H. Fu, S. Khijwania, H. Au, X. Dong, H. Tam, P. Wai, and C. Lu, “Novel fiber optic polarimetric torsion sensor based on polarization- maintaining photonic crystal fiber,” in Proceedings of SPIE - The International Society for Optical Engineering (2008).
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
A. Sirenko, C. Bernhard, A. Golnik, A. Clark, J. Hao, W. Si, and X. Xi, “Soft-mode hardening in SrTiO3 thin films,” Nature 404(6776), 373–376 (2000).
[Crossref]
[PubMed]
E. Louis, A. Yakshin, T. Tsarfati, and F. Bijkerk, “Nanometer interface and materials control for multilayer EUV-optical applications,” Prog. Surface Sci. , 1–40 (2011).
[Crossref]
J. Chen, C. Lee, E. Louis, F. Bijkerk, R. Kunze, H. Schmidt, D. Schneider, and R. Moors, “Characterization of EUV induced carbon films using laser-generated surface acoustic waves,” Diamond Relat. Mater. 18(5–8), 768–771 (2009).
[Crossref]
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
K. Ragil, J. Meunier, D. Broseta, J. Indekeu, and D. Bonn, “Experimental observation of critical wetting,” Phys. Rev. Lett. 77(8), 1532–1535 (1996).
[Crossref]
[PubMed]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
B. Gompf, J. Braun, T. Weiss, H. Giessen, M. Dressel, and U. Huebner, “Periodic nanostructures: Spatial dispersion mimics chirality,” Phys. Rev. Lett. 106(18), 185501 (2011).
[Crossref]
[PubMed]
C. Striebel, A. Brecht, and G. Gauglitz, “Characterization of biomembranes by spectral ellipsometry, surface plasmon resonance and interferometry with regard to biosensor application,” Biosens. Bioelectron. 9, 139–146 (1994).
[Crossref]
[PubMed]
K. Ragil, J. Meunier, D. Broseta, J. Indekeu, and D. Bonn, “Experimental observation of critical wetting,” Phys. Rev. Lett. 77(8), 1532–1535 (1996).
[Crossref]
[PubMed]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
J. Chen, C. Lee, E. Louis, F. Bijkerk, R. Kunze, H. Schmidt, D. Schneider, and R. Moors, “Characterization of EUV induced carbon films using laser-generated surface acoustic waves,” Diamond Relat. Mater. 18(5–8), 768–771 (2009).
[Crossref]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
A. Sirenko, C. Bernhard, A. Golnik, A. Clark, J. Hao, W. Si, and X. Xi, “Soft-mode hardening in SrTiO3 thin films,” Nature 404(6776), 373–376 (2000).
[Crossref]
[PubMed]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
Z. Dai, X. Zhang, Z. Peng, J. Li, Z. Ou, and Y. Liu, “Distributed fiber optic stress sensor system based on P-OFDR,” in Proceedings of SPIE - The International Society for Optical Engineering (2010).
E. Kim, D. Dave, and T. E. Milner, “Fiber-optic spectral polarimeter using a broadband swept laser source,” Opt. Commun. 249(1–3), 351–356 (2005).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
P. Hauge and F. Dill, “A rotating-compensator fourier ellipsometer,” Opt. Commun. 14(4), 431–437 (1975).
[Crossref]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
H. Fu, S. Khijwania, H. Au, X. Dong, H. Tam, P. Wai, and C. Lu, “Novel fiber optic polarimetric torsion sensor based on polarization- maintaining photonic crystal fiber,” in Proceedings of SPIE - The International Society for Optical Engineering (2008).
B. Gompf, J. Braun, T. Weiss, H. Giessen, M. Dressel, and U. Huebner, “Periodic nanostructures: Spatial dispersion mimics chirality,” Phys. Rev. Lett. 106(18), 185501 (2011).
[Crossref]
[PubMed]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
H. Fu, S. Khijwania, H. Au, X. Dong, H. Tam, P. Wai, and C. Lu, “Novel fiber optic polarimetric torsion sensor based on polarization- maintaining photonic crystal fiber,” in Proceedings of SPIE - The International Society for Optical Engineering (2008).
C. Striebel, A. Brecht, and G. Gauglitz, “Characterization of biomembranes by spectral ellipsometry, surface plasmon resonance and interferometry with regard to biosensor application,” Biosens. Bioelectron. 9, 139–146 (1994).
[Crossref]
[PubMed]
B. Gompf, J. Braun, T. Weiss, H. Giessen, M. Dressel, and U. Huebner, “Periodic nanostructures: Spatial dispersion mimics chirality,” Phys. Rev. Lett. 106(18), 185501 (2011).
[Crossref]
[PubMed]
N. Gisin, G. Ribordy, W. Tittel, and H. Zbinden, “Quantum cryptography,” Rev. Mod. Phys. 74(1), 145–195 (2002).
[Crossref]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
A. Sirenko, C. Bernhard, A. Golnik, A. Clark, J. Hao, W. Si, and X. Xi, “Soft-mode hardening in SrTiO3 thin films,” Nature 404(6776), 373–376 (2000).
[Crossref]
[PubMed]
B. Gompf, J. Braun, T. Weiss, H. Giessen, M. Dressel, and U. Huebner, “Periodic nanostructures: Spatial dispersion mimics chirality,” Phys. Rev. Lett. 106(18), 185501 (2011).
[Crossref]
[PubMed]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
A. Sirenko, C. Bernhard, A. Golnik, A. Clark, J. Hao, W. Si, and X. Xi, “Soft-mode hardening in SrTiO3 thin films,” Nature 404(6776), 373–376 (2000).
[Crossref]
[PubMed]
P. Hauge and F. Dill, “A rotating-compensator fourier ellipsometer,” Opt. Commun. 14(4), 431–437 (1975).
[Crossref]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
B. Gompf, J. Braun, T. Weiss, H. Giessen, M. Dressel, and U. Huebner, “Periodic nanostructures: Spatial dispersion mimics chirality,” Phys. Rev. Lett. 106(18), 185501 (2011).
[Crossref]
[PubMed]
K. Ragil, J. Meunier, D. Broseta, J. Indekeu, and D. Bonn, “Experimental observation of critical wetting,” Phys. Rev. Lett. 77(8), 1532–1535 (1996).
[Crossref]
[PubMed]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
J. Xue, C. Jung, and M. Kim, “Phase-transitions Of liquid-crystal films on an air-water-interface,” Phys. Rev. Lett. 69(3), 474–477 (1992).
[Crossref]
[PubMed]
A. H. Gnauck, G. Charlet, P. Tran, P. J. Winzer, C. R. Doerr, J. C. Centanni, E. C. Burrows, T. Kawanishi, T. Sakamoto, and K. Higuma, “25.6-Tb/s WDM transmission of polarization-multiplexed RZ-DQPSK signals,” J. Lightwave Technol. 26(1), 79–84 (2008).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
H. Fu, S. Khijwania, H. Au, X. Dong, H. Tam, P. Wai, and C. Lu, “Novel fiber optic polarimetric torsion sensor based on polarization- maintaining photonic crystal fiber,” in Proceedings of SPIE - The International Society for Optical Engineering (2008).
E. Kim, D. Dave, and T. E. Milner, “Fiber-optic spectral polarimeter using a broadband swept laser source,” Opt. Commun. 249(1–3), 351–356 (2005).
[Crossref]
J. Xue, C. Jung, and M. Kim, “Phase-transitions Of liquid-crystal films on an air-water-interface,” Phys. Rev. Lett. 69(3), 474–477 (1992).
[Crossref]
[PubMed]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
J. Chen, C. Lee, E. Louis, F. Bijkerk, R. Kunze, H. Schmidt, D. Schneider, and R. Moors, “Characterization of EUV induced carbon films using laser-generated surface acoustic waves,” Diamond Relat. Mater. 18(5–8), 768–771 (2009).
[Crossref]
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
J. Chen, C. Lee, E. Louis, F. Bijkerk, R. Kunze, H. Schmidt, D. Schneider, and R. Moors, “Characterization of EUV induced carbon films using laser-generated surface acoustic waves,” Diamond Relat. Mater. 18(5–8), 768–771 (2009).
[Crossref]
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
H. Rhee, Y.-G. June, J.-S. Lee, K.-K. Lee, J.-H. Ha, Z. H. Kim, S.-J. Jeon, and M. Cho, “Femtosecond characterization of vibrational optical activity of chiral molecules,” Nature 458(7236), 310–313 (2009).
[Crossref]
[PubMed]
Z. Dai, X. Zhang, Z. Peng, J. Li, Z. Ou, and Y. Liu, “Distributed fiber optic stress sensor system based on P-OFDR,” in Proceedings of SPIE - The International Society for Optical Engineering (2010).
Z. Dai, X. Zhang, Z. Peng, J. Li, Z. Ou, and Y. Liu, “Distributed fiber optic stress sensor system based on P-OFDR,” in Proceedings of SPIE - The International Society for Optical Engineering (2010).
E. Louis, A. Yakshin, T. Tsarfati, and F. Bijkerk, “Nanometer interface and materials control for multilayer EUV-optical applications,” Prog. Surface Sci. , 1–40 (2011).
[Crossref]
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
J. Chen, C. Lee, E. Louis, F. Bijkerk, R. Kunze, H. Schmidt, D. Schneider, and R. Moors, “Characterization of EUV induced carbon films using laser-generated surface acoustic waves,” Diamond Relat. Mater. 18(5–8), 768–771 (2009).
[Crossref]
H. Fu, S. Khijwania, H. Au, X. Dong, H. Tam, P. Wai, and C. Lu, “Novel fiber optic polarimetric torsion sensor based on polarization- maintaining photonic crystal fiber,” in Proceedings of SPIE - The International Society for Optical Engineering (2008).
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
K. Ragil, J. Meunier, D. Broseta, J. Indekeu, and D. Bonn, “Experimental observation of critical wetting,” Phys. Rev. Lett. 77(8), 1532–1535 (1996).
[Crossref]
[PubMed]
E. Kim, D. Dave, and T. E. Milner, “Fiber-optic spectral polarimeter using a broadband swept laser source,” Opt. Commun. 249(1–3), 351–356 (2005).
[Crossref]
J. Chen, C. Lee, E. Louis, F. Bijkerk, R. Kunze, H. Schmidt, D. Schneider, and R. Moors, “Characterization of EUV induced carbon films using laser-generated surface acoustic waves,” Diamond Relat. Mater. 18(5–8), 768–771 (2009).
[Crossref]
J. Chen, E. Louis, C. J. Lee, H. Wormeester, R. Kunze, H. Schmidt, D. Schneider, R. Moors, W. van Schaik, M. Lubomska, and F. Bijkerk, “Detection and characterization of carbon contamination on EUV multilayer mirrors,” Opt. Express 17(19), 16969–16979 (2009).
[Crossref]
[PubMed]
A. V. Boris, Y. Matiks, E. Benckiser, A. Frano, P. Popovich, V. Hinkov, P. Wochner, M. Castro-Colin, E. Detemple, V. K. Malik, C. Bernhard, T. Prokscha, A. Suter, Z. Salman, E. Morenzoni, G. Cristiani, H.-U. Habermeier, and B. Keimer, “Dimensionality Control of Electronic Phase Transitions in Nickel-Oxide Superlattices,” Science 332(6032), 940–943 (2011).
[Crossref]
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
[Crossref]
Z. Dai, X. Zhang, Z. Peng, J. Li, Z. Ou, and Y. Liu, “Distributed fiber optic stress sensor system based on P-OFDR,” in Proceedings of SPIE - The International Society for Optical Engineering (2010).
B. Johs, C. Herzinger, J. Dinan, A. Cornfeld, J. Benson, D. Doctor, G. Olson, I. Ferguson, M. Pelczynski, P. Chow, C. Kuo, and S. Johnson, “Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry,” Thin Solid Films 313–314, 490–495 (1998).
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