Abstract

We have used optical coherence tomography to study the internal structure of a variety of non-biological materials. In particular, we have imaged internal regions from a commercial grade of lead zirconate titanate ceramic material, from a sample of single-crystal silicon carbide, and from a Teflon-coated wire. In each case the spatial positions of internal defects were determined.

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References

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  1. R. C. Youngquist, S. Carr, and D. E. N. Davies, "Optical coherence-domain reflectometry: a new optical evaluation technique," Opt. Lett. 12, 158-160 (1987).
    [CrossRef] [PubMed]
  2. K. Takada, I. Yokohama, K. Chida, and J. Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1063 (1987).
    [CrossRef]
  3. A. F. Fercher, K. Mengedoht, W. Werner, "Eye-length measurement by interferometry with partially coherent light," Opt. Lett. 13, 186-188 (1988).
    [CrossRef] [PubMed]
  4. E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito, "High-speed optical coherence domain reflectometry," Opt. Lett. 17, 151-153 (1992).
    [CrossRef] [PubMed]
  5. V. M. Gelikonov, G. V. Gelikonov, R. V. Kuranov, K. I. Pravdenko, A. M. Sergeev, F. I. Feldshtein, Ya. I. Khanin, and D. V. Shabanov, "Coherent optical tomography of microscopic inhomogeneities in biological tissues," JETP Lett. 61, 159 (1995).
  6. M. Bashkansky, M. D. Duncan, M. Kahn, D. Lewis, III and J. Reintjes, "Subsurface Defect Detection in Ceramics Using Optical Gated Techniques," Opt. Lett. 22, 61-63 (1997).
    [CrossRef] [PubMed]
  7. J. A. Powell and D. J. Larkin, "Process-induced morphological defects in epitaxial CVD silicon carbide," Phys. Status Solidi B 202, 529-548 (1997).
    [CrossRef]
  8. J. F. de Boer, T. E. Milner, M. J. C. van Gemert, J. S. Nelson, "Two-dimensional birefringence imaging in biological tissue by polarization-sensitive optical coherence tomography," Opt. Lett. 22, 934-936 (1997).
    [CrossRef] [PubMed]

Other

R. C. Youngquist, S. Carr, and D. E. N. Davies, "Optical coherence-domain reflectometry: a new optical evaluation technique," Opt. Lett. 12, 158-160 (1987).
[CrossRef] [PubMed]

K. Takada, I. Yokohama, K. Chida, and J. Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1063 (1987).
[CrossRef]

A. F. Fercher, K. Mengedoht, W. Werner, "Eye-length measurement by interferometry with partially coherent light," Opt. Lett. 13, 186-188 (1988).
[CrossRef] [PubMed]

E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito, "High-speed optical coherence domain reflectometry," Opt. Lett. 17, 151-153 (1992).
[CrossRef] [PubMed]

V. M. Gelikonov, G. V. Gelikonov, R. V. Kuranov, K. I. Pravdenko, A. M. Sergeev, F. I. Feldshtein, Ya. I. Khanin, and D. V. Shabanov, "Coherent optical tomography of microscopic inhomogeneities in biological tissues," JETP Lett. 61, 159 (1995).

M. Bashkansky, M. D. Duncan, M. Kahn, D. Lewis, III and J. Reintjes, "Subsurface Defect Detection in Ceramics Using Optical Gated Techniques," Opt. Lett. 22, 61-63 (1997).
[CrossRef] [PubMed]

J. A. Powell and D. J. Larkin, "Process-induced morphological defects in epitaxial CVD silicon carbide," Phys. Status Solidi B 202, 529-548 (1997).
[CrossRef]

J. F. de Boer, T. E. Milner, M. J. C. van Gemert, J. S. Nelson, "Two-dimensional birefringence imaging in biological tissue by polarization-sensitive optical coherence tomography," Opt. Lett. 22, 934-936 (1997).
[CrossRef] [PubMed]

Supplementary Material (3)

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Figures (5)

Fig. 1.
Fig. 1.

Reflection (a) and transmission (b) micrographs of a silicon nitride PZT ceramic sample 4 mm thick. There is a defect in the center of the image, and a larger, low contrast discoloration surrounding the defect.

Fig. 2.
Fig. 2.

A movie of 13 separate OCT scans taken at various depths from the same region of the sample shown in Fig. 1. The OCT scans are taken in the X-Y plane (parallel to the surface of the ceramic) at the depths shown in the lower right hand corner of each frame. Zero microns represents the approximate surface of the sample. [Media 1]

Fig. 3.
Fig. 3.

A transmission micrograph of a single-crystal silicon carbide sample.

Fig. 4.
Fig. 4.

A movie showing various three-dimensional views of OCT data from 15 different X-Y scans in the silicon carbide sample shown in Fig. 3. The scan range in X and Y is 1 mm . The X-Y scans were taken 10 μm apart in depth. The colored regions represent areas of high scatter. [Media 2]

Fig. 5.
Fig. 5.

A movie of 29 separate OCT scans taken at 100 μm intervals along a teflon-coated copper wire. The OCT scans are taken in the X-Z direction (cross-sections of the wire). [Media 3]

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