Abstract

Recently introduced DLP Discovery technology allows for tens of kHz binary image switching, which has great potential for superfast 3-D shape measurement. This paper presents a system that realizes 3-D shape measurement by using a DLP Discovery technology to switch binary structured patterns at very high frame rates. The sinusoidal fringe patterns are generated by properly defocusing the projector. Combining this approach with a phase-shifting method, we achieve an unprecedented rate for 3-D shape measurement: 667 Hz. This technology can be applied to numerous applications including medical science, biometrics, and entertainment.

© 2010 Optical Society of America

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References

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  1. S. Zhang, “Recent Progresses on Real-time 3-D Shape Measurement Using Digital Fringe Projection Techniques,” Opt. Laser Eng. 48, 149–158 (2010).
    [CrossRef]
  2. R. Höfling and P. Aswendt, “Real time 3D Shape Recording by DLP-based All-digital Surface Encoding,” in Proc. SPIE, vol. 7210, pp. 72,100E1-8 (2009).
  3. R. Höfling, “High-speed 3D Imaging by DMD Technology,” in Proc. SPIE,  vol. 5303, pp. 188–194 (2004).
    [CrossRef]
  4. R. Höling and E. Ahl, “ALP: Universal DMD Controller for Metrology and Testing,” in Proc. SPIE,  vol. 5289, pp. 322–329 (2004).
    [CrossRef]
  5. S. Lei and S. Zhang, “Flexible 3-D Shape Measurement Using Projector Defocusing,” Opt. Lett. 34, 3080–3082 (2009).
    [CrossRef] [PubMed]
  6. S. Lei and S. Zhang, “Digital Sinusoidal Fringe Pattern Generation: Defocusing Binary Patterns VS Focusing Sinusoidal Patterns,” Opt. Laser Eng. 48, 561–569 (2010).
    [CrossRef]
  7. D. Malacara, ed., Optical Shop Testing, 3rd ed. (John Wiley and Sons, New York, 2007).
    [CrossRef]
  8. D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (John Wiley and Sons, Inc, 1998).
  9. C. Zhang, P. S. Huang, and F.-P. Chiang, “Microscopic Phase-shifting Profilometry Based on Digital Micromirror Device Technology,” Appl. Opt. 41(8), 5896–5904 (2002).
    [CrossRef] [PubMed]
  10. S. Zhang and P. S. Huang, “Novel Method for Structured Light System Calibration,” Opt. Eng. 45(8), 083601 (2006).
    [CrossRef]

2010 (2)

S. Zhang, “Recent Progresses on Real-time 3-D Shape Measurement Using Digital Fringe Projection Techniques,” Opt. Laser Eng. 48, 149–158 (2010).
[CrossRef]

S. Lei and S. Zhang, “Digital Sinusoidal Fringe Pattern Generation: Defocusing Binary Patterns VS Focusing Sinusoidal Patterns,” Opt. Laser Eng. 48, 561–569 (2010).
[CrossRef]

2009 (2)

S. Lei and S. Zhang, “Flexible 3-D Shape Measurement Using Projector Defocusing,” Opt. Lett. 34, 3080–3082 (2009).
[CrossRef] [PubMed]

R. Höfling and P. Aswendt, “Real time 3D Shape Recording by DLP-based All-digital Surface Encoding,” in Proc. SPIE, vol. 7210, pp. 72,100E1-8 (2009).

2006 (1)

S. Zhang and P. S. Huang, “Novel Method for Structured Light System Calibration,” Opt. Eng. 45(8), 083601 (2006).
[CrossRef]

2004 (2)

R. Höfling, “High-speed 3D Imaging by DMD Technology,” in Proc. SPIE,  vol. 5303, pp. 188–194 (2004).
[CrossRef]

R. Höling and E. Ahl, “ALP: Universal DMD Controller for Metrology and Testing,” in Proc. SPIE,  vol. 5289, pp. 322–329 (2004).
[CrossRef]

2002 (1)

Ahl, E.

R. Höling and E. Ahl, “ALP: Universal DMD Controller for Metrology and Testing,” in Proc. SPIE,  vol. 5289, pp. 322–329 (2004).
[CrossRef]

Aswendt, P.

R. Höfling and P. Aswendt, “Real time 3D Shape Recording by DLP-based All-digital Surface Encoding,” in Proc. SPIE, vol. 7210, pp. 72,100E1-8 (2009).

Chiang, F.-P.

Ghiglia, D. C.

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (John Wiley and Sons, Inc, 1998).

Höfling, R.

R. Höfling and P. Aswendt, “Real time 3D Shape Recording by DLP-based All-digital Surface Encoding,” in Proc. SPIE, vol. 7210, pp. 72,100E1-8 (2009).

R. Höfling, “High-speed 3D Imaging by DMD Technology,” in Proc. SPIE,  vol. 5303, pp. 188–194 (2004).
[CrossRef]

Höling, R.

R. Höling and E. Ahl, “ALP: Universal DMD Controller for Metrology and Testing,” in Proc. SPIE,  vol. 5289, pp. 322–329 (2004).
[CrossRef]

Huang, P. S.

Lei, S.

S. Lei and S. Zhang, “Digital Sinusoidal Fringe Pattern Generation: Defocusing Binary Patterns VS Focusing Sinusoidal Patterns,” Opt. Laser Eng. 48, 561–569 (2010).
[CrossRef]

S. Lei and S. Zhang, “Flexible 3-D Shape Measurement Using Projector Defocusing,” Opt. Lett. 34, 3080–3082 (2009).
[CrossRef] [PubMed]

Malacara, D.

D. Malacara, ed., Optical Shop Testing, 3rd ed. (John Wiley and Sons, New York, 2007).
[CrossRef]

Pritt, M. D.

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (John Wiley and Sons, Inc, 1998).

Zhang, C.

Zhang, S.

S. Lei and S. Zhang, “Digital Sinusoidal Fringe Pattern Generation: Defocusing Binary Patterns VS Focusing Sinusoidal Patterns,” Opt. Laser Eng. 48, 561–569 (2010).
[CrossRef]

S. Zhang, “Recent Progresses on Real-time 3-D Shape Measurement Using Digital Fringe Projection Techniques,” Opt. Laser Eng. 48, 149–158 (2010).
[CrossRef]

S. Lei and S. Zhang, “Flexible 3-D Shape Measurement Using Projector Defocusing,” Opt. Lett. 34, 3080–3082 (2009).
[CrossRef] [PubMed]

S. Zhang and P. S. Huang, “Novel Method for Structured Light System Calibration,” Opt. Eng. 45(8), 083601 (2006).
[CrossRef]

Appl. Opt. (1)

in Proc. SPIE (2)

R. Höfling, “High-speed 3D Imaging by DMD Technology,” in Proc. SPIE,  vol. 5303, pp. 188–194 (2004).
[CrossRef]

R. Höling and E. Ahl, “ALP: Universal DMD Controller for Metrology and Testing,” in Proc. SPIE,  vol. 5289, pp. 322–329 (2004).
[CrossRef]

in Proc. SPIE, vol. (1)

R. Höfling and P. Aswendt, “Real time 3D Shape Recording by DLP-based All-digital Surface Encoding,” in Proc. SPIE, vol. 7210, pp. 72,100E1-8 (2009).

Opt. Eng. (1)

S. Zhang and P. S. Huang, “Novel Method for Structured Light System Calibration,” Opt. Eng. 45(8), 083601 (2006).
[CrossRef]

Opt. Laser Eng. (2)

S. Zhang, “Recent Progresses on Real-time 3-D Shape Measurement Using Digital Fringe Projection Techniques,” Opt. Laser Eng. 48, 149–158 (2010).
[CrossRef]

S. Lei and S. Zhang, “Digital Sinusoidal Fringe Pattern Generation: Defocusing Binary Patterns VS Focusing Sinusoidal Patterns,” Opt. Laser Eng. 48, 561–569 (2010).
[CrossRef]

Opt. Lett. (1)

Other (2)

D. Malacara, ed., Optical Shop Testing, 3rd ed. (John Wiley and Sons, New York, 2007).
[CrossRef]

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (John Wiley and Sons, Inc, 1998).

Supplementary Material (2)

» Media 1: MPG (708 KB)     
» Media 2: MPG (844 KB)     

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Figures (6)

Fig. 1.
Fig. 1.

Photograph of the superfast 3-D shape measurement system.

Fig. 2.
Fig. 2.

Example of measuring a 3-D surface. (a) Photograph of the object; (b) I 1(2π/3); (c) I 2(0); (d) I 3(2π/3); (e) Wrapped phase map; (f) Unwrapped phase map.

Fig. 3.
Fig. 3.

Measurement results of a known height object. (a) Photograph of the object; (b) 3-D plot of the measured result; (c) Plot of one cross section.

Fig. 4.
Fig. 4.

3-D plot of the measurement.

Fig. 5.
Fig. 5.

Measurement results of a vibrating cantilever beam. The color of the image indicates depth, z, information (Media 1).

Fig. 6.
Fig. 6.

Measurement results of a vibrating cantilever beam and plotted in 3-D (Media 2).

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

I 1 ( x , y ) = I ( x , y ) + I ( x , y ) cos ( ϕ 2 π / 3 ) ,
I 2 ( x , y ) = I ( x , y ) + I ( x , y ) cos ( ϕ ) ,
I 3 ( x , y ) = I ( x , y ) + I ( x , y ) cos ( ϕ + 2 π / 3 ) .
ϕ ( x , y ) = tan 1 [ 3 ( I 1 I 3 ) / ( 2 I 2 I 2 I 3 ) ] .

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