H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
R. S. Ruskin, Z. Yu, and N. Grigorieff, “Quantitative characterization of electron detectors for transmission electron microscopy,” J. Struct. Biol. 184, 385–393 (2013).
[Crossref]
[PubMed]
D. B. Carlson, J. Gelb, V. Palshin, and J. E. Evans, “Laboratory-based cryogenic soft X-ray tomography with correlative cryo-light and electron microscopy,” Microsc. Microanal. 19, 22–29 (2013).
[Crossref]
[PubMed]
S. Rehbein, P. Guttmann, S. Werner, and G. Schneider, “Characterization of the resolving power and contrast transfer function of a transmission X-ray microscope with partially coherent illumination,” Opt. Express 20, 1–3 (2012).
[Crossref]
L. Chen, J. McGinty, H. B. Taylor, L. Bugeon, J. R. Lamb, M. J. Dallman, and P. M. W. French, “Incorporation of an experimentally determined MTF for spatial frequency filtering and deconvolution during optical projection tomography reconstruction,” Opt. Express 20, 7323–7337 (2012).
[Crossref]
[PubMed]
W. V. D. Broek, S. V. Aert, and D. V. Dyck, “Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency,” Microsc. Microanal. 18, 336–342 (2012).
[Crossref]
[PubMed]
E. Pereiro, J. Nicolás, S. Ferrer, and M. R. Howells, “A soft X-ray beamline for transmission X-ray microscopy at ALBA,” J. Synchrotron Radiat. 16, 505–512 (2009).
[Crossref]
[PubMed]
C. D. Claxton and R. C. Staunton, “Measurement of the point-spread function of a noisy imaging system,” J. Opt. Soc. Am. A 25, 159–170 (2008).
[Crossref]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
R. Reulke, S. Becker, N. Haala, and U. Tempelmann, “Determination and improvement of spatial resolution of the CCD-line-scanner system ADS40,” ISPRS J. Photogramm. Remote Sens. 60, 81–90 (2006).
[Crossref]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
R. R. Meyer and A. I. Kirkland, “Characterisation of the signal and noise transfer of CCD cameras for electron detection,” Microsc. Res. Techniq. 49, 269–280 (2000).
[Crossref]
S. Reichenbach, S. K. Park, and R. Narayanswamy, “Characterizing digital image acquisition devices,” Opt. Eng. 30, 170–177 (1991).
[Crossref]
W. V. D. Broek, S. V. Aert, and D. V. Dyck, “Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency,” Microsc. Microanal. 18, 336–342 (2012).
[Crossref]
[PubMed]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
R. Reulke, S. Becker, N. Haala, and U. Tempelmann, “Determination and improvement of spatial resolution of the CCD-line-scanner system ADS40,” ISPRS J. Photogramm. Remote Sens. 60, 81–90 (2006).
[Crossref]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge University, 1999), 7.
[Crossref]
W. V. D. Broek, S. V. Aert, and D. V. Dyck, “Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency,” Microsc. Microanal. 18, 336–342 (2012).
[Crossref]
[PubMed]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
D. B. Carlson, J. Gelb, V. Palshin, and J. E. Evans, “Laboratory-based cryogenic soft X-ray tomography with correlative cryo-light and electron microscopy,” Microsc. Microanal. 19, 22–29 (2013).
[Crossref]
[PubMed]
C. Chang and T. Nakamura, “Partially coherent image formation theory for X-ray microscopy,” in “Microscopy: Science, Technology, Applications and Education,”, A. Mendez-Vilas and J. Diaz, eds. (Formatex Research Center, 2010), 3, pp. 1897–1904, 4.
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
W. V. D. Broek, S. V. Aert, and D. V. Dyck, “Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency,” Microsc. Microanal. 18, 336–342 (2012).
[Crossref]
[PubMed]
D. B. Carlson, J. Gelb, V. Palshin, and J. E. Evans, “Laboratory-based cryogenic soft X-ray tomography with correlative cryo-light and electron microscopy,” Microsc. Microanal. 19, 22–29 (2013).
[Crossref]
[PubMed]
E. Pereiro, J. Nicolás, S. Ferrer, and M. R. Howells, “A soft X-ray beamline for transmission X-ray microscopy at ALBA,” J. Synchrotron Radiat. 16, 505–512 (2009).
[Crossref]
[PubMed]
D. B. Carlson, J. Gelb, V. Palshin, and J. E. Evans, “Laboratory-based cryogenic soft X-ray tomography with correlative cryo-light and electron microscopy,” Microsc. Microanal. 19, 22–29 (2013).
[Crossref]
[PubMed]
J. W. Goodman, Statistical Optics (Wiley, 2000).
J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, 1996).
R. S. Ruskin, Z. Yu, and N. Grigorieff, “Quantitative characterization of electron detectors for transmission electron microscopy,” J. Struct. Biol. 184, 385–393 (2013).
[Crossref]
[PubMed]
R. Reulke, S. Becker, N. Haala, and U. Tempelmann, “Determination and improvement of spatial resolution of the CCD-line-scanner system ADS40,” ISPRS J. Photogramm. Remote Sens. 60, 81–90 (2006).
[Crossref]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
E. Pereiro, J. Nicolás, S. Ferrer, and M. R. Howells, “A soft X-ray beamline for transmission X-ray microscopy at ALBA,” J. Synchrotron Radiat. 16, 505–512 (2009).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
R. R. Meyer and A. I. Kirkland, “Characterisation of the signal and noise transfer of CCD cameras for electron detection,” Microsc. Res. Techniq. 49, 269–280 (2000).
[Crossref]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
R. R. Meyer and A. I. Kirkland, “Characterisation of the signal and noise transfer of CCD cameras for electron detection,” Microsc. Res. Techniq. 49, 269–280 (2000).
[Crossref]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
C. Chang and T. Nakamura, “Partially coherent image formation theory for X-ray microscopy,” in “Microscopy: Science, Technology, Applications and Education,”, A. Mendez-Vilas and J. Diaz, eds. (Formatex Research Center, 2010), 3, pp. 1897–1904, 4.
S. Reichenbach, S. K. Park, and R. Narayanswamy, “Characterizing digital image acquisition devices,” Opt. Eng. 30, 170–177 (1991).
[Crossref]
E. Pereiro, J. Nicolás, S. Ferrer, and M. R. Howells, “A soft X-ray beamline for transmission X-ray microscopy at ALBA,” J. Synchrotron Radiat. 16, 505–512 (2009).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
D. B. Carlson, J. Gelb, V. Palshin, and J. E. Evans, “Laboratory-based cryogenic soft X-ray tomography with correlative cryo-light and electron microscopy,” Microsc. Microanal. 19, 22–29 (2013).
[Crossref]
[PubMed]
S. Reichenbach, S. K. Park, and R. Narayanswamy, “Characterizing digital image acquisition devices,” Opt. Eng. 30, 170–177 (1991).
[Crossref]
E. Pereiro, J. Nicolás, S. Ferrer, and M. R. Howells, “A soft X-ray beamline for transmission X-ray microscopy at ALBA,” J. Synchrotron Radiat. 16, 505–512 (2009).
[Crossref]
[PubMed]
S. Reichenbach, S. K. Park, and R. Narayanswamy, “Characterizing digital image acquisition devices,” Opt. Eng. 30, 170–177 (1991).
[Crossref]
R. Reulke, S. Becker, N. Haala, and U. Tempelmann, “Determination and improvement of spatial resolution of the CCD-line-scanner system ADS40,” ISPRS J. Photogramm. Remote Sens. 60, 81–90 (2006).
[Crossref]
R. S. Ruskin, Z. Yu, and N. Grigorieff, “Quantitative characterization of electron detectors for transmission electron microscopy,” J. Struct. Biol. 184, 385–393 (2013).
[Crossref]
[PubMed]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
R. Reulke, S. Becker, N. Haala, and U. Tempelmann, “Determination and improvement of spatial resolution of the CCD-line-scanner system ADS40,” ISPRS J. Photogramm. Remote Sens. 60, 81–90 (2006).
[Crossref]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge University, 1999), 7.
[Crossref]
R. S. Ruskin, Z. Yu, and N. Grigorieff, “Quantitative characterization of electron detectors for transmission electron microscopy,” J. Struct. Biol. 184, 385–393 (2013).
[Crossref]
[PubMed]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
M. C. Bertilson, O. von Hofsten, M. Lindblom, T. Wilhein, H. M. Hertz, and U. Vogt, “Compact high-resolution differential interference contrast soft X-ray microscopy,” Appl. Phys. Lett. 92, 064104 (2008).
[Crossref]
R. Reulke, S. Becker, N. Haala, and U. Tempelmann, “Determination and improvement of spatial resolution of the CCD-line-scanner system ADS40,” ISPRS J. Photogramm. Remote Sens. 60, 81–90 (2006).
[Crossref]
P. a. C. Takman, H. Stollberg, G. A. Johansson, A. Holmberg, M. Lindblom, and H. M. Hertz, “High-resolution compact X-ray microscopy,” J. Microsc. 226, 175–181 (2007).
[Crossref]
[PubMed]
R. S. Ruskin, Z. Yu, and N. Grigorieff, “Quantitative characterization of electron detectors for transmission electron microscopy,” J. Struct. Biol. 184, 385–393 (2013).
[Crossref]
[PubMed]
H. Takano, S. Konishi, T. Koyama, Y. Tsusaka, S. Ichimaru, T. Ohchi, H. Takenaka, and Y. Kagoshima, “Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture,” J. Synchrotron Radiat. 21, 446–448 (2014).
[Crossref]
[PubMed]
E. Pereiro, J. Nicolás, S. Ferrer, and M. R. Howells, “A soft X-ray beamline for transmission X-ray microscopy at ALBA,” J. Synchrotron Radiat. 16, 505–512 (2009).
[Crossref]
[PubMed]
W. V. D. Broek, S. V. Aert, and D. V. Dyck, “Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency,” Microsc. Microanal. 18, 336–342 (2012).
[Crossref]
[PubMed]
D. B. Carlson, J. Gelb, V. Palshin, and J. E. Evans, “Laboratory-based cryogenic soft X-ray tomography with correlative cryo-light and electron microscopy,” Microsc. Microanal. 19, 22–29 (2013).
[Crossref]
[PubMed]
R. R. Meyer and A. I. Kirkland, “Characterisation of the signal and noise transfer of CCD cameras for electron detection,” Microsc. Res. Techniq. 49, 269–280 (2000).
[Crossref]
S. Reichenbach, S. K. Park, and R. Narayanswamy, “Characterizing digital image acquisition devices,” Opt. Eng. 30, 170–177 (1991).
[Crossref]
S. Rehbein, P. Guttmann, S. Werner, and G. Schneider, “Characterization of the resolving power and contrast transfer function of a transmission X-ray microscope with partially coherent illumination,” Opt. Express 20, 1–3 (2012).
[Crossref]
L. Chen, J. McGinty, H. B. Taylor, L. Bugeon, J. R. Lamb, M. J. Dallman, and P. M. W. French, “Incorporation of an experimentally determined MTF for spatial frequency filtering and deconvolution during optical projection tomography reconstruction,” Opt. Express 20, 7323–7337 (2012).
[Crossref]
[PubMed]
R. Burge, X.-C. Yuan, G. Morrison, P. Charalambous, M. Browne, and Z. An, “Incoherent imaging with the soft X-ray microscope,” Ultramicroscopy 83, 75–92 (2000).
[Crossref]
[PubMed]
J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, 1996).
M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge University, 1999), 7.
[Crossref]
C. Chang and T. Nakamura, “Partially coherent image formation theory for X-ray microscopy,” in “Microscopy: Science, Technology, Applications and Education,”, A. Mendez-Vilas and J. Diaz, eds. (Formatex Research Center, 2010), 3, pp. 1897–1904, 4.
J. W. Goodman, Statistical Optics (Wiley, 2000).