Abstract

CMOS image sensors (CIS) are promising candidates as part of optical imagers for the plasma diagnostics devoted to the study of fusion by inertial confinement. However, the harsh radiative environment of Megajoule Class Lasers threatens the performances of these optical sensors. In this paper, the vulnerability of CIS to the transient and mixed pulsed radiation environment associated with such facilities is investigated during an experiment at the OMEGA facility at the Laboratory for Laser Energetics (LLE), Rochester, NY, USA. The transient and permanent effects of the 14 MeV neutron pulse on CIS are presented. The behavior of the tested CIS shows that active pixel sensors (APS) exhibit a better hardness to this harsh environment than a CCD. A first order extrapolation of the reported results to the higher level of radiation expected for Megajoule Class Laser facilities (Laser Megajoule in France or National Ignition Facility in the USA) shows that temporarily saturated pixels due to transient neutron-induced single event effects will be the major issue for the development of radiation-tolerant plasma diagnostic instruments whereas the permanent degradation of the CIS related to displacement damage or total ionizing dose effects could be reduced by applying well known mitigation techniques.

© 2012 OSA

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2011

2010

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

2008

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

2004

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

2003

J. Bogaerts, B. Dierickx, G. Meynants, and D. Uwaerts, “Total dose and displacement damage effects in a radiation-hardened CMOS APS,” IEEE Trans. Electron. Dev.50(1), 84–90 (2003).
[CrossRef]

J. R. Srour, C. J. Marshall, and P. W. Marshall, “Review of displacement damage effects in silicon devices,” IEEE Trans. Nucl. Sci.50(3), 653–670 (2003).
[CrossRef]

A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, “Single particle dark current spikes induced in CCDs by high energy neutrons,” IEEE Trans. Nucl. Sci.50(6), 2011–2017 (2003).
[CrossRef]

P. E. Dodd and L. W. Massengill, “Basic mechanisms and modeling of single-event upset in digital microelectronics,” IEEE Trans. Nucl. Sci.50(3), 583–602 (2003).
[CrossRef]

2002

J. Baggio, M. Martinez, C. D'hose, and O. Musseau, “Analysis of transient effects induced by neutrons on a CCD image sensor,” Proc. SPIE4547, 105–115 (2002).
[CrossRef]

2000

J. R. Srour and D. H. Lo, “Universal damage factor for radiation-induced dark current in silicon devices,” IEEE Trans. Nucl. Sci.47(6), 2451–2459 (2000).
[CrossRef]

G. R. Hopkinson, “Radiation effects in a CMOS active pixel sensor,” IEEE Trans. Nucl. Sci.47(6), 2480–2484 (2000).
[CrossRef]

1999

E. Pailharey, J. Baggio, C. D'hose, and O. Musseau, “Reliability of 1300 nm laser diode for space applications,” Proc. SPIE3872, 139–147 (1999).
[CrossRef]

1998

Y. Tanimura and T. Iida, “Effects of DD and DT neutron irradiation on some Si devices for fusion diagnostics,” J. Nucl. Mater.258(263), 1812–1816 (1998).
[CrossRef]

1997

E. R. Fossum, “CMOS image sensors: Electronic camera-on-a-chip,” IEEE Trans. Electron. Dev.44(10), 1689–1698 (1997).
[CrossRef]

1993

I. Hopkins and G. Hopkinson, “Random telegraph signals from proton-irradiated CCDs,” IEEE Trans. Nucl. Sci.40(6), 1567–1574 (1993).
[CrossRef]

1986

G. Yates and B. Turko, “Circumvention of radiation-induced noise in CCD and CID imagers,” IEEE Trans. Nucl. Sci.33(1), 2214–2222 (1986).

1978

J. Killiany, “Radiation effects on silicon charge-coupled devices,” IEEE Trans. Compon., Hybrids, Manuf. Technol.1, 353–365 (1978).

Allouche, V.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Armstrong, J. R.

A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, “Single particle dark current spikes induced in CCDs by high energy neutrons,” IEEE Trans. Nucl. Sci.50(6), 2011–2017 (2003).
[CrossRef]

Aubard, F.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Baggio, J.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

J. Baggio, M. Martinez, C. D'hose, and O. Musseau, “Analysis of transient effects induced by neutrons on a CCD image sensor,” Proc. SPIE4547, 105–115 (2002).
[CrossRef]

E. Pailharey, J. Baggio, C. D'hose, and O. Musseau, “Reliability of 1300 nm laser diode for space applications,” Proc. SPIE3872, 139–147 (1999).
[CrossRef]

Bardoux, A.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Bayer, C.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Bazzoli, S.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Bertron, I.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Bigot, L.

Bogaerts, J.

J. Bogaerts, B. Dierickx, G. Meynants, and D. Uwaerts, “Total dose and displacement damage effects in a radiation-hardened CMOS APS,” IEEE Trans. Electron. Dev.50(1), 84–90 (2003).
[CrossRef]

Bonneau, F.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Bouazaoui, M.

Boukenter, A.

Bourgade, J. L.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Boutin, J. Y.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Caillaud, T.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Chevalier, J. M.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Chollet, C.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

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J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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S. Girard, Y. Ouerdane, M. Bouazaoui, C. Marcandella, A. Boukenter, L. Bigot, and A. Kudlinski, “Transient radiation-induced effects on solid core microstructured optical fibers,” Opt. Express19(22), 21760–21767 (2011), http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-22-21760 .
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C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Glebov, V.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Glebov, V. Y.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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Goiffon, V.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Gomme, J. C.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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Gommé, J. C.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Gontier, D.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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Hodgson, E. R.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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Hopkinson, G. R.

G. R. Hopkinson, “Radiation effects in a CMOS active pixel sensor,” IEEE Trans. Nucl. Sci.47(6), 2480–2484 (2000).
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J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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Inguimbert, C.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

Jaanimagi, P.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Jacquet, H. P.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Jadaud, J. P.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Jones, R.

A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, “Single particle dark current spikes induced in CCDs by high energy neutrons,” IEEE Trans. Nucl. Sci.50(6), 2011–2017 (2003).
[CrossRef]

Killiany, J.

J. Killiany, “Radiation effects on silicon charge-coupled devices,” IEEE Trans. Compon., Hybrids, Manuf. Technol.1, 353–365 (1978).

King, D. B. S.

A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, “Single particle dark current spikes induced in CCDs by high energy neutrons,” IEEE Trans. Nucl. Sci.50(6), 2011–2017 (2003).
[CrossRef]

Kudlinski, A.

Landoas, O.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Le Tonqueze, Y.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Legendre, J.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Leray, J. L.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Lerche, R. A.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Lo, D. H.

J. R. Srour and D. H. Lo, “Universal damage factor for radiation-induced dark current in silicon devices,” IEEE Trans. Nucl. Sci.47(6), 2451–2459 (2000).
[CrossRef]

Magnan, P.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Malaise, F.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Marcandella, C.

Marmoret, R.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Maroni, R.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Marshall, C. J.

J. R. Srour, C. J. Marshall, and P. W. Marshall, “Review of displacement damage effects in silicon devices,” IEEE Trans. Nucl. Sci.50(3), 653–670 (2003).
[CrossRef]

Marshall, F. J.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Marshall, P. W.

J. R. Srour, C. J. Marshall, and P. W. Marshall, “Review of displacement damage effects in silicon devices,” IEEE Trans. Nucl. Sci.50(3), 653–670 (2003).
[CrossRef]

Martinez, M.

J. Baggio, M. Martinez, C. D'hose, and O. Musseau, “Analysis of transient effects induced by neutrons on a CCD image sensor,” Proc. SPIE4547, 105–115 (2002).
[CrossRef]

Masclet-Gobin, I.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Massengill, L. W.

P. E. Dodd and L. W. Massengill, “Basic mechanisms and modeling of single-event upset in digital microelectronics,” IEEE Trans. Nucl. Sci.50(3), 583–602 (2003).
[CrossRef]

Meyerhofer, D. D.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Meynants, G.

J. Bogaerts, B. Dierickx, G. Meynants, and D. Uwaerts, “Total dose and displacement damage effects in a radiation-hardened CMOS APS,” IEEE Trans. Electron. Dev.50(1), 84–90 (2003).
[CrossRef]

Miquel, J. L.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Moreau, N.

A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, “Single particle dark current spikes induced in CCDs by high energy neutrons,” IEEE Trans. Nucl. Sci.50(6), 2011–2017 (2003).
[CrossRef]

Moutrie, M. J.

A. M. Chugg, R. Jones, M. J. Moutrie, J. R. Armstrong, D. B. S. King, and N. Moreau, “Single particle dark current spikes induced in CCDs by high energy neutrons,” IEEE Trans. Nucl. Sci.50(6), 2011–2017 (2003).
[CrossRef]

Musseau, O.

J. Baggio, M. Martinez, C. D'hose, and O. Musseau, “Analysis of transient effects induced by neutrons on a CCD image sensor,” Proc. SPIE4547, 105–115 (2002).
[CrossRef]

E. Pailharey, J. Baggio, C. D'hose, and O. Musseau, “Reliability of 1300 nm laser diode for space applications,” Proc. SPIE3872, 139–147 (1999).
[CrossRef]

Negre, J. P.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Ouerdane, Y.

Pailharey, E.

E. Pailharey, J. Baggio, C. D'hose, and O. Musseau, “Reliability of 1300 nm laser diode for space applications,” Proc. SPIE3872, 139–147 (1999).
[CrossRef]

Petit, S.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Pien, G.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Raimbourg, J.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Reverdin, C.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Richard, A.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Rolland, G.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Rosch, R.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Rubins de Cervens, D.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Saint-Pe, O.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

Saint-Pé, O.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Sangster, C. T.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Sangster, T. C.

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Seaux, J. P.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Shmayda, W.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Soullie, G.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Srour, J. R.

J. R. Srour, C. J. Marshall, and P. W. Marshall, “Review of displacement damage effects in silicon devices,” IEEE Trans. Nucl. Sci.50(3), 653–670 (2003).
[CrossRef]

J. R. Srour and D. H. Lo, “Universal damage factor for radiation-induced dark current in silicon devices,” IEEE Trans. Nucl. Sci.47(6), 2451–2459 (2000).
[CrossRef]

Stoeckl, C.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Tanimura, Y.

Y. Tanimura and T. Iida, “Effects of DD and DT neutron irradiation on some Si devices for fusion diagnostics,” J. Nucl. Mater.258(263), 1812–1816 (1998).
[CrossRef]

Thfoin, I.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Troussel, P.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Turko, B.

G. Yates and B. Turko, “Circumvention of radiation-induced noise in CCD and CID imagers,” IEEE Trans. Nucl. Sci.33(1), 2214–2222 (1986).

Uwaerts, D.

J. Bogaerts, B. Dierickx, G. Meynants, and D. Uwaerts, “Total dose and displacement damage effects in a radiation-hardened CMOS APS,” IEEE Trans. Electron. Dev.50(1), 84–90 (2003).
[CrossRef]

Videau, L.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

Villette, B.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
[CrossRef]

Virmontois, C.

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, C. Inguimbert, S. Petit, G. Rolland, and O. Saint-Pe, “Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology,” IEEE Trans. Nucl. Sci.57(6), 3101–3108 (2010).

C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

Yates, G.

G. Yates and B. Turko, “Circumvention of radiation-induced noise in CCD and CID imagers,” IEEE Trans. Nucl. Sci.33(1), 2214–2222 (1986).

Zuber, C.

J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

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J. Bogaerts, B. Dierickx, G. Meynants, and D. Uwaerts, “Total dose and displacement damage effects in a radiation-hardened CMOS APS,” IEEE Trans. Electron. Dev.50(1), 84–90 (2003).
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C. Virmontois, V. Goiffon, P. Magnan, S. Girard, O. Saint-Pé, S. Petit, G. Rolland, and A. Bardoux, “Similarities between proton and neutron induced dark current distribution in CMOS image sensors,” IEEE Trans. Nucl. Sci.57(4), (2010).

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J. L. Bourgade, V. Allouche, J. Baggio, C. Bayer, F. Bonneau, C. Chollet, S. Darbon, L. Disdier, D. Gontier, M. Houry, H. P. Jacquet, J. P. Jadaud, J. L. Leray, I. Masclet-Gobin, J. P. Negre, J. Raimbourg, B. Villette, I. Bertron, J. M. Chevalier, J. M. Favier, J. Gazave, J. C. Gomme, F. Malaise, J. P. Seaux, V. Y. Glebov, P. Jaanimagi, C. Stoeckl, T. C. Sangster, G. Pien, R. A. Lerche, and E. R. Hodgson, “New constraints for plasma diagnostics development due to the harsh environment of MJ class lasers,” Rev. Sci. Instrum.75(10), 4204–4212 (2004).
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J. L. Bourgade, R. Marmoret, S. Darbon, R. Rosch, P. Troussel, B. Villette, V. Glebov, W. Shmayda, J. C. Gommé, Y. Le Tonqueze, F. Aubard, J. Baggio, S. Bazzoli, F. Bonneau, J. Y. Boutin, T. Caillaud, C. Chollet, P. Combis, L. Disdier, J. Gazave, S. Girard, D. Gontier, P. Jaanimagi, H. P. Jacquet, J. P. Jadaud, O. Landoas, J. Legendre, J. L. Leray, R. Maroni, D. D. Meyerhofer, J. L. Miquel, F. J. Marshall, I. Masclet-Gobin, G. Pien, J. Raimbourg, C. Reverdin, A. Richard, D. Rubins de Cervens, C. T. Sangster, J. P. Seaux, G. Soullie, C. Stoeckl, I. Thfoin, L. Videau, and C. Zuber, “Present LMJ diagnostics developments integrating its harsh environment,” Rev. Sci. Instrum.795(10), (2008).

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Figures (14)

Fig. 1
Fig. 1

(a) CAD drawing of the Experimental Hall (EH) of the Laser Megajoule facility. The EH diameter is 30 m whereas the diameter of the target chamber is 10 m. (b) Neutron and gamma fluxes at the locations of diagnostic components during full performance shots in LMJ, from [8].

Fig. 2
Fig. 2

Synoptic diagram of the tested sensors.

Fig. 3
Fig. 3

Synoptic diagram of the test setup in the LLE OMEGA facility.

Fig. 4
Fig. 4

Picture of the CMOS imager test setup. (a) In the lab, before deployment. (b) In the target bay of the LLE OMEGA facility.

Fig. 5
Fig. 5

CIS operation timing diagram with possible temporal coupling cases with the radiation pulse (plain vertical red arrow). (a) Overview of the CIS operation showing the sequence between the readout phase and the additional integration phase. (b) Details of the readout phase.

Fig. 6
Fig. 6

Raw dark frames: (a) before a shot. (b) during shot 8 and (c) right after shot 8. Neutron fluence at the detector level: 7 × 106 n/cm2. The image contrast has been tuned to emphasize the studied effects.

Fig. 7
Fig. 7

Reconstituted dark frame during laser shot 8 with subtracted average dark level. (a) before a shot. (b) during the shot. (c) magnification of an area of the reconstituted image taken during a shot (indicated by a white dashed square in (b). The image contrast has been tuned to emphasize the studied effects.

Fig. 8
Fig. 8

Distribution of the number of generated electrons after three selected shots.

Fig. 9
Fig. 9

Evolution of the number of disturbed and saturated pixels with neutron fluence.

Fig. 10
Fig. 10

Raw dark frame (200 × 200 pixel window at the top left corner of the pixel array) taken at room temperature (a) before the first shot and (b) after the last shot showing the creation of a few permanent hot pixels. The image contrast has been tuned to emphasize the studied effects.

Fig. 11
Fig. 11

Dark current distribution of 128 × 128 pixel CIS before irradiation and after exposition to neutrons at a 1010 n/cm2 fluence (with two different flux). These data come from [20].

Fig. 12
Fig. 12

Quantum efficiency measured on two 128 × 128 pixel CIS, one unirradiated and the other exposed to 14 MeV neutrons at a fluence of 5 × 1011n/cm2.

Fig. 13
Fig. 13

Typical transient response induced by a neutron pulse in a CMOS photodiode (800 × 800 µm2).

Fig. 14
Fig. 14

Evolution of the transient voltage pulse as a function of neutron fluence.

Tables (1)

Tables Icon

Table 1 Summary of the neutron yields and equivalent fluences at the detector levels for each laser shot of the experiment.

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