Abstract

The role played by heat accumulation in multi-shot damage of silicon was studied. Bulk silicon samples were exposed to intense XUV monochromatic radiation of a 13.5 nm wavelength in a series of 400 femtosecond pulses, repeated with a 1 MHz rate (pulse trains) at the FLASH facility in Hamburg. The observed surface morphological and structural modifications are formed as a result of sample surface melting. Modifications are threshold dependent on the mean fluence of the incident pulse train, with all threshold values in the range of approximately 36-40 mJ/cm2. Experimental data is supported by a theoretical model described by the heat diffusion equation. The threshold for reaching the melting temperature (45 mJ/cm2) and liquid state (54 mJ/cm2), estimated from this model, is in accordance with experimental values within measurement error. The model indicates a significant role of heat accumulation in surface modification processes.

© 2016 Optical Society of America

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2015 (1)

N. Medvedev, Z. Li, and B. Ziaja, “Thermal and nonthermal melting of silicon under femtosecond x-ray irradiation,” Phys. Rev. B 91(5), 054113 (2015).
[Crossref]

2014 (1)

A. Rämer, O. Osmani, and B. Rethfeld, “Laser damage in silicon: energy absorption, relaxation, and transport,” J. Appl. Phys. 116(5), 053508 (2014).
[Crossref]

2013 (4)

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

2011 (1)

D. Pile, “X-rays: First light from SACLA,” Nat. Photonics 5(8), 456–457 (2011).
[Crossref]

2010 (2)

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

2009 (3)

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

2008 (1)

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

2007 (3)

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

2006 (1)

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

2004 (1)

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

1996 (1)

H. Hu and S. A. Argyropoulos, “Mathematical modelling of solidification and melting: a review,” Model. Simul. Mater. Sc. 4(4), 371–396 (1996).
[Crossref]

1982 (1)

1963 (1)

H. Shanks, P. Maycock, P. Sidles, and G. Danielson, “Thermal conductivity of silicon from 300 to 1400 K,” Phys. Rev. 130(5), 1743–1748 (1963).
[Crossref]

Akre, R.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Andrejczuk, A.

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

Argyropoulos, S. A.

H. Hu and S. A. Argyropoulos, “Mathematical modelling of solidification and melting: a review,” Model. Simul. Mater. Sc. 4(4), 371–396 (1996).
[Crossref]

Arthur, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Azima, A.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Bajt, S.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Baker, S.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Baker, S. L.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Balcer, T.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Bergh, M.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Bijkerk, F.

Bionta, R.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Bionta, R. M.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Bittner, L.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Bittner, M.

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

Bobashev, S.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Bonfigt, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Bostedt, C.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Bozek, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Brachmann, A.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Bruijn, S.

Bucksbaum, P.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Burghammer, M.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Burian, T.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Caleman, C.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Caliebe, W.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Chalupsky, J.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Chalupský, J.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

Chapman, H. N.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Cibik, L.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Cihelka, J.

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J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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Coffee, R.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Danielson, G.

H. Shanks, P. Maycock, P. Sidles, and G. Danielson, “Thermal conductivity of silicon from 300 to 1400 K,” Phys. Rev. 130(5), 1743–1748 (1963).
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Davies, R.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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Decker, F. J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Ding, Y.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Dowell, D.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Dusterer, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Dynowska, E.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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Edstrom, S.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Emma, P.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Faatz, B.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

Farahani, S. D.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
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Feldhaus, J.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
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J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
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K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

Fisher, A.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Forster, E.

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Frisch, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Fruhling, U.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Galayda, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Gaudin, J.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
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W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
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Gensch, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Gerth, C.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Gilevich, S.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Gleeson, A.

Gleeson, A. J.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Gottwald, A.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Guerassimova, N.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Gullikson, E.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Gullikson, E. M.

Hahn, U.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Hajkova, V.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Hájková, V.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Hans, T.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Harmand, M.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

Hastings, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Hau-Riege, S.

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Hau-Riege, S. P.

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Hays, G.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Hering, P.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Hesse, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Hoehl, A.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Honkavaar, K.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Honkavaara, K.

K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

Hu, H.

H. Hu and S. A. Argyropoulos, “Mathematical modelling of solidification and melting: a review,” Model. Simul. Mater. Sc. 4(4), 371–396 (1996).
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Huang, Z.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Inubushi, Y.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

Ishikawa, T.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

Iverson, R.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Jastrow, U.

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Juha, L.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

Juranic, P.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Jurek, M.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Kapitzki, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Katayama, T.

Keitel, B.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

Khorsand, A. R.

Kim, J.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

Kimura, T.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

Kjornrattanawanich, B.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Klinger, D.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

Koptyaev, S.

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Koyama, T.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

Kracht, T.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Krasa, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Kroth, U.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Krumrey, M.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Krzywinski, J.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
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N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
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Kuba, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
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S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
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N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Kuhlmann, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Letal, V.

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
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Li, W. B.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Li, Z.

N. Medvedev, Z. Li, and B. Ziaja, “Thermal and nonthermal melting of silicon under femtosecond x-ray irradiation,” Phys. Rev. B 91(5), 054113 (2015).
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Liu, J. M.

Loch, R. A.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
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London, R.

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R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
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J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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London, R. A.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
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Loos, H.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Louis, E.

Martins, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Matsuyama, S.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
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T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
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Maycock, P.

H. Shanks, P. Maycock, P. Sidles, and G. Danielson, “Thermal conductivity of silicon from 300 to 1400 K,” Phys. Rev. 130(5), 1743–1748 (1963).
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McKernan, M. A.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Medvedev, N.

N. Medvedev, Z. Li, and B. Ziaja, “Thermal and nonthermal melting of silicon under femtosecond x-ray irradiation,” Phys. Rev. B 91(5), 054113 (2015).
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Messerschmidt, M.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Miahnahri, A.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Mimura, H.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
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T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
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Moeller, S.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Möller, S.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
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Nietubyc, R.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Nuhn, H. D.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Nunez, T.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Ohashi, H.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
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Osmani, O.

A. Rämer, O. Osmani, and B. Rethfeld, “Laser damage in silicon: energy absorption, relaxation, and transport,” J. Appl. Phys. 116(5), 053508 (2014).
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Ozkan, C.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
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Paszkowicz, W.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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Paulmann, C.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
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Pelka, J.

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Pelka, J. B.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
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R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
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A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
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R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
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J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
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S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
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J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
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Perner, F.

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Petroutchik, A.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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Pile, D.

D. Pile, “X-rays: First light from SACLA,” Nat. Photonics 5(8), 456–457 (2011).
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Pile, G.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Plonjes, E.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Plönjes, E.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
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Rämer, A.

A. Rämer, O. Osmani, and B. Rethfeld, “Laser damage in silicon: energy absorption, relaxation, and transport,” J. Appl. Phys. 116(5), 053508 (2014).
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Ratner, D.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Redlin, H.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
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Reniewicz, H.

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
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Rethfeld, B.

A. Rämer, O. Osmani, and B. Rethfeld, “Laser damage in silicon: energy absorption, relaxation, and transport,” J. Appl. Phys. 116(5), 053508 (2014).
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Richter, M.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
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Riekel, C.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
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Rzepiela, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Saldin, E. L.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
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Sato, T.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
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T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
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Schell, N.

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
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Schneider, J. R.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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Schneidmiller, E. A.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
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Schöppe, H.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
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Schreiber, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
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K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

Schultz, D.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
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Senba, Y.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
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Shanks, H.

H. Shanks, P. Maycock, P. Sidles, and G. Danielson, “Thermal conductivity of silicon from 300 to 1400 K,” Phys. Rev. 130(5), 1743–1748 (1963).
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Sidles, P.

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Sinn, H.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

Smith, T.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Sobierajski, R.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

Sobota, D.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Sokolowski Tinten, K.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Sokolowski-Tinten, K.

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Sorokin, A.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

Spiller, E.

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

Stefan, P.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Stojanovic, N.

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Szuszkiewicz, W.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Tavella, F.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Tiedtke, K.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Togashi, T.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

Toleikis, S.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Tompkins, H.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Tono, K.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

Treusch, R.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

Tschentscher, T.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Turner, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Ulm, G.

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
[Crossref]

van de Kruijs, R. W. E.

van Hattum, E. D.

Velyhan, A.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Vogt, M.

K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

von Bargen, N.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

von der Linde, D.

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Vorlicek, V.

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

Vysin, L.

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Vyšín, L.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Wabnitz, H.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

A. R. Khorsand, R. Sobierajski, E. Louis, S. Bruijn, E. D. van Hattum, R. W. E. van de Kruijs, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, T. Burian, J. Chalupsky, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, K. Tiedtke, K. Sokolowski-Tinten, U. Shymanovich, J. Krzywinski, S. Hau-Riege, R. London, A. Gleeson, E. M. Gullikson, and F. Bijkerk, “Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure,” Opt. Express 18(2), 700–712 (2010).
[Crossref] [PubMed]

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Wawro, A.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

Weigelt, H.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Welch, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Wellhofer, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

White, W.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Wierzchowski, W.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Wieteska, K.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Wu, J.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Yabashi, M.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

Yamauchi, K.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

Yocky, G.

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

Yumoto, H.

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser,” Opt. Express 21(13), 15382–15388 (2013).
[Crossref] [PubMed]

Yurkov, M. V.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

Zastrau, U.

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

Ziaja, B.

N. Medvedev, Z. Li, and B. Ziaja, “Thermal and nonthermal melting of silicon under femtosecond x-ray irradiation,” Phys. Rev. B 91(5), 054113 (2015).
[Crossref]

Zymierska, D.

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

Zytkiewicz, Z. R.

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

Appl. Phys. Lett. (2)

N. Stojanovic, D. von der Linde, K. Sokolowski-Tinten, U. Zastrau, F. Perner, E. Forster, R. Sobierajski, R. Nietubyc, M. Jurek, D. Klinger, J. Pelka, J. Krzywinski, L. Juha, J. Cihelka, A. Velyhan, S. Koptyaev, V. Hajkova, J. Chalupsky, J. Kuba, T. Tschentscher, S. Toleikis, S. Dusterer, and H. Redlin, “Ablation of solids using a femtosecond extreme ultraviolet free electron laser,” Appl. Phys. Lett. 89(24), 241909 (2006).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

J. Alloys Compd. (1)

J. B. Pelka, A. Andrejczuk, H. Reniewicz, N. Schell, J. Krzywinski, R. Sobierajski, A. Wawro, Z. R. Zytkiewicz, D. Klinger, and L. Juha, “Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser,” J. Alloys Compd. 382(1-2), 264–270 (2004).
[Crossref]

J. Appl. Phys. (3)

K. Tiedtke, J. Feldhaus, U. Hahn, U. Jastrow, T. Nunez, T. Tschentscher, S. Bobashev, A. Sorokin, J. Hastings, S. Möller, L. Cibik, A. Gottwald, A. Hoehl, U. Kroth, M. Krumrey, H. Schöppe, G. Ulm, and M. Richter, “Gas detectors for x-ray lasers,” J. Appl. Phys. 103(9), 094511 (2008).
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J. Krzywinski, R. Sobierajski, M. Jurek, R. Nietubyc, J. B. Pelka, L. Juha, M. Bittner, V. Letal, V. Vorlicek, A. Andrejczuk, J. Feldhaus, B. Keitel, E. L. Saldin, E. A. Schneidmiller, R. Treusch, and M. V. Yurkov, “Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser,” J. Appl. Phys. 101(4), 043107 (2007).
[Crossref]

A. Rämer, O. Osmani, and B. Rethfeld, “Laser damage in silicon: energy absorption, relaxation, and transport,” J. Appl. Phys. 116(5), 053508 (2014).
[Crossref]

J. Instrum. (1)

R. Sobierajski, M. Jurek, J. Chalupsky, J. Krzywinski, T. Burian, S. D. Farahani, V. Hajkova, M. Harmand, L. Juha, D. Klinger, R. A. Loch, C. Ozkan, J. B. Pelka, K. Sokolowski-Tinten, H. Sinn, S. Toleikis, K. Tiedtke, T. Tschentscher, H. Wabnitz, and J. Gaudin, “Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids,” J. Instrum. 8(02), 013909 (2013).
[Crossref]

J. Phys. Conf. Ser. (1)

T. Koyama, H. Yumoto, Y. Senba, K. Tono, T. Sato, T. Togashi, Y. Inubushi, J. Kim, T. Kimura, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, H. Ohashi, and T. Ishikawa, “Damage study of optical substrates using 1-μm-focusing beam of hard x-ray free-electron laser,” J. Phys. Conf. Ser. 463, 012043 (2013).
[Crossref]

Model. Simul. Mater. Sc. (1)

H. Hu and S. A. Argyropoulos, “Mathematical modelling of solidification and melting: a review,” Model. Simul. Mater. Sc. 4(4), 371–396 (1996).
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Nat. Photonics (2)

D. Pile, “X-rays: First light from SACLA,” Nat. Photonics 5(8), 456–457 (2011).
[Crossref]

P. Emma, R. Akre, J. Arthur, R. Bionta, C. Bostedt, J. Bozek, A. Brachmann, P. Bucksbaum, R. Coffee, F. J. Decker, Y. Ding, D. Dowell, S. Edstrom, A. Fisher, J. Frisch, S. Gilevich, J. Hastings, G. Hays, P. Hering, Z. Huang, R. Iverson, H. Loos, M. Messerschmidt, A. Miahnahri, S. Moeller, H. D. Nuhn, G. Pile, D. Ratner, J. Rzepiela, D. Schultz, T. Smith, P. Stefan, H. Tompkins, J. Turner, J. Welch, W. White, J. Wu, G. Yocky, and J. Galayda, “First lasing and operation of an angstrom-wavelength free-electron laser,” Nat. Photonics 4(9), 641–647 (2010).
[Crossref]

New J. Phys. (1)

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Dusterer, B. Faatz, U. Fruhling, M. Gensch, C. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nunez, E. Plonjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhofer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” New J. Phys. 11(2), 023029 (2009).
[Crossref]

Opt. Express (2)

Opt. Lett. (1)

Phys. Rev. (1)

H. Shanks, P. Maycock, P. Sidles, and G. Danielson, “Thermal conductivity of silicon from 300 to 1400 K,” Phys. Rev. 130(5), 1743–1748 (1963).
[Crossref]

Phys. Rev. B (1)

N. Medvedev, Z. Li, and B. Ziaja, “Thermal and nonthermal melting of silicon under femtosecond x-ray irradiation,” Phys. Rev. B 91(5), 054113 (2015).
[Crossref]

Phys. Rev. Lett. (1)

S. P. Hau-Riege, H. N. Chapman, J. Krzywinski, R. Sobierajski, S. Bajt, R. A. London, M. Bergh, C. Caleman, R. Nietubyc, L. Juha, J. Kuba, E. Spiller, S. Baker, R. Bionta, K. Sokolowski Tinten, N. Stojanovic, B. Kjornrattanawanich, E. Gullikson, E. Plönjes, S. Toleikis, and T. Tschentscher, “Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter,” Phys. Rev. Lett. 98(14), 145502 (2007).
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Proc. SPIE (1)

R. Sobierajski, D. Klinger, M. Jurek, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. P. Hau-Riege, and R. London, “Interaction of intense ultrashort XUV pulses with silicon,” Proc. SPIE 7361, 736107 (2009).
[Crossref]

Radiat. Phys. Chem. (2)

J. B. Pelka, R. Sobierajski, D. Klinger, W. Paszkowicz, J. Krzywinski, M. Jurek, D. Zymierska, A. Wawro, A. Petroutchik, L. Juha, V. Hajkova, J. Cihelka, J. Chalupsky, T. Burian, L. Vysin, S. Toleikis, K. Sokolowski-Tinten, N. Stojanovic, U. Zastrau, R. London, S. Hau-Riege, C. Riekel, R. Davies, M. Burghammer, E. Dynowska, W. Szuszkiewicz, W. Caliebe, and R. Nietubyc, “Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using x-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy,” Radiat. Phys. Chem. 78(10), 546–552 (2009).
[Crossref]

W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J. B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A. J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, and C. Paulmann, “„Investigations of the damages induced by flash pulses in silicon crystals by means of white beam synchrotron section topography,” Radiat. Phys. Chem. 93, 99–103 (2013).
[Crossref]

Other (4)

K. Honkavaara, B. Faatz, J. Feldhaus, S. Schreiber, R. Treusch, and M. Vogt, “Status of the sof x-ray user facility FLASH,” Proceedings of FEL2015, Daejeon, Korea (2015).

D. W. Bäuerle, Laser Processing and Chemistry (Springer Science & Business Media, 2013).

B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E= 50-30,000 eV, Z= 1-92,” Atom. Data Nucl. Data 54, 181–342 (1993).
[Crossref]

Material’s thermodynamical parameterters taken from NIST Chemistry WebBook, http://webbook.nist.gov/chemistry/ .

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Figures (6)

Fig. 1
Fig. 1 Pulse energy distributions for various spots (different colours on the plot) normalized to the mean train energy.
Fig. 2
Fig. 2 DIC optical microscopy (a) and SEM (b) images of a spot irradiated at a fluence level of 42.5 mJ/cm2.
Fig. 3
Fig. 3 TEM images of sample cross-sections taken at the spot presented on Fig. 2 in three areas: (a) droplet–like surface feature of the outer region, (b) 0.5 μm thick layer of lattice defects in the vicinity of the sample surface in the middle region, (c) lattice defects at the border between the middle and inner regions. A polycrystalline ultrathin Pt cap layer is visible on top of the sample. It was deposited for sample protection during cross-sectional cutting using focus ion beam (FIB). FIB processing was carried out after irradiation and measurement with DIC optical microscopy and SEM.
Fig. 4
Fig. 4 Simulation’s result for a fluence of 500 mJ/cm2. Local enthalpy dependence on time (up to 1 µs) and depth (down to 100 µm). Two enthalpy levels of 3 and 7.17 GJ/m3 corresponding to T = Tmelt and start of liquid phase are marked with black lines (dashed and solid, respectively). Colour bar values on the right are in [J/m3].
Fig. 5
Fig. 5 Maximum enthalpy during each pulse (a) and accumulated enthalpy before each pulse (b) for various mean fluence levels. Two enthalpy levels of 3.0 and 7.17 GJ/m3 corresponding to T = Tmelt and the start of liquid phase are marked with black lines (dashed and solid, respectively). The colour map corresponds to an enthalpy range of 0 to 7.17 GJ/m3 (liquid sample).
Fig. 6
Fig. 6 Map of maximum melted depth after each pulse for various fluence levels. Two enthalpy levels of 3 and 7.17 GJ/m3 corresponding to T = Tmelt and the start of the liquid phase are marked with black lines (dashed and solid, respectively). The colour map corresponds to a depth range of 0 to 2 μm.

Equations (1)

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h t = x ( k C h x )+S,

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