C. M. Jan, Y. H. Lee, and C. K. Lee, “The circular polarization interferometer based surface plasmon biosensor,” Proc. SPIE 7577, 75770B, 75770B-12 (2010).
[Crossref]
W. L. Hsu, S. S. Lee, and C. K. Lee, “Ellipsometric surface plasmon resonance,” J. Biomed. Opt. 14(2), 024036 (2009).
[Crossref]
[PubMed]
C. K. Lee, T. D. Cheng, S. S. Lee, and C. K. Chang, “Opto-mechatronic configurations to maximize dynamic range and optimize resolution of optical instruments,” Opt. Rev. 16(2), 133–140 (2009).
[Crossref]
J. Y. Lee, H. C. Shih, C. T. Hong, and T. K. Chou, “Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry,” Opt. Commun. 276(2), 283–287 (2007).
[Crossref]
R. Naraoka and K. Kajikawa, “Phase detection of surface plasmon resonance using rotating analyzer method,” Sens. Actuators B Chem. 107(2), 952–956 (2005).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
D. Tanooka, E. Adachi, and K. Nagayama, “Color-imaging ellipsometer: high-speed characterization of in-plane distribution of film thickness at nano-scale,” Jpn. J. Appl. Phys., Part 1 40(2A), 877–880 (2001).
[Crossref]
W. J. Wu, C. K. Lee, and C. T. Hsieh, “Signal processing algorithms for Doppler effect based nanometer positioning systems,” Jpn. J. Appl. Phys., Part 1 38(3B), 1725–1729 (1999).
[Crossref]
G. Jin, R. Jansson, and H. Arwin, “Imaging ellipsometry revisited: developments for visualization of thin transparent layers on silicon substrates,” Rev. Sci. Instrum. 67(8), 2930–2936 (1996).
[Crossref]
W. M. Duncan and S. A. Henck, “In situ spectral ellipsometry for real-time measurement and control,” Appl. Surf. Sci. 63(1-4), 9–16 (1993).
[Crossref]
S. A. Henck, W. M. Duncan, L. M. Lowenstein, and S. W. Butler, “In situ spectral ellipsometry for real-time thickness measurement: etching multilayer stacks,” J. Vac. Sci. Technol. A 11(4), 1179–1185 (1993).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
N. V. Nguyen, B. S. Pudliner, I. An, and R. W. Collins, “Error correction for calibration and data reduction in rotating-polarizer ellipsometry - applications to a novel multichannel ellipsometer,” J. Opt. Soc. Am. A 8(6), 919–931 (1991).
[Crossref]
P. A. Cuypers, W. T. Hermens, and H. C. Hemker, “Ellipsometry as a tool to study protein films at liquid-solid interfaces,” Anal. Biochem. 84(1), 56–67 (1978).
[Crossref]
[PubMed]
D. Tanooka, E. Adachi, and K. Nagayama, “Color-imaging ellipsometer: high-speed characterization of in-plane distribution of film thickness at nano-scale,” Jpn. J. Appl. Phys., Part 1 40(2A), 877–880 (2001).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
N. V. Nguyen, B. S. Pudliner, I. An, and R. W. Collins, “Error correction for calibration and data reduction in rotating-polarizer ellipsometry - applications to a novel multichannel ellipsometer,” J. Opt. Soc. Am. A 8(6), 919–931 (1991).
[Crossref]
G. Jin, R. Jansson, and H. Arwin, “Imaging ellipsometry revisited: developments for visualization of thin transparent layers on silicon substrates,” Rev. Sci. Instrum. 67(8), 2930–2936 (1996).
[Crossref]
P. Westphal and A. Bornmann, “Biomolecular detection by surface plasmon enhanced ellipsometry,” Sens. Actuators B Chem. 84(2-3), 278–282 (2002).
[Crossref]
S. A. Henck, W. M. Duncan, L. M. Lowenstein, and S. W. Butler, “In situ spectral ellipsometry for real-time thickness measurement: etching multilayer stacks,” J. Vac. Sci. Technol. A 11(4), 1179–1185 (1993).
[Crossref]
C. K. Lee, T. D. Cheng, S. S. Lee, and C. K. Chang, “Opto-mechatronic configurations to maximize dynamic range and optimize resolution of optical instruments,” Opt. Rev. 16(2), 133–140 (2009).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
C. K. Lee, T. D. Cheng, S. S. Lee, and C. K. Chang, “Opto-mechatronic configurations to maximize dynamic range and optimize resolution of optical instruments,” Opt. Rev. 16(2), 133–140 (2009).
[Crossref]
J. Y. Lee, H. C. Shih, C. T. Hong, and T. K. Chou, “Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry,” Opt. Commun. 276(2), 283–287 (2007).
[Crossref]
N. V. Nguyen, B. S. Pudliner, I. An, and R. W. Collins, “Error correction for calibration and data reduction in rotating-polarizer ellipsometry - applications to a novel multichannel ellipsometer,” J. Opt. Soc. Am. A 8(6), 919–931 (1991).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
P. A. Cuypers, W. T. Hermens, and H. C. Hemker, “Ellipsometry as a tool to study protein films at liquid-solid interfaces,” Anal. Biochem. 84(1), 56–67 (1978).
[Crossref]
[PubMed]
W. M. Duncan and S. A. Henck, “In situ spectral ellipsometry for real-time measurement and control,” Appl. Surf. Sci. 63(1-4), 9–16 (1993).
[Crossref]
S. A. Henck, W. M. Duncan, L. M. Lowenstein, and S. W. Butler, “In situ spectral ellipsometry for real-time thickness measurement: etching multilayer stacks,” J. Vac. Sci. Technol. A 11(4), 1179–1185 (1993).
[Crossref]
P. A. Cuypers, W. T. Hermens, and H. C. Hemker, “Ellipsometry as a tool to study protein films at liquid-solid interfaces,” Anal. Biochem. 84(1), 56–67 (1978).
[Crossref]
[PubMed]
W. M. Duncan and S. A. Henck, “In situ spectral ellipsometry for real-time measurement and control,” Appl. Surf. Sci. 63(1-4), 9–16 (1993).
[Crossref]
S. A. Henck, W. M. Duncan, L. M. Lowenstein, and S. W. Butler, “In situ spectral ellipsometry for real-time thickness measurement: etching multilayer stacks,” J. Vac. Sci. Technol. A 11(4), 1179–1185 (1993).
[Crossref]
P. A. Cuypers, W. T. Hermens, and H. C. Hemker, “Ellipsometry as a tool to study protein films at liquid-solid interfaces,” Anal. Biochem. 84(1), 56–67 (1978).
[Crossref]
[PubMed]
J. Homola, “Surface plasmon resonance sensors for detection of chemical and biological species,” Chem. Rev. 108(2), 462–493 (2008).
[Crossref]
[PubMed]
J. Y. Lee, H. C. Shih, C. T. Hong, and T. K. Chou, “Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry,” Opt. Commun. 276(2), 283–287 (2007).
[Crossref]
W. J. Wu, C. K. Lee, and C. T. Hsieh, “Signal processing algorithms for Doppler effect based nanometer positioning systems,” Jpn. J. Appl. Phys., Part 1 38(3B), 1725–1729 (1999).
[Crossref]
W. L. Hsu, S. S. Lee, and C. K. Lee, “Ellipsometric surface plasmon resonance,” J. Biomed. Opt. 14(2), 024036 (2009).
[Crossref]
[PubMed]
C. M. Jan, Y. H. Lee, and C. K. Lee, “The circular polarization interferometer based surface plasmon biosensor,” Proc. SPIE 7577, 75770B, 75770B-12 (2010).
[Crossref]
G. Jin, R. Jansson, and H. Arwin, “Imaging ellipsometry revisited: developments for visualization of thin transparent layers on silicon substrates,” Rev. Sci. Instrum. 67(8), 2930–2936 (1996).
[Crossref]
G. Jin, R. Jansson, and H. Arwin, “Imaging ellipsometry revisited: developments for visualization of thin transparent layers on silicon substrates,” Rev. Sci. Instrum. 67(8), 2930–2936 (1996).
[Crossref]
R. Naraoka and K. Kajikawa, “Phase detection of surface plasmon resonance using rotating analyzer method,” Sens. Actuators B Chem. 107(2), 952–956 (2005).
[Crossref]
C. M. Jan, Y. H. Lee, and C. K. Lee, “The circular polarization interferometer based surface plasmon biosensor,” Proc. SPIE 7577, 75770B, 75770B-12 (2010).
[Crossref]
W. L. Hsu, S. S. Lee, and C. K. Lee, “Ellipsometric surface plasmon resonance,” J. Biomed. Opt. 14(2), 024036 (2009).
[Crossref]
[PubMed]
C. K. Lee, T. D. Cheng, S. S. Lee, and C. K. Chang, “Opto-mechatronic configurations to maximize dynamic range and optimize resolution of optical instruments,” Opt. Rev. 16(2), 133–140 (2009).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
W. J. Wu, C. K. Lee, and C. T. Hsieh, “Signal processing algorithms for Doppler effect based nanometer positioning systems,” Jpn. J. Appl. Phys., Part 1 38(3B), 1725–1729 (1999).
[Crossref]
J. Y. Lee, H. C. Shih, C. T. Hong, and T. K. Chou, “Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry,” Opt. Commun. 276(2), 283–287 (2007).
[Crossref]
W. L. Hsu, S. S. Lee, and C. K. Lee, “Ellipsometric surface plasmon resonance,” J. Biomed. Opt. 14(2), 024036 (2009).
[Crossref]
[PubMed]
C. K. Lee, T. D. Cheng, S. S. Lee, and C. K. Chang, “Opto-mechatronic configurations to maximize dynamic range and optimize resolution of optical instruments,” Opt. Rev. 16(2), 133–140 (2009).
[Crossref]
C. M. Jan, Y. H. Lee, and C. K. Lee, “The circular polarization interferometer based surface plasmon biosensor,” Proc. SPIE 7577, 75770B, 75770B-12 (2010).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
S. A. Henck, W. M. Duncan, L. M. Lowenstein, and S. W. Butler, “In situ spectral ellipsometry for real-time thickness measurement: etching multilayer stacks,” J. Vac. Sci. Technol. A 11(4), 1179–1185 (1993).
[Crossref]
D. Tanooka, E. Adachi, and K. Nagayama, “Color-imaging ellipsometer: high-speed characterization of in-plane distribution of film thickness at nano-scale,” Jpn. J. Appl. Phys., Part 1 40(2A), 877–880 (2001).
[Crossref]
R. Naraoka and K. Kajikawa, “Phase detection of surface plasmon resonance using rotating analyzer method,” Sens. Actuators B Chem. 107(2), 952–956 (2005).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
N. V. Nguyen, B. S. Pudliner, I. An, and R. W. Collins, “Error correction for calibration and data reduction in rotating-polarizer ellipsometry - applications to a novel multichannel ellipsometer,” J. Opt. Soc. Am. A 8(6), 919–931 (1991).
[Crossref]
H. Nygren and M. Stenberg, “Calibration by ellipsometry of the enzyme-linked immunosorbent assay,” J. Immunol. Methods 80(1), 15–24 (1985).
[Crossref]
[PubMed]
N. V. Nguyen, B. S. Pudliner, I. An, and R. W. Collins, “Error correction for calibration and data reduction in rotating-polarizer ellipsometry - applications to a novel multichannel ellipsometer,” J. Opt. Soc. Am. A 8(6), 919–931 (1991).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
J. Y. Lee, H. C. Shih, C. T. Hong, and T. K. Chou, “Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry,” Opt. Commun. 276(2), 283–287 (2007).
[Crossref]
H. Nygren and M. Stenberg, “Calibration by ellipsometry of the enzyme-linked immunosorbent assay,” J. Immunol. Methods 80(1), 15–24 (1985).
[Crossref]
[PubMed]
D. Tanooka, E. Adachi, and K. Nagayama, “Color-imaging ellipsometer: high-speed characterization of in-plane distribution of film thickness at nano-scale,” Jpn. J. Appl. Phys., Part 1 40(2A), 877–880 (2001).
[Crossref]
P. Westphal and A. Bornmann, “Biomolecular detection by surface plasmon enhanced ellipsometry,” Sens. Actuators B Chem. 84(2-3), 278–282 (2002).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
W. J. Wu, C. K. Lee, and C. T. Hsieh, “Signal processing algorithms for Doppler effect based nanometer positioning systems,” Jpn. J. Appl. Phys., Part 1 38(3B), 1725–1729 (1999).
[Crossref]
P. A. Cuypers, W. T. Hermens, and H. C. Hemker, “Ellipsometry as a tool to study protein films at liquid-solid interfaces,” Anal. Biochem. 84(1), 56–67 (1978).
[Crossref]
[PubMed]
Y. Y. Cheng and J. C. Wyant, “Phase shifter calibration in phase-shifting interferometry,” Appl. Opt. 24(18), 3049–3052 (1985).
[Crossref]
[PubMed]
Q. W. Zhan and J. R. Leger, “High-resolution imaging ellipsometer,” Appl. Opt. 41(22), 4443–4450 (2002).
[Crossref]
[PubMed]
P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt. 26(13), 2504–2506 (1987).
[Crossref]
[PubMed]
W. M. Duncan and S. A. Henck, “In situ spectral ellipsometry for real-time measurement and control,” Appl. Surf. Sci. 63(1-4), 9–16 (1993).
[Crossref]
J. Homola, “Surface plasmon resonance sensors for detection of chemical and biological species,” Chem. Rev. 108(2), 462–493 (2008).
[Crossref]
[PubMed]
W. L. Hsu, S. S. Lee, and C. K. Lee, “Ellipsometric surface plasmon resonance,” J. Biomed. Opt. 14(2), 024036 (2009).
[Crossref]
[PubMed]
H. Nygren and M. Stenberg, “Calibration by ellipsometry of the enzyme-linked immunosorbent assay,” J. Immunol. Methods 80(1), 15–24 (1985).
[Crossref]
[PubMed]
S. A. Henck, W. M. Duncan, L. M. Lowenstein, and S. W. Butler, “In situ spectral ellipsometry for real-time thickness measurement: etching multilayer stacks,” J. Vac. Sci. Technol. A 11(4), 1179–1185 (1993).
[Crossref]
D. Tanooka, E. Adachi, and K. Nagayama, “Color-imaging ellipsometer: high-speed characterization of in-plane distribution of film thickness at nano-scale,” Jpn. J. Appl. Phys., Part 1 40(2A), 877–880 (2001).
[Crossref]
W. J. Wu, C. K. Lee, and C. T. Hsieh, “Signal processing algorithms for Doppler effect based nanometer positioning systems,” Jpn. J. Appl. Phys., Part 1 38(3B), 1725–1729 (1999).
[Crossref]
J. Y. Lee, H. C. Shih, C. T. Hong, and T. K. Chou, “Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry,” Opt. Commun. 276(2), 283–287 (2007).
[Crossref]
C. K. Lee, W. J. Wu, G. Y. Wu, C. L. Li, Z. D. Chen, and J. Y. Chen, “Design and performance verification of a microscope-based interferometer for miniature-specimen metrology,” Opt. Eng. 44(8), 085602 (2005).
[Crossref]
C. K. Lee, T. D. Cheng, S. S. Lee, and C. K. Chang, “Opto-mechatronic configurations to maximize dynamic range and optimize resolution of optical instruments,” Opt. Rev. 16(2), 133–140 (2009).
[Crossref]
C. M. Jan, Y. H. Lee, and C. K. Lee, “The circular polarization interferometer based surface plasmon biosensor,” Proc. SPIE 7577, 75770B, 75770B-12 (2010).
[Crossref]
G. Jin, R. Jansson, and H. Arwin, “Imaging ellipsometry revisited: developments for visualization of thin transparent layers on silicon substrates,” Rev. Sci. Instrum. 67(8), 2930–2936 (1996).
[Crossref]
R. Naraoka and K. Kajikawa, “Phase detection of surface plasmon resonance using rotating analyzer method,” Sens. Actuators B Chem. 107(2), 952–956 (2005).
[Crossref]
P. Westphal and A. Bornmann, “Biomolecular detection by surface plasmon enhanced ellipsometry,” Sens. Actuators B Chem. 84(2-3), 278–282 (2002).
[Crossref]
I. An, Y. Cong, N. V. Nguyen, B. S. Pudliner, and R. W. Collins, “Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy,” Thin Solid Films 206(1-2), 300–305 (1991).
[Crossref]
R. M. A. Azzam, and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland Pub. Co., 1977).
H. G. Tompkins, and E. A. Irene, Handbook of Ellipsometry (William Andrew Pub., Springer, 2005).
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley & Sons, 2007).