Abstract

Pixelated phase-mask interferograms have become an industry standard in spatial phase-shifting interferometry. These pixelated interferograms allow full wavefront encoding using a single interferogram. This allows the study of fast dynamic events in hostile mechanical environments. Recently an error-free demodulation method for ideal pixelated interferograms was proposed. However, non-ideal conditions in interferometry may arise due to non-linear response of the CCD camera, multiple light paths in the interferometer, etc. These conditions generate non-sinusoidal fringes containing harmonics which degrade the phase estimation. Here we show that two-dimensional Fourier demodulation of pixelated interferograms rejects most harmonics except the complex ones at {-3rd, +5th, −7th, +9th, −11th,…}. We propose temporal phase-shifting to remove these remaining harmonics. In particular, a 2-step phase-shifting algorithm is used to eliminate the −3rd and +5th complex harmonics, while a 3-step one is used to remove the −3rd, +5th, −7th and +9th complex harmonics.

© 2011 OSA

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2011 (1)

2010 (2)

M. Servin and J. C. Estrada, “Error-free demodulation of pixelated carrier frequency interferograms,” Opt. Express 18(17), 18492–18497 (2010).
[CrossRef] [PubMed]

B. Kimbrough and J. Millerd, “The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry,” Proc. SPIE 7790, 1–12 (2010).

2009 (1)

2004 (1)

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

2001 (1)

1996 (1)

1992 (1)

C. L. Koliopoulos, “Simultaneous phase-shift interferometer,” Proc. SPIE 1531, 119–127 (1992).
[CrossRef]

1984 (2)

R. Smythe and R. Moore, “Instantaneous phase measuring interferometry,” Opt. Eng. 23, 361–364 (1984).

O. Y. Kwon, “Multichannel phase-shifted interferometer,” Opt. Lett. 9(2), 59–61 (1984).
[CrossRef] [PubMed]

1982 (1)

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).
[CrossRef]

Brock, N.

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

Estrada, J. C.

Gonzalez, A.

Hayes, J.

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

Ina, H.

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).
[CrossRef]

Kimbrough, B.

B. Kimbrough and J. Millerd, “The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry,” Proc. SPIE 7790, 1–12 (2010).

Kobayashi, S.

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).
[CrossRef]

Koliopoulos, C. L.

C. L. Koliopoulos, “Simultaneous phase-shift interferometer,” Proc. SPIE 1531, 119–127 (1992).
[CrossRef]

Kwon, O. Y.

Millerd, J.

B. Kimbrough and J. Millerd, “The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry,” Proc. SPIE 7790, 1–12 (2010).

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

Moore, R.

R. Smythe and R. Moore, “Instantaneous phase measuring interferometry,” Opt. Eng. 23, 361–364 (1984).

Ngoi, B. K. A.

North-Morris, M.

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

Novak, M.

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

Quiroga, J. A.

Servin, M.

Sivakumar, N. R.

Smythe, R.

R. Smythe and R. Moore, “Instantaneous phase measuring interferometry,” Opt. Eng. 23, 361–364 (1984).

Surrel, Y.

Takeda, M.

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).
[CrossRef]

Venkatakrishnan, K.

Wyant, J. C.

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

Appl. Opt. (2)

J. Opt. Soc. Am. A (1)

M. Takeda, H. Ina, and S. Kobayashi, “Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. A 72(1), 156–160 (1982).
[CrossRef]

Opt. Eng. (1)

R. Smythe and R. Moore, “Instantaneous phase measuring interferometry,” Opt. Eng. 23, 361–364 (1984).

Opt. Express (3)

Opt. Lett. (1)

Proc. SPIE (3)

C. L. Koliopoulos, “Simultaneous phase-shift interferometer,” Proc. SPIE 1531, 119–127 (1992).
[CrossRef]

B. Kimbrough and J. Millerd, “The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry,” Proc. SPIE 7790, 1–12 (2010).

J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, “Pixelated phase-mask dynamic interferometer,” Proc. SPIE 5531, 304–314 (2004).
[CrossRef]

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