Abstract

A detailed characterization of the coherent x-ray wavefront produced by a partially illuminated Fresnel zone plate is presented. We show, by numerical and experimental approaches, how the beam size and the focal depth are strongly influenced by the illumination conditions, while the phase of the focal spot remains constant. These results confirm that the partial illumination can be used for coherent diffraction experiments. Finally, we demonstrate the possibility of reconstructing the complex-valued illumination function by simple measurement of the far field intensity in the specific case of partial illumination.

© 2011 OSA

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
  35. J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
    [CrossRef] [PubMed]
  36. O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
    [CrossRef]
  37. D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
    [CrossRef] [PubMed]

2011 (4)

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

2010 (6)

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

K. A. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 1–99 (2010).
[CrossRef]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

2009 (2)

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

2008 (3)

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

2007 (1)

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

2006 (3)

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

2005 (2)

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

2004 (1)

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

2003 (1)

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

2002 (1)

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

2001 (2)

I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
[CrossRef]

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

1999 (2)

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

1998 (1)

1982 (1)

1972 (1)

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).

1969 (1)

S. Takagi, “A dynamical theory of diffraction for a distorted crystal,” J. Phys. Soc. Jpn. 26, 1239–1253 (1969).
[CrossRef]

Alfonso, C.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

Allain, M.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Anderson, E. H.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Attwood, D. T.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Barrett, R.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Bauer, G.

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

Bley, F.

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Bolloc’h, D. L.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Boye, P.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Bunk, O.

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

Burghammer, M.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Cabrini, S.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Cai, Z.

H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused x-ray fields,” Nat. Phys. 2, 101–104 (2006).
[CrossRef]

Carbone, D.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Carbone, G.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

Chamard, V.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Chao, W.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Chapman, H. N.

K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Charalambous, P.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Chen, G.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Clément, J.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

David, C.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, “Phase retrieval and differential phase-contrast imaging with low-brilliance x-ray sources,” Nat. Phys. 2, 258–261 (2006).
[CrossRef]

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

de Jonge, M. D.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

Dhal, B. B.

G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
[CrossRef] [PubMed]

Diaz, A.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
[CrossRef]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Dierolf, M.

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

Eberhardt, W.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Eisebitt, S.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Endo, K.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Eymery, J.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Fabrizio, E. D.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Färm, E.

Favre-Nicolin, V.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Feldkamp, J. M.

C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, “Coherent x-ray diffraction imaging with nanofocused illumination,” Phys. Rev. Lett. 101, 090801 (2008).
[CrossRef] [PubMed]

Fienup, J. R.

Gentile, P.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Gentili, M.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Gerchberg, R. W.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of the phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).

Godard, P.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Gorelick, S.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

Guzenko, V. A.

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

Harder, R.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Harteneck, B. D.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Hau-Riege, S. P.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

He, H.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Hellwig, O.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Hignette, O.

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

Homs, A.

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

Howells, M. R.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Ishikawa, T.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Jacques, V. L. R.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

Jefimovs, K.

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

Kaulich, B.

E. D. Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, “High-efficiency multilevel zone plates for keV x-rays,” Nature 401, 895–898 (1999).
[CrossRef]

Keplinger, M.

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

Kewish, C. M.

J. Vila-Comamala, S. Gorelick, E. Färm, C. M. Kewish, A. Diaz, R. Barrett, V. A. Guzenko, M. Ritala, and C. David, “Ultra-high resolution zone-doubled diffractive x-ray optics for the multi-kev regime,” Opt. Express 19, 175–184 (2011).
[CrossRef] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

Kirz, J.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Koester, R.

V. Favre-Nicolin, J. Eymery, R. Koester, and P. Gentile, “Coherent-diffraction imaging of single nanowires of diameter 95 nanometers,” Phys. Rev. B 79, 195401 (2009).

Kohn, V.

Labat, S.

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

Leake, S. J.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Lechner, R. T.

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

Lengeler, B.

Liddle, J. A.

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, “Soft x-ray microscopy at a spatial resolution better than 15nm,” Nature 435, 1210–1213 (2005).
[CrossRef] [PubMed]

Livet, F.

V. L. R. Jacques, S. Ravy, D. L. Bolloc’h, E. Pinsolle, M. Sauvage-Simkin, and F. Livet, “Bulk dislocation core dissociation probed by coherent x rays in silicon,” Phys. Rev. Lett. 106, 065502 (2011).
[CrossRef] [PubMed]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Lorgen, M.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Lüning, J.

S. Eisebitt, J. Lüning, W. F. Schlotter, M. Lorgen, O. Hellwig, W. Eberhardt, and J. Stohr, “Lensless imaging of magnetic nanostructures by x-ray spectro-holography,” Nature 432, 885–888 (2004).
[CrossRef] [PubMed]

Mandl, B.

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

Marchesini, S.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68, 140101 (2003).
[CrossRef]

Mastropietro, F.

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Matsuyama, S.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Menzel, A.

C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, “Ptychographic characterization of the wavefield in the focus of reflective hard x-ray optics,” Ultramicroscopy 110, 325–329 (2010).
[CrossRef] [PubMed]

M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321, 379–382 (2008).
[CrossRef] [PubMed]

Metzger, T. H.

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

P. Godard, D. Carbone, M. Allain, F. Mastropietro, G. Chen, A. Diaz, T. H. Metzger, J. Stangl, and V. Chamard, “Three-dimensional x-ray Bragg ptychography: high-resolution imaging of extended crystalline nanostructures,” Submitted to Nat. Commun.

Miao, J.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of x-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens,” Nature 400, 342–344 (1999).
[CrossRef]

Mimura, H. M.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Mocuta, C.

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

V. Chamard, J. Stangl, G. Carbone, A. Diaz, G. Chen, C. Alfonso, C. Mocuta, and T. H. Metzger, “Three-dimensional x-Ray Fourier transform holography: the Bragg case,” Phys. Rev. Lett. 104, 165501 (2010).
[CrossRef] [PubMed]

A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
[CrossRef]

Mori, Y.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Newton, M. C.

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Nishino, Y.

K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

Nöhammer, B.

C. David, B. Nöhammer, E. Ziegler, and O. Hignette, “Tunable diffractive optical elements for hard x-rays,” Proc. SPIE 4499, 96–104 (2001).
[CrossRef]

Noy, A.

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O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
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[CrossRef] [PubMed]

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
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A. Diaz, C. Mocuta, J. Stangl, B. Mandl, C. David, J. Vila-Comamala, V. Chamard, T. H. Metzger, and G. Bauer, “Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam,” Phys. Rev. B 79, 125324 (2009).
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O. Bunk, A. Diaz, F. Pfeiffer, C. David, B. Schmitt, D. K. Satapathy, and J. F. van der Veen, “Diffractive imaging for periodic samples: retrieving one-dimensional concentration profiles across microfluidic channels,” Acta Cryst. A 63, 306–314 (2007).
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A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
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M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, “Ptychographic x-ray computed tomography at the nanoscale,” Nature 467, 436–439 (2010).
[CrossRef] [PubMed]

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G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett. 97, 025506 (2006).
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K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

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K. Yamauchi, H. M. Mimura, K. Yamamura, Y. Sano, H. Yumoto, S. Matsuyama, K. Endo, Y. Nishino, K. Tamasaku, M. Yabashi, T. Ishikawa, and Y. Mori “Development of elliptical Kirkpatrick-Baez mirrors for hard x-ray nanofocusing,” Frontiers in Optics, OSA Technical Digest Series (Optical Society of America, 2005), paper FTuS4.

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K. A. Nugent, A. G. Peele, H. M. Quiney, and H. N. Chapman, “Diffraction with wavefront curvature: a path to unique phase recovery,” Acta Cryst. A 61, 373–381 (2005).
[CrossRef]

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Adv. Phys. (1)

K. A. Nugent, “Coherent methods in the x-ray sciences,” Adv. Phys. 59, 1–99 (2010).
[CrossRef]

Appl. Opt. (2)

J. Appl. Cryst. (1)

V. Chamard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, “Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent x-ray diffraction,” J. Appl. Cryst. 41, 272–280 (2008).
[CrossRef]

J. Instrum. (1)

C. Ponchut, J. M. Rigal, J. Clément, E. Papillon, A. Homs, and S. Petitdemange, “Maxipix, a fast readout photon-counting x-ray area detector for synchrotron applications,” J. Instrum. 6, C01069 (2011).
[CrossRef]

J. Phys. Condens. Matter (1)

I. A. Vartanyants and I. K. Robinson, “Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction,” J. Phys. Condens. Matter 13, 10593–10611 (2001).
[CrossRef]

J. Phys. Soc. Jpn. (1)

S. Takagi, “A dynamical theory of diffraction for a distorted crystal,” J. Phys. Soc. Jpn. 26, 1239–1253 (1969).
[CrossRef]

J. Strain Anal. Eng. Des. (1)

V. Chamard, A. Diaz, J. Stangl, and S. Labat, “Structural investigation of InAs nanowires with coherent x-rays,” J. Strain Anal. Eng. Des. 44, 533–542 (2009).
[CrossRef]

J. Synchrotron Radiat. (3)

A. Diaz, C. Mocuta, J. Stangl, M. Keplinger, T. Weitkamp, F. Pfeiffer, C. David, T. H. Metzger, and G. Bauer, “Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry,” J. Synchrotron Radiat. 17, 299–307 (2010).
[CrossRef] [PubMed]

S. Gorelick, J. Vila-Comamala, V. A. Guzenko, R. Barrett, M. Salomé, and C. David, “High-efficiency Fresnel zone plates for hard x-rays by 100keV e-beam lithography and electroplating,” J. Synchrotron Radiat. 18, 442–446 (2011).
[CrossRef] [PubMed]

D. L. Bolloc’h, F. Livet, F. Bley, T. Schülli, M. Veron, and T. H. Metzger, “X-ray diffraction from rectangular slits,” J. Synchrotron Radiat. 9, 258–265 (2002).
[CrossRef] [PubMed]

Nat. Mater. (1)

M. C. Newton, S. J. Leake, R. Harder, and I. K. Robinson, “Three-dimensional imaging of strain in a single ZnO nanorod,” Nat. Mater. 9, 120–124 (2010).
[CrossRef]

Nat. Phys. (2)

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