We comment on a recent paper by Kim et al. [Opt. Exp. 20(6) 6737-6745 (2012)], in which the authors claimed to present a new method for first-order differentiation of phase objects called gradient field microscopy (GFM). We consider that the method does not substantially differ from well-known Fourier methods discussed in textbooks. Also, we discuss some deficiencies of the paper.
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