J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
R. W. Cole, T. Jinadasa, and C. M. Brown, “Measuring and interpreting point spread functions to determine confocal microscope resolution and ensure quality control,” Nat. Protoc. 6, 1929–1941 (2011).
[Crossref]
[PubMed]
P. Huang, T. Huang, Y. Sun, and S. Yang, “Fabrication of large area resin microlens arrays using gas-assisted ultraviolet embossing,” Opt. Express 16, 3041–3048 (2008).
[Crossref]
[PubMed]
J. Braat, S. V. Haver, A. Janssen, and P. Dirksen, “Assessment of optical systems by means of point-spread functions,” Prog. Optics 51, 349–468 (2008).
[Crossref]
E. Botcherby, R. Juskaitis, M. Booth, and T. Wilson, “An optical technique for remote focusing in microscopy,” Opt. Commun. 281, 880–887 (2008).
[Crossref]
T. E. Oliphant, “Python for scientific computing,” Comput. Sci. Eng. 9, 10–20 (2007).
[Crossref]
F. Charriere, A. Marian, T. Colomb, P. Marquet, and C. Depeursinge, “Amplitude point-spread function measurement of high-NA microscope objectives by digital holographic microscopy,” Opt. Lett. 32, 2456–2458 (2007).
[Crossref]
[PubMed]
L. Jiang, T. Huang, C. Chiu, C. Chang, and S. Yang, “Fabrication of plastic microlens arrays using hybrid extrusion rolling embossing with a metallic cylinder mold fabricated using dry film resist,” Opt. Express 15, 12088–12094 (2007).
[Crossref]
[PubMed]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
H. Yang, C.-K. Chao, M.-K. Wei, and C.-P. Lin, “High fill-factor microlens array mold insert fabrication using a thermal reflow process,” J. Micromech. Microeng. 14, 1197–1204 (2004).
[Crossref]
J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205, 61–75 (2002).
[Crossref]
[PubMed]
P. Sandoz and G. Tribillon, “Profilometry by zero-order interference fringe identification,” J. Mod. Opt. 40, 1691–1700 (1993).
[Crossref]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205, 61–75 (2002).
[Crossref]
[PubMed]
M. Born, E. Wolf, and A. Bhatia, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge U. Press, 1999).
[Crossref]
E. Botcherby, R. Juskaitis, M. Booth, and T. Wilson, “An optical technique for remote focusing in microscopy,” Opt. Commun. 281, 880–887 (2008).
[Crossref]
M. A. Robertson, S. Borman, and R. Stevenson, “Dynamic range improvement through multiple exposures,” in Proceedings of the International Conference on Image Processing (IEEE, 1999), pp. 159–163.
M. Born, E. Wolf, and A. Bhatia, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge U. Press, 1999).
[Crossref]
E. Botcherby, R. Juskaitis, M. Booth, and T. Wilson, “An optical technique for remote focusing in microscopy,” Opt. Commun. 281, 880–887 (2008).
[Crossref]
J. Braat, S. V. Haver, A. Janssen, and P. Dirksen, “Assessment of optical systems by means of point-spread functions,” Prog. Optics 51, 349–468 (2008).
[Crossref]
R. W. Cole, T. Jinadasa, and C. M. Brown, “Measuring and interpreting point spread functions to determine confocal microscope resolution and ensure quality control,” Nat. Protoc. 6, 1929–1941 (2011).
[Crossref]
[PubMed]
H. Yang, C.-K. Chao, M.-K. Wei, and C.-P. Lin, “High fill-factor microlens array mold insert fabrication using a thermal reflow process,” J. Micromech. Microeng. 14, 1197–1204 (2004).
[Crossref]
F. Charriere, A. Marian, T. Colomb, P. Marquet, and C. Depeursinge, “Amplitude point-spread function measurement of high-NA microscope objectives by digital holographic microscopy,” Opt. Lett. 32, 2456–2458 (2007).
[Crossref]
[PubMed]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
R. W. Cole, T. Jinadasa, and C. M. Brown, “Measuring and interpreting point spread functions to determine confocal microscope resolution and ensure quality control,” Nat. Protoc. 6, 1929–1941 (2011).
[Crossref]
[PubMed]
F. Charriere, A. Marian, T. Colomb, P. Marquet, and C. Depeursinge, “Amplitude point-spread function measurement of high-NA microscope objectives by digital holographic microscopy,” Opt. Lett. 32, 2456–2458 (2007).
[Crossref]
[PubMed]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
F. Charriere, A. Marian, T. Colomb, P. Marquet, and C. Depeursinge, “Amplitude point-spread function measurement of high-NA microscope objectives by digital holographic microscopy,” Opt. Lett. 32, 2456–2458 (2007).
[Crossref]
[PubMed]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205, 61–75 (2002).
[Crossref]
[PubMed]
J. Braat, S. V. Haver, A. Janssen, and P. Dirksen, “Assessment of optical systems by means of point-spread functions,” Prog. Optics 51, 349–468 (2008).
[Crossref]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
J. Braat, S. V. Haver, A. Janssen, and P. Dirksen, “Assessment of optical systems by means of point-spread functions,” Prog. Optics 51, 349–468 (2008).
[Crossref]
M.-S. Kim, T. Scharf, and H. P. Herzig, “Small-size microlens characterization by multi-wavelength high-resolution interference microscopy,” Opt. Express 18, 14319–14329 (2010).
[Crossref]
[PubMed]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
P. Huang, T. Huang, Y. Sun, and S. Yang, “Fabrication of large area resin microlens arrays using gas-assisted ultraviolet embossing,” Opt. Express 16, 3041–3048 (2008).
[Crossref]
[PubMed]
L. Jiang, T. Huang, C. Chiu, C. Chang, and S. Yang, “Fabrication of plastic microlens arrays using hybrid extrusion rolling embossing with a metallic cylinder mold fabricated using dry film resist,” Opt. Express 15, 12088–12094 (2007).
[Crossref]
[PubMed]
S. Sinzinger and J. Jahns, Microoptics, 2nd ed. (Wiley-VCH, 2003).
[Crossref]
J. Braat, S. V. Haver, A. Janssen, and P. Dirksen, “Assessment of optical systems by means of point-spread functions,” Prog. Optics 51, 349–468 (2008).
[Crossref]
R. W. Cole, T. Jinadasa, and C. M. Brown, “Measuring and interpreting point spread functions to determine confocal microscope resolution and ensure quality control,” Nat. Protoc. 6, 1929–1941 (2011).
[Crossref]
[PubMed]
E. Botcherby, R. Juskaitis, M. Booth, and T. Wilson, “An optical technique for remote focusing in microscopy,” Opt. Commun. 281, 880–887 (2008).
[Crossref]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
R. Leach, Optical Measurement of Surface Topography (Springer, 2011).
[Crossref]
H. Yang, C.-K. Chao, M.-K. Wei, and C.-P. Lin, “High fill-factor microlens array mold insert fabrication using a thermal reflow process,” J. Micromech. Microeng. 14, 1197–1204 (2004).
[Crossref]
D. Malacara, Optical Shop Testing, 3rd ed. (John Wiley and Sons, 2007)
[Crossref]
F. Charriere, A. Marian, T. Colomb, P. Marquet, and C. Depeursinge, “Amplitude point-spread function measurement of high-NA microscope objectives by digital holographic microscopy,” Opt. Lett. 32, 2456–2458 (2007).
[Crossref]
[PubMed]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
T. E. Oliphant, “Python for scientific computing,” Comput. Sci. Eng. 9, 10–20 (2007).
[Crossref]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
M. A. Robertson, S. Borman, and R. Stevenson, “Dynamic range improvement through multiple exposures,” in Proceedings of the International Conference on Image Processing (IEEE, 1999), pp. 159–163.
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
P. Sandoz and G. Tribillon, “Profilometry by zero-order interference fringe identification,” J. Mod. Opt. 40, 1691–1700 (1993).
[Crossref]
J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205, 61–75 (2002).
[Crossref]
[PubMed]
S. Sinzinger and J. Jahns, Microoptics, 2nd ed. (Wiley-VCH, 2003).
[Crossref]
M. A. Robertson, S. Borman, and R. Stevenson, “Dynamic range improvement through multiple exposures,” in Proceedings of the International Conference on Image Processing (IEEE, 1999), pp. 159–163.
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
P. Sandoz and G. Tribillon, “Profilometry by zero-order interference fringe identification,” J. Mod. Opt. 40, 1691–1700 (1993).
[Crossref]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
H. Yang, C.-K. Chao, M.-K. Wei, and C.-P. Lin, “High fill-factor microlens array mold insert fabrication using a thermal reflow process,” J. Micromech. Microeng. 14, 1197–1204 (2004).
[Crossref]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
E. Botcherby, R. Juskaitis, M. Booth, and T. Wilson, “An optical technique for remote focusing in microscopy,” Opt. Commun. 281, 880–887 (2008).
[Crossref]
M. Born, E. Wolf, and A. Bhatia, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge U. Press, 1999).
[Crossref]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
H. Yang, C.-K. Chao, M.-K. Wei, and C.-P. Lin, “High fill-factor microlens array mold insert fabrication using a thermal reflow process,” J. Micromech. Microeng. 14, 1197–1204 (2004).
[Crossref]
P. Huang, T. Huang, Y. Sun, and S. Yang, “Fabrication of large area resin microlens arrays using gas-assisted ultraviolet embossing,” Opt. Express 16, 3041–3048 (2008).
[Crossref]
[PubMed]
L. Jiang, T. Huang, C. Chiu, C. Chang, and S. Yang, “Fabrication of plastic microlens arrays using hybrid extrusion rolling embossing with a metallic cylinder mold fabricated using dry film resist,” Opt. Express 15, 12088–12094 (2007).
[Crossref]
[PubMed]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
N. Bobroff and A. E. Rosenbluth, “Evaluation of highly corrected optics by measurement of the Strehl ratio,” Appl. Opt. 31, 1523–1536 (1992).
[Crossref]
[PubMed]
G. C. Firestone and A. Y. Yi, “Precision compression molding of glass microlenses and microlens arrays–an experimental study,” Appl. Opt. 44, 6115–6122 (2005).
[Crossref]
[PubMed]
F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge, “Characterization of microlenses by digital holographic microscopy,” Appl. Opt. 45, 829–835 (2006).
[Crossref]
[PubMed]
T. E. Oliphant, “Python for scientific computing,” Comput. Sci. Eng. 9, 10–20 (2007).
[Crossref]
J. Albero, S. Bargiel, N. Passilly, P. Dannberg, M. Stumpf, U. D. Zeitner, C. Rousselot, K. Gastinger, and C. Gorecki, “Micromachined array-type Mirau interferometer for parallel inspection of MEMS,” J. Micromech. Microeng. 21, 065005 (2011).
[Crossref]
H. Yang, C.-K. Chao, M.-K. Wei, and C.-P. Lin, “High fill-factor microlens array mold insert fabrication using a thermal reflow process,” J. Micromech. Microeng. 14, 1197–1204 (2004).
[Crossref]
J. L. Beverage, R. V. Shack, and M. R. Descour, “Measurement of the three-dimensional microscope point spread function using a Shack-Hartmann wavefront sensor,” J. Microsc. 205, 61–75 (2002).
[Crossref]
[PubMed]
P. Sandoz and G. Tribillon, “Profilometry by zero-order interference fringe identification,” J. Mod. Opt. 40, 1691–1700 (1993).
[Crossref]
H. Ottevaere, R. Cox, H. P. Herzig, T. Miyashita, K. Naessens, M. Taghizadeh, R. Völkel, H. J. Woo, and H. Thienpont, “Comparing glass and plastic refractive microlenses fabricated with different technologies,” J. Opt. A: Pure Appl. Opt. 8, S407–S429 (2006).
[Crossref]
R. W. Cole, T. Jinadasa, and C. M. Brown, “Measuring and interpreting point spread functions to determine confocal microscope resolution and ensure quality control,” Nat. Protoc. 6, 1929–1941 (2011).
[Crossref]
[PubMed]
E. Botcherby, R. Juskaitis, M. Booth, and T. Wilson, “An optical technique for remote focusing in microscopy,” Opt. Commun. 281, 880–887 (2008).
[Crossref]
L. Jiang, T. Huang, C. Chiu, C. Chang, and S. Yang, “Fabrication of plastic microlens arrays using hybrid extrusion rolling embossing with a metallic cylinder mold fabricated using dry film resist,” Opt. Express 15, 12088–12094 (2007).
[Crossref]
[PubMed]
P. Huang, T. Huang, Y. Sun, and S. Yang, “Fabrication of large area resin microlens arrays using gas-assisted ultraviolet embossing,” Opt. Express 16, 3041–3048 (2008).
[Crossref]
[PubMed]
M.-S. Kim, T. Scharf, and H. P. Herzig, “Small-size microlens characterization by multi-wavelength high-resolution interference microscopy,” Opt. Express 18, 14319–14329 (2010).
[Crossref]
[PubMed]
F. Charriere, A. Marian, T. Colomb, P. Marquet, and C. Depeursinge, “Amplitude point-spread function measurement of high-NA microscope objectives by digital holographic microscopy,” Opt. Lett. 32, 2456–2458 (2007).
[Crossref]
[PubMed]
A. Y. Yi and L. Li, “Design and fabrication of a microlens array by use of a slow tool servo,” Opt. Lett. 30, 1707–1709 (2005).
[Crossref]
[PubMed]
J. Braat, S. V. Haver, A. Janssen, and P. Dirksen, “Assessment of optical systems by means of point-spread functions,” Prog. Optics 51, 349–468 (2008).
[Crossref]
D. Malacara, Optical Shop Testing, 3rd ed. (John Wiley and Sons, 2007)
[Crossref]
R. Leach, Optical Measurement of Surface Topography (Springer, 2011).
[Crossref]
S. Sinzinger and J. Jahns, Microoptics, 2nd ed. (Wiley-VCH, 2003).
[Crossref]
M. A. Robertson, S. Borman, and R. Stevenson, “Dynamic range improvement through multiple exposures,” in Proceedings of the International Conference on Image Processing (IEEE, 1999), pp. 159–163.
M. Born, E. Wolf, and A. Bhatia, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge U. Press, 1999).
[Crossref]