R. S. Moirangthem, Y. C. Chang, and P.-K. Wei, “Investigation of surface plasmon biosensing using gold nanoparticles enhanced ellipsometry,” Opt. Lett. 36(5), 775–777 (2011).
[Crossref]
[PubMed]
R. S. Moirangthem, Y. C. Chang, and P. K. Wei, “Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application,” Biomed. Opt. Express 2(9), 2569–2576 (2011).
[Crossref]
[PubMed]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
Y. C. Chang, S. H. Hsu, P. K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5(5), 1194–1197 (2008).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
B. Kaplan, T. Novikova, A. De Martino, and B. Drévillon, “Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetry,” Appl. Opt. 43(6), 1233–1240 (2004).
[Crossref]
[PubMed]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
R. Lazzari and I. Simonsen, “GRANFILM: a software for calculating thin-layer dielectric properties and Fresnel coefficients,” Thin Solid Films 419(1-2), 124–136 (2002).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
H. Xu, J. Aizpurua, M. Käll, and P. Apell, “Electromagnetic contributions to single-molecule sensitivity in surface-enhanced Raman scattering,” Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics 62(33 Pt B), 4318–4324 (2000).
[Crossref]
[PubMed]
A. M. Michaels, J. Jiang, and L. Brus, “Ag nanocrystal junctions as the site for surface-enhanced Raman scattering of single rhodamine 6G molecules,” J. Phys. Chem. B 104(50), 11965–11971 (2000).
[Crossref]
I. Simonsen, R. Lazzari, J. Jupille, and S. Roux, “Numerical modeling ot the optical response of supported metallic particles,” Phys. Rev. B 61(11), 7722–7733 (2000).
[Crossref]
J. T. Krug, G. D. Wang, S. R. Emory, and S. Nie, “Efficient Raman enhancement and intermittent light emission observed in single gold nanocrystals,” J. Am. Chem. Soc. 121(39), 9208–9214 (1999).
[Crossref]
S. M. Nie and S. R. Emory, “Probing single molecules and single nanoparticles by surface-enhanced Raman scattering,” Science 275(5303), 1102–1106 (1997).
[Crossref]
[PubMed]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation Damping in Surface-Enhanced Raman Scattering,” Phys. Rev. Lett. 48(14), 957–960 (1982).
[Crossref]
G. Mie, “Beiträge zur optik trüber medien, speziell kolloidaler metallösungen,” Ann. Phys. 330(3), 377–445 (1908).
[Crossref]
H. Xu, J. Aizpurua, M. Käll, and P. Apell, “Electromagnetic contributions to single-molecule sensitivity in surface-enhanced Raman scattering,” Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics 62(33 Pt B), 4318–4324 (2000).
[Crossref]
[PubMed]
H. Xu, J. Aizpurua, M. Käll, and P. Apell, “Electromagnetic contributions to single-molecule sensitivity in surface-enhanced Raman scattering,” Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics 62(33 Pt B), 4318–4324 (2000).
[Crossref]
[PubMed]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
A. M. Michaels, J. Jiang, and L. Brus, “Ag nanocrystal junctions as the site for surface-enhanced Raman scattering of single rhodamine 6G molecules,” J. Phys. Chem. B 104(50), 11965–11971 (2000).
[Crossref]
R. S. Moirangthem, Y. C. Chang, and P.-K. Wei, “Investigation of surface plasmon biosensing using gold nanoparticles enhanced ellipsometry,” Opt. Lett. 36(5), 775–777 (2011).
[Crossref]
[PubMed]
R. S. Moirangthem, Y. C. Chang, and P. K. Wei, “Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application,” Biomed. Opt. Express 2(9), 2569–2576 (2011).
[Crossref]
[PubMed]
S. H. Hsu, Y. C. Chang, Y. C. Chen, P. K. Wei, and Y. D. Kim, “Optical metrology of randomly-distributed Au colloids on a multilayer film,” Opt. Express 18(2), 1310–1315 (2010).
[Crossref]
[PubMed]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
Y. C. Chang, S. H. Hsu, P. K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5(5), 1194–1197 (2008).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
Y. C. Chang, G. Li, H. Chu, and J. Opsal, “Efficient finite-element, Green’s function approach for critical-dimension metrology of three-dimensional gratings on multilayer films,” J. Opt. Soc. Am. A 23(3), 638–645 (2006).
[Crossref]
[PubMed]
J. T. Krug, G. D. Wang, S. R. Emory, and S. Nie, “Efficient Raman enhancement and intermittent light emission observed in single gold nanocrystals,” J. Am. Chem. Soc. 121(39), 9208–9214 (1999).
[Crossref]
S. M. Nie and S. R. Emory, “Probing single molecules and single nanoparticles by surface-enhanced Raman scattering,” Science 275(5303), 1102–1106 (1997).
[Crossref]
[PubMed]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation Damping in Surface-Enhanced Raman Scattering,” Phys. Rev. Lett. 48(14), 957–960 (1982).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
S. H. Hsu, Y. C. Chang, Y. C. Chen, P. K. Wei, and Y. D. Kim, “Optical metrology of randomly-distributed Au colloids on a multilayer film,” Opt. Express 18(2), 1310–1315 (2010).
[Crossref]
[PubMed]
Y. C. Chang, S. H. Hsu, P. K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5(5), 1194–1197 (2008).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
A. M. Michaels, J. Jiang, and L. Brus, “Ag nanocrystal junctions as the site for surface-enhanced Raman scattering of single rhodamine 6G molecules,” J. Phys. Chem. B 104(50), 11965–11971 (2000).
[Crossref]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
I. Simonsen, R. Lazzari, J. Jupille, and S. Roux, “Numerical modeling ot the optical response of supported metallic particles,” Phys. Rev. B 61(11), 7722–7733 (2000).
[Crossref]
H. Xu, J. Aizpurua, M. Käll, and P. Apell, “Electromagnetic contributions to single-molecule sensitivity in surface-enhanced Raman scattering,” Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics 62(33 Pt B), 4318–4324 (2000).
[Crossref]
[PubMed]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
S. H. Hsu, Y. C. Chang, Y. C. Chen, P. K. Wei, and Y. D. Kim, “Optical metrology of randomly-distributed Au colloids on a multilayer film,” Opt. Express 18(2), 1310–1315 (2010).
[Crossref]
[PubMed]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
Y. C. Chang, S. H. Hsu, P. K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5(5), 1194–1197 (2008).
[Crossref]
J. T. Krug, G. D. Wang, S. R. Emory, and S. Nie, “Efficient Raman enhancement and intermittent light emission observed in single gold nanocrystals,” J. Am. Chem. Soc. 121(39), 9208–9214 (1999).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
R. Lazzari and I. Simonsen, “GRANFILM: a software for calculating thin-layer dielectric properties and Fresnel coefficients,” Thin Solid Films 419(1-2), 124–136 (2002).
[Crossref]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
I. Simonsen, R. Lazzari, J. Jupille, and S. Roux, “Numerical modeling ot the optical response of supported metallic particles,” Phys. Rev. B 61(11), 7722–7733 (2000).
[Crossref]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation Damping in Surface-Enhanced Raman Scattering,” Phys. Rev. Lett. 48(14), 957–960 (1982).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
A. M. Michaels, J. Jiang, and L. Brus, “Ag nanocrystal junctions as the site for surface-enhanced Raman scattering of single rhodamine 6G molecules,” J. Phys. Chem. B 104(50), 11965–11971 (2000).
[Crossref]
G. Mie, “Beiträge zur optik trüber medien, speziell kolloidaler metallösungen,” Ann. Phys. 330(3), 377–445 (1908).
[Crossref]
R. S. Moirangthem, Y. C. Chang, and P.-K. Wei, “Investigation of surface plasmon biosensing using gold nanoparticles enhanced ellipsometry,” Opt. Lett. 36(5), 775–777 (2011).
[Crossref]
[PubMed]
R. S. Moirangthem, Y. C. Chang, and P. K. Wei, “Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application,” Biomed. Opt. Express 2(9), 2569–2576 (2011).
[Crossref]
[PubMed]
J. T. Krug, G. D. Wang, S. R. Emory, and S. Nie, “Efficient Raman enhancement and intermittent light emission observed in single gold nanocrystals,” J. Am. Chem. Soc. 121(39), 9208–9214 (1999).
[Crossref]
S. M. Nie and S. R. Emory, “Probing single molecules and single nanoparticles by surface-enhanced Raman scattering,” Science 275(5303), 1102–1106 (1997).
[Crossref]
[PubMed]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
I. Simonsen, R. Lazzari, J. Jupille, and S. Roux, “Numerical modeling ot the optical response of supported metallic particles,” Phys. Rev. B 61(11), 7722–7733 (2000).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
R. Lazzari and I. Simonsen, “GRANFILM: a software for calculating thin-layer dielectric properties and Fresnel coefficients,” Thin Solid Films 419(1-2), 124–136 (2002).
[Crossref]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
I. Simonsen, R. Lazzari, J. Jupille, and S. Roux, “Numerical modeling ot the optical response of supported metallic particles,” Phys. Rev. B 61(11), 7722–7733 (2000).
[Crossref]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
J. T. Krug, G. D. Wang, S. R. Emory, and S. Nie, “Efficient Raman enhancement and intermittent light emission observed in single gold nanocrystals,” J. Am. Chem. Soc. 121(39), 9208–9214 (1999).
[Crossref]
R. S. Moirangthem, Y. C. Chang, and P. K. Wei, “Ellipsometry study on gold-nanoparticle-coated gold thin film for biosensing application,” Biomed. Opt. Express 2(9), 2569–2576 (2011).
[Crossref]
[PubMed]
S. H. Hsu, Y. C. Chang, Y. C. Chen, P. K. Wei, and Y. D. Kim, “Optical metrology of randomly-distributed Au colloids on a multilayer film,” Opt. Express 18(2), 1310–1315 (2010).
[Crossref]
[PubMed]
Y. C. Chang, S. H. Hsu, P. K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5(5), 1194–1197 (2008).
[Crossref]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation Damping in Surface-Enhanced Raman Scattering,” Phys. Rev. Lett. 48(14), 957–960 (1982).
[Crossref]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
H. Xu, J. Aizpurua, M. Käll, and P. Apell, “Electromagnetic contributions to single-molecule sensitivity in surface-enhanced Raman scattering,” Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics 62(33 Pt B), 4318–4324 (2000).
[Crossref]
[PubMed]
G. Mie, “Beiträge zur optik trüber medien, speziell kolloidaler metallösungen,” Ann. Phys. 330(3), 377–445 (1908).
[Crossref]
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94(1), 011914 (2009).
[Crossref]
G. R. Lin, Y. C. Chang, E. S. Liu, H. C. Kuo, and H. S. Lin, “Low refractive index Si nanopillars on Si substrate,” Appl. Phys. Lett. 90(18), 181923 (2007).
[Crossref]
R. Lazzari, I. Simonsen, D. Bedeaux, J. Vlieger, and J. Jupille, “Polarizability of truncated spheroidal particles supported by a substrate: model and applications,” Eur. Phys. J. B 24(2), 267–284 (2001).
[Crossref]
J. T. Krug, G. D. Wang, S. R. Emory, and S. Nie, “Efficient Raman enhancement and intermittent light emission observed in single gold nanocrystals,” J. Am. Chem. Soc. 121(39), 9208–9214 (1999).
[Crossref]
G. Videen, “Light scattering from a sphere on or near a surface,” J. Opt. Soc. Am. A 8(3), 483–489 (1991).
[Crossref]
M. G. Moharam, E. B. Grann, D. A. Pommet, and T. K. Gaylord, “Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings,” J. Opt. Soc. Am. A 12(5), 1068–1076 (1995).
[Crossref]
Y. C. Chang, G. Li, H. Chu, and J. Opsal, “Efficient finite-element, Green’s function approach for critical-dimension metrology of three-dimensional gratings on multilayer films,” J. Opt. Soc. Am. A 23(3), 638–645 (2006).
[Crossref]
[PubMed]
A. M. Michaels, J. Jiang, and L. Brus, “Ag nanocrystal junctions as the site for surface-enhanced Raman scattering of single rhodamine 6G molecules,” J. Phys. Chem. B 104(50), 11965–11971 (2000).
[Crossref]
S. V. Gaponenko, A. A. Gaiduk, O. S. Kulakovich, S. A. Maskevich, N. D. Strekal, O. A. Prokhorov, and V. M. Shelekhina, “Raman scattering enhancement using crystallographic surface of a colloidal crystal,” JETP Lett. 74(6), 309–311 (2001).
[Crossref]
I. Simonsen, R. Lazzari, J. Jupille, and S. Roux, “Numerical modeling ot the optical response of supported metallic particles,” Phys. Rev. B 61(11), 7722–7733 (2000).
[Crossref]
H. Xu, J. Aizpurua, M. Käll, and P. Apell, “Electromagnetic contributions to single-molecule sensitivity in surface-enhanced Raman scattering,” Phys. Rev. E Stat. Phys. Plasmas Fluids Relat. Interdiscip. Topics 62(33 Pt B), 4318–4324 (2000).
[Crossref]
[PubMed]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation Damping in Surface-Enhanced Raman Scattering,” Phys. Rev. Lett. 48(14), 957–960 (1982).
[Crossref]
S.-H. Hsu, E.-S. Liu, Y. C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C. J. Lin, and G. R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205(4), 876–879 (2008).
[Crossref]
Y. C. Chang, S. H. Hsu, P. K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5(5), 1194–1197 (2008).
[Crossref]
S. M. Nie and S. R. Emory, “Probing single molecules and single nanoparticles by surface-enhanced Raman scattering,” Science 275(5303), 1102–1106 (1997).
[Crossref]
[PubMed]
H. Wormeester, E. Stefan Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004).
[Crossref]
R. Lazzari and I. Simonsen, “GRANFILM: a software for calculating thin-layer dielectric properties and Fresnel coefficients,” Thin Solid Films 419(1-2), 124–136 (2002).
[Crossref]
E. D. Palik, ed., Handbook of Optical Constants of Solids, vol. 1 (Academic, Orlando, FL, USA, 1985).
See for example, Fayyazuddin and Riazuddin, Quantum Mechanics (World Scientific, 1990), p. 368.
H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Modern Physics, Vol. 111 (Springer-Verlag, New York, 1988).
C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, 1983).
D. Bedeaux and J. Vlieger, Optical Properties of Surfaces (Imperial College Press, London, UK, 2002).