Abstract

We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

© 2013 OSA

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    [CrossRef] [PubMed]
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  23. S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
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  24. B. Tian, T. J. Kempa, and C. M. Lieber, “Single nanowire photovoltaics,” Chem. Soc. Rev.38(1), 16–24 (2008).
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  25. Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
    [CrossRef]

2013

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

2012

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

2011

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

2010

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

2009

C. R. Carey, Y. Yu, M. Kuno, and G. V. Hartland, “Ultrafast transient absorption measurements of charge carrier dynamics in single II-VI nanowires,” J. Phys. Chem. C113(44), 19077–19081 (2009).
[CrossRef]

K. Goda, K. K. Tsia, and B. Jalali, “Serial time-encoded amplified imaging for real-time observation of fast dynamic phenomena,” Nature458(7242), 1145–1149 (2009).
[CrossRef] [PubMed]

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

R. P. Prasankumar, P. C. Upadhya, and A. J. Taylor, “Ultrafast carrier dynamics in semiconductor nanowires,” Phys. Status Solidi B246(9), 1973–1995 (2009).
[CrossRef]

2008

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

B. Tian, T. J. Kempa, and C. M. Lieber, “Single nanowire photovoltaics,” Chem. Soc. Rev.38(1), 16–24 (2008).
[CrossRef] [PubMed]

L. Gundlach and P. Piotrowiak, “Femtosecond Kerr-gated wide-field fluorescence microscopy,” Opt. Lett.33(9), 992–994 (2008).
[CrossRef] [PubMed]

2007

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

2004

V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, “Femtosecond time-resolved interferometric microscopy,” Appl. Phys., A Mater. Sci. Process.78(4), 483–489 (2004).
[CrossRef]

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

P. Cherukuri, S. M. Bachilo, S. H. Litovsky, and R. B. Weisman, “Near-infrared fluorescence microscopy of single-walled carbon nanotubes in phagocytic cells,” J. Am. Chem. Soc.126(48), 15638–15639 (2004).
[CrossRef] [PubMed]

2003

2002

A. Othonos and C. Christofides, “Spatial dependence of ultrafast carrier recombination centers of phosphorus-implanted and annealed silicon wafers,” Appl. Phys. Lett.81(5), 856 (2002).
[CrossRef]

R. D. Averitt and A. J. Taylor, “Ultrafast optical and far-infrared quasiparticle dynamics in correlated electron materials,” J. Phys. Condens. Matter14(50), R1357–R1390 (2002).
[CrossRef]

2001

S. Bourquin, P. Seitz, and R. P. Salathé, “Two-dimensional smart detector array for interferometric applications,” Electron. Lett.37(15), 975–976 (2001).
[CrossRef]

1985

Averitt, R. D.

R. D. Averitt and A. J. Taylor, “Ultrafast optical and far-infrared quasiparticle dynamics in correlated electron materials,” J. Phys. Condens. Matter14(50), R1357–R1390 (2002).
[CrossRef]

Bachilo, S. M.

P. Cherukuri, S. M. Bachilo, S. H. Litovsky, and R. B. Weisman, “Near-infrared fluorescence microscopy of single-walled carbon nanotubes in phagocytic cells,” J. Am. Chem. Soc.126(48), 15638–15639 (2004).
[CrossRef] [PubMed]

Beaune, G.

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

Bjork, M. T.

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

Böhmler, M.

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

Boss, D.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Bourquin, S.

Brueck, S. R. J.

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

Cabuil, V.

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

Carey, C. R.

C. R. Carey, Y. Yu, M. Kuno, and G. V. Hartland, “Ultrafast transient absorption measurements of charge carrier dynamics in single II-VI nanowires,” J. Phys. Chem. C113(44), 19077–19081 (2009).
[CrossRef]

Cherukuri, P.

P. Cherukuri, S. M. Bachilo, S. H. Litovsky, and R. B. Weisman, “Near-infrared fluorescence microscopy of single-walled carbon nanotubes in phagocytic cells,” J. Am. Chem. Soc.126(48), 15638–15639 (2004).
[CrossRef] [PubMed]

Christofides, C.

A. Othonos and C. Christofides, “Spatial dependence of ultrafast carrier recombination centers of phosphorus-implanted and annealed silicon wafers,” Appl. Phys. Lett.81(5), 856 (2002).
[CrossRef]

Chu, L.-Q.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Clément, O.

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

Cotte, Y.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Dani, K. M.

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

Dayeh, S. A.

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

Depeursinge, C.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Downer, M. C.

Dubertret, B.

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

Feenstra, R. M.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Fork, R. L.

Fujii, Y.

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

Fujimoto, J. G.

Goda, K.

K. Goda, K. K. Tsia, and B. Jalali, “Serial time-encoded amplified imaging for real-time observation of fast dynamic phenomena,” Nature458(7242), 1145–1149 (2009).
[CrossRef] [PubMed]

Gundlach, L.

Hartland, G. V.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

C. R. Carey, Y. Yu, M. Kuno, and G. V. Hartland, “Ultrafast transient absorption measurements of charge carrier dynamics in single II-VI nanowires,” J. Phys. Chem. C113(44), 19077–19081 (2009).
[CrossRef]

Hartschuh, A.

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

Hase, M.

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

Horiuchi, K.

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

Huang, L.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Jalali, B.

K. Goda, K. K. Tsia, and B. Jalali, “Serial time-encoded amplified imaging for real-time observation of fast dynamic phenomena,” Nature458(7242), 1145–1149 (2009).
[CrossRef] [PubMed]

Jourdain, P.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Kannari, F.

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

Kärtner, F. X.

Kempa, T. J.

B. Tian, T. J. Kempa, and C. M. Lieber, “Single nanowire photovoltaics,” Chem. Soc. Rev.38(1), 16–24 (2008).
[CrossRef] [PubMed]

Kitajima, M.

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

Knoch, J.

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

Ku, Z.

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

Kuno, M.

C. R. Carey, Y. Yu, M. Kuno, and G. V. Hartland, “Ultrafast transient absorption measurements of charge carrier dynamics in single II-VI nanowires,” J. Phys. Chem. C113(44), 19077–19081 (2009).
[CrossRef]

Lasser, T.

Lian, C.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Lieber, C. M.

B. Tian, T. J. Kempa, and C. M. Lieber, “Single nanowire photovoltaics,” Chem. Soc. Rev.38(1), 16–24 (2008).
[CrossRef] [PubMed]

Litovsky, S. H.

P. Cherukuri, S. M. Bachilo, S. H. Litovsky, and R. B. Weisman, “Near-infrared fluorescence microscopy of single-walled carbon nanotubes in phagocytic cells,” J. Am. Chem. Soc.126(48), 15638–15639 (2004).
[CrossRef] [PubMed]

Luxmi, R. M.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Magistretti, P.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Marquet, P.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Martinez, J.

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

Ménager, C.

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

Mews, A.

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

Myalitsin, A.

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

Othonos, A.

A. Othonos and C. Christofides, “Spatial dependence of ultrafast carrier recombination centers of phosphorus-implanted and annealed silicon wafers,” Appl. Phys. Lett.81(5), 856 (2002).
[CrossRef]

Pavillon, N.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Picraux, S. T.

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

Piotrowiak, P.

Prasankumar, R. P.

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

R. P. Prasankumar, P. C. Upadhya, and A. J. Taylor, “Ultrafast carrier dynamics in semiconductor nanowires,” Phys. Status Solidi B246(9), 1973–1995 (2009).
[CrossRef]

S. Bourquin, R. P. Prasankumar, F. X. Kärtner, J. G. Fujimoto, T. Lasser, and R. P. Salathé, “High-speed femtosecond pump-probe spectroscopy with a smart pixel detector array,” Opt. Lett.28(17), 1588–1590 (2003).
[CrossRef] [PubMed]

Riel, H.

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

Riess, W.

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

Salathé, R. P.

Schmid, H.

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

Seitz, P.

S. Bourquin, P. Seitz, and R. P. Salathé, “Two-dimensional smart detector array for interferometric applications,” Electron. Lett.37(15), 975–976 (2001).
[CrossRef]

Seo, M. A.

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

Shank, C. V.

Soci, C.

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

Sokolowski-Tinten, K.

V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, “Femtosecond time-resolved interferometric microscopy,” Appl. Phys., A Mater. Sci. Process.78(4), 483–489 (2004).
[CrossRef]

Swartzentruber, B. S.

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

Tahy, K.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Taylor, A. J.

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

R. P. Prasankumar, P. C. Upadhya, and A. J. Taylor, “Ultrafast carrier dynamics in semiconductor nanowires,” Phys. Status Solidi B246(9), 1973–1995 (2009).
[CrossRef]

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

R. D. Averitt and A. J. Taylor, “Ultrafast optical and far-infrared quasiparticle dynamics in correlated electron materials,” J. Phys. Condens. Matter14(50), R1357–R1390 (2002).
[CrossRef]

Temnov, V. V.

V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, “Femtosecond time-resolved interferometric microscopy,” Appl. Phys., A Mater. Sci. Process.78(4), 483–489 (2004).
[CrossRef]

Tian, B.

B. Tian, T. J. Kempa, and C. M. Lieber, “Single nanowire photovoltaics,” Chem. Soc. Rev.38(1), 16–24 (2008).
[CrossRef] [PubMed]

Toy, F.

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Tsia, K. K.

K. Goda, K. K. Tsia, and B. Jalali, “Serial time-encoded amplified imaging for real-time observation of fast dynamic phenomena,” Nature458(7242), 1145–1149 (2009).
[CrossRef] [PubMed]

Upadhya, P. C.

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

R. P. Prasankumar, P. C. Upadhya, and A. J. Taylor, “Ultrafast carrier dynamics in semiconductor nanowires,” Phys. Status Solidi B246(9), 1973–1995 (2009).
[CrossRef]

Vayssettes, C.

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

von der Linde, D.

V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, “Femtosecond time-resolved interferometric microscopy,” Appl. Phys., A Mater. Sci. Process.78(4), 483–489 (2004).
[CrossRef]

Wang, D.

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

Wang, Z.

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

Weisman, R. B.

P. Cherukuri, S. M. Bachilo, S. H. Litovsky, and R. B. Weisman, “Near-infrared fluorescence microscopy of single-walled carbon nanotubes in phagocytic cells,” J. Am. Chem. Soc.126(48), 15638–15639 (2004).
[CrossRef] [PubMed]

Xing, H.

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

Yoo, J.

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

Yu, E. T.

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

Yu, P. K. L.

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

Yu, Y.

C. R. Carey, Y. Yu, M. Kuno, and G. V. Hartland, “Ultrafast transient absorption measurements of charge carrier dynamics in single II-VI nanowires,” J. Phys. Chem. C113(44), 19077–19081 (2009).
[CrossRef]

Zhou, P.

V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, “Femtosecond time-resolved interferometric microscopy,” Appl. Phys., A Mater. Sci. Process.78(4), 483–489 (2004).
[CrossRef]

Angew. Chem. Int. Ed. Engl.

M. Böhmler, Z. Wang, A. Myalitsin, A. Mews, and A. Hartschuh, “Optical imaging of CdSe nanowires with nanoscale resolution,” Angew. Chem. Int. Ed. Engl.50(48), 11536–11538 (2011).
[CrossRef] [PubMed]

G. Beaune, B. Dubertret, O. Clément, C. Vayssettes, V. Cabuil, and C. Ménager, “Giant vesicles containing magnetic nanoparticles and quantum dots: feasibility and tracking by fiber confocal fluorescence microscopy,” Angew. Chem. Int. Ed. Engl.119(28), 5517–5520 (2007).
[CrossRef] [PubMed]

Appl. Phys. Lett.

M. A. Seo, S. A. Dayeh, P. C. Upadhya, J. Martinez, B. S. Swartzentruber, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Understanding ultrafast carrier dynamics in single quasi-one-dimensional Si nanowires,” Appl. Phys. Lett.100(7), 071104 (2012).
[CrossRef]

A. Othonos and C. Christofides, “Spatial dependence of ultrafast carrier recombination centers of phosphorus-implanted and annealed silicon wafers,” Appl. Phys. Lett.81(5), 856 (2002).
[CrossRef]

M. T. Bjork, J. Knoch, H. Schmid, H. Riel, and W. Riess, “Silicon nanowire tunneling field-effect transistors,” Appl. Phys. Lett.92(19), 193504 (2008).
[CrossRef]

S. A. Dayeh, C. Soci, P. K. L. Yu, E. T. Yu, and D. Wang, “Influence of surface states on the extraction of transport parameters from InAs nanowire field effect transistors,” Appl. Phys. Lett.90(16), 162112 (2007).
[CrossRef]

Appl. Phys., A Mater. Sci. Process.

V. V. Temnov, K. Sokolowski-Tinten, P. Zhou, and D. von der Linde, “Femtosecond time-resolved interferometric microscopy,” Appl. Phys., A Mater. Sci. Process.78(4), 483–489 (2004).
[CrossRef]

Chem. Soc. Rev.

B. Tian, T. J. Kempa, and C. M. Lieber, “Single nanowire photovoltaics,” Chem. Soc. Rev.38(1), 16–24 (2008).
[CrossRef] [PubMed]

Electron. Lett.

S. Bourquin, P. Seitz, and R. P. Salathé, “Two-dimensional smart detector array for interferometric applications,” Electron. Lett.37(15), 975–976 (2001).
[CrossRef]

J. Am. Chem. Soc.

P. Cherukuri, S. M. Bachilo, S. H. Litovsky, and R. B. Weisman, “Near-infrared fluorescence microscopy of single-walled carbon nanotubes in phagocytic cells,” J. Am. Chem. Soc.126(48), 15638–15639 (2004).
[CrossRef] [PubMed]

J. Opt. Soc. Am. B

J. Phys. Chem. C

C. R. Carey, Y. Yu, M. Kuno, and G. V. Hartland, “Ultrafast transient absorption measurements of charge carrier dynamics in single II-VI nanowires,” J. Phys. Chem. C113(44), 19077–19081 (2009).
[CrossRef]

J. Phys. Condens. Matter

R. D. Averitt and A. J. Taylor, “Ultrafast optical and far-infrared quasiparticle dynamics in correlated electron materials,” J. Phys. Condens. Matter14(50), R1357–R1390 (2002).
[CrossRef]

Jpn. J. Appl. Phys.

Y. Fujii, K. Horiuchi, F. Kannari, M. Hase, and M. Kitajima, “Optical imaging of defect density distribution in ion-implanted GaAs using ultrafast carrier dynamics,” Jpn. J. Appl. Phys.43(1), 184–185 (2004).
[CrossRef]

Nano Lett.

M. A. Seo, J. Yoo, S. A. Dayeh, S. T. Picraux, A. J. Taylor, and R. P. Prasankumar, “Mapping carrier diffusion in single silicon core-shell nanowires with ultrafast optical microscopy,” Nano Lett.12(12), 6334–6338 (2012).
[CrossRef] [PubMed]

L. Huang, G. V. Hartland, L.-Q. Chu, R. M. Luxmi, R. M. Feenstra, C. Lian, K. Tahy, and H. Xing, “Ultrafast transient absorption microscopy studies of carrier dynamics in epitaxial graphene,” Nano Lett.10(4), 1308–1313 (2010).
[CrossRef] [PubMed]

K. M. Dani, Z. Ku, P. C. Upadhya, R. P. Prasankumar, S. R. J. Brueck, and A. J. Taylor, “Subpicosecond optical switching with a negative index metamaterial,” Nano Lett.9(10), 3565–3569 (2009).
[CrossRef] [PubMed]

Nat. Photonics

Y. Cotte, F. Toy, P. Jourdain, N. Pavillon, D. Boss, P. Magistretti, P. Marquet, and C. Depeursinge, “Marker-free phase nanoscopy,” Nat. Photonics7(2), 113–117 (2013).
[CrossRef]

Nature

K. Goda, K. K. Tsia, and B. Jalali, “Serial time-encoded amplified imaging for real-time observation of fast dynamic phenomena,” Nature458(7242), 1145–1149 (2009).
[CrossRef] [PubMed]

Opt. Lett.

Phys. Status Solidi B

R. P. Prasankumar, P. C. Upadhya, and A. J. Taylor, “Ultrafast carrier dynamics in semiconductor nanowires,” Phys. Status Solidi B246(9), 1973–1995 (2009).
[CrossRef]

Other

D. J. Hilton, “Ultrafast pump-probe spectroscopy,” in Optical Techniques for Solid-State Materials Characterization, R. P. Prasankumar and A. J. Taylor, eds. (CRC Press, 2011).

S. Inoue and K. R. Spring, Video Microscopy: the Fundamentals (Plenum Press, 1997).

A. Neumann, Y. Kuznetsova, and S. R. J. Brueck, “Microscopy,” in Optical Techniques for Solid-State Materials Characterization, eds. R. P. Prasankumar and A. J. Taylor, (CRC Press, 2011).

Supplementary Material (1)

» Media 1: MP4 (147 KB)     

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Figures (5)

Fig. 1
Fig. 1

Schematic of a generic UOWFM setup.

Fig. 2
Fig. 2

(a) Schematic showing the UOWFM setup for studying the Au patterned amorphous Si film. (b) An SEM image of the mask used to pattern our samples. (c) A conventional optical microscope image of the enlarged central region of the sample. (d) Wide field optical image taken using the 2D array detector by chopping the 550 nm probe beam. The probe spot (~30 μm) is smaller than the area imaged (~50 μm), leading to the observed intensity variation across the image.

Fig. 3
Fig. 3

(a) The photoinduced change in transmission measured on the Au patterned amorphous Si film with a conventional single pixel detector. UOWFM images are shown at pump-probe time delays of (b) −1 ps, (c) 0 ps, (d) 5 ps, and (e) 150 ps, respectively. (f) A movie (Media 1) of UOWFM, taken at different time delays on the Au patterned amorphous Si film, is shown (148 KB).

Fig. 4
Fig. 4

(a) Schematic showing the UOWFM setup for studying single SiNWs. (b) A conventional optical microscope image of the single SiNW used in this experiment. (c) Time-resolved photoinduced change in transmission for a Si/SiO2 NW obtained with a conventional single pixel detector.

Fig. 5
Fig. 5

Images taken in our UOWFM system while modulating the 840 nm probe beam are shown in (a) image of the sapphire substrate and a single Si NW, (b) image of the sapphire substrate without NWs, and (c) image of the single Si core-shell NW extracted by subtracting (a) from (b). (d) The optical resolution is obtained by taking the cross section of the NW from the image in (c) (inset). UOWFM images at different time delays of (d) 0 ps, (e) 100 ps, and (f) 400 ps. The red dashed lines represent the NW region.

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