Andrew M. Weiner, Editor-in-Chief
Sehoon Lim, Kerkil Choi, Joonku Hahn, Daniel L. Marks, and David J. Brady
Sehoon Lim, Kerkil Choi, Joonku Hahn, Daniel L. Marks, and David J. Brady*
Duke University Fitzpatrick Center for Photonics and Communications Systems, Durham, North Carolina 27708,
*Corresponding author: email@example.com
High pixel count apertures for digital holography may be synthesized by scanning smaller aperture detector arrays. Characterization and compensation for registration errors in the detector array position and pitch and for phase instability between the reference and object field is a major challenge in scanned systems. We use a secondary sensor to monitor phase and image-based registration parameter estimators to demonstrate near diffraction-limited resolution from a 63.4 mm aperture synthesized by scanning a 5.28 mm subaperture over 144 transverse positions. We demonstrate 60 μm resolution at 2 m range.
©2011 Optical Society of America
Abbie E. Tippie, Abhishek Kumar, and James R. Fienup
Opt. Express 19(13) 12027-12038 (2011)
Samuel T. Thurman and Andrew Bratcher
Appl. Opt. 54(3) 559-568 (2015)
P. L. Makowski, T. Kozacki, P. Zdankowski, and W. Zaperty
Appl. Opt. 54(12) 3658-3665 (2015)
Lluís Martínez-León and Bahram Javidi
Opt. Express 16(1) 161-169 (2008)
F. Le Clerc, M. Gross, and L. Collot
Opt. Lett. 26(20) 1550-1552 (2001)
H. Jiang, J. Zhao, J. Di, and C. Qin, “Numerically correcting the joint misplacement of the sub-holograms in spatial synthetic aperture digital Fresnel holography,” Opt. Express 17, 18836–18842 (2009).
S. T. Thurman and J. R. Fienup, “Phase-error correction in digital holography,” J. Opt. Soc. Am. A 25, 983–994 (2008).
V. Mico, Z. Zalevsky, C. Ferreira, and J. Garca, “Superresolution digital holographic microscopy for three-dimensional samples,” Opt. Express 16, 19260–19270 (2008).
B. Javidi, P. Ferraro, S.-H. Hong, S. De Nicola, A. Finizio, D. Alfieri, and G. Pierattini, “Three-dimensional image fusion by use of multiwavelength digital holography,” Opt. Lett. 30, 144–146 (2005).
J. R. Fienup and J. J. Miller, “Aberration correction by maximizing generalized sharpness metrics,” J. Opt. Soc. Am. A 20, 609–620 (2003).
R. Binet, J. Colineau, and J.-C. Lehureau, “Short-range synthetic aperture imaging at 633 nm by digital holography,” Appl. Opt. 41, 4775–4782 (2002).
J. H. Massig, “Digital off-axis holography with a synthetic aperture,” Opt. Lett. 27, 24, 2179–2181 (2002).
U. Schnars and W. P. O. Juptner, “Digital recording and numerical reconstruction of holograms,” Meas. Sci. Technol. 13, R85–R101 (2002).
T. M. Kreis, M. Adams, and W. P. O. Jueptner, “Methods of digital holography: a comparison,” Proc. SPIE 3098, 224–233 (1997).
L. G. Brown, “A survey of image registration techniques,” ACM Comput. Surv. 24, 4 (1992).
A. Kozmat and C. R. Christensent, “Effects of speckle on resolution,” J. Opt. Soc. Am. 66, 1257–1260 (1976).
C. W. Sherwin, P. Ruina, and R. D. Rawcliffe, “Some early developments in synthetic aperture radar systems,” IRE Trans. Mil. Electron. 6, 111–115 (1962).
D. J. Brady, Optical Imaging and Spectroscopy (Wiley, 2009).
L. Romero and F. Calderon, A Tutorial on Parametric Image Registration (I-Tech, 2007).
J. W. Goodman, Introduction to Fourier Optics, 3rd ed. (Roberts and Company, 2005).
J. W. Goodman, Speckle Phenomena in Optics - Theory and Applications (Roberts and Company, 2007).
OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.
Alert me when this article is cited.
Click here to see a list of articles that cite this paper
Download Full Size | PPT Slide | PDF
Table 1 The estimated parameters of the detector registration errors and the reference field errors for the WA hologram synthesis.
Table 2 The Chebychev coefficients for the reference field discrepancy.
Equations on this page are rendered with MathJax. Learn more.
The estimated parameters of the detector registration errors and the reference field errors for the WA hologram synthesis.
The Chebychev coefficients for the reference field discrepancy.