Abstract

The technique of generating sinusoidal fringe patterns by defocusing squared binary structured ones has numerous merits for high-speed three-dimensional (3D) shape measurement. However, it is challenging for this method to realize a multifrequency phase-shifting (MFPS) algorithm because it is difficult to simultaneously generate high-quality sinusoidal fringe patterns with different periods. This paper proposes to realize an MFPS algorithm utilizing an optimal pulse width modulation (OPWM) technique that can selectively eliminate high-order harmonics of squared binary patterns. We successfully develop a 556 Hz system utilizing a three-frequency algorithm for simultaneously measuring multiple objects.

© 2011 Optical Society of America

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  1. S. Gorthi and P. Rastogi, “Fringe projection techniques: whither we are?” Opt. Lasers Eng. 48, 133–140 (2010).
    [CrossRef]
  2. X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
    [CrossRef]
  3. S. Lei and S. Zhang, “Flexible 3-D shape measurement using projector defocusing,” Opt. Lett. 34(20), 3080–3082 (2009).
    [CrossRef]
  4. S. Lei and S. Zhang, “Digital sinusoidal fringe generation: defocusing binary patterns VS focusing sinusoidal patterns,” Opt. Lasers Eng. 48(5), 561–569 (2010).
    [CrossRef]
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    [CrossRef]
  7. D. Malacara, ed., Optical Shop Testing, 3rd ed. (John Wiley and Sons, 2007).
  8. D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (John Wiley and Sons, 1998).
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  10. C. E. Towers, D. P. Towers, and J. D. Jones, “Optimum frequency selection in multifrequency interferometry,” Opt. Lett. 28(11), 887–889 (2003).
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  12. S. Zhang, D. van der Weide, and J. Olvier, “Superfast phase-shifting method for 3-D shape measurement,” Opt. Express 18(9), 9684–9689 (2010).
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    [CrossRef]

2010 (6)

2009 (1)

2004 (1)

V. G. Agelidis, A. Balouktsis, and I. Balouktsis, “On applying a minimization technique to the harmonic elimilation PWM control: the bipolar waveform,” IEEE Power Electron. Lett. 2, 41–44 (2004).
[CrossRef]

2003 (1)

1992 (1)

X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
[CrossRef]

1987 (1)

Agelidis, V. G.

V. G. Agelidis, A. Balouktsis, and I. Balouktsis, “On applying a minimization technique to the harmonic elimilation PWM control: the bipolar waveform,” IEEE Power Electron. Lett. 2, 41–44 (2004).
[CrossRef]

Bally, G. V.

X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
[CrossRef]

Balouktsis, A.

V. G. Agelidis, A. Balouktsis, and I. Balouktsis, “On applying a minimization technique to the harmonic elimilation PWM control: the bipolar waveform,” IEEE Power Electron. Lett. 2, 41–44 (2004).
[CrossRef]

Balouktsis, I.

V. G. Agelidis, A. Balouktsis, and I. Balouktsis, “On applying a minimization technique to the harmonic elimilation PWM control: the bipolar waveform,” IEEE Power Electron. Lett. 2, 41–44 (2004).
[CrossRef]

Creath, K.

Gorthi, S.

S. Gorthi and P. Rastogi, “Fringe projection techniques: whither we are?” Opt. Lasers Eng. 48, 133–140 (2010).
[CrossRef]

Grosse, M.

Jones, J. D.

Kowarschik, R.

Lei, S.

S. Lei and S. Zhang, “Digital sinusoidal fringe generation: defocusing binary patterns VS focusing sinusoidal patterns,” Opt. Lasers Eng. 48(5), 561–569 (2010).
[CrossRef]

S. Lei and S. Zhang, “Flexible 3-D shape measurement using projector defocusing,” Opt. Lett. 34(20), 3080–3082 (2009).
[CrossRef]

Olvier, J.

Rastogi, P.

S. Gorthi and P. Rastogi, “Fringe projection techniques: whither we are?” Opt. Lasers Eng. 48, 133–140 (2010).
[CrossRef]

Schaffer, M.

Su, X.-Y.

X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
[CrossRef]

Towers, C. E.

Towers, D. P.

van der Weide, D.

Vukicevic, D.

X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
[CrossRef]

Wang, Y.

Zhang, S.

Zhou, W.-S.

X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
[CrossRef]

Appl. Opt. (2)

IEEE Power Electron. Lett. (1)

V. G. Agelidis, A. Balouktsis, and I. Balouktsis, “On applying a minimization technique to the harmonic elimilation PWM control: the bipolar waveform,” IEEE Power Electron. Lett. 2, 41–44 (2004).
[CrossRef]

Opt. Commun. (1)

X.-Y. Su, W.-S. Zhou, G. V. Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94(13), 561–573 (1992).
[CrossRef]

Opt. Express (1)

Opt. Lasers Eng. (2)

S. Gorthi and P. Rastogi, “Fringe projection techniques: whither we are?” Opt. Lasers Eng. 48, 133–140 (2010).
[CrossRef]

S. Lei and S. Zhang, “Digital sinusoidal fringe generation: defocusing binary patterns VS focusing sinusoidal patterns,” Opt. Lasers Eng. 48(5), 561–569 (2010).
[CrossRef]

Opt. Lett. (4)

Other (2)

D. Malacara, ed., Optical Shop Testing, 3rd ed. (John Wiley and Sons, 2007).

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (John Wiley and Sons, 1998).

Supplementary Material (2)

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» Media 2: MOV (1056 KB)     

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