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M. Batzill and U. Diebold, “The surface and materials science of tin oxide,” Prog. Surf. Sci. 79(2-4), 47–154 (2005).
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[Crossref]
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[Crossref]
K. Mishchik, A. Ferrer, A. R. de la Cruz, A. Mermillod-Blondin, C. Mauclair, Y. Ouerdane, A. Boukenter, J. Solis, and R. Stoian, “Photoinscription domains for ultrafast laser writing of refractive index changes in BK7 borosilicate crown optical glass,” Opt. Mater. Express 3(1), 67–85 (2013).
[Crossref]
A. Miotello, R. Kelly, B. Braren, and C. E. Otis, “Novel Geometrical Effects Observed in Debris When Polymers Are Laser Sputtered,” Appl. Phys. Lett. 61(23), 2784–2786 (1992).
[Crossref]
C. Kisielowski, J. Kruger, S. Ruvimov, T. Suski, J. W. Ager, E. Jones, Z. Liliental-Weber, M. Rubin, E. R. Weber, M. D. Bremser, and R. F. Davis, “Strain-related phenomena in GaN thin films,” Phys. Rev. B 54(24), 17745–17753 (1996).
[Crossref]
J. Elsner, R. Jones, M. I. Heggie, P. K. Sitch, M. Haugk, T. Frauenheim, S. Oberg, and P. R. Briddon, “Deep acceptors trapped at threading-edge dislocations in GaN,” Phys. Rev. B 58(19), 12571–12574 (1998).
[Crossref]
W. S. Brocklesby, “Progress in high average power ultrafast lasers,” Eur. Phys. J. Spec. Top. 224(13), 2529–2543 (2015).
[Crossref]
P. E. Miller, J. D. Bude, T. I. Suratwala, N. Shen, T. A. Laurence, W. A. Steele, J. Menapace, M. D. Feit, and L. L. Wong, “Fracture-induced subbandgap absorption as a precursor to optical damage on fused silica surfaces,” Opt. Lett. 35(16), 2702–2704 (2010).
[Crossref]
[PubMed]
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[Crossref]
D. D. Koleske, A. E. Wickenden, R. L. Henry, J. C. Culbertson, and M. E. Twigg, “GaN decomposition in H2 and N2 at MOVPE temperatures and pressures,” J. Cryst. Growth 223(4), 466–483 (2001).
[Crossref]
C. Kisielowski, J. Kruger, S. Ruvimov, T. Suski, J. W. Ager, E. Jones, Z. Liliental-Weber, M. Rubin, E. R. Weber, M. D. Bremser, and R. F. Davis, “Strain-related phenomena in GaN thin films,” Phys. Rev. B 54(24), 17745–17753 (1996).
[Crossref]
T. Kim, H. S. Kim, M. Hetterich, D. Jones, J. M. Girkin, E. Bente, and M. D. Dawson, “Femtosecond laser machining of gallium nitride,” Mat. Sci. Eng. B-Solid 82(1-3), 262–264 (2001).
[Crossref]
K. Mishchik, A. Ferrer, A. R. de la Cruz, A. Mermillod-Blondin, C. Mauclair, Y. Ouerdane, A. Boukenter, J. Solis, and R. Stoian, “Photoinscription domains for ultrafast laser writing of refractive index changes in BK7 borosilicate crown optical glass,” Opt. Mater. Express 3(1), 67–85 (2013).
[Crossref]
D. O. Demchenko, I. C. Diallo, and M. A. Reshchikov, “Yellow Luminescence of Gallium Nitride Generated by Carbon Defect Complexes,” Phys. Rev. Lett. 110(8), 087404 (2013).
[Crossref]
[PubMed]
R. N. Raman, S. G. Demos, N. Shen, E. Feigenbaum, R. A. Negres, S. Elhadj, A. M. Rubenchik, and M. J. Matthews, “Damage on fused silica optics caused by laser ablation of surface-bound microparticles,” Opt. Express 24(3), 2634–2647 (2016).
[Crossref]
[PubMed]
D. O. Demchenko, I. C. Diallo, and M. A. Reshchikov, “Yellow Luminescence of Gallium Nitride Generated by Carbon Defect Complexes,” Phys. Rev. Lett. 110(8), 087404 (2013).
[Crossref]
[PubMed]
M. Batzill and U. Diebold, “The surface and materials science of tin oxide,” Prog. Surf. Sci. 79(2-4), 47–154 (2005).
[Crossref]
S. T. Yang, M. J. Matthews, S. Elhadj, V. G. Draggoo, and S. E. Bisson, “Thermal transport in CO2 laser irradiated fused silica: In situ measurements and analysis,” J. Appl. Phys. 106(10), 103106 (2009).
[Crossref]
M. D. Drory, J. W. Ager, T. Suski, I. Grzegory, and S. Porowski, “Hardness and fracture toughness of bulk single crystal gallium nitride,” Appl. Phys. Lett. 69(26), 4044–4046 (1996).
[Crossref]
M. Kuball, J. M. Hayes, A. D. Prins, N. W. A. van Uden, D. J. Dunstan, Y. Shi, and J. H. Edgar, “Raman scattering studies on single-crystalline bulk AlN under high pressures,” Appl. Phys. Lett. 78(6), 724 (2001).
[Crossref]
M. Kuball, J. M. Hayes, A. D. Prins, N. W. A. van Uden, D. J. Dunstan, Y. Shi, and J. H. Edgar, “Raman scattering studies on single-crystalline bulk AlN under high pressures,” Appl. Phys. Lett. 78(6), 724–726 (2001).
[Crossref]
M. Kuball, J. M. Hayes, A. D. Prins, N. W. A. van Uden, D. J. Dunstan, Y. Shi, and J. H. Edgar, “Raman scattering studies on single-crystalline bulk AlN under high pressures,” Appl. Phys. Lett. 78(6), 724–726 (2001).
[Crossref]
M. Kuball, J. M. Hayes, A. D. Prins, N. W. A. van Uden, D. J. Dunstan, Y. Shi, and J. H. Edgar, “Raman scattering studies on single-crystalline bulk AlN under high pressures,” Appl. Phys. Lett. 78(6), 724 (2001).
[Crossref]
R. N. Raman, S. G. Demos, N. Shen, E. Feigenbaum, R. A. Negres, S. Elhadj, A. M. Rubenchik, and M. J. Matthews, “Damage on fused silica optics caused by laser ablation of surface-bound microparticles,” Opt. Express 24(3), 2634–2647 (2016).
[Crossref]
[PubMed]
J. H. Yoo, J. B. In, C. Zheng, I. Sakellari, R. N. Raman, M. J. Matthews, S. Elhadj, and C. P. Grigoropoulos, “Directed dewetting of amorphous silicon film by a donut-shaped laser pulse,” Nanotechnology 26(16), 165303 (2015).
[Crossref]
[PubMed]
S. T. Yang, M. J. Matthews, S. Elhadj, V. G. Draggoo, and S. E. Bisson, “Thermal transport in CO2 laser irradiated fused silica: In situ measurements and analysis,” J. Appl. Phys. 106(10), 103106 (2009).
[Crossref]
P. G. Eliseev, S. Juodkazis, T. Sugahara, H.-B. Sun, S. Matsuo, S. Sakai, and H. Misawa, “GaN surface ablation by femtosecond pulses: atomic force microscopy studies and accumulation effects,” Proc. SPIE 4065, 546–556 (2000).
[Crossref]
P. G. Eliseev, H. B. Sun, S. Juodkazis, T. Sugahara, S. Sakai, and H. Misawa, “Laser-induced damage threshold and surface processing of GaN at 400 nm wavelength,” Jap. J.Appl. Phys. Part 2-Letters 38(Part 2, No. 7B), L839–L841 (1999).
[Crossref]
J. W. Tomm, M. Ziegler, M. Hempel, and T. Elsaesser, “Mechanisms and fast kinetics of the catastrophic optical damage (COD) in GaAs-based diode lasers,” Laser Photonics Rev. 5(3), 422–441 (2011).
[Crossref]
J. Elsner, R. Jones, M. I. Heggie, P. K. Sitch, M. Haugk, T. Frauenheim, S. Oberg, and P. R. Briddon, “Deep acceptors trapped at threading-edge dislocations in GaN,” Phys. Rev. B 58(19), 12571–12574 (1998).
[Crossref]
R. N. Raman, S. G. Demos, N. Shen, E. Feigenbaum, R. A. Negres, S. Elhadj, A. M. Rubenchik, and M. J. Matthews, “Damage on fused silica optics caused by laser ablation of surface-bound microparticles,” Opt. Express 24(3), 2634–2647 (2016).
[Crossref]
[PubMed]
P. E. Miller, J. D. Bude, T. I. Suratwala, N. Shen, T. A. Laurence, W. A. Steele, J. Menapace, M. D. Feit, and L. L. Wong, “Fracture-induced subbandgap absorption as a precursor to optical damage on fused silica surfaces,” Opt. Lett. 35(16), 2702–2704 (2010).
[Crossref]
[PubMed]
K. Mishchik, A. Ferrer, A. R. de la Cruz, A. Mermillod-Blondin, C. Mauclair, Y. Ouerdane, A. Boukenter, J. Solis, and R. Stoian, “Photoinscription domains for ultrafast laser writing of refractive index changes in BK7 borosilicate crown optical glass,” Opt. Mater. Express 3(1), 67–85 (2013).
[Crossref]
J. Elsner, R. Jones, M. I. Heggie, P. K. Sitch, M. Haugk, T. Frauenheim, S. Oberg, and P. R. Briddon, “Deep acceptors trapped at threading-edge dislocations in GaN,” Phys. Rev. B 58(19), 12571–12574 (1998).
[Crossref]
F. Y. Genin and C. J. Stolz, “Morphologies of laser-induced damage in hafnia-silica multilayer mirror and polarizer coatings,” Proc. SPIE 2870, 439–448 (1996).
[Crossref]
T. Kim, H. S. Kim, M. Hetterich, D. Jones, J. M. Girkin, E. Bente, and M. D. Dawson, “Femtosecond laser machining of gallium nitride,” Mat. Sci. Eng. B-Solid 82(1-3), 262–264 (2001).
[Crossref]
J. H. Yoo, J. B. In, C. Zheng, I. Sakellari, R. N. Raman, M. J. Matthews, S. Elhadj, and C. P. Grigoropoulos, “Directed dewetting of amorphous silicon film by a donut-shaped laser pulse,” Nanotechnology 26(16), 165303 (2015).
[Crossref]
[PubMed]
M. D. Drory, J. W. Ager, T. Suski, I. Grzegory, and S. Porowski, “Hardness and fracture toughness of bulk single crystal gallium nitride,” Appl. Phys. Lett. 69(26), 4044–4046 (1996).
[Crossref]
S. Z. Xiao, E. L. Gurevich, and A. Ostendorf, “Incubation effect and its influence on laser patterning of ITO thin film,” Appl. Phys. Adv. Mater. 107, 333–338 (2012).
J. Elsner, R. Jones, M. I. Heggie, P. K. Sitch, M. Haugk, T. Frauenheim, S. Oberg, and P. R. Briddon, “Deep acceptors trapped at threading-edge dislocations in GaN,” Phys. Rev. B 58(19), 12571–12574 (1998).
[Crossref]
M. Kuball, J. M. Hayes, A. D. Prins, N. W. A. van Uden, D. J. Dunstan, Y. Shi, and J. H. Edgar, “Raman scattering studies on single-crystalline bulk AlN under high pressures,” Appl. Phys. Lett. 78(6), 724 (2001).
[Crossref]
M. Kuball, J. M. Hayes, A. D. Prins, N. W. A. van Uden, D. J. Dunstan, Y. Shi, and J. H. Edgar, “Raman scattering studies on single-crystalline bulk AlN under high pressures,” Appl. Phys. Lett. 78(6), 724–726 (2001).
[Crossref]
J. Elsner, R. Jones, M. I. Heggie, P. K. Sitch, M. Haugk, T. Frauenheim, S. Oberg, and P. R. Briddon, “Deep acceptors trapped at threading-edge dislocations in GaN,” Phys. Rev. B 58(19), 12571–12574 (1998).
[Crossref]
M. A. Reshchikov, A. Usikov, H. Helava, and Y. Makarov, “Fine structure of the red luminescence band in undoped GaN,” Appl. Phys. Lett. 104(3), 032103 (2014).
[Crossref]
J. W. Tomm, M. Ziegler, M. Hempel, and T. Elsaesser, “Mechanisms and fast kinetics of the catastrophic optical damage (COD) in GaAs-based diode lasers,” Laser Photonics Rev. 5(3), 422–441 (2011).
[Crossref]
D. D. Koleske, A. E. Wickenden, R. L. Henry, J. C. Culbertson, and M. E. Twigg, “GaN decomposition in H2 and N2 at MOVPE temperatures and pressures,” J. Cryst. Growth 223(4), 466–483 (2001).
[Crossref]
R. Seemann, S. Herminghaus, and K. Jacobs, “Dewetting patterns and molecular forces: a reconciliation,” Phys. Rev. Lett. 86(24), 5534–5537 (2001).
[Crossref]
[PubMed]
T. Kim, H. S. Kim, M. Hetterich, D. Jones, J. M. Girkin, E. Bente, and M. D. Dawson, “Femtosecond laser machining of gallium nitride,” Mat. Sci. Eng. B-Solid 82(1-3), 262–264 (2001).
[Crossref]
W. J. Heward and D. J. Swenson, “Phase equilibria in the pseudo-binary In2O3-SnO2 system,” J. Mater. Sci. 42(17), 7135–7140 (2007).
[Crossref]
S. Ishibashi, Y. Higuchi, Y. Ota, and K. Nakamura, “Low Resistivity Indium Tin Oxide Transparent Conductive Films. 2. Effect of Sputtering Voltage on Electrical Property of Films,” J. Vac. Sci. Technol. A 8(3), 1403–1406 (1990).
[Crossref]
H. Wang, Z. Huang, D. Zhang, F. Luo, L. Huang, Y. Li, Y. Luo, W. Wang, and X. Zhao, “Thickness effect on laser-induced-damage threshold of indium-tin oxide films at 1064 nm,” J. Appl. Phys. 110(11), 113111 (2011).
[Crossref]
H. Wang, Z. Huang, D. Zhang, F. Luo, L. Huang, Y. Li, Y. Luo, W. Wang, and X. Zhao, “Thickness effect on laser-induced-damage threshold of indium-tin oxide films at 1064 nm,” J. Appl. Phys. 110(11), 113111 (2011).
[Crossref]
J. H. Yoo, J. B. In, C. Zheng, I. Sakellari, R. N. Raman, M. J. Matthews, S. Elhadj, and C. P. Grigoropoulos, “Directed dewetting of amorphous silicon film by a donut-shaped laser pulse,” Nanotechnology 26(16), 165303 (2015).
[Crossref]
[PubMed]
S. Ishibashi, Y. Higuchi, Y. Ota, and K. Nakamura, “Low Resistivity Indium Tin Oxide Transparent Conductive Films. 2. Effect of Sputtering Voltage on Electrical Property of Films,” J. Vac. Sci. Technol. A 8(3), 1403–1406 (1990).
[Crossref]
S. Nakashima, K. Sugioka, T. Ito, H. Takai, and K. Midorikawa, “Fabrication of periodic nano-hole array on GaN surface by fs laser for improvement of extraction efficiency in blue LED,” Phys. Procedia 5, 203–211 (2010).
[Crossref]
R. Seemann, S. Herminghaus, and K. Jacobs, “Dewetting patterns and molecular forces: a reconciliation,” Phys. Rev. Lett. 86(24), 5534–5537 (2001).
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