Abstract

Propagation-based imaging or inline holography in combination with computed tomography (holotomography) is a versatile tool to access a sample’s three-dimensional (3D) micro or nano structure. However, the phase retrieval step needed prior to tomographic reconstruction can be challenging especially for strongly absorbing and refracting samples. Near-field ptychography is a recently developed phase imaging method that has been proven to overcome this hurdle in projection data. In this work we extend near-field ptychography to three dimensions and we show that, in combination with tomography, it can access the nano structure of a solid oxide fuel cell (SOFC). The quality of the resulting tomographic data and the structural properties of the anode extracted from this volume were compared to previous results obtained with holotomography. This work highlights the potential of 3D near-field ptychography for reliable and detailed investigations of samples at the nanometer scale, with important applications in materials and life sciences among others.

© 2015 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Dark-field X-ray ptychography

Akihiro Suzuki and Yukio Takahashi
Opt. Express 23(12) 16429-16438 (2015)

X-ray ptychography with extended depth of field

Esther H. R. Tsai, Ivan Usov, Ana Diaz, Andreas Menzel, and Manuel Guizar-Sicairos
Opt. Express 24(25) 29089-29108 (2016)

Characterization of near-field ptychography

Richard M. Clare, Marco Stockmar, Martin Dierolf, Irene Zanette, and Franz Pfeiffer
Opt. Express 23(15) 19728-19742 (2015)

References

  • View by:
  • |
  • |
  • |

  1. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
    [Crossref] [PubMed]
  2. M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
    [Crossref] [PubMed]
  3. S. C. Mayo, A. W. Stevenson, and S. W. Wilkins, “In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science,” Materials 5, 937–965 (2012).
    [Crossref]
  4. B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
    [Crossref] [PubMed]
  5. K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
    [Crossref] [PubMed]
  6. P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
    [Crossref]
  7. S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
    [Crossref] [PubMed]
  8. R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
    [Crossref]
  9. J. Miao, P. Charalambous, and J. Kirz, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
    [Crossref]
  10. J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
    [Crossref] [PubMed]
  11. B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
    [Crossref]
  12. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
    [Crossref] [PubMed]
  13. A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
    [Crossref]
  14. M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
    [Crossref] [PubMed]
  15. J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
    [Crossref]
  16. C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).
  17. J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
    [Crossref]
  18. M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
    [Crossref] [PubMed]
  19. M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
    [Crossref]
  20. A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
    [Crossref] [PubMed]
  21. D. Paganin, Coherent X-Ray Optics (Oxford Series on Synchrotron Radiation) (Oxford University, 2006).
    [Crossref]
  22. J. Als-Nielsen and D. McMorrow, Elements of Modern X-ray Physics (Wiley, 2001).
  23. A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (Classics in Applied Mathematics) (Society for Industrial Mathematics, 1987).
  24. M. Born and E. Wolf, eds., Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 7. (Cambridge University, 1999).
    [Crossref]
  25. G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).
  26. W. H. Richardson, “Bayesian-Based Iterative Method of Image Restoration,” J. Opt. Soc. Am. 62, 55–59 (1972).
    [Crossref]
  27. L. Lucy, “An iterative technique for the rectification of observed distributions,” Astronom J 79, 745–754 (1974).
    [Crossref]
  28. P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
    [Crossref] [PubMed]
  29. P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
    [Crossref] [PubMed]
  30. P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
    [Crossref]
  31. C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
    [Crossref] [PubMed]
  32. P. Perona and J. Malik, “Scale-space and edge detection using anisotropic diffusion,” IEEE Trans. Pattern Anal. Mach. Intel. 12, 629–639 (1990).
    [Crossref]
  33. N. Otsu, “A Threshold Selection Method from Gray-Level Histograms,” IEEE Trans. Syst., Man, .Cybernet.  9, 62–66 (1979).
  34. J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
    [Crossref]
  35. F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
    [Crossref]
  36. G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
    [Crossref]
  37. T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
    [Crossref]
  38. B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
    [Crossref]
  39. M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
    [Crossref] [PubMed]
  40. A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
    [Crossref]
  41. A. Maiden, M. Humphry, and J. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
    [Crossref]

2015 (2)

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

2014 (6)

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
[Crossref]

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

2013 (5)

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

2012 (5)

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

S. C. Mayo, A. W. Stevenson, and S. W. Wilkins, “In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science,” Materials 5, 937–965 (2012).
[Crossref]

A. Maiden, M. Humphry, and J. Rodenburg, “Ptychographic transmission microscopy in three dimensions using a multi-slice approach,” J. Opt. Soc. Am. A 29, 1606–1614 (2012).
[Crossref]

2011 (1)

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

2010 (2)

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

2009 (1)

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

2008 (3)

M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
[Crossref] [PubMed]

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

2007 (2)

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

2005 (1)

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

2003 (1)

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

2002 (1)

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

1999 (2)

J. Miao, P. Charalambous, and J. Kirz, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[Crossref]

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

1996 (1)

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

1990 (1)

P. Perona and J. Malik, “Scale-space and edge detection using anisotropic diffusion,” IEEE Trans. Pattern Anal. Mach. Intel. 12, 629–639 (1990).
[Crossref]

1979 (1)

N. Otsu, “A Threshold Selection Method from Gray-Level Histograms,” IEEE Trans. Syst., Man, .Cybernet.  9, 62–66 (1979).

1974 (1)

L. Lucy, “An iterative technique for the rectification of observed distributions,” Astronom J 79, 745–754 (1974).
[Crossref]

1972 (1)

Abbey, B.

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Als-Nielsen, J.

J. Als-Nielsen and D. McMorrow, Elements of Modern X-ray Physics (Wiley, 2001).

Barnea, Z.

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

Bartels, M.

A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
[Crossref]

Baruchel, J.

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

Bleuet, P.

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Bohic, S.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Bonnin, A.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

Buffiere, J.-Y.

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

Bunk, O.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Burdet, N.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Burgess, A.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Cauzid, J.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Charalambous, P.

J. Miao, P. Charalambous, and J. Kirz, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[Crossref]

Chen, B.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Clare, R.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

Clark, J. N.

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Cloetens, P.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
[Crossref] [PubMed]

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

Cookson, D.

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

Cullis, A.

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

David, C.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Davis, T. J.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

de Jonge, M.

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Delette, G.

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

Diaz, A.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Dierolf, M.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Dobson, B.

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Enders, B.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Falkenberg, G.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Färm, E.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Forest, S.

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

Furutaku, S.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Galliet, I.

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

Gao, D.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Guigay, J. P.

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

Guigay, J.-P.

M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
[Crossref] [PubMed]

Guizar-Sicairos, M.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

Gureyev, T.

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

Gureyev, T. E.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Hagemann, J.

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

Härkönen, E.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Hohage, T.

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

Holler, M.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Homann, C.

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

Hoppe, R.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Humphry, M.

Huo, S.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Hurst, A.

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Ishikawa, T.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Jefimovs, K.

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Jeulin, D.

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

Johnson, I.

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Kak, A. C.

A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (Classics in Applied Mathematics) (Society for Industrial Mathematics, 1987).

Kanit, T.

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

Karvinen, P.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Kewish, C. M.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Kieffer, I.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Kirz, J.

J. Miao, P. Charalambous, and J. Kirz, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[Crossref]

Kohmura, Y.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Kosior, E.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Krenkel, M.

A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
[Crossref]

Labouré, S.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Langer, M.

M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
[Crossref] [PubMed]

Laurencin, J.

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

Lay-Grindler, E.

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

Le Bihan, T.

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

Leguillon, D.

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

Lucy, L.

L. Lucy, “An iterative technique for the rectification of observed distributions,” Astronom J 79, 745–754 (1974).
[Crossref]

Ludwig, W.

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

Luke, D. R.

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

Maiden, A.

Maire, E.

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

Malik, J.

P. Perona and J. Malik, “Scale-space and edge detection using anisotropic diffusion,” IEEE Trans. Pattern Anal. Mach. Intel. 12, 629–639 (1990).
[Crossref]

Mancuso, J.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Martínez-Criado, G.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Mayo, S. C.

S. C. Mayo, A. W. Stevenson, and S. W. Wilkins, “In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science,” Materials 5, 937–965 (2012).
[Crossref]

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

McMorrow, D.

J. Als-Nielsen and D. McMorrow, Elements of Modern X-ray Physics (Wiley, 2001).

McNulty, I.

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Menzel, A.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Miao, J.

J. Miao, P. Charalambous, and J. Kirz, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[Crossref]

Miller, P. R.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Mokso, R.

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

Monteith, A.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Mounoury, V.

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

Nugent, K.

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

Nugent, K. A.

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Nulty, I.

Nutter, J.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Otsu, N.

N. Otsu, “A Threshold Selection Method from Gray-Level Histograms,” IEEE Trans. Syst., Man, .Cybernet.  9, 62–66 (1979).

Paganin, D.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

D. Paganin, Coherent X-Ray Optics (Oxford Series on Synchrotron Radiation) (Oxford University, 2006).
[Crossref]

Parry, D. J.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Patommel, J.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Peele, A. G.

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Perona, P.

P. Perona and J. Malik, “Scale-space and edge detection using anisotropic diffusion,” IEEE Trans. Pattern Anal. Mach. Intel. 12, 629–639 (1990).
[Crossref]

Petitgirard, S.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Peyrin, F.

M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
[Crossref] [PubMed]

Pfeifer, M. A.

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Pfeiffer, F.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Pogany, A.

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Putkunz, C. T.

Quey, R.

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

Quiney, H. M.

Raabe, J.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Rack, A.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Richardson, W. H.

Ritala, M.

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

Robinson, I.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Robisch, A.-L.

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

Rodenburg, J.

Rodenburg, J. M.

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Ruhlandt, A.

A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
[Crossref]

Salditt, T.

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
[Crossref]

Samberg, D.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Sans, J. A.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Schatz, M.

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Schlenker, M.

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

Schneider, P.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Schroer, C. G.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Schropp, A.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Segura-Ruiz, J.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Seiboth, F.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Shemilt, L.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Shimomura, K.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Slaney, M.

A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (Classics in Applied Mathematics) (Society for Industrial Mathematics, 1987).

Stephan, S.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Stevenson, A. W.

S. C. Mayo, A. W. Stevenson, and S. W. Wilkins, “In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science,” Materials 5, 937–965 (2012).
[Crossref]

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Stockmar, M.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Suhonen, H.

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Susini, J.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Suzuki, A.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Takahashi, Y.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Thibault, P.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Tucoulou, R.

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Usseglio-Viretta, F.

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

Van Dyck, D.

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

van Heel, M.

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

Van Landuyt, J.

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

Vergeer, F.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Villanova, J.

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Wellenreuther, G.

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

Wepf, R.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

Wilkins, S. W.

S. C. Mayo, A. W. Stevenson, and S. W. Wilkins, “In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science,” Materials 5, 937–965 (2012).
[Crossref]

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

Williams, G. J.

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Xiong, G.

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

Yamauchi, K.

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

Zanette, I.

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Appl. Phys. Lett. (4)

P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, “Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x-rays,” Appl. Phys. Lett. 75, 2912–2914 (1999).
[Crossref]

R. Mokso, P. Cloetens, E. Maire, W. Ludwig, and J.-Y. Buffiere, “Nanoscale zoom tomography with hard x rays using Kirkpatrick-Baez optics,” Appl. Phys. Lett. 90, 144104 (2007).
[Crossref]

A. Schropp, R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer, “Hard x-ray scanning microscopy with coherent radiation: beyond the resolution of conventional x-ray microscopes,” Appl. Phys. Lett. 100, 253112 (2012).
[Crossref]

B. Enders, M. Dierolf, M. Stockmar, F. Pfeiffer, and P. Thibault, “Ptychography with broad-bandwidth radiation,” Appl. Phys. Lett. 104, 171104 (2014).
[Crossref]

Astronom J (1)

L. Lucy, “An iterative technique for the rectification of observed distributions,” Astronom J 79, 745–754 (1974).
[Crossref]

I. J. Sol. Struct. (1)

T. Kanit, S. Forest, I. Galliet, V. Mounoury, and D. Jeulin, “Determination of the size of the representative volume element for random composites: statistical and numerical approach,” I. J. Sol. Struct. 40, 3647–3679 (2003).
[Crossref]

IEEE Trans. Pattern Anal. Mach. Intel. (1)

P. Perona and J. Malik, “Scale-space and edge detection using anisotropic diffusion,” IEEE Trans. Pattern Anal. Mach. Intel. 12, 629–639 (1990).
[Crossref]

IEEE Trans. Syst., Man, .Cybernet (1)

N. Otsu, “A Threshold Selection Method from Gray-Level Histograms,” IEEE Trans. Syst., Man, .Cybernet.  9, 62–66 (1979).

Int. J. Hydro. Energy (1)

G. Delette, J. Laurencin, F. Usseglio-Viretta, J. Villanova, P. Bleuet, E. Lay-Grindler, and T. Le Bihan, “Thermoelastic properties of SOFC/SOEC electrode materials determined from three-dimensional microstructural reconstructions,” Int. J. Hydro. Energy 38, 12379–12391 (2013).
[Crossref]

J. Microsc. (1)

S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref] [PubMed]

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (1)

J. Power Sources (3)

J. Laurencin, R. Quey, G. Delette, H. Suhonen, P. Cloetens, and P. Bleuet, “Characterisation of Solid Oxide Fuel Cell Ni8YSZ substrate by synchrotron X-ray nano-tomography: from 3D reconstruction to microstructure quantification,” J. Power Sources 198, 182–189 (2012).
[Crossref]

F. Usseglio-Viretta, J. Laurencin, G. Delette, J. Villanova, P. Cloetens, and D. Leguillon, “Quantitative microstructure characterization of a Ni-YSZ bi-layer coupled with simulated electrode polarisation,” J. Power Sources 256, 394–403 (2014).
[Crossref]

J. Villanova, J. Laurencin, P. Cloetens, P. Bleuet, G. Delette, H. Suhonen, and F. Usseglio-Viretta, “3D phase mapping of solid oxide fuel cell YSZ/Ni cermet at the nanoscale by holographic X-ray nanotomography,” J. Power Sources 243, 841–849 (2013).
[Crossref]

J. Struct. Biol. (1)

M. van Heel and M. Schatz, “Fourier shell correlation threshold criteria,” J. Struct. Biol. 151, 250–262 (2005).
[Crossref] [PubMed]

J. Synchro. Rad. (1)

G. Martínez-Criado, R. Tucoulou, P. Cloetens, P. Bleuet, S. Bohic, J. Cauzid, I. Kieffer, E. Kosior, S. Labouré, S. Petitgirard, A. Rack, J. A. Sans, J. Segura-Ruiz, H. Suhonen, J. Susini, and J. Villanova, “Status of the hard X-ray microprobe beamline ID22 of the European Synchrotron Radiation Facility,” J. Synchro. Rad. 19, 1–9 (2011).

Materials (1)

S. C. Mayo, A. W. Stevenson, and S. W. Wilkins, “In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science,” Materials 5, 937–965 (2012).
[Crossref]

Med. Phys. (1)

M. Langer, P. Cloetens, J.-P. Guigay, and F. Peyrin, “Quantitative comparison of direct phase retrieval algorithms in in-line phase tomography,” Med. Phys. 35, 4556–4566 (2008).
[Crossref] [PubMed]

Nat. Phys. (1)

B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. de Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys. 4, 394–398 (2008).
[Crossref]

Nature (3)

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic X-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[Crossref] [PubMed]

J. Miao, P. Charalambous, and J. Kirz, “Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[Crossref]

P. Thibault and A. Menzel, “Reconstructing state mixtures from diffraction measurements,” Nature 494, 68–71 (2013).
[Crossref] [PubMed]

New J. Phys. (1)

P. Thibault and M. Guizar-Sicairos, “Maximum-likelihood refinement for coherent diffractive imaging,” New J. Phys. 14, 063004 (2012).
[Crossref]

Opt. Express (2)

C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, and I. Nulty, “Fresnel coherent diffraction tomography,” Opt. Express 18, 11746–11753 (2010).
[Crossref] [PubMed]

J. Hagemann, D. R. Luke, C. Homann, T. Hohage, P. Cloetens, H. Suhonen, and T. Salditt, “Reconstruction of wave front and object for inline holography from a set of detection planes,” Opt. Express 22, 195–202 (2014).
[Crossref]

Phys. Rev. A (2)

C. Homann, T. Hohage, J. Hagemann, A.-L. Robisch, and T. Salditt, “Validity of the empty-beam correction in near-field imaging,” Phys. Rev. A 91, 018321 (2015).

A. Ruhlandt, M. Krenkel, M. Bartels, and T. Salditt, “Three-dimensional phase retrieval in propagation-based phase-contrast imaging,” Phys. Rev. A 89, 033847 (2014).
[Crossref]

Phys. Rev. Appl. (1)

M. Stockmar, P. Cloetens, A. Bonnin, I. Zanette, M. Dierolf, B. Enders, R. Clare, F. Pfeiffer, and P. Thibault, “X-ray near-field ptychography for optically thick specimens,” Phys. Rev. Appl. 3, 014005 (2015).
[Crossref]

Phys. Rev. Lett. (3)

A. Suzuki, S. Furutaku, K. Shimomura, K. Yamauchi, Y. Kohmura, T. Ishikawa, and Y. Takahashi, “High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects,” Phys. Rev. Lett. 112, 053903 (2014).
[Crossref] [PubMed]

K. Nugent, T. Gureyev, D. Cookson, D. Paganin, and Z. Barnea, “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961–2964 (1996).
[Crossref] [PubMed]

J. M. Rodenburg, A. Hurst, A. Cullis, B. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-X-Ray Lensless Imaging of Extended Objects,” Phys. Rev. Lett. 98, 034801 (2007).
[Crossref] [PubMed]

Sci. Rep. (3)

M. Holler, A. Diaz, M. Guizar-Sicairos, P. Karvinen, E. Färm, E. Härkönen, M. Ritala, A. Menzel, J. Raabe, and O. Bunk, “X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution,” Sci. Rep. 4, 3857 (2014).
[Crossref] [PubMed]

B. Chen, M. Guizar-Sicairos, G. Xiong, L. Shemilt, A. Diaz, J. Nutter, N. Burdet, S. Huo, J. Mancuso, A. Monteith, F. Vergeer, A. Burgess, and I. Robinson, “Three-dimensional structure analysis and percolation properties of a barrier marine coating,” Sci. Rep. 3, 1177 (2013).
[Crossref] [PubMed]

M. Stockmar, P. Cloetens, I. Zanette, B. Enders, M. Dierolf, F. Pfeiffer, and P. Thibault, “Near-field ptychography: phase retrieval for inline holography using a structured illumination,” Sci. Rep. 3, 1927 (2013).
[Crossref] [PubMed]

Science (1)

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[Crossref] [PubMed]

Ultramicroscopy (1)

P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, “Probe retrieval in ptychographic coherent diffractive imaging,” Ultramicroscopy 109, 338–343 (2009).
[Crossref] [PubMed]

Other (4)

D. Paganin, Coherent X-Ray Optics (Oxford Series on Synchrotron Radiation) (Oxford University, 2006).
[Crossref]

J. Als-Nielsen and D. McMorrow, Elements of Modern X-ray Physics (Wiley, 2001).

A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (Classics in Applied Mathematics) (Society for Industrial Mathematics, 1987).

M. Born and E. Wolf, eds., Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 7. (Cambridge University, 1999).
[Crossref]

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1 (a) Schematics of the setup used. (b) Scanning pattern. (d) One diffraction pattern of the sample. (d) Diffraction pattern of the beam without the sample.
Fig. 2
Fig. 2 Ptychographic reconstruction results for a single projection angle. (a) Wrapped phase of the sample transmission function. (b) Magnitude of the sample transmission function. (c) Main mode of the complex valued illumination function with additional modes as insets. The scale bars indicate 10 μm.
Fig. 3
Fig. 3 Tomographic reconstruction results: (a) Frontal slice through the center. Transverse slices depicting (b) the cathode current collector, (c) the cathode functional layer, (d) the electrolyte and (e) the anode substrate. The scale bars indicate 10 μm.
Fig. 4
Fig. 4 Analysis of the anode substrate microstructure and comparison with holotomography. (a) shows a slice of the volume obtained by near-field ptychography, (c) shows the same slice after segmentation into the gas phase (red), the ceramic phase (blue) and the metallic phase (green). A similar slice (but not the same slice) of the volume obtained by holotomography is shown before (b) and after segmentation (d). The scale bars indicate 5 μm. (e) A plot comparing the covariance functions for each phase obtained from the segmentation of the near-field ptychography CT volume (faint colors) and the volume obtained by holotomography (bright colors).

Tables (1)

Tables Icon

Table 1 Comparison of the anodes’s microstructural properties. Rel. Dev. denotes the relative deviation of the values obtained with near-field ptychographic (NFP) CT with respect to the value obtained with holotomography.

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

t m a x r 2 / λ ,
T ( x , y ) = A ( x , y ) exp [ i ϕ ( x , y ) ] = exp [ k β ( x , y , z ) d z ] exp [ i k δ ( x , y , z ) d z ] ,
n ( x , y , z ) = 1 δ ( x , y , z ) + i β ( x , y , z ) .
M = z 1 + z 2 z 1 ,
I ( x , y ) = | D z eff [ χ ( x , y ) ] | 2 = | F 1 [ F [ χ ( x , y ) ] exp ( i Δ z eff k 2 q x 2 q y 2 ) ] | 2 ,
I j ( x , y ) = | D z eff [ χ j ( x , y ) ] | 2
χ j ( x , y ) = ψ ( x , y ) T ( x x j , y y j ) .

Metrics