Abstract

Damage tests are carried out at 1064nm to measure the laser resistance of TiO2/Al2O3and HfO2/Al2O3 antireflection coatings grown by atomic layer deposition (ALD). The damage results are determined by S-on-1 and R-on-1 tests. Interestingly, the damage performance of ALD coatings is similar to those grown by conventional e-beam evaporation process. A decline law of damage resistance under multiple irradiations is revealed. The influence of growth temperature on damage performance has been investigated. Result shows that the crystallization of TiO2 layer at higher temperature could lead to numerous absorption defects that reduce the laser-induced damage threshold (LIDT). In addition, it has been found that using inorganic compound instead of organic compound as precursors for ALD process maybe effectively prevent carbon impurities in films and will increase the LIDT obviously.

© 2012 OSA

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    [CrossRef]
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    [CrossRef]
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2011 (2)

2010 (3)

J. Maula, “Atomic layer deposition (ALD) for optical nanofabrication,” Proc. SPIE 7591, 75910S, 75910S-15 (2010).
[CrossRef]

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

2009 (3)

2008 (3)

M. Mero, L. A. Emmert, and W. Rudolph, “The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films,” Proc. SPIE 7132, 713209, 713209-10 (2008).
[CrossRef]

T. Pilvi, M. Ritala, M. Leskelä, M. Bischoff, U. Kaiser, and N. Kaiser, “Atomic layer deposition process with TiF4 as a precursor for depositing metal fluoride thin films,” Appl. Opt. 47(13), C271–C274 (2008).
[CrossRef] [PubMed]

N. B. Abaffy, P. Evans, G. Triani, and D. McCulloch, “Multilayer alumina and titania optical coatings prepared by atomic layer deposition,” Proc. SPIE 7041, 70419 (2008).

2007 (1)

2005 (2)

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

2004 (1)

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

2003 (1)

E. I. Moses, J. H. Campbell, C. J. Stolz, and C. R. Wuest, “The national ignition facility: the world’s largest optics and laser system,” Proc. SPIE 5001, 1–15 (2003).
[CrossRef]

2002 (3)

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

L. Gallais, J. Y. Natoli, and C. Amra, “Statistical study of single and multiple pulse laser-induced damage in glasses,” Opt. Express 10(25), 1465–1474 (2002).
[PubMed]

1999 (1)

M. Ritala and M. Leskelä, “Atomic layer epitaxy—a valuable tool for nanotechnology?” Nanotechnology 10(1), 19–24 (1999).
[CrossRef]

1997 (1)

J. DiJon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers: a key point in laser damage thin films,” Proc. SPIE 2966, 315–325 (1997).
[CrossRef]

Abaffy, N. B.

N. B. Abaffy, P. Evans, G. Triani, and D. McCulloch, “Multilayer alumina and titania optical coatings prepared by atomic layer deposition,” Proc. SPIE 7041, 70419 (2008).

Allenspacher, P.

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

Amra, C.

Arenberg, J.

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

Arenberg, J. W.

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

J. W. Arenberg, “Life testing for laser optics: a first look,” Proc. SPIE 7504, 7504I (2009).

Avrutsky, I.

Bischoff, M.

Brunner, R.

Campbell, J. H.

E. I. Moses, J. H. Campbell, C. J. Stolz, and C. R. Wuest, “The national ignition facility: the world’s largest optics and laser system,” Proc. SPIE 5001, 1–15 (2003).
[CrossRef]

Chen, S. L.

Ciapponi, A.

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

Clark-Phelps, R. B.

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

Desrumaux, C.

J. DiJon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers: a key point in laser damage thin films,” Proc. SPIE 2966, 315–325 (1997).
[CrossRef]

DiJon, J.

J. DiJon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers: a key point in laser damage thin films,” Proc. SPIE 2966, 315–325 (1997).
[CrossRef]

Ding, T.

Emmert, L. A.

M. Mero, L. A. Emmert, and W. Rudolph, “The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films,” Proc. SPIE 7132, 713209, 713209-10 (2008).
[CrossRef]

Evans, P.

N. B. Abaffy, P. Evans, G. Triani, and D. McCulloch, “Multilayer alumina and titania optical coatings prepared by atomic layer deposition,” Proc. SPIE 7041, 70419 (2008).

Gabriel, N. T.

Gallais, L.

Gösele, U.

Grigonis, R.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Helgert, M.

Herringer, J.

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

Heyroth, F.

Jiao, H. F.

Jitsuno, T.

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

Kaiser, N.

Kaiser, U.

Kim, S. S.

Knez, M.

Kumar, P.

Kuzma, D.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Leskelä, M.

Liu, H.

Liu, J.

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

Liu, Z. C.

Londergan, A. R.

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

Maula, J.

J. Maula, “Atomic layer deposition (ALD) for optical nanofabrication,” Proc. SPIE 7591, 75910S, 75910S-15 (2010).
[CrossRef]

McCulloch, D.

N. B. Abaffy, P. Evans, G. Triani, and D. McCulloch, “Multilayer alumina and titania optical coatings prepared by atomic layer deposition,” Proc. SPIE 7041, 70419 (2008).

Melninkaitis, A.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Mero, M.

M. Mero, L. A. Emmert, and W. Rudolph, “The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films,” Proc. SPIE 7132, 713209, 713209-10 (2008).
[CrossRef]

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

Miksys, D.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Moses, E. I.

E. I. Moses, J. H. Campbell, C. J. Stolz, and C. R. Wuest, “The national ignition facility: the world’s largest optics and laser system,” Proc. SPIE 5001, 1–15 (2003).
[CrossRef]

Motokoshi, S.

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

Nakatsuka, M.

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

Natoli, J. Y.

Papernov, S.

S. Papernov and A. W. Schmid, “Laser-induced surface damage of optical materials: Absorption sources, initiation, growth, and mitigation,” Proc. SPIE7132, 71321J (2008).

Pilvi, T.

Poiroux, T.

J. DiJon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers: a key point in laser damage thin films,” Proc. SPIE 2966, 315–325 (1997).
[CrossRef]

Riede, W.

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

Ristau, D.

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

Ritala, M.

Rudolph, W.

M. Mero, L. A. Emmert, and W. Rudolph, “The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films,” Proc. SPIE 7132, 713209, 713209-10 (2008).
[CrossRef]

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

Schmid, A. W.

S. Papernov and A. W. Schmid, “Laser-induced surface damage of optical materials: Absorption sources, initiation, growth, and mitigation,” Proc. SPIE7132, 71321J (2008).

Seidel, T. E.

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

Sheng, O. Y.

Sirutkaitis, V.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Skokov, G.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Sneh, O.

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

Song, W. B.

Starke, K.

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

Stolz, C. J.

E. I. Moses, J. H. Campbell, C. J. Stolz, and C. R. Wuest, “The national ignition facility: the world’s largest optics and laser system,” Proc. SPIE 5001, 1–15 (2003).
[CrossRef]

Szeghalmi, A.

Talghader, J. J.

Triani, G.

N. B. Abaffy, P. Evans, G. Triani, and D. McCulloch, “Multilayer alumina and titania optical coatings prepared by atomic layer deposition,” Proc. SPIE 7041, 70419 (2008).

Tumosa, D.

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

Wei, Y. W.

Wiedmann, M. K.

Winkler, J.

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

Winter, C. H.

Wuest, C. R.

E. I. Moses, J. H. Campbell, C. J. Stolz, and C. R. Wuest, “The national ignition facility: the world’s largest optics and laser system,” Proc. SPIE 5001, 1–15 (2003).
[CrossRef]

Yamanaka, T.

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

Yang, L. L.

Zaitsu, S.

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

Zhang, Q.

Appl. Opt. (4)

Jpn. J. Appl. Phys. (2)

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Laser damage properties of optical coatings with nanoscale layers grown by atomic layer deposition,” Jpn. J. Appl. Phys. 43(3), 1034–1035 (2004).
[CrossRef]

S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, and T. Yamanaka, “Large-area optical coatings with uniform thickness grown by surface chemical reactions for high-power laser applications,” Jpn. J. Appl. Phys. 41(Part 1, No. 1), 160–165 (2002).
[CrossRef]

Nanotechnology (1)

M. Ritala and M. Leskelä, “Atomic layer epitaxy—a valuable tool for nanotechnology?” Nanotechnology 10(1), 19–24 (1999).
[CrossRef]

Opt. Express (3)

Phys. Rev. B (1)

M. Mero, J. Liu, W. Rudolph, D. Ristau, and K. Starke, “Scaling laws of femtosecond laser pulse induced breakdown in oxide films,” Phys. Rev. B 71(11), 115109 (2005).
[CrossRef]

Proc. SPIE (9)

J. Maula, “Atomic layer deposition (ALD) for optical nanofabrication,” Proc. SPIE 7591, 75910S, 75910S-15 (2010).
[CrossRef]

N. B. Abaffy, P. Evans, G. Triani, and D. McCulloch, “Multilayer alumina and titania optical coatings prepared by atomic layer deposition,” Proc. SPIE 7041, 70419 (2008).

J. DiJon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers: a key point in laser damage thin films,” Proc. SPIE 2966, 315–325 (1997).
[CrossRef]

A. Ciapponi, P. Allenspacher, W. Riede, J. Herringer, and J. Arenberg, “S on 1 testing of AR and HR designs at 1064nm,” Proc. SPIE 7842, 78420J, 78420J-6 (2010).
[CrossRef]

A. Melninkaitis, D. Miksys, R. Grigonis, V. Sirutkaitis, D. Tumosa, G. Skokov, and D. Kuzma, “Multiple pulse laser-induced damage of antireflection coated lithium triborate,” Proc. SPIE 5963, 59631I, 59631I-8 (2005).
[CrossRef]

M. Mero, L. A. Emmert, and W. Rudolph, “The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films,” Proc. SPIE 7132, 713209, 713209-10 (2008).
[CrossRef]

J. W. Arenberg, “Life testing for laser optics: a first look,” Proc. SPIE 7504, 7504I (2009).

J. W. Arenberg, W. Riede, A. Ciapponi, P. Allenspacher, and J. Herringer, “An empirical investigation of the laser survivability curve,” Proc. SPIE 7842, 78421B, 78421B-8 (2010).
[CrossRef]

E. I. Moses, J. H. Campbell, C. J. Stolz, and C. R. Wuest, “The national ignition facility: the world’s largest optics and laser system,” Proc. SPIE 5001, 1–15 (2003).
[CrossRef]

Thin Solid Films (1)

O. Sneh, R. B. Clark-Phelps, A. R. Londergan, J. Winkler, and T. E. Seidel, “Thin film atomic layer deposition equipment for semiconductor processing,” Thin Solid Films 402(1-2), 248–261 (2002).
[CrossRef]

Other (1)

S. Papernov and A. W. Schmid, “Laser-induced surface damage of optical materials: Absorption sources, initiation, growth, and mitigation,” Proc. SPIE7132, 71321J (2008).

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