M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[Crossref]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
A. Hettwer, J. Kranz, and J. Schwider, “Three channel phase-shifting interferometer using polarization-optics and a diffraction grating,” Opt. Eng. 39(4), 960–966 (2000).
[Crossref]
J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. C. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
[Crossref]
B. B. García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]
A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera,” Appl. Opt. 38(7), 1159–1162 (1999).
[Crossref]
J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase-shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38(31), 6556–6563 (1999).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
J. Kranz, J. Lamprecht, A. Hettwer, and J. Schwider, “Fiber optical single frame speckle interferometer for measuring industrial surfaces,” Proc. SPIE 3407, 328–331 (1998).
[Crossref]
A. L. Weijers, H. van Brug, and H. J. Frankena, “Polarization phase stepping with a savart element,” Appl. Opt. 37(22), 5150–5155 (1998).
[Crossref]
H. van Brug, “Temporal phase unwrapping and its application in shearography systems,” Appl. Opt. 37(28), 6701–6706 (1998).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. C. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
[Crossref]
A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera,” Appl. Opt. 38(7), 1159–1162 (1999).
[Crossref]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[Crossref]
A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera,” Appl. Opt. 38(7), 1159–1162 (1999).
[Crossref]
A. Hettwer, J. Kranz, and J. Schwider, “Three channel phase-shifting interferometer using polarization-optics and a diffraction grating,” Opt. Eng. 39(4), 960–966 (2000).
[Crossref]
J. Kranz, J. Lamprecht, A. Hettwer, and J. Schwider, “Fiber optical single frame speckle interferometer for measuring industrial surfaces,” Proc. SPIE 3407, 328–331 (1998).
[Crossref]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase-shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38(31), 6556–6563 (1999).
[Crossref]
W. N. MacPherson, M. Reeves, D. P. Towers, A. J. Moore, J. D. C. Jones, M. Dale, and C. Edwards, “Multipoint laser vibrometer for modal analysis,” Appl. Opt. 46(16), 3126–3132 (2007).
[Crossref]
[PubMed]
M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[Crossref]
J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. C. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
[Crossref]
A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera,” Appl. Opt. 38(7), 1159–1162 (1999).
[Crossref]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase-shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38(31), 6556–6563 (1999).
[Crossref]
A. Hettwer, J. Kranz, and J. Schwider, “Three channel phase-shifting interferometer using polarization-optics and a diffraction grating,” Opt. Eng. 39(4), 960–966 (2000).
[Crossref]
J. Kranz, J. Lamprecht, A. Hettwer, and J. Schwider, “Fiber optical single frame speckle interferometer for measuring industrial surfaces,” Proc. SPIE 3407, 328–331 (1998).
[Crossref]
J. Kranz, J. Lamprecht, A. Hettwer, and J. Schwider, “Fiber optical single frame speckle interferometer for measuring industrial surfaces,” Proc. SPIE 3407, 328–331 (1998).
[Crossref]
J. E. Greivenkamp, A. E. Lowman, and R. J. Palum, “Sub-Nyquist interferometry: Implementation and measurement capability,” Opt. Eng. 35(10), 2962–2969 (1996).
[Crossref]
W. N. MacPherson, M. Reeves, D. P. Towers, A. J. Moore, J. D. C. Jones, M. Dale, and C. Edwards, “Multipoint laser vibrometer for modal analysis,” Appl. Opt. 46(16), 3126–3132 (2007).
[Crossref]
[PubMed]
T. Wu, J. D. Jones, and A. J. Moore, “High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera,” Appl. Opt. 45(23), 5845–5855 (2006).
[Crossref]
[PubMed]
M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[Crossref]
J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. C. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
[Crossref]
A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera,” Appl. Opt. 38(7), 1159–1162 (1999).
[Crossref]
B. B. García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
J. E. Greivenkamp, A. E. Lowman, and R. J. Palum, “Sub-Nyquist interferometry: Implementation and measurement capability,” Opt. Eng. 35(10), 2962–2969 (1996).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
W. N. MacPherson, M. Reeves, D. P. Towers, A. J. Moore, J. D. C. Jones, M. Dale, and C. Edwards, “Multipoint laser vibrometer for modal analysis,” Appl. Opt. 46(16), 3126–3132 (2007).
[Crossref]
[PubMed]
M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[Crossref]
J. M. Kilpatrick, A. J. Moore, J. S. Barton, J. D. C. Jones, M. Reeves, and C. Buckberry, “Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry,” Opt. Lett. 25(15), 1068–1070 (2000).
[Crossref]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
A. Hettwer, J. Kranz, and J. Schwider, “Three channel phase-shifting interferometer using polarization-optics and a diffraction grating,” Opt. Eng. 39(4), 960–966 (2000).
[Crossref]
J. Kranz, J. Lamprecht, A. Hettwer, and J. Schwider, “Fiber optical single frame speckle interferometer for measuring industrial surfaces,” Proc. SPIE 3407, 328–331 (1998).
[Crossref]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
B. B. García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
B. B. García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
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[Crossref]
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[Crossref]
H. van Brug, “Temporal phase unwrapping and its application in shearography systems,” Appl. Opt. 37(28), 6701–6706 (1998).
[Crossref]
A. J. Moore, D. P. Hand, J. S. Barton, and J. D. C. Jones, “Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera,” Appl. Opt. 38(7), 1159–1162 (1999).
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J. M. Huntley, G. H. Kaufmann, and D. Kerr, “Phase-shifted dynamic speckle pattern interferometry at 1 kHz,” Appl. Opt. 38(31), 6556–6563 (1999).
[Crossref]
B. B. García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, “Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping,” Appl. Opt. 38(28), 5944–5947 (1999).
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[Crossref]
[PubMed]
W. N. MacPherson, M. Reeves, D. P. Towers, A. J. Moore, J. D. C. Jones, M. Dale, and C. Edwards, “Multipoint laser vibrometer for modal analysis,” Appl. Opt. 46(16), 3126–3132 (2007).
[Crossref]
[PubMed]
P. D. Ruiz, J. M. Huntley, Y. Shen, C. R. Coggrave, and G. H. Kaufmann, “Phase errors in low-frequency vibration measurement with high-speed phase-shifting speckle pattern interferometry,” Opt. Eng. 40(9), 1984–1992 (2001).
[Crossref]
M. Reeves, A. J. Moore, D. P. Hand, and J. D. C. Jones, “Dynamic shape measurement system for laser materials processing,” Opt. Eng. 42(10), 2923–2929 (2003).
[Crossref]
B. Barrientos García, A. J. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi, “Spatial phase-stepped interferometry using a holographic optical element,” Opt. Eng. 38(12), 2069–2074 (1999).
[Crossref]
A. Hettwer, J. Kranz, and J. Schwider, “Three channel phase-shifting interferometer using polarization-optics and a diffraction grating,” Opt. Eng. 39(4), 960–966 (2000).
[Crossref]
J. E. Greivenkamp, A. E. Lowman, and R. J. Palum, “Sub-Nyquist interferometry: Implementation and measurement capability,” Opt. Eng. 35(10), 2962–2969 (1996).
[Crossref]
J. Kranz, J. Lamprecht, A. Hettwer, and J. Schwider, “Fiber optical single frame speckle interferometer for measuring industrial surfaces,” Proc. SPIE 3407, 328–331 (1998).
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