Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol. 39(6), 1155–1161 (2007).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol. 39(6), 1155–1161 (2007).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser 23(11), 2154-2162 (2012).

S. Zhang, D. Van Der Weide, and J. Oliver, “Superfast phase-shifting method for 3-D shape measurement,” Opt. Express 18(9), 9684–9689 (2010).

[Crossref]
[PubMed]

L. Huang, C. S. Ng, and A. K. Asundi, “Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry,” Opt. Express 19(13), 12809–12814 (2011).

[Crossref]
[PubMed]

L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express 20(22), 24505–24515 (2012).

[Crossref]
[PubMed]

C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol. 39(6), 1155–1161 (2007).

[Crossref]

Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng. 51(3), 253–260 (2013).

[Crossref]

M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE 5457, 366–376 (2004).

[Crossref]