Modeling and analysis of high-performance, multicolored anti-reflection coatings for solar cells

Matthew P. Lumb; Woojun Yoon; Christopher G. Bailey; David Scheiman; Joseph G. Tischler; Robert J. Walters

doi:10.1364/OE.21.00A585

Optics Express
Vol. 21,
Issue S4,
pp. A585-A594
(2013)
•https://doi.org/10.1364/OE.21.00A585

Modeling and analysis of high-performance, multicolored anti-reflection coatings for solar cells

Matthew P. Lumb, Woojun Yoon, Christopher G. Bailey, David Scheiman, Joseph G. Tischler, and Robert J. Walters

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Matthew P. Lumb, Woojun Yoon, Christopher G. Bailey, David Scheiman, Joseph G. Tischler, and Robert J. Walters, "Modeling and analysis of high-performance, multicolored anti-reflection coatings for solar cells," Opt. Express 21, A585-A594 (2013)

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Abstract

In this work solar cell anti-reflection coatings tuned to give a specific hue under solar illumination are investigated. We demonstrate that it is possible to form patterned coatings with large color contrast and high transmittance. We use colorimetric and thin film optics models to explore the relationship between the color and performance of bilayer anti-reflection coatings on Si, and predict the photocurrent generation from an example Si solar cell. The colorimetric predictions were verified by measuring a series of coatings deposited on Si substrates. Finally, a patterned Si sample was produced using a simple, low-cost photolithography procedure to selectively etch only the top layer of a bilayer coating to demonstrate a high-performance anti-reflection coating with strong color contrast.

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Fig. 1 The normalized CIE D65 illuminant spectrum and Oriel AM1.5 solar simulator spectrum. The solar simulator spectrum was dispersed using a translucent plastic sheet. CIE 1931 color-matching functions are also shown on the right-hand axis.

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Fig. 2 (a) The calculated short circuit current under the ASTM AM1.5G spectrum for a bilayer anti-reflection coated Silicon solar cell with different thicknesses of SiO_x and SiN_x. The internal quantum efficiency of the solar cell was deduced from the data in reference [12]. The dots indicate the thicknesses of sample coatings deposited on pieces of crystalline Si wafers. (b) The modeled sRGB color observed for each coating thickness under the D65 standard illuminant. For clarity, the J_sc contours from Fig. 2(a) are superimposed. (c) The J_sc and sRGB color observed for a Si solar cell coated with a single layer of SiO_x or SiN_x.

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Fig. 3 The calculated and measured reflectivity at normal incidence for samples 1-6. The calculated sRGB color of each coating is also shown, along with the reflected power density, P_ref, under the ASTM AM1.5G spectrum as a percentage of the incident power density.

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Fig. 4 Photographs of samples 1-6 at two different angles of incidence. The samples were illuminated using diffuse light from an Oriel AM1.5G solar simulator. The model prediction for the coating color under the D65 illuminant spectrum is also shown for each sample.

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Fig. 5 (a) The hue angle as a function of the angle of incidence for samples 1-6. Note the hue angle variation is not a smooth function, as the sRGB values from which it is calculated are rounded integer numbers. (b) The sRGB color for each sample as a function of incident angle.

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Fig. 6 (a) A patterned crystalline Si wafer with a bilayer SiO_x/SiN_x AR coating, patterned using a photolithography and reactive ion etch technique. The inset shows the emblem of the Naval Research Laboratory for comparison. (b) The laser printed mask, printed on a flexible, transparent film.

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Equations (7)

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X = \int \bar{x} (λ) P (λ) d λ

Y = \int \bar{y} (λ) P (λ) d λ

Z = \int \bar{z} (λ) P (λ) d λ

P (λ) = R (λ) D_{65} (λ)

(\begin{matrix} R_{l i n e a r} \\ G_{l i n e a r} \\ B_{l i n e a r} \end{matrix}) = (\begin{matrix} 3.240479 & - 1.53150 & - 0.498535 \\ - 0.969256 & 1.875992 & 0.041556 \\ 0.055648 & - 0.204043 & 1.057311 \end{matrix}) (\begin{matrix} X \\ Y \\ Z \end{matrix})

R_{s R G B} = {\begin{matrix} 255 \times 12.92 R_{l i n e a r}, R_{l i n e a r} \leq 0.0031308 \\ 255 \times (1.055 R_{l i n e a r}^{1 / 2.4} - 0.055), R_{l i n e a r} > 0.0031308 \end{matrix}

E Q E (λ) = (1 - R (λ)) I Q E (λ)

Abstract

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Figures (6)

Equations (7)

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