M. Servin, J. C. Estrada, J. A. Quiroga, J. F. Mosiño, and M. Cywiak, “Noise in phase shifting interferometry,” Opt. Express17(11), 8789–8794 (2009).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

J.-R. Lee, “Spatial resolution and resolution in phase-shifting laser interferometry,” Meas. Sci. Technol.16(12), 2525–2533 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

O. Soloviev and G. Vdovin, “Phase extraction from three and more interferograms registered with different unknown wavefront tilts,” Opt. Express13(10), 3743–3753 (2005).

[CrossRef]
[PubMed]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

J. E. Greivenkamp, “Generalized data reduction for heterodyne interferometry,” Opt. Eng.23, 350–352 (1984).

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

J. E. Greivenkamp, “Generalized data reduction for heterodyne interferometry,” Opt. Eng.23, 350–352 (1984).

H. Guo, “Blind self-calibrating algorithm for phase-shifting interferometry by use of cross-bispectrum,” Opt. Express19(8), 7807–7815 (2011).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

J.-R. Lee, “Spatial resolution and resolution in phase-shifting laser interferometry,” Meas. Sci. Technol.16(12), 2525–2533 (2005).

[CrossRef]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, “Digital wavefront measuring interferometer for testing optical surfaces and lenses,” Appl. Opt.13(11), 2693–2703 (1974).

[CrossRef]
[PubMed]

V. Srinivasan, H. C. Liu, and M. Halioua, “Automated phase-measuring profilometry: a phase mapping approach,” Appl. Opt.24(2), 185–188 (1985).

[CrossRef]
[PubMed]

J. J. J. Dirckx and W. F. Decraemer, “Automatic calibration method for phase shift shadow moire interferometry,” Appl. Opt.29(10), 1474–1476 (1990).

[CrossRef]
[PubMed]

T. Yatagai, K. Ohmura, S. Iwasaki, S. Hasegawa, J. Endo, and A. Tonomura, “Quantitative phase analysis in electron holographic interferometry,” Appl. Opt.26(2), 377–382 (1987).

[CrossRef]
[PubMed]

Y. Surrel, “Additive noise effect in digital phase detection,” Appl. Opt.36(1), 271–276 (1997).

[CrossRef]
[PubMed]

K. Hibino, “Susceptibility of systematic error-compensating algorithms to random noise in phase-shifting interferometry,” Appl. Opt.36(10), 2084–2093 (1997).

[CrossRef]
[PubMed]

H. Guo, Q. Yang, and M. Chen, “Local Frequency Estimation for the Fringe Pattern with a Spatial Carrier: Principle and Applications,” Appl. Opt.46(7), 1057–1065 (2007).

[CrossRef]
[PubMed]

K. A. Stetson and W. R. Brohinsky, “Electro-optic holography and its application to hologram interferometry,” Appl. Opt.24(21), 3631–3637 (1985).

[CrossRef]
[PubMed]

J.-R. Lee, J. Molimard, A. Vautrin, and Y. Surrel, “Digital phase-shifting grating shearography for experimental analysis of fabric composites under tension,” Composites: Part A35(7-8), 849–859 (2004).

[CrossRef]

N. A. Booth, A. A. Chernov, and P. G. Vekilov, “Characteristic lengthscales of step bunching in KDP crystal growth: in situ differential phase-shifting interferometry study,” J. Cryst. Growth237–239, 1818–1824 (2002).

[CrossRef]

J.-R. Lee, “Spatial resolution and resolution in phase-shifting laser interferometry,” Meas. Sci. Technol.16(12), 2525–2533 (2005).

[CrossRef]

H. Guo, H. He, Y. Yu, and M. Chen, “Least-squares calibration method for fringe projection profilometry,” Opt. Eng.44(3), 033603 (2005).

[CrossRef]

J. E. Greivenkamp, “Generalized data reduction for heterodyne interferometry,” Opt. Eng.23, 350–352 (1984).

O. Soloviev and G. Vdovin, “Phase extraction from three and more interferograms registered with different unknown wavefront tilts,” Opt. Express13(10), 3743–3753 (2005).

[CrossRef]
[PubMed]

M. Servin, J. C. Estrada, J. A. Quiroga, J. F. Mosiño, and M. Cywiak, “Noise in phase shifting interferometry,” Opt. Express17(11), 8789–8794 (2009).

[CrossRef]
[PubMed]

H. Guo, “Blind self-calibrating algorithm for phase-shifting interferometry by use of cross-bispectrum,” Opt. Express19(8), 7807–7815 (2011).

[CrossRef]
[PubMed]

H. Guo, Z. Zhao, and M. Chen, “Efficient iterative algorithm for phase-shifting interferometry,” Opt. Lasers Eng.45(2), 281–292 (2007).

[CrossRef]

P. Gao, B. Yao, N. Lindlein, K. Mantel, I. Harder, and E. Geist, “Phase-shift extraction for generalized phase-shifting interferometry,” Opt. Lett.34(22), 3553–3555 (2009).

[CrossRef]
[PubMed]

C. J. Morgan, “Least-squares estimation in phase-measurement interferometry,” Opt. Lett.7(8), 368–370 (1982).

[CrossRef]
[PubMed]

P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao, “Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy,” Opt. Lett.35(5), 712–714 (2010).

[CrossRef]
[PubMed]

S. Singh, S. Rana, S. Prakash, and O. Sasaki, “Application of wavelet filtering techniques to Lau interferometric fringe analysis for measurement of small tilt angles,” Optik (Stuttg.)122(18), 1666–1671 (2011).

[CrossRef]

H. Guo and M. Chen, “Fourier analysis of the sampling characteristics of the phase-shifting algorithm,” Proc. SPIE5180, 437–444 (2003).

W. H. Wang, Y. S. Wong, and G. S. Hong, “3D measurement of crater wear by phase shifting method,” Wear261(2), 164–171 (2006).

[CrossRef]

D. Malacara, M. Servin, and Z. Malacara, Interferogram Analysis for Optical Testing (Taylor & Francis Group, 2005).

R. C. Gonzalez and R. E. Woods, Digital Image Processing (Prentice Hall, 2007), Chap. 10.

K. Creath, “Temporal phase measurement methods,” in Interferogram Analysis: Digital Fringe Pattern Measurement, D. W. Robinson and G. Reid, eds. (IOP, 1993), pp. 94–140.

H. Schreiber and J. H. Bruning, “Phase Shifting Interferometry,” in Optical Shop Test, D. Malacara, ed. (Wiley-Interscience, 2007), 547–666.

I. Yamaguchi, “Phase-Shifting Digital Holography,” in Digital Holography and Three-Dimensional Display, T-C. Poon, ed. (Springer, 2006), 145–171.

D. C. Ghiglia and M. D. Pritt, Two-dimensional phase unwrapping: theory, algorithms, and software (Wiley-Interscience, 1998).

M. Kujawinska, “Spatial phase measurement methods,” in Interferogram Analysis: Digital Fringe Pattern Measurement, D. W. Robinson and G. Reid, eds. (IOP, 1993), pp. 141–193.