B. S. Chun, K. Kim, and D. Gweon, “Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope,” Rev. Sci. Instrum. 80(7), 073706 (2009).
[Crossref]
[PubMed]
J. Liu, J. Tan, H. Bin, and Y. Wang, “Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility,” Appl. Opt. 48(32), 6195–6201 (2009).
[Crossref]
[PubMed]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
K. B. Shi, P. Li, S. Z. Yin, and Z. W. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express 12(10), 2096–2101 (2004).
[Crossref]
[PubMed]
W. Zhao, J. Tan, and L. Qiu, “Bipolar absolute differential confocal approach to higher spatial resolution,” Opt. Express 12(21), 5013–5021 (2004).
[Crossref]
[PubMed]
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
F. Chen, G. M. Brown, and M. M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39(1), 10–22 (2000).
[Crossref]
S. D. Cha, P. C. Lin, L. J. Zhu, P. C. Sun, and Y. Fainman, “Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning,” Appl. Opt. 39(16), 2605–2613 (2000).
[Crossref]
[PubMed]
M. F. M. Costa, “Surface inspection by an optical triangulation method,” Opt. Eng. 35(9), 2743–2747 (1996).
[Crossref]
M. A. Browne, O. Akinyemi, and A. Boyde, “Confocal surface profiling utilizing chromatic aberration,” Scanning 14(3), 145–153 (1992).
[Crossref]
G. Molesini, G. Pedrini, P. Poggi, and F. Quercioli, “Focus-wavelength encoded optical profilometer,” Opt. Commun. 49(4), 229–233 (1984).
[Crossref]
D. K. Hamilton and T. Wilson, “3-dimensional surface measurement using the confocal scanning microscope,” Appl. Phys. B 27(4), 211–213 (1982).
[Crossref]
M. A. Browne, O. Akinyemi, and A. Boyde, “Confocal surface profiling utilizing chromatic aberration,” Scanning 14(3), 145–153 (1992).
[Crossref]
M. Maly and A. Boyde, “Real-time stereoscopic confocal reflection microscopy using objective lenses with linear longitudinal chromatic dispersion,” Scanning 16, 187–192 (1994).
M. A. Browne, O. Akinyemi, and A. Boyde, “Confocal surface profiling utilizing chromatic aberration,” Scanning 14(3), 145–153 (1992).
[Crossref]
F. Chen, G. M. Brown, and M. M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39(1), 10–22 (2000).
[Crossref]
M. A. Browne, O. Akinyemi, and A. Boyde, “Confocal surface profiling utilizing chromatic aberration,” Scanning 14(3), 145–153 (1992).
[Crossref]
F. Chen, G. M. Brown, and M. M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39(1), 10–22 (2000).
[Crossref]
B. S. Chun, K. Kim, and D. Gweon, “Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope,” Rev. Sci. Instrum. 80(7), 073706 (2009).
[Crossref]
[PubMed]
M. F. M. Costa, “Surface inspection by an optical triangulation method,” Opt. Eng. 35(9), 2743–2747 (1996).
[Crossref]
S. D. Cha, P. C. Lin, L. J. Zhu, P. C. Sun, and Y. Fainman, “Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning,” Appl. Opt. 39(16), 2605–2613 (2000).
[Crossref]
[PubMed]
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[Crossref]
[PubMed]
S. L. Dobson, P. C. Sun, and Y. Fainman, “Diffractive lenses for chromatic confocal imaging,” Appl. Opt. 36(20), 4744–4748 (1997).
[Crossref]
[PubMed]
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
B. S. Chun, K. Kim, and D. Gweon, “Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope,” Rev. Sci. Instrum. 80(7), 073706 (2009).
[Crossref]
[PubMed]
D. K. Hamilton and T. Wilson, “3-dimensional surface measurement using the confocal scanning microscope,” Appl. Phys. B 27(4), 211–213 (1982).
[Crossref]
H. Leeghim, M. Ahn, and K. Kim, “Novel approach to optical profiler with gradient focal point methods,” Opt. Express 20(21), 23061–23073 (2012).
[Crossref]
[PubMed]
B. S. Chun, K. Kim, and D. Gweon, “Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope,” Rev. Sci. Instrum. 80(7), 073706 (2009).
[Crossref]
[PubMed]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
K. B. Shi, P. Li, S. Z. Yin, and Z. W. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express 12(10), 2096–2101 (2004).
[Crossref]
[PubMed]
S. D. Cha, P. C. Lin, L. J. Zhu, P. C. Sun, and Y. Fainman, “Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning,” Appl. Opt. 39(16), 2605–2613 (2000).
[Crossref]
[PubMed]
P. C. Lin, P. C. Sun, L. J. Zhu, and Y. Fainman, “Single-shot depth-section imaging through chromatic slit-scan confocal microscopy,” Appl. Opt. 37(28), 6764–6770 (1998).
[Crossref]
[PubMed]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
K. B. Shi, P. Li, S. Z. Yin, and Z. W. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express 12(10), 2096–2101 (2004).
[Crossref]
[PubMed]
M. Maly and A. Boyde, “Real-time stereoscopic confocal reflection microscopy using objective lenses with linear longitudinal chromatic dispersion,” Scanning 16, 187–192 (1994).
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
G. Molesini, G. Pedrini, P. Poggi, and F. Quercioli, “Focus-wavelength encoded optical profilometer,” Opt. Commun. 49(4), 229–233 (1984).
[Crossref]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
G. Molesini, G. Pedrini, P. Poggi, and F. Quercioli, “Focus-wavelength encoded optical profilometer,” Opt. Commun. 49(4), 229–233 (1984).
[Crossref]
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
G. Molesini, G. Pedrini, P. Poggi, and F. Quercioli, “Focus-wavelength encoded optical profilometer,” Opt. Commun. 49(4), 229–233 (1984).
[Crossref]
G. Molesini, G. Pedrini, P. Poggi, and F. Quercioli, “Focus-wavelength encoded optical profilometer,” Opt. Commun. 49(4), 229–233 (1984).
[Crossref]
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
K. B. Shi, P. Li, S. Z. Yin, and Z. W. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express 12(10), 2096–2101 (2004).
[Crossref]
[PubMed]
F. Chen, G. M. Brown, and M. M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39(1), 10–22 (2000).
[Crossref]
S. D. Cha, P. C. Lin, L. J. Zhu, P. C. Sun, and Y. Fainman, “Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning,” Appl. Opt. 39(16), 2605–2613 (2000).
[Crossref]
[PubMed]
P. C. Lin, P. C. Sun, L. J. Zhu, and Y. Fainman, “Single-shot depth-section imaging through chromatic slit-scan confocal microscopy,” Appl. Opt. 37(28), 6764–6770 (1998).
[Crossref]
[PubMed]
S. L. Dobson, P. C. Sun, and Y. Fainman, “Diffractive lenses for chromatic confocal imaging,” Appl. Opt. 36(20), 4744–4748 (1997).
[Crossref]
[PubMed]
J. Liu, J. Tan, H. Bin, and Y. Wang, “Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility,” Appl. Opt. 48(32), 6195–6201 (2009).
[Crossref]
[PubMed]
W. Zhao, J. Tan, and L. Qiu, “Bipolar absolute differential confocal approach to higher spatial resolution,” Opt. Express 12(21), 5013–5021 (2004).
[Crossref]
[PubMed]
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
D. K. Hamilton and T. Wilson, “3-dimensional surface measurement using the confocal scanning microscope,” Appl. Phys. B 27(4), 211–213 (1982).
[Crossref]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
K. B. Shi, P. Li, S. Z. Yin, and Z. W. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express 12(10), 2096–2101 (2004).
[Crossref]
[PubMed]
S. D. Cha, P. C. Lin, L. J. Zhu, P. C. Sun, and Y. Fainman, “Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning,” Appl. Opt. 39(16), 2605–2613 (2000).
[Crossref]
[PubMed]
P. C. Lin, P. C. Sun, L. J. Zhu, and Y. Fainman, “Single-shot depth-section imaging through chromatic slit-scan confocal microscopy,” Appl. Opt. 37(28), 6764–6770 (1998).
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[Crossref]
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S. L. Dobson, P. C. Sun, and Y. Fainman, “Diffractive lenses for chromatic confocal imaging,” Appl. Opt. 36(20), 4744–4748 (1997).
[Crossref]
[PubMed]
P. C. Lin, P. C. Sun, L. J. Zhu, and Y. Fainman, “Single-shot depth-section imaging through chromatic slit-scan confocal microscopy,” Appl. Opt. 37(28), 6764–6770 (1998).
[Crossref]
[PubMed]
S. D. Cha, P. C. Lin, L. J. Zhu, P. C. Sun, and Y. Fainman, “Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning,” Appl. Opt. 39(16), 2605–2613 (2000).
[Crossref]
[PubMed]
J. Liu, J. Tan, H. Bin, and Y. Wang, “Improved differential confocal microscopy with ultrahigh signal-to-noise ratio and reflectance disturbance resistibility,” Appl. Opt. 48(32), 6195–6201 (2009).
[Crossref]
[PubMed]
D. K. Hamilton and T. Wilson, “3-dimensional surface measurement using the confocal scanning microscope,” Appl. Phys. B 27(4), 211–213 (1982).
[Crossref]
J. G. R, J. Meneses, G. Tribillon, T. Gharbi, and A. Plata, “Chromatic confocal microscopy by means of continuum light generated through a standard single-mode fibre,” J. Opt. A, Pure Appl. Opt. 6(6), 544–548 (2004).
[Crossref]
G. Molesini, G. Pedrini, P. Poggi, and F. Quercioli, “Focus-wavelength encoded optical profilometer,” Opt. Commun. 49(4), 229–233 (1984).
[Crossref]
K. B. Shi, S. H. Nam, P. Li, S. Z. Yin, and Z. W. Liu, “Wavelength division multiplexed confocal microscopy using supercontinuum,” Opt. Commun. 263(2), 156–162 (2006).
[Crossref]
F. Chen, G. M. Brown, and M. M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39(1), 10–22 (2000).
[Crossref]
M. F. M. Costa, “Surface inspection by an optical triangulation method,” Opt. Eng. 35(9), 2743–2747 (1996).
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H. Leeghim, M. Ahn, and K. Kim, “Novel approach to optical profiler with gradient focal point methods,” Opt. Express 20(21), 23061–23073 (2012).
[Crossref]
[PubMed]
K. B. Shi, P. Li, S. Z. Yin, and Z. W. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express 12(10), 2096–2101 (2004).
[Crossref]
[PubMed]
W. Zhao, J. Tan, and L. Qiu, “Bipolar absolute differential confocal approach to higher spatial resolution,” Opt. Express 12(21), 5013–5021 (2004).
[Crossref]
[PubMed]
B. S. Chun, K. Kim, and D. Gweon, “Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope,” Rev. Sci. Instrum. 80(7), 073706 (2009).
[Crossref]
[PubMed]
M. A. Browne, O. Akinyemi, and A. Boyde, “Confocal surface profiling utilizing chromatic aberration,” Scanning 14(3), 145–153 (1992).
[Crossref]
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