, A. Bergamaschi, C. Broennimann, R. Dinapoli, E. F. Eikenberry, I. Johnson, M. Kobas, P. Kraft, A. Mozzanica, and B. Schmitt, “Pilatus: A single photon counting pixel detector for X-ray applications,” Nucl. Instr. Meth. Phys. Res. A 607, 247–249 (2009).
[Crossref]

Opt. Commun. (1)

E. Wolf, “Three-dimensional structure determination of semi-transparent objects from holographic data,” Opt. Commun. 1, 153–156 (1969).
[Crossref]

Opt. Express (5)

Opt. Lett. (3)

Phys. Rev. A (1)

F. Zhang, G. Pedrini, and W. Osten, “Phase retrieval of arbitrary complex-valued fields through aperture-plane modulation,” Phys. Rev. A 75, 043805 (2007).
[Crossref]

Phys. Rev. B (1)

M. Guizar-Sicairos, M. Holler, A. Diaz, J. Vila-Comamala, O. Bunk, and A. Menzel, “Role of the illumination spatial-frequency spectrum for ptychography,” Phys. Rev. B 86, 100103 (2012).
[Crossref]

Phys. Rev. Lett. (2)

H. M. L. Faulkner and J. M. Rodenburg, “Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm,” Phys. Rev. Lett. 93, 023903 (2004).
[Crossref] [PubMed]

I. Johnson, K. Jefimovs, O. Bunk, C. David, M. Dierolf, J. Gray, D. Renker, and F. Pfeiffer, “Coherent diffractive imaging using phase front modifications,” Phys. Rev. Lett. 100, 155503 (2008).
[Crossref] [PubMed]

Science (1)

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Ultramicroscopy (2)

A. M. Maiden and J. M. Rodenburg, “An improved ptychographical phase retrieval algorithm for diffractive imaging,” Ultramicroscopy 109, 1256–1262 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

Other (2)

B. E. Warren, “X-ray Diffraction,” Courier Corporation (1969).

M. Born and E. Wolf, “Principles of optics: electromagnetic theory of propagation, interference and diffraction of light,” Cambridge University Press (1999).
[Crossref]

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Figures (5)

Fig. 1
Fig. 1 Overview of the tele-ptychography setup. The area of interest of the object is illuminated, and an exit wavefield ψobj is generated by an interaction between the incident beam and the object. This interaction can in principle be unknown. An analyzer downstream of the object is translated across the propagated exit wavefield, ψprop. The field after the analyzer, ψana, propagates to the detector and diffraction patterns, I, are recorded. Standard ptychography algorithms are used to reconstruct ψprop and the analyzer transmissivity function.
Fig. 2
Fig. 2 (a) Reconstruction of the propagated exit wavefield, ψprop, and (b) the pinhole transmissivity using tele-ptychography. (c) The field at the object plane, ψobj, was recovered by backpropagating the reconstructed ψprop in (a) from plane z2 to z1, as shown in Fig. 1. (d) For comparison the same object was also measured using conventional ptychography. The scanning FOV was 10×10 μm2. The hue and brightness encode the phase and amplitude, respectively. The brightness was obtained by normalizing the amplitude to its mean plus two times its standard deviation. Although this causes slight saturation of the brightness, it improves visibility of faint features. The scale bars are 1 μm for all images.
Fig. 3
Fig. 3 Gold particles imaged using tele-ptychography. The reconstructed wavefields, ψprop, are shown in (a) and (c) for D = 9.65 mm and D = 15.65 mm, respectively. The object exit wavefields obtained through backpropagation are given in (b) and (d), clearly showing the particles. The scanning FOV was 30×30 μm2. The hue and brightness encode the phase and amplitude respectively, brightness is adjusted as described in Fig. 2 caption. The scale bars are 1 μm for all images.
Fig. 4
Fig. 4 Diffracted contributions interfere from a larger region of ψobj at a pinhole with diameter ξ, resulting in a required transverse coherence of ξ + 2Δ.
Fig. 5
Fig. 5 Image resolution determined using FSC for different distances D is compared for slit openings 300×300 μm2 and 50×50 μm2. The latter reduces significantly the incident flux while providing an incident field that is close to a plane wave. The first gray line shows the distance above which the coherence requirement is not strictly satisfied; the second gray line gives the threshold above which the scanning FOV gradually becomes insufficient.

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