Abstract

A combined cavity ring-down (CRD) and spectrophotometry technique is developed to measure with sufficiently high accuracy the reflectance of any practically fabricated optical laser component with reflectance ranging from below 0.01% to over 99.999%. In this combined technique, a CRD configuration is employed to measure reflectance higher than 99%, and a conventional spectrophotometric configuration, which is formed by simply removing the rear cavity mirror from the CRD configuration, is applied to measure reflectance below 99%. Uncertainties below 0.0001% for reflectance over 99.99% and below 0.3% for reflectance below 99% are experimentally achieved with CRD and spectrophotometry configurations, respectively, of one single experimental setup.

© 2013 Optical Society of America

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References

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2011 (1)

2008 (1)

Y. Gong, B. Li, and Y. Han, “Optical feedback cavity ring-down technique for accurate measurement of ultra-high reflectivity,” Appl. Phys. B 93(2-3), 355–360 (2008).
[Crossref]

2007 (1)

Y. Gong and B. Li, “Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement,” Proc. SPIE 6723, 672356, 672356-6 (2007).
[Crossref]

2005 (1)

L. Gao, S. Xiong, B. Li, and Y. Zhang, “High reflectivity measurement with cavity ring-down technique,” Proc. SPIE 5963, 59632F, 59632F-8 (2005).
[Crossref]

1995 (1)

1994 (1)

1992 (1)

1990 (1)

1984 (1)

1980 (1)

1978 (2)

Anderson, D. Z.

Arnon, O.

Baumeister, P.

Benard, D. J.

Castellini, C.

Duparré, A.

Emiliani, G.

Frisch, J. C.

Gao, L.

L. Gao, S. Xiong, B. Li, and Y. Zhang, “High reflectivity measurement with cavity ring-down technique,” Proc. SPIE 5963, 59632F, 59632F-8 (2005).
[Crossref]

Giesen, A.

Gong, Y.

Y. Gong, B. Li, and Y. Han, “Optical feedback cavity ring-down technique for accurate measurement of ultra-high reflectivity,” Appl. Phys. B 93(2-3), 355–360 (2008).
[Crossref]

Y. Gong and B. Li, “Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement,” Proc. SPIE 6723, 672356, 672356-6 (2007).
[Crossref]

Han, Y.

Y. Gong, B. Li, and Y. Han, “Optical feedback cavity ring-down technique for accurate measurement of ultra-high reflectivity,” Appl. Phys. B 93(2-3), 355–360 (2008).
[Crossref]

Herbelin, J. M.

Kataoka, I.

Kimble, H. J.

Kitajima, N.

Kwok, M. A.

Lalezari, R.

Li, B.

Y. Gong, B. Li, and Y. Han, “Optical feedback cavity ring-down technique for accurate measurement of ultra-high reflectivity,” Appl. Phys. B 93(2-3), 355–360 (2008).
[Crossref]

Y. Gong and B. Li, “Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement,” Proc. SPIE 6723, 672356, 672356-6 (2007).
[Crossref]

L. Gao, S. Xiong, B. Li, and Y. Zhang, “High reflectivity measurement with cavity ring-down technique,” Proc. SPIE 5963, 59632F, 59632F-8 (2005).
[Crossref]

Masetti, E.

Masser, C. S.

McKay, J. A.

Mitake, T.

Nakamura, K.

Plass, W.

Poggi, P.

Polato, P. P.

Rempe, G.

Ristau, D.

Sekiguchi, H.

Smith, I. W.

Spencer, D. J.

Thompson, R. J.

Ueda, A.

Ueda, K.

Uehara, N.

Ueunten, R. H.

Urevig, D. S.

Voss, A.

Xiong, S.

L. Gao, S. Xiong, B. Li, and Y. Zhang, “High reflectivity measurement with cavity ring-down technique,” Proc. SPIE 5963, 59632F, 59632F-8 (2005).
[Crossref]

Zhang, Y.

L. Gao, S. Xiong, B. Li, and Y. Zhang, “High reflectivity measurement with cavity ring-down technique,” Proc. SPIE 5963, 59632F, 59632F-8 (2005).
[Crossref]

Appl. Opt. (7)

Appl. Phys. B (1)

Y. Gong, B. Li, and Y. Han, “Optical feedback cavity ring-down technique for accurate measurement of ultra-high reflectivity,” Appl. Phys. B 93(2-3), 355–360 (2008).
[Crossref]

Opt. Lett. (2)

Proc. SPIE (2)

Y. Gong and B. Li, “Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement,” Proc. SPIE 6723, 672356, 672356-6 (2007).
[Crossref]

L. Gao, S. Xiong, B. Li, and Y. Zhang, “High reflectivity measurement with cavity ring-down technique,” Proc. SPIE 5963, 59632F, 59632F-8 (2005).
[Crossref]

Other (4)

H. R. Philipp, “Silicon Dioxide (SiO2) (Glass),” in Handbook of Optical Constants of Solids, (Academic Press, 1985).

ISO 15368:2001(E), “Optics and optical instruments-measurement of reflectance of plane surfaces and transmittance of plane parallel elements,” International Organization for Standardization, Switzerland.

ISO 13697:2006(E), “Optics and photonics – Lasers and laser-related equipment – Test methods for specular reflectance of optical laser components,” International Organization for Standardization, Switzerland.

http://www.perkinelmer.com/IN/CMSResources/Images/44-74856TCH_LinearityMeasurementLAMBDAHellmaFilters.pdf .

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