Abstract

Near-infrared surface plasmon resonance (SPR) spectra were collected of thin multilayer films of aluminum-doped zinc oxide (AZO) / silver (Ag) / AZO on BK-7 glass in the Kretschmann configuration in air, with the silver layer thickness varying from 5 nm to 50 nm. The SPR results were interpreted by modeling the reflectance with a five-layer transfer-matrix method, with the aid of a simplex algorithm. The model indicated that the Ag plasma frequency was significantly higher than the bulk value, possibly due to Schottky effect charge transfer from the AZO to the Ag layer. Continuous silver films were made as thin as 10 nm, indicating an inhibition of metal island formation for Ag deposited on AZO.

© 2012 OSA

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2012 (1)

2011 (2)

M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
[CrossRef]

N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
[CrossRef]

2010 (4)

G. T. West, P. J. Kelly, and J. W. Bradley, “A comparison of thin silver films grown onto zinc oxide via conventional magnetron sputtering and HiPIMS deposition,” IEEE Trans. Plasma Sci.38(11), 3057–3061 (2010).
[CrossRef]

M. Bao, G. Li, D. M. Jiang, W. J. Cheng, and X. M. Ma, “ZnO sensing film thickness effects on the sensitivity of surface plasmon resonance sensors with angular interrogation,” Mater. Sci. Eng. B-Adv.171, 155–158 (2010).

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

P. R. West, S. Ichii, G. V. Naik, N. K. Emani, V. M. Shalaev, and A. Boltasseva, “Searching for better plasmonic materials,” Laser Photon. Rev.4(6), 795–808 (2010).

2009 (5)

S. Franzen, C. Rhodes, M. Cerruti, R. W. Gerber, M. Losego, J. P. Maria, and D. E. Aspnes, “Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films,” Opt. Lett.34(18), 2867–2869 (2009).
[CrossRef] [PubMed]

M. D. Losego, A. Y. Efremenko, C. L. Rhodes, M. G. Cerruti, S. Franzen, and J. P. Maria, “Conductive oxide thin films: Model systems for understanding and controlling surface plasmon resonance,” J. Appl. Phys.106(2), 024903 (2009).
[CrossRef]

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
[CrossRef] [PubMed]

C. Guillen and J. Herrero, “Transparent conductive ITO/Ag/ITO multilayer electrodes deposited by sputtering at room temperature,” Opt. Commun.282(4), 574–578 (2009).
[CrossRef]

T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
[CrossRef]

2008 (9)

C. L. Rhodes, S. Lappi, D. Fischer, S. Sambasivan, J. Genzer, and S. Franzen, “Characterization of monolayer formation on aluminum-doped zinc oxide thin films,” Langmuir24(2), 433–440 (2008).
[CrossRef] [PubMed]

N. B. Abaffy, J. G. Partridge, J. Plessis, and D. G. McCulloch, “Optically absorbing trilayer films fabricated using a filtered cathodic vacuum arc,” Phys. Status Solidi. A205(6), 1439–1442 (2008).
[CrossRef]

S. Franzen, “Surface plasmon polaritons and screened plasma absorption in indium tin oxide compared to silver and gold,” J. Phys. Chem. C112(15), 6027–6032 (2008).
[CrossRef]

C. Rhodes, M. Cerruti, A. Efremenko, M. Losego, D. E. Aspnes, J. P. Maria, and S. Franzen, “Dependence of plasmon polaritons on the thickness of indium tin oxide thin films,” J. Appl. Phys.103(9), 093108 (2008).
[CrossRef]

R. Soref, R. E. Peale, and W. Buchwald, “Longwave plasmonics on doped silicon and silicides,” Opt. Express16(9), 6507–6514 (2008).
[CrossRef] [PubMed]

K. Fukuda, S. H. N. Lim, and A. Anders, “Coalescence of magnetron-sputtered silver islands affected by transition metal seeding (Ni, Cr, Nb, Zr, Mo, W, Ta) and other parameters,” Thin Solid Films516(14), 4546–4552 (2008).
[CrossRef]

S. Szunerits, X. Castel, and R. Boukherroub, “Surface plasmon resonance investigation of silver and gold films coated with thin indium tin oxide layers: Influence on stability and sensitivity,” J. Phys. Chem. C112(40), 15813–15817 (2008).
[CrossRef]

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, R. Boukherroub, and S. Szunerits, “Preparation and characterization of antimony-doped SnO2 thin films on gold and silver substrates for electrochemical and surface plasmon resonance studies,” Electrochem. Commun.10(7), 1041–1043 (2008).
[CrossRef]

2007 (2)

M. R. Lockett, M. F. Phillips, M. R. Shortreed, S. C. Weibel, and L. M. Smith, “Surface plasmon resonance compatible carbon thin films,” Abstr. Pap. Am. Chem. Soc. 233 (2007).

X. D. Hoa, A. G. Kirk, and M. Tabrizian, “Towards integrated and sensitive surface plasmon resonance biosensors: A review of recent progress,” Biosens. Bioelectron.23(2), 151–160 (2007).
[CrossRef] [PubMed]

2006 (9)

A. Anders, E. Byon, D.-H. Kim, K. Fukuda, and S. H. N. Lim, “Smoothing of ultrathin silver films by transition metal seeding,” Solid State Commun.140(5), 225–229 (2006).
[CrossRef]

D. R. Sahu, S. Y. Lin, and J. L. Huang, “ZnO/Ag/ZnO multilayer films for the application of a very low resistance transparent electrode,” Appl. Surf. Sci.252(20), 7509–7514 (2006).
[CrossRef]

D. R. Sahu and J. L. Huang, “Characteristics of ZnO-Cu-ZnO multilayer films on copper layer properties,” Appl. Surf. Sci.253(2), 827–832 (2006).
[CrossRef]

D. R. Sahu and J. L. Huang, “High quality transparent conductive ZnO/Ag/ZnO multilayer films deposited at room temperature,” Thin Solid Films515(3), 876–879 (2006).
[CrossRef]

T. W. Kim, D. C. Choo, Y. S. No, W. K. Choi, and E. H. Choi, “High work function of Al-doped zinc-oxide thin films as transparent conductive anodes in organic light-emitting devices,” Appl. Surf. Sci.253(4), 1917–1920 (2006).
[CrossRef]

K. S. Phillips, J. H. Han, M. Martinez, Z. Z. Wang, D. Carter, and Q. Cheng, “Nanoscale glassification of gold substrates for surface plasmon resonance analysis of protein toxins with supported lipid membranes,” Anal. Chem.78(2), 596–603 (2006).
[CrossRef] [PubMed]

S. Szunerits and R. Boukherroub, “Preparation and characterization of thin films of SiO(x) on gold substrates for surface plasmon resonance studies,” Langmuir22(4), 1660–1663 (2006).
[CrossRef] [PubMed]

S. Szunerits, Y. Coffinier, S. Janel, and R. Boukherroub, “Stability of the gold/silica thin film interface: Electrochemical and surface plasmon resonance studies,” Langmuir22(25), 10716–10722 (2006).
[CrossRef] [PubMed]

C. Rhodes, S. Franzen, J. P. Maria, M. Losego, D. N. Leonard, B. Laughlin, G. Duscher, and S. Weibel, “Surface plasmon resonance in conducting metal oxides,” J. Appl. Phys.100(5), 054905 (2006).
[CrossRef]

2004 (2)

R. Zia, M. D. Selker, P. B. Catrysse, and M. L. Brongersma, “Geometries and materials for subwavelength surface plasmon modes,” J. Opt. Soc. Am. A21(12), 2442–2446 (2004).
[CrossRef] [PubMed]

A. V. Singh, R. M. Mehra, A. Yoshida, and A. Wakahara, “Doping mechanism in aluminum doped zinc oxide films,” J. Appl. Phys.95(7), 3640–3643 (2004).
[CrossRef]

2003 (4)

Y. S. Jung, Y. W. Choi, H. C. Lee, and D. W. Lee, “Effects of thermal treatment on the electrical and optical properties of silver-based indium tin oxide/metal/indium tin oxide structures,” Thin Solid Films440(1-2), 278–284 (2003).
[CrossRef]

X. J. Liu, X. Cai, J. S. Qiao, H. F. Mao, and N. Jiang, “The design of ZnS/Ag/ZnS transparent conductive multilayer films,” Thin Solid Films441(1-2), 200–206 (2003).
[CrossRef]

X. Jiang, F. L. Wong, M. K. Fung, and S. T. Lee, “Aluminum-doped zinc oxide films as transparent conductive electrode for organic light-emitting devices,” Appl. Phys. Lett.83(9), 1875–1877 (2003).
[CrossRef]

J. Homola, “Present and future of surface plasmon resonance biosensors,” Anal. Bioanal. Chem.377(3), 528–539 (2003).
[CrossRef] [PubMed]

2001 (3)

R. Lazzari and J. Jupille, “Silver layers on oxide surfaces: morphology and optical properties,” Surf. Sci.482, 823–828 (2001).
[CrossRef]

M. Sawada, M. Higuchi, S. Kondo, and H. Saka, “Characteristics of indium-tin-oxide/silver/indium-tin-oxide sandwich films and their application to simple-matrix liquid-crystal displays,” Jpn. J. Appl. Phys.40(Part 1, 5A), 3332–3336 (2001).
[CrossRef]

M. Fahland, P. Karlsson, and C. Charton, “Low resisitivity transparent electrodes for displays on polymer substrates,” Thin Solid Films392(2), 334–337 (2001).
[CrossRef]

2000 (1)

A. Kloppel, W. Kriegseis, B. K. Meyer, A. Scharmann, C. Daube, J. Stollenwerk, and J. Trube, “Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties,” Thin Solid Films365(1), 139–146 (2000).
[CrossRef]

1999 (1)

J. Homola, S. S. Yee, and G. Gauglitz, “Surface plasmon resonance sensors: review,” Sensor. Actuat. Biol. Chem.54, 3–15 (1999).

1998 (1)

M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
[CrossRef]

1997 (1)

G. Leftheriotis, P. Yianoulis, and D. Patrikios, “Deposition and optical properties of optimised ZnS/Ag/ZnS thin films for energy saving applications,” Thin Solid Films306(1), 92–99 (1997).
[CrossRef]

1996 (1)

F. Didier and J. Jupille, “Simple views on metal/oxide interfaces: Contributions of the long-range interactions to the adhesion energy,” J. Adhes.58(3-4), 253–261 (1996).
[CrossRef]

1986 (2)

C. A. Bishop and R. P. Howson, “The performance of large area optical filters using DC magnetron sputtered metal thin-films in oxide metal-oxide sandwiches,” Sol. Energy Mater.13(3), 175–184 (1986).
[CrossRef]

E. Kusano, J. Kawaguchi, and K. Enjouji, “Thermal-stability of heat-reflective films consisting of oxide-Ag-oxide deposited by DC magnetron sputtering,” J. Vac. Sci. Technol. A4(6), 2907–2910 (1986).
[CrossRef]

1984 (1)

1983 (2)

1982 (2)

M. Chelvayohan and C. H. B. Mee, “Work function measurements on (110), (100) and (111) surfaces of silver,” J. Phys. C Sol. State15, 2305–2312 (1982).

H. Kostlin and G. Frank, “Optimization of transparent heat mirrors based on a thin silver film between antireflection films,” Thin Solid Films89(3), 287–293 (1982).
[CrossRef]

1980 (1)

M. G. Nicholas, T. M. Valentine, and M. J. Waite, “The wetting of alumina by copper alloyed with titanium and other elements,” J. Mater. Sci.15(9), 2197–2206 (1980).
[CrossRef]

1974 (1)

J. C. C. Fan, F. J. Bachner, G. H. Foley, and P. M. Zavracky, “Transparent heat-mirror films of TiO2/Ag/TiO2 for solar-energy collection and radiation insulation,” Appl. Phys. Lett.25(12), 693–695 (1974).
[CrossRef]

1972 (2)

P. B. Johnson and R. W. Christy, “Optical constants of the noble metals,” Phys. Rev. B6(12), 4370–4379 (1972).
[CrossRef]

E. Kretschmann, “Decay of non radiative surface plasmons into light on rough silver films. Comparison of experimental and theoretical results,” Opt. Commun.6(2), 185–187 (1972).
[CrossRef]

1968 (1)

E. Kretschmann and H. Raether, “Radiative decay of non radiative surface plasmons excited by light,” Z. Naturforsch. Pt. A23, 2135–2136 (1968).

1958 (1)

L. Holland and G. Siddall, “Heat-reflecting windows using gold and bismuth oxide films,” Br. J. Appl. Phys.9(9), 359–361 (1958).
[CrossRef]

1957 (1)

Abaffy, N. B.

N. B. Abaffy, J. G. Partridge, J. Plessis, and D. G. McCulloch, “Optically absorbing trilayer films fabricated using a filtered cathodic vacuum arc,” Phys. Status Solidi. A205(6), 1439–1442 (2008).
[CrossRef]

Alexander, R. W.

Anders, A.

K. Fukuda, S. H. N. Lim, and A. Anders, “Coalescence of magnetron-sputtered silver islands affected by transition metal seeding (Ni, Cr, Nb, Zr, Mo, W, Ta) and other parameters,” Thin Solid Films516(14), 4546–4552 (2008).
[CrossRef]

A. Anders, E. Byon, D.-H. Kim, K. Fukuda, and S. H. N. Lim, “Smoothing of ultrathin silver films by transition metal seeding,” Solid State Commun.140(5), 225–229 (2006).
[CrossRef]

Aspnes, D. E.

S. Franzen, C. Rhodes, M. Cerruti, R. W. Gerber, M. Losego, J. P. Maria, and D. E. Aspnes, “Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films,” Opt. Lett.34(18), 2867–2869 (2009).
[CrossRef] [PubMed]

C. Rhodes, M. Cerruti, A. Efremenko, M. Losego, D. E. Aspnes, J. P. Maria, and S. Franzen, “Dependence of plasmon polaritons on the thickness of indium tin oxide thin films,” J. Appl. Phys.103(9), 093108 (2008).
[CrossRef]

Bachner, F. J.

J. C. C. Fan, F. J. Bachner, G. H. Foley, and P. M. Zavracky, “Transparent heat-mirror films of TiO2/Ag/TiO2 for solar-energy collection and radiation insulation,” Appl. Phys. Lett.25(12), 693–695 (1974).
[CrossRef]

Bahoura, M.

M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
[CrossRef]

Bao, M.

M. Bao, G. Li, D. M. Jiang, W. J. Cheng, and X. M. Ma, “ZnO sensing film thickness effects on the sensitivity of surface plasmon resonance sensors with angular interrogation,” Mater. Sci. Eng. B-Adv.171, 155–158 (2010).

Barmak, K.

T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
[CrossRef]

Barnakov, Y. A.

M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
[CrossRef]

Bell, R. J.

Bell, R. R.

Bell, S. E.

Bender, M.

M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
[CrossRef]

Berning, P. H.

Bishop, C. A.

C. A. Bishop and R. P. Howson, “The performance of large area optical filters using DC magnetron sputtered metal thin-films in oxide metal-oxide sandwiches,” Sol. Energy Mater.13(3), 175–184 (1986).
[CrossRef]

Boltasseva, A.

P. R. West, S. Ichii, G. V. Naik, N. K. Emani, V. M. Shalaev, and A. Boltasseva, “Searching for better plasmonic materials,” Laser Photon. Rev.4(6), 795–808 (2010).

Boreman, G. D.

Boukherroub, R.

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, R. Boukherroub, and S. Szunerits, “Preparation and characterization of antimony-doped SnO2 thin films on gold and silver substrates for electrochemical and surface plasmon resonance studies,” Electrochem. Commun.10(7), 1041–1043 (2008).
[CrossRef]

S. Szunerits, X. Castel, and R. Boukherroub, “Surface plasmon resonance investigation of silver and gold films coated with thin indium tin oxide layers: Influence on stability and sensitivity,” J. Phys. Chem. C112(40), 15813–15817 (2008).
[CrossRef]

S. Szunerits and R. Boukherroub, “Preparation and characterization of thin films of SiO(x) on gold substrates for surface plasmon resonance studies,” Langmuir22(4), 1660–1663 (2006).
[CrossRef] [PubMed]

S. Szunerits, Y. Coffinier, S. Janel, and R. Boukherroub, “Stability of the gold/silica thin film interface: Electrochemical and surface plasmon resonance studies,” Langmuir22(25), 10716–10722 (2006).
[CrossRef] [PubMed]

Bradley, J. W.

G. T. West, P. J. Kelly, and J. W. Bradley, “A comparison of thin silver films grown onto zinc oxide via conventional magnetron sputtering and HiPIMS deposition,” IEEE Trans. Plasma Sci.38(11), 3057–3061 (2010).
[CrossRef]

Brongersma, M. L.

Buchwald, W.

Buchwald, W. R.

Byon, E.

A. Anders, E. Byon, D.-H. Kim, K. Fukuda, and S. H. N. Lim, “Smoothing of ultrathin silver films by transition metal seeding,” Solid State Commun.140(5), 225–229 (2006).
[CrossRef]

Cai, X.

X. J. Liu, X. Cai, J. S. Qiao, H. F. Mao, and N. Jiang, “The design of ZnS/Ag/ZnS transparent conductive multilayer films,” Thin Solid Films441(1-2), 200–206 (2003).
[CrossRef]

Carter, D.

K. S. Phillips, J. H. Han, M. Martinez, Z. Z. Wang, D. Carter, and Q. Cheng, “Nanoscale glassification of gold substrates for surface plasmon resonance analysis of protein toxins with supported lipid membranes,” Anal. Chem.78(2), 596–603 (2006).
[CrossRef] [PubMed]

Castel, X.

S. Szunerits, X. Castel, and R. Boukherroub, “Surface plasmon resonance investigation of silver and gold films coated with thin indium tin oxide layers: Influence on stability and sensitivity,” J. Phys. Chem. C112(40), 15813–15817 (2008).
[CrossRef]

Catrysse, P. B.

Cerrina, F.

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

Cerruti, M.

S. Franzen, C. Rhodes, M. Cerruti, R. W. Gerber, M. Losego, J. P. Maria, and D. E. Aspnes, “Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films,” Opt. Lett.34(18), 2867–2869 (2009).
[CrossRef] [PubMed]

C. Rhodes, M. Cerruti, A. Efremenko, M. Losego, D. E. Aspnes, J. P. Maria, and S. Franzen, “Dependence of plasmon polaritons on the thickness of indium tin oxide thin films,” J. Appl. Phys.103(9), 093108 (2008).
[CrossRef]

Cerruti, M. G.

M. D. Losego, A. Y. Efremenko, C. L. Rhodes, M. G. Cerruti, S. Franzen, and J. P. Maria, “Conductive oxide thin films: Model systems for understanding and controlling surface plasmon resonance,” J. Appl. Phys.106(2), 024903 (2009).
[CrossRef]

Chang, S. Y.

N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
[CrossRef]

Charton, C.

M. Fahland, P. Karlsson, and C. Charton, “Low resisitivity transparent electrodes for displays on polymer substrates,” Thin Solid Films392(2), 334–337 (2001).
[CrossRef]

Chazalviel, J. N.

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

Chelvayohan, M.

M. Chelvayohan and C. H. B. Mee, “Work function measurements on (110), (100) and (111) surfaces of silver,” J. Phys. C Sol. State15, 2305–2312 (1982).

Chen, N. C.

N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
[CrossRef]

Cheng, Q.

K. S. Phillips, J. H. Han, M. Martinez, Z. Z. Wang, D. Carter, and Q. Cheng, “Nanoscale glassification of gold substrates for surface plasmon resonance analysis of protein toxins with supported lipid membranes,” Anal. Chem.78(2), 596–603 (2006).
[CrossRef] [PubMed]

Cheng, W. J.

M. Bao, G. Li, D. M. Jiang, W. J. Cheng, and X. M. Ma, “ZnO sensing film thickness effects on the sensitivity of surface plasmon resonance sensors with angular interrogation,” Mater. Sci. Eng. B-Adv.171, 155–158 (2010).

Choi, E. H.

T. W. Kim, D. C. Choo, Y. S. No, W. K. Choi, and E. H. Choi, “High work function of Al-doped zinc-oxide thin films as transparent conductive anodes in organic light-emitting devices,” Appl. Surf. Sci.253(4), 1917–1920 (2006).
[CrossRef]

Choi, W. K.

T. W. Kim, D. C. Choo, Y. S. No, W. K. Choi, and E. H. Choi, “High work function of Al-doped zinc-oxide thin films as transparent conductive anodes in organic light-emitting devices,” Appl. Surf. Sci.253(4), 1917–1920 (2006).
[CrossRef]

Choi, Y. W.

Y. S. Jung, Y. W. Choi, H. C. Lee, and D. W. Lee, “Effects of thermal treatment on the electrical and optical properties of silver-based indium tin oxide/metal/indium tin oxide structures,” Thin Solid Films440(1-2), 278–284 (2003).
[CrossRef]

Choo, D. C.

T. W. Kim, D. C. Choo, Y. S. No, W. K. Choi, and E. H. Choi, “High work function of Al-doped zinc-oxide thin films as transparent conductive anodes in organic light-emitting devices,” Appl. Surf. Sci.253(4), 1917–1920 (2006).
[CrossRef]

Chou, C.

N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
[CrossRef]

Christy, R. W.

P. B. Johnson and R. W. Christy, “Optical constants of the noble metals,” Phys. Rev. B6(12), 4370–4379 (1972).
[CrossRef]

Cleary, J. W.

Coffey, K. R.

T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
[CrossRef]

Coffinier, Y.

S. Szunerits, Y. Coffinier, S. Janel, and R. Boukherroub, “Stability of the gold/silica thin film interface: Electrochemical and surface plasmon resonance studies,” Langmuir22(25), 10716–10722 (2006).
[CrossRef] [PubMed]

Corn, R. M.

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

Daube, C.

A. Kloppel, W. Kriegseis, B. K. Meyer, A. Scharmann, C. Daube, J. Stollenwerk, and J. Trube, “Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties,” Thin Solid Films365(1), 139–146 (2000).
[CrossRef]

M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
[CrossRef]

Didier, F.

F. Didier and J. Jupille, “Simple views on metal/oxide interfaces: Contributions of the long-range interactions to the adhesion energy,” J. Adhes.58(3-4), 253–261 (1996).
[CrossRef]

Duscher, G.

C. Rhodes, S. Franzen, J. P. Maria, M. Losego, D. N. Leonard, B. Laughlin, G. Duscher, and S. Weibel, “Surface plasmon resonance in conducting metal oxides,” J. Appl. Phys.100(5), 054905 (2006).
[CrossRef]

Efremenko, A.

C. Rhodes, M. Cerruti, A. Efremenko, M. Losego, D. E. Aspnes, J. P. Maria, and S. Franzen, “Dependence of plasmon polaritons on the thickness of indium tin oxide thin films,” J. Appl. Phys.103(9), 093108 (2008).
[CrossRef]

Efremenko, A. Y.

M. D. Losego, A. Y. Efremenko, C. L. Rhodes, M. G. Cerruti, S. Franzen, and J. P. Maria, “Conductive oxide thin films: Model systems for understanding and controlling surface plasmon resonance,” J. Appl. Phys.106(2), 024903 (2009).
[CrossRef]

Emani, N. K.

P. R. West, S. Ichii, G. V. Naik, N. K. Emani, V. M. Shalaev, and A. Boltasseva, “Searching for better plasmonic materials,” Laser Photon. Rev.4(6), 795–808 (2010).

Enjouji, K.

E. Kusano, J. Kawaguchi, and K. Enjouji, “Thermal-stability of heat-reflective films consisting of oxide-Ag-oxide deposited by DC magnetron sputtering,” J. Vac. Sci. Technol. A4(6), 2907–2910 (1986).
[CrossRef]

Fahland, M.

M. Fahland, P. Karlsson, and C. Charton, “Low resisitivity transparent electrodes for displays on polymer substrates,” Thin Solid Films392(2), 334–337 (2001).
[CrossRef]

Fan, J. C. C.

J. C. C. Fan, F. J. Bachner, G. H. Foley, and P. M. Zavracky, “Transparent heat-mirror films of TiO2/Ag/TiO2 for solar-energy collection and radiation insulation,” Appl. Phys. Lett.25(12), 693–695 (1974).
[CrossRef]

Fischer, D.

C. L. Rhodes, S. Lappi, D. Fischer, S. Sambasivan, J. Genzer, and S. Franzen, “Characterization of monolayer formation on aluminum-doped zinc oxide thin films,” Langmuir24(2), 433–440 (2008).
[CrossRef] [PubMed]

Foley, G. H.

J. C. C. Fan, F. J. Bachner, G. H. Foley, and P. M. Zavracky, “Transparent heat-mirror films of TiO2/Ag/TiO2 for solar-energy collection and radiation insulation,” Appl. Phys. Lett.25(12), 693–695 (1974).
[CrossRef]

Frank, G.

H. Kostlin and G. Frank, “Optimization of transparent heat mirrors based on a thin silver film between antireflection films,” Thin Solid Films89(3), 287–293 (1982).
[CrossRef]

Frankenberger, H.

M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
[CrossRef]

Franzen, S.

M. D. Losego, A. Y. Efremenko, C. L. Rhodes, M. G. Cerruti, S. Franzen, and J. P. Maria, “Conductive oxide thin films: Model systems for understanding and controlling surface plasmon resonance,” J. Appl. Phys.106(2), 024903 (2009).
[CrossRef]

S. Franzen, C. Rhodes, M. Cerruti, R. W. Gerber, M. Losego, J. P. Maria, and D. E. Aspnes, “Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films,” Opt. Lett.34(18), 2867–2869 (2009).
[CrossRef] [PubMed]

C. L. Rhodes, S. Lappi, D. Fischer, S. Sambasivan, J. Genzer, and S. Franzen, “Characterization of monolayer formation on aluminum-doped zinc oxide thin films,” Langmuir24(2), 433–440 (2008).
[CrossRef] [PubMed]

C. Rhodes, M. Cerruti, A. Efremenko, M. Losego, D. E. Aspnes, J. P. Maria, and S. Franzen, “Dependence of plasmon polaritons on the thickness of indium tin oxide thin films,” J. Appl. Phys.103(9), 093108 (2008).
[CrossRef]

S. Franzen, “Surface plasmon polaritons and screened plasma absorption in indium tin oxide compared to silver and gold,” J. Phys. Chem. C112(15), 6027–6032 (2008).
[CrossRef]

C. Rhodes, S. Franzen, J. P. Maria, M. Losego, D. N. Leonard, B. Laughlin, G. Duscher, and S. Weibel, “Surface plasmon resonance in conducting metal oxides,” J. Appl. Phys.100(5), 054905 (2006).
[CrossRef]

Fukuda, K.

K. Fukuda, S. H. N. Lim, and A. Anders, “Coalescence of magnetron-sputtered silver islands affected by transition metal seeding (Ni, Cr, Nb, Zr, Mo, W, Ta) and other parameters,” Thin Solid Films516(14), 4546–4552 (2008).
[CrossRef]

A. Anders, E. Byon, D.-H. Kim, K. Fukuda, and S. H. N. Lim, “Smoothing of ultrathin silver films by transition metal seeding,” Solid State Commun.140(5), 225–229 (2006).
[CrossRef]

Fung, M. K.

X. Jiang, F. L. Wong, M. K. Fung, and S. T. Lee, “Aluminum-doped zinc oxide films as transparent conductive electrode for organic light-emitting devices,” Appl. Phys. Lett.83(9), 1875–1877 (2003).
[CrossRef]

Galopin, E.

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

Gauglitz, G.

J. Homola, S. S. Yee, and G. Gauglitz, “Surface plasmon resonance sensors: review,” Sensor. Actuat. Biol. Chem.54, 3–15 (1999).

Genzer, J.

C. L. Rhodes, S. Lappi, D. Fischer, S. Sambasivan, J. Genzer, and S. Franzen, “Characterization of monolayer formation on aluminum-doped zinc oxide thin films,” Langmuir24(2), 433–440 (2008).
[CrossRef] [PubMed]

Gerber, R. W.

Gouget-Laemmel, A. C.

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

Gu, L.

M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
[CrossRef]

Guillen, C.

C. Guillen and J. Herrero, “Transparent conductive ITO/Ag/ITO multilayer electrodes deposited by sputtering at room temperature,” Opt. Commun.282(4), 574–578 (2009).
[CrossRef]

Hamers, R. J.

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

Han, J. H.

K. S. Phillips, J. H. Han, M. Martinez, Z. Z. Wang, D. Carter, and Q. Cheng, “Nanoscale glassification of gold substrates for surface plasmon resonance analysis of protein toxins with supported lipid membranes,” Anal. Chem.78(2), 596–603 (2006).
[CrossRef] [PubMed]

Herrero, J.

C. Guillen and J. Herrero, “Transparent conductive ITO/Ag/ITO multilayer electrodes deposited by sputtering at room temperature,” Opt. Commun.282(4), 574–578 (2009).
[CrossRef]

Higuchi, M.

M. Sawada, M. Higuchi, S. Kondo, and H. Saka, “Characteristics of indium-tin-oxide/silver/indium-tin-oxide sandwich films and their application to simple-matrix liquid-crystal displays,” Jpn. J. Appl. Phys.40(Part 1, 5A), 3332–3336 (2001).
[CrossRef]

Ho, C. W.

N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
[CrossRef]

Hoa, X. D.

X. D. Hoa, A. G. Kirk, and M. Tabrizian, “Towards integrated and sensitive surface plasmon resonance biosensors: A review of recent progress,” Biosens. Bioelectron.23(2), 151–160 (2007).
[CrossRef] [PubMed]

Holland, L.

L. Holland and G. Siddall, “Heat-reflecting windows using gold and bismuth oxide films,” Br. J. Appl. Phys.9(9), 359–361 (1958).
[CrossRef]

Homola, J.

J. Homola, “Present and future of surface plasmon resonance biosensors,” Anal. Bioanal. Chem.377(3), 528–539 (2003).
[CrossRef] [PubMed]

J. Homola, S. S. Yee, and G. Gauglitz, “Surface plasmon resonance sensors: review,” Sensor. Actuat. Biol. Chem.54, 3–15 (1999).

Howson, R. P.

C. A. Bishop and R. P. Howson, “The performance of large area optical filters using DC magnetron sputtered metal thin-films in oxide metal-oxide sandwiches,” Sol. Energy Mater.13(3), 175–184 (1986).
[CrossRef]

Huang, J. L.

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D. R. Sahu, S. Y. Lin, and J. L. Huang, “ZnO/Ag/ZnO multilayer films for the application of a very low resistance transparent electrode,” Appl. Surf. Sci.252(20), 7509–7514 (2006).
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N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
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N. C. Chen, W. C. Lien, C. R. Liu, Y. L. Huang, Y. R. Lin, C. Chou, S. Y. Chang, and C. W. Ho, “Excitation of surface plasma wave at TiN/air interface in the Kretschmann geometry,” J. Appl. Phys.109(4), 043104 (2011).
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X. J. Liu, X. Cai, J. S. Qiao, H. F. Mao, and N. Jiang, “The design of ZnS/Ag/ZnS transparent conductive multilayer films,” Thin Solid Films441(1-2), 200–206 (2003).
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M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
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C. Rhodes, S. Franzen, J. P. Maria, M. Losego, D. N. Leonard, B. Laughlin, G. Duscher, and S. Weibel, “Surface plasmon resonance in conducting metal oxides,” J. Appl. Phys.100(5), 054905 (2006).
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M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
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S. Franzen, C. Rhodes, M. Cerruti, R. W. Gerber, M. Losego, J. P. Maria, and D. E. Aspnes, “Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films,” Opt. Lett.34(18), 2867–2869 (2009).
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M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
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N. B. Abaffy, J. G. Partridge, J. Plessis, and D. G. McCulloch, “Optically absorbing trilayer films fabricated using a filtered cathodic vacuum arc,” Phys. Status Solidi. A205(6), 1439–1442 (2008).
[CrossRef]

Patrikios, D.

G. Leftheriotis, P. Yianoulis, and D. Patrikios, “Deposition and optical properties of optimised ZnS/Ag/ZnS thin films for energy saving applications,” Thin Solid Films306(1), 92–99 (1997).
[CrossRef]

Peale, R. E.

Pelissier, B.

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
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L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
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K. S. Phillips, J. H. Han, M. Martinez, Z. Z. Wang, D. Carter, and Q. Cheng, “Nanoscale glassification of gold substrates for surface plasmon resonance analysis of protein toxins with supported lipid membranes,” Anal. Chem.78(2), 596–603 (2006).
[CrossRef] [PubMed]

Phillips, M. F.

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

M. R. Lockett, M. F. Phillips, M. R. Shortreed, S. C. Weibel, and L. M. Smith, “Surface plasmon resonance compatible carbon thin films,” Abstr. Pap. Am. Chem. Soc. 233 (2007).

Pisarek, M.

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
[CrossRef] [PubMed]

Plessis, J.

N. B. Abaffy, J. G. Partridge, J. Plessis, and D. G. McCulloch, “Optically absorbing trilayer films fabricated using a filtered cathodic vacuum arc,” Phys. Status Solidi. A205(6), 1439–1442 (2008).
[CrossRef]

Podolskiy, V. A.

M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
[CrossRef]

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M. A. Noginov, L. Gu, J. Livenere, G. Zhu, A. K. Pradhan, R. Mundle, M. Bahoura, Y. A. Barnakov, and V. A. Podolskiy, “Transparent conductive oxides: Plasmonic materials for telecom wavelengths,” Appl. Phys. Lett.99(2), 021101 (2011).
[CrossRef]

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X. J. Liu, X. Cai, J. S. Qiao, H. F. Mao, and N. Jiang, “The design of ZnS/Ag/ZnS transparent conductive multilayer films,” Thin Solid Films441(1-2), 200–206 (2003).
[CrossRef]

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E. Kretschmann and H. Raether, “Radiative decay of non radiative surface plasmons excited by light,” Z. Naturforsch. Pt. A23, 2135–2136 (1968).

Rezadad, I.

Rhodes, C.

S. Franzen, C. Rhodes, M. Cerruti, R. W. Gerber, M. Losego, J. P. Maria, and D. E. Aspnes, “Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films,” Opt. Lett.34(18), 2867–2869 (2009).
[CrossRef] [PubMed]

C. Rhodes, M. Cerruti, A. Efremenko, M. Losego, D. E. Aspnes, J. P. Maria, and S. Franzen, “Dependence of plasmon polaritons on the thickness of indium tin oxide thin films,” J. Appl. Phys.103(9), 093108 (2008).
[CrossRef]

C. Rhodes, S. Franzen, J. P. Maria, M. Losego, D. N. Leonard, B. Laughlin, G. Duscher, and S. Weibel, “Surface plasmon resonance in conducting metal oxides,” J. Appl. Phys.100(5), 054905 (2006).
[CrossRef]

Rhodes, C. L.

M. D. Losego, A. Y. Efremenko, C. L. Rhodes, M. G. Cerruti, S. Franzen, and J. P. Maria, “Conductive oxide thin films: Model systems for understanding and controlling surface plasmon resonance,” J. Appl. Phys.106(2), 024903 (2009).
[CrossRef]

C. L. Rhodes, S. Lappi, D. Fischer, S. Sambasivan, J. Genzer, and S. Franzen, “Characterization of monolayer formation on aluminum-doped zinc oxide thin films,” Langmuir24(2), 433–440 (2008).
[CrossRef] [PubMed]

Sahu, D. R.

D. R. Sahu, S. Y. Lin, and J. L. Huang, “ZnO/Ag/ZnO multilayer films for the application of a very low resistance transparent electrode,” Appl. Surf. Sci.252(20), 7509–7514 (2006).
[CrossRef]

D. R. Sahu and J. L. Huang, “Characteristics of ZnO-Cu-ZnO multilayer films on copper layer properties,” Appl. Surf. Sci.253(2), 827–832 (2006).
[CrossRef]

D. R. Sahu and J. L. Huang, “High quality transparent conductive ZnO/Ag/ZnO multilayer films deposited at room temperature,” Thin Solid Films515(3), 876–879 (2006).
[CrossRef]

Saka, H.

M. Sawada, M. Higuchi, S. Kondo, and H. Saka, “Characteristics of indium-tin-oxide/silver/indium-tin-oxide sandwich films and their application to simple-matrix liquid-crystal displays,” Jpn. J. Appl. Phys.40(Part 1, 5A), 3332–3336 (2001).
[CrossRef]

Sambasivan, S.

C. L. Rhodes, S. Lappi, D. Fischer, S. Sambasivan, J. Genzer, and S. Franzen, “Characterization of monolayer formation on aluminum-doped zinc oxide thin films,” Langmuir24(2), 433–440 (2008).
[CrossRef] [PubMed]

Sanjines, R.

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, R. Boukherroub, and S. Szunerits, “Preparation and characterization of antimony-doped SnO2 thin films on gold and silver substrates for electrochemical and surface plasmon resonance studies,” Electrochem. Commun.10(7), 1041–1043 (2008).
[CrossRef]

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M. Sawada, M. Higuchi, S. Kondo, and H. Saka, “Characteristics of indium-tin-oxide/silver/indium-tin-oxide sandwich films and their application to simple-matrix liquid-crystal displays,” Jpn. J. Appl. Phys.40(Part 1, 5A), 3332–3336 (2001).
[CrossRef]

Scharmann, A.

A. Kloppel, W. Kriegseis, B. K. Meyer, A. Scharmann, C. Daube, J. Stollenwerk, and J. Trube, “Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties,” Thin Solid Films365(1), 139–146 (2000).
[CrossRef]

Seelig, W.

M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
[CrossRef]

Selker, M. D.

Shahzad, M.

Shalaev, V. M.

P. R. West, S. Ichii, G. V. Naik, N. K. Emani, V. M. Shalaev, and A. Boltasseva, “Searching for better plasmonic materials,” Laser Photon. Rev.4(6), 795–808 (2010).

Shortreed, M. R.

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

M. R. Lockett, M. F. Phillips, M. R. Shortreed, S. C. Weibel, and L. M. Smith, “Surface plasmon resonance compatible carbon thin films,” Abstr. Pap. Am. Chem. Soc. 233 (2007).

Siddall, G.

L. Holland and G. Siddall, “Heat-reflecting windows using gold and bismuth oxide films,” Br. J. Appl. Phys.9(9), 359–361 (1958).
[CrossRef]

Singh, A. V.

A. V. Singh, R. M. Mehra, A. Yoshida, and A. Wakahara, “Doping mechanism in aluminum doped zinc oxide films,” J. Appl. Phys.95(7), 3640–3643 (2004).
[CrossRef]

Smith, L. M.

M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

M. R. Lockett, M. F. Phillips, M. R. Shortreed, S. C. Weibel, and L. M. Smith, “Surface plasmon resonance compatible carbon thin films,” Abstr. Pap. Am. Chem. Soc. 233 (2007).

Solomon, I.

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

Soref, R.

Stambouli, V.

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, R. Boukherroub, and S. Szunerits, “Preparation and characterization of antimony-doped SnO2 thin films on gold and silver substrates for electrochemical and surface plasmon resonance studies,” Electrochem. Commun.10(7), 1041–1043 (2008).
[CrossRef]

Stollenwerk, J.

A. Kloppel, W. Kriegseis, B. K. Meyer, A. Scharmann, C. Daube, J. Stollenwerk, and J. Trube, “Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties,” Thin Solid Films365(1), 139–146 (2000).
[CrossRef]

M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
[CrossRef]

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A. M. Stoneham, “Systematics of metal-insulator interfacial energies - a new rule for wetting and strong catalyst support interactions,” Appl. Surf. Sci.14(3-4), 249–259 (1983).
[CrossRef]

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M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

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T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
[CrossRef]

Szunerits, S.

L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, C. Jorel, B. Pelissier, M. Pisarek, R. Boukherroub, and S. Szunerits, “Preparation and characterization of silver substrates coated with antimony-doped SnO2 thin films for surface plasmon resonance studies,” Langmuir25(14), 8036–8041 (2009).
[CrossRef] [PubMed]

M. Manesse, R. Sanjines, V. Stambouli, R. Boukherroub, and S. Szunerits, “Preparation and characterization of antimony-doped SnO2 thin films on gold and silver substrates for electrochemical and surface plasmon resonance studies,” Electrochem. Commun.10(7), 1041–1043 (2008).
[CrossRef]

S. Szunerits, X. Castel, and R. Boukherroub, “Surface plasmon resonance investigation of silver and gold films coated with thin indium tin oxide layers: Influence on stability and sensitivity,” J. Phys. Chem. C112(40), 15813–15817 (2008).
[CrossRef]

S. Szunerits and R. Boukherroub, “Preparation and characterization of thin films of SiO(x) on gold substrates for surface plasmon resonance studies,” Langmuir22(4), 1660–1663 (2006).
[CrossRef] [PubMed]

S. Szunerits, Y. Coffinier, S. Janel, and R. Boukherroub, “Stability of the gold/silica thin film interface: Electrochemical and surface plasmon resonance studies,” Langmuir22(25), 10716–10722 (2006).
[CrossRef] [PubMed]

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X. D. Hoa, A. G. Kirk, and M. Tabrizian, “Towards integrated and sensitive surface plasmon resonance biosensors: A review of recent progress,” Biosens. Bioelectron.23(2), 151–160 (2007).
[CrossRef] [PubMed]

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T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
[CrossRef]

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L. Touahir, J. Niedziółka-Jönsson, E. Galopin, R. Boukherroub, A. C. Gouget-Laemmel, I. Solomon, M. Petukhov, J. N. Chazalviel, F. Ozanam, and S. Szunerits, “Surface plasmon resonance on gold and silver films coated with thin layers of amorphous silicon-carbon alloys,” Langmuir26(8), 6058–6065 (2010).
[CrossRef] [PubMed]

Trube, J.

A. Kloppel, W. Kriegseis, B. K. Meyer, A. Scharmann, C. Daube, J. Stollenwerk, and J. Trube, “Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties,” Thin Solid Films365(1), 139–146 (2000).
[CrossRef]

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M. G. Nicholas, T. M. Valentine, and M. J. Waite, “The wetting of alumina by copper alloyed with titanium and other elements,” J. Mater. Sci.15(9), 2197–2206 (1980).
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A. V. Singh, R. M. Mehra, A. Yoshida, and A. Wakahara, “Doping mechanism in aluminum doped zinc oxide films,” J. Appl. Phys.95(7), 3640–3643 (2004).
[CrossRef]

Wang, Z. Z.

K. S. Phillips, J. H. Han, M. Martinez, Z. Z. Wang, D. Carter, and Q. Cheng, “Nanoscale glassification of gold substrates for surface plasmon resonance analysis of protein toxins with supported lipid membranes,” Anal. Chem.78(2), 596–603 (2006).
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Warren, A. P.

T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
[CrossRef]

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C. Rhodes, S. Franzen, J. P. Maria, M. Losego, D. N. Leonard, B. Laughlin, G. Duscher, and S. Weibel, “Surface plasmon resonance in conducting metal oxides,” J. Appl. Phys.100(5), 054905 (2006).
[CrossRef]

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M. R. Lockett, S. C. Weibel, M. F. Phillips, M. R. Shortreed, B. Sun, R. M. Corn, R. J. Hamers, F. Cerrina, and L. M. Smith, “Carbon-on-metal films for surface plasmon resonance detection of DNA arrays,” J. Am. Chem. Soc.130(27), 8611–8613 (2008).
[CrossRef] [PubMed]

M. R. Lockett, M. F. Phillips, M. R. Shortreed, S. C. Weibel, and L. M. Smith, “Surface plasmon resonance compatible carbon thin films,” Abstr. Pap. Am. Chem. Soc. 233 (2007).

Wentzell, S.

West, G. T.

G. T. West, P. J. Kelly, and J. W. Bradley, “A comparison of thin silver films grown onto zinc oxide via conventional magnetron sputtering and HiPIMS deposition,” IEEE Trans. Plasma Sci.38(11), 3057–3061 (2010).
[CrossRef]

West, P. R.

P. R. West, S. Ichii, G. V. Naik, N. K. Emani, V. M. Shalaev, and A. Boltasseva, “Searching for better plasmonic materials,” Laser Photon. Rev.4(6), 795–808 (2010).

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X. Jiang, F. L. Wong, M. K. Fung, and S. T. Lee, “Aluminum-doped zinc oxide films as transparent conductive electrode for organic light-emitting devices,” Appl. Phys. Lett.83(9), 1875–1877 (2003).
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T. Sun, B. Yao, A. P. Warren, K. Barmak, M. F. Toney, R. E. Peale, and K. R. Coffey, “Dominant role of grain boundary scattering in the resistivity of nanometric Cu films,” Phys. Rev. B79(4), 041402 (2009).
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J. Homola, S. S. Yee, and G. Gauglitz, “Surface plasmon resonance sensors: review,” Sensor. Actuat. Biol. Chem.54, 3–15 (1999).

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G. Leftheriotis, P. Yianoulis, and D. Patrikios, “Deposition and optical properties of optimised ZnS/Ag/ZnS thin films for energy saving applications,” Thin Solid Films306(1), 92–99 (1997).
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Yoshida, A.

A. V. Singh, R. M. Mehra, A. Yoshida, and A. Wakahara, “Doping mechanism in aluminum doped zinc oxide films,” J. Appl. Phys.95(7), 3640–3643 (2004).
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X. D. Hoa, A. G. Kirk, and M. Tabrizian, “Towards integrated and sensitive surface plasmon resonance biosensors: A review of recent progress,” Biosens. Bioelectron.23(2), 151–160 (2007).
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L. Holland and G. Siddall, “Heat-reflecting windows using gold and bismuth oxide films,” Br. J. Appl. Phys.9(9), 359–361 (1958).
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M. Manesse, R. Sanjines, V. Stambouli, R. Boukherroub, and S. Szunerits, “Preparation and characterization of antimony-doped SnO2 thin films on gold and silver substrates for electrochemical and surface plasmon resonance studies,” Electrochem. Commun.10(7), 1041–1043 (2008).
[CrossRef]

IEEE Trans. Plasma Sci. (1)

G. T. West, P. J. Kelly, and J. W. Bradley, “A comparison of thin silver films grown onto zinc oxide via conventional magnetron sputtering and HiPIMS deposition,” IEEE Trans. Plasma Sci.38(11), 3057–3061 (2010).
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A. V. Singh, R. M. Mehra, A. Yoshida, and A. Wakahara, “Doping mechanism in aluminum doped zinc oxide films,” J. Appl. Phys.95(7), 3640–3643 (2004).
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J. Mater. Sci. (1)

M. G. Nicholas, T. M. Valentine, and M. J. Waite, “The wetting of alumina by copper alloyed with titanium and other elements,” J. Mater. Sci.15(9), 2197–2206 (1980).
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S. Szunerits and R. Boukherroub, “Preparation and characterization of thin films of SiO(x) on gold substrates for surface plasmon resonance studies,” Langmuir22(4), 1660–1663 (2006).
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M. Bender, W. Seelig, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, “Dependence of film composition and thicknesses on optical and electrical properties of ITO-metal-ITO multilayers,” Thin Solid Films326(1-2), 67–71 (1998).
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A. Kloppel, W. Kriegseis, B. K. Meyer, A. Scharmann, C. Daube, J. Stollenwerk, and J. Trube, “Dependence of the electrical and optical behaviour of ITO-silver-ITO multilayers on the silver properties,” Thin Solid Films365(1), 139–146 (2000).
[CrossRef]

K. Fukuda, S. H. N. Lim, and A. Anders, “Coalescence of magnetron-sputtered silver islands affected by transition metal seeding (Ni, Cr, Nb, Zr, Mo, W, Ta) and other parameters,” Thin Solid Films516(14), 4546–4552 (2008).
[CrossRef]

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Other (6)

J. Ã. Homola and M. Piliarik, “Surface plasmon resonance (SPR) sensors” in Surface Plasmon Resonance Based Sensors, O. S. Wolfbeis, ed. (Springer Berlin Heidelberg, 2006), 45–67.

S. I. Bozhevolnyi, Plasmonic nanoguides and circuits (Pan Stanford, 2009)

B. G. Streetman, Solid State Electronic Devices (Prentice-Hall, Englewood Cliffs, N.J., 1980).

D. J. Segelstein, “The complex refractive index of water,” Thesis (M.S.), Dept. of Physics. University of Missouri, Kansas City (1981).

O. S. Heavens, Optical Properties of Thin Solid Films (Butterworths Scientific Publications, 1955).

H. A. Macleod, Thin-Film Optical Filters (CRC Press/Taylor & Francis, 2010), Chap. 2.

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Figures (4)

Fig. 1
Fig. 1

Experimental (left) and theoretical (right) FTIR-SPR spectra from 4200 cm−1 to 11000 cm−1 (2.38 μm to 0.909 μm) for (A) the 23 nm AZO / 5 nm Ag / 23 nm AZO film, (B) the 23 nm AZO / 10 nm Ag / 23 nm AZO film, (C) the 23 nm AZO / 11.2 nm Ag / 23nm AZO film, and (D) the 42.0 nm AZO / 13.9 nm Ag / 22.4 nm AZO film. The summary for all films is shown in Table 1.

Fig. 2
Fig. 2

Experimental (left) and theoretical (right) FTIR-SPR spectra from 4200 cm−1 to 11000 cm−1 (2.38 μm to 0.909 μm) for (A) the 21.5 nm AZO / 15.8 nm Ag / 48.5 nm AZO film, (B) the 27.5 nm AZO / 20.0 nm Ag / 27.1 nm AZO film, (C) the 23 nm AZO / 30 nm Ag / 23nm AZO film, and (D) the 23 nm AZO / 50 nm Ag / 23 nm AZO film. The summary for all films is shown in Table 1.

Fig. 3
Fig. 3

Complex dielectric function (ε = ε1 + 2) for bulk silver from 4000 to 11290 cm−1 wavenumber (2.5 μm to 0.886 μm wavelength), from the following data sources: ATI: Acree Tech Inc.; Sopra: Sopra S. A. Database; Ordal: Ordal, et al. [58]; J&C: Johnson and Christy [59]. Model: Drude model fit, using the means across data sources of the parameters ε, ωp, and Γ given by the method in the text. The reported R2 values are the averages. SPR: Average result from SPR modeling (cf. Table 1).

Fig. 4
Fig. 4

UV-vis transmission spectra of the AZO/Ag/AZO films.

Tables (2)

Tables Icon

Table 1 Summary of fitted parameters for the AZO/Ag/AZO films

Tables Icon

Table 2 Estimated sensitivities of the films to refractive index changes. Sensitivities expressed in units per refractive index unit (RIU): Sθ: angle interrogation, Sν: wavenumber interrogation, Sλ: wavelength interrogation.

Equations (6)

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ε Ag = ε + ω p 2 iωΓ ω 2
ε 1 = ε ω p 2 Γ 2 + ω 2
ε 2 = ω p 2 Γ Γ 2 ω+ ω 3
Q=2( R ε 1 2 + R ε 2 2 )
R 2 =1 i ( y i y ^ i ) 2 i ( y i y ¯ ) 2
Γ= e mμ

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