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Characteristic investigation of scanning surface plasmon microscopy for nucleotide functionalized nanoarray

Shih-Chung Wei, Pei-Tung Yang, Tzu-Heng Wu, Yin-Lin Lu, Frank Gu, Kung-Bin Sung, and Chii-Wann Lin

Open Access Open Access

Abstract

A calculation based on surface plasmon coupling condition and Maxwell-Garnett equation was performed for predicting the coupling angle shift and thin film thickness in scanning surface plasmon microscopy (SSPM). The refractive index sensitivity and lateral resolution of an SSPM system was also investigated. The limit of detection of angle shift was 0.01°, the limit of quantification of angle shift was 0.03°, and the sensitivity was around 0.12° shift per nm ZnO film when the film thickness was less than 22.6 nm. Two partially connected Au nano-discs with a center-to-center distance of 1.1 μm could be identified as two peaks. The system was applied to image nanostructure defects and a virus-probe functionalized nanoarray. We expect the potential application in nanobiosensors with further optimization in the future.

© 2015 Optical Society of America

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Figures (8)
Fig. 1
Fig. 1 Radially-polarized illumination was used to locally excite surface plasmon. (a) The schematic diagram of our SSPM. (b) The image of the BFP was acquired for the coupling angle calculation. (c) n eff a is the effective refractive index of the target sample including the deposited material and medium. (LP: linear polarizer, RPC: radial polarization converter, RP: radial polarization, BS: beam splitter, L: lens, OBJ: objective, BFP: back focal plane, BFPI: back focal plane image)

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Fig. 2
Fig. 2 The fabrication methods used in this article are illustrated. (a) Thin film was sputtered sequentially to stack ZnO layers with variant thicknesses. (b) MHA ink was written on Au film with DPN for producing the Au nanoarray. (c) Microsphere lithography was performed for making a large area nanoarray. (Unit: nm)

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Fig. 3
Fig. 3 (a) The SPR angle shifted with the thickness of the ZnO layer (performed with Macleod. (b) The trend of coupling angle shifts predicted with Macleod, MG model, and the equation published by Jung et al. [24] (c) BFP images with the SPR angles of sample with different ZnO thickness. Region in 10 um2 size was scanned for each sample and calculated the average angle and standard deviation.

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Fig. 4
Fig. 4 (a) Nano-disc pairs with gradually decreased center-to-center distances were imaged by SSPM and SEM. (b) The distances between peaks of the intensity profiles of the SSPM image in (a) were measured.

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Fig. 5
Fig. 5 The SSPM measured particle distances were compared to the measurement with SEM.

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Fig. 6
Fig. 6 A nano-disc array produced by DPN was imaged by SEM (a) and SSPM (b). The SSPM image clearly showed the nanoarray structure and some defects on the SPR chip (c). No.1 is the image of residual Au after etching, and No. 2 is the image of a scratch on the surface.

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Fig. 7
Fig. 7 The SSPM image before and after single-strand DNA modification. (HCV probe sequence: 5′-thiol-TATGGCTCTCCCGGGAGGGGTTGCCATGGCGTTAGTATGAGT-3′)

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Fig. 8
Fig. 8 (a) The histogram of SPR angle showed a slight right shift after ssDNA modification. (b) The simulation results for ssDNA modification based on Jung et al. and MG model.

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Equations (10)

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sinθ SPR / sinθ max = R SPR / R max .
θ SPR = sin −1 [ ( R SPR / R max )×( NA / n 0 ) ].
β EW = β SP = β SP0 +Δβ .
( 2π λ ) n 0 sin θ SPR =( 2π λ ) n eff SP =( 2π λ ) n eff SP0 +Δβ=( 2π λ ) [ ε eff a ε m / ( ε eff a + ε m ) ] 1/2 +Δβ.
I d =( λ/ 2π )Re { [ n eff a 2 ε m / ( n eff a 2 + ε m ) ]− n eff a 2 } −1 /2 =( λ/ 2π )Re { −n eff a 4 / ( n eff a 2 + ε m ) } −1 /2 ,
n eff a =( 2/ I d ) ∫ 0 ∞ n( z ) EXP( −2z / I d )dz,
n eff a = n a [ 1−EXP( −2d / I d ) ]+ n s EXP( −2d / I d )= n s +( n a − n s )[ 1−EXP( −2d / I d ) ],
n eff a = n s +( n a − n s )( 2d / I d ).
( ε eff a − ε s ) / ( ε eff a +2 ε s ) = V a × ( ε a − ε s ) / ( ε a +2 ε s ) ,
V a =d/ I d .
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