M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

A. Owyoung, “Ellipse rotation studies in laser host materials,” IEEE J. Quantum Electron. 9(11), 1064–1069 (1973).

[Crossref]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

S. Hughes and J. M. Burzler, “Theory of Z-scan measurements using Gaussian-Bessel beams,” Phys. Rev. A 56(2), R1103–R1106 (1997).

[Crossref]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

S. Hughes and J. M. Burzler, “Theory of Z-scan measurements using Gaussian-Bessel beams,” Phys. Rev. A 56(2), R1103–R1106 (1997).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

E. C. Barbano, S. C. Zílio, and L. Misoguti, “Influence of self-focusing of ultrashort laser pulses on optical third-harmonic generation at interfaces,” Opt. Lett. 38(23), 5165–5168 (2013).

[Crossref]
[PubMed]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

A. Owyoung, “Ellipse rotation studies in laser host materials,” IEEE J. Quantum Electron. 9(11), 1064–1069 (1973).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

M. Sheik-Bahae, A. A. Said, T. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26(4), 760–769 (1990).

[Crossref]

A. Owyoung, “Ellipse rotation studies in laser host materials,” IEEE J. Quantum Electron. 9(11), 1064–1069 (1973).

[Crossref]

I. Guedes, L. Misoguti, L. De Boni, and S. C. Zilio, “Heterodyne Z-scan measurements of slow absorbers,” J. Appl. Phys. 101(6), 063112 (2007).

[Crossref]

N. Minkovscki, G. I. Petrov, S. M. Satiel, O. Albert, and J. Etchepare, “Nonlinear polarization rotation and orthogonal polarization generation experienced in a single-beam configuration,” J. Opt. Soc. Am. B 21(9), 1659–1664 (2004).

[Crossref]

R. Adair, L. L. Chase, and S. A. Payne, “Nonlinear refractive-index measurements of glasses using three-wave frequency mixing,” J. Opt. Soc. Am. B 4(6), 875–881 (1987).

[Crossref]

M. Lefkir and G. Rivoire, “Influence of transverse effect on measurement of third-order nonlinear susceptibility by self-induced polarization state change,” J. Opt. Soc. Am. B 14(11), 2856–2864 (1997).

[Crossref]

M. Kokhharov, S. A. Bakhromov, U. K. Makhmanov, R. A. Kokhkharov, and E. A. Zakhidov, “Self-induced polarization rotation of laser beam in fullerene (C70) solutions,” Opt. Commun. 285(12), 2947–2951 (2012).

[Crossref]

Z. B. Liu, X. Q. Yan, J. G. Tian, W. Y. Zhou, and W. P. Zang, “Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor,” Opt. Express 15(20), 13351–13359 (2007).

[Crossref]
[PubMed]

X. Q. Yan, Z. B. Liu, X. L. Zhang, W. Y. Zhou, and J. G. Tian, “Polarization dependence of Z-scan measurement: theory and experiment,” Opt. Express 17(8), 6397–6406 (2009).

[Crossref]
[PubMed]

X. Q. Yan, X. L. Zhang, S. Shi, Z. B. Liu, and J. G. Tian, “Third-order nonlinear susceptibility tensor elements of CS2 at femtosecond time scale,” Opt. Express 19(6), 5559–5564 (2011).

[Crossref]
[PubMed]

Z. B. Liu, S. Shi, X. Q. Yan, W. Y. Zhou, and J. G. Tian, “Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements,” Opt. Lett. 36(11), 2086–2088 (2011).

[Crossref]
[PubMed]

E. C. Barbano, S. C. Zílio, and L. Misoguti, “Influence of self-focusing of ultrashort laser pulses on optical third-harmonic generation at interfaces,” Opt. Lett. 38(23), 5165–5168 (2013).

[Crossref]
[PubMed]

P. D. Maker and R. W. Terhune, “Study of optical effects due to an induced polarization third order in the electric field strength,” Phys. Rev. 137(3A), A801–A818 (1965).

[Crossref]

S. Hughes and J. M. Burzler, “Theory of Z-scan measurements using Gaussian-Bessel beams,” Phys. Rev. A 56(2), R1103–R1106 (1997).

[Crossref]

P. B. Maker, R. W. Terhune, and C. M. Savage, “Intensity-dependence change in the refractive index of liquids,” Phys. Rev. Lett. 12(18), 507–509 (1964).

[Crossref]

R. W. Boyd, Nonlinear Optics, 3rd edition (Academic, 2008).

M. L. Miguez, E. C. Barbano, S. C. Zilio, L. Misoguti, and K. L. Vodopyanov, “New simple method for measuring nonlinear polarization ellipse rotation with high precision using a dual-phase lock-in,” in Nonlinear Frequency Generation and Conversion: Materials, Devices and Applications XIII, edited by Konstantin L. Vodopyanov, Proceedings of SPIE Vol. 8964 (SPIE, Bellingham, WA, 2014) 896446.