We correct two small errors in our publication [Opt. Express 21, 22441 (2013)].

© 2014 Optical Society of America

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  1. P. H. Wang, Y. Xuan, L. Fan, L. T. Varghese, J. Wang, Y. Liu, X. Xue, D. E. Leaird, M. Qi, A. M. Weiner, “Drop-port study of microresonator frequency combs: power transfer, spectra and time-domain characterization,” Opt. Express 21(19), 22441–22452 (2013).
    [CrossRef] [PubMed]

2013 (1)

Fan, L.

Leaird, D. E.

Liu, Y.

Qi, M.

Varghese, L. T.

Wang, J.

Wang, P. H.

Weiner, A. M.

Xuan, Y.

Xue, X.

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Figures (1)

Fig. 2
Fig. 2

Measured and simulated dispersion of silicon nitride waveguides for 550 nm and 765 nm film thicknesses. The inset shows the TE1 and TE2 mode profiles for 550 nm waveguide thickness. The solid lines show the simulated data while the dots show the measured data. The values in the parentheses in the legend indicate the height of the waveguide.

Equations (1)

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P μ r i n g P i n = 4 κ e 2 ( κ d 2 + κ p 2 + κ e 2 ) 2