Abstract

We present a reflection based coherent diffraction imaging method which can be used to reconstruct a non periodic surface image from a diffraction amplitude measured in reflection geometry. Using a He-Ne laser, we demonstrated that a surface image can be reconstructed solely from the reflected intensity from a surface without relying on any prior knowledge of the sample object or the object support. The reconstructed phase image of the exit wave is particularly interesting since it can be used to obtain quantitative information of the surface depth profile or the phase change during the reflection process. We believe that this work will broaden the application areas of coherent diffraction imaging techniques using light sources with limited penetration depth.

© 2010 OSA

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  1. D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5(6), 843 (1952).
    [CrossRef]
  2. R. H. T. Bates, “Fourier phase problems are uniquely solvable in more than one dimension. I: Underlying theory,” Optik (Stuttg.) 61, 247–262 (1982).
  3. J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15(6), 1662–1669 (1998).
    [CrossRef]
  4. J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
    [CrossRef]
  5. R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Jena) 35, 237–246 (1972).
  6. J. R. Fienup, “Reconstruction of an object from the modulus of its Fourier transform,” Opt. Lett. 3(1), 27–29 (1978).
    [CrossRef] [PubMed]
  7. J. R. Fienup, “Phase retrieval algorithms: a comparison,” Appl. Opt. 21(15), 2758–2769 (1982).
    [CrossRef] [PubMed]
  8. J. R. Fienup and C. C. Wackerman, “Phase-retrieval stagnation problems and solutions,” J. Opt. Soc. Am. A 3(11), 1897–1907 (1986).
    [CrossRef]
  9. J. R. Fienup, “Reconstruction of a complex-valued object from the modulus of its Fourier transform using a support constraint,” J. Opt. Soc. Am. A 4(1), 118–123 (1987).
    [CrossRef]
  10. T. R. Crimmins, J. R. Fienup, and B. J. Thelen, “Improved bounds on object support from autocorrelation support and application to phase retrieval,” J. Opt. Soc. Am. A 7(1), 3–13 (1990).
    [CrossRef]
  11. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
    [CrossRef]
  12. I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
    [CrossRef] [PubMed]
  13. J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
    [CrossRef] [PubMed]
  14. Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68(22), 220101 (2003).
    [CrossRef]
  15. S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
    [CrossRef]
  16. H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
    [CrossRef]
  17. J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
    [CrossRef] [PubMed]
  18. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
    [CrossRef] [PubMed]
  19. A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
    [CrossRef]
  20. A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
    [CrossRef]
  21. J. R. Fienup, “Lensless coherent imaging by phase retrieval with an illumination pattern constraint,” Opt. Express 14(2), 498–508 (2006).
    [CrossRef] [PubMed]
  22. M. Born, and E. Wolf, Principles of Optics (Cambridge University press, 1999),7th Edition.
  23. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill Companies, Inc., 1996), 2nd ed.
  24. D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
    [CrossRef] [PubMed]

2008

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

2007

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

2006

J. R. Fienup, “Lensless coherent imaging by phase retrieval with an illumination pattern constraint,” Opt. Express 14(2), 498–508 (2006).
[CrossRef] [PubMed]

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

2005

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

2004

A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
[CrossRef]

2003

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68(22), 220101 (2003).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
[CrossRef]

2002

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

2001

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

2000

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

1999

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
[CrossRef]

1998

1990

1987

1986

1982

J. R. Fienup, “Phase retrieval algorithms: a comparison,” Appl. Opt. 21(15), 2758–2769 (1982).
[CrossRef] [PubMed]

R. H. T. Bates, “Fourier phase problems are uniquely solvable in more than one dimension. I: Underlying theory,” Optik (Stuttg.) 61, 247–262 (1982).

1978

1972

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Jena) 35, 237–246 (1972).

1952

D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5(6), 843 (1952).
[CrossRef]

Anderson, E. H.

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

Bajt, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Barty, A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Bates, R. H. T.

R. H. T. Bates, “Fourier phase problems are uniquely solvable in more than one dimension. I: Underlying theory,” Optik (Stuttg.) 61, 247–262 (1982).

Beetz, T.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Benner, W. H.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Bergh, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Bogan, M. J.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Bostedt, C.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Boutet, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Bunk, O.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Burmeister, F.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Caleman, C.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Chapman, H. N.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15(6), 1662–1669 (1998).
[CrossRef]

Charalambous, P.

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
[CrossRef]

Crimmins, T. R.

Cullis, A. G.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

David, C.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Dierolf, M.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

Dobson, B. R.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Düsterer, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Elser, V.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Fienup, J. R.

Frank, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Gerchberg, R. W.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Jena) 35, 237–246 (1972).

Hajdu, J.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Hau-Riege, S. P.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

He, H.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Hodgson, K. O.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

Hoener, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Howells, M.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Howells, M. R.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Huldt, G.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Hurst, A. C.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Ishikawa, T.

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68(22), 220101 (2003).
[CrossRef]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

Jacobsen, C.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Jefimovs, K.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Johnson, B.

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

Johnson, I.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Kirz, J.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
[CrossRef]

Kuhlmann, M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Lai, B.

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

Lee, R. W.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Lima, E.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

London, R. A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Maia, F. R. N. C.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Marchesini, S.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Menzel, A.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

Miao, H.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Miao, J.

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68(22), 220101 (2003).
[CrossRef]

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
[CrossRef]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
[CrossRef]

J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15(6), 1662–1669 (1998).
[CrossRef]

Miyoshi, T.

A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
[CrossRef]

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

Möller, T.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Neiman, A. M.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Nishino, Y.

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68(22), 220101 (2003).
[CrossRef]

Noy, A.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Pfeifer, M. A.

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

Pfeiffer, F.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Pitney, J. A.

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

Plönjes, E.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Robinson, I. K.

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

Rodenburg, J. M.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

Saito, K.

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

Saxton, W. O.

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Jena) 35, 237–246 (1972).

Sayre, D.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
[CrossRef]

J. Miao, D. Sayre, and H. N. Chapman, “Phase retrieval from the magnitude of the Fourier transforms of nonperiodic objects,” J. Opt. Soc. Am. A 15(6), 1662–1669 (1998).
[CrossRef]

D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5(6), 843 (1952).
[CrossRef]

Schneider, J. R.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Seibert, M. M.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Shapiro, D.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Shapiro, D. A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Spence, J. C. H.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Spiller, E.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Szöke, A.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Taguchi, A.

A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
[CrossRef]

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

Takahashi, S.

A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
[CrossRef]

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

Takaya, Y.

A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
[CrossRef]

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

Thelen, B. J.

Thibault, P.

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Timneanu, N.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Treusch, R.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Tschentscher, T.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

van der Spoel, D.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Vartanyants, I. A.

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

Wackerman, C. C.

Weierstall, U.

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Williams, G. J.

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

Woods, B. W.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Acta Crystallogr.

D. Sayre, “Some implications of a theorem due to Shannon,” Acta Crystallogr. 5(6), 843 (1952).
[CrossRef]

Annals CIRP

A. Taguchi, T. Miyoshi, Y. Takaya, S. Takahashi, and K. Saito, “3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method,” Annals CIRP 49(1), 423–426 (2000).
[CrossRef]

Appl. Opt.

J. Opt. Soc. Am. A

Nat. Phys.

H. N. Chapman, A. Barty, M. J. Bogan, S. Boutet, M. Frank, S. P. Hau-Riege, S. Marchesini, B. W. Woods, S. Bajt, W. H. Benner, R. A. London, E. Plönjes, M. Kuhlmann, R. Treusch, S. Düsterer, T. Tschentscher, J. R. Schneider, E. Spiller, T. Möller, C. Bostedt, M. Hoener, D. A. Shapiro, K. O. Hodgson, D. van der Spoel, F. Burmeister, M. Bergh, C. Caleman, G. Huldt, M. M. Seibert, F. R. N. C. Maia, R. W. Lee, A. Szöke, N. Timneanu, and J. Hajdu, “Femtosecond diffractive imaging with a soft-X-ray free- electron laser,” Nat. Phys. 2(12), 839–843 (2006).
[CrossRef]

Nature

J. Miao, P. Charalambous, J. Kirz, and D. Sayre, “Extending the methodology of X-ray crystallography to allow imaging of micrometer-sized non-crystalline specimens,” Nature 400(6742), 342–344 (1999).
[CrossRef]

Opt. Express

Opt. Lett.

Optik (Jena)

R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik (Jena) 35, 237–246 (1972).

Optik (Stuttg.)

R. H. T. Bates, “Fourier phase problems are uniquely solvable in more than one dimension. I: Underlying theory,” Optik (Stuttg.) 61, 247–262 (1982).

Phys. Rev. B

J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, “Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method,” Phys. Rev. B 67(17), 174104 (2003).
[CrossRef]

Y. Nishino, J. Miao, and T. Ishikawa, “Image reconstruction of nanostructured nonperiodic objects only from oversampled hard x-ray diffraction intensities,” Phys. Rev. B 68(22), 220101 (2003).
[CrossRef]

S. Marchesini, H. He, H. N. Chapman, S. P. Hau-Riege, A. Noy, M. R. Howells, U. Weierstall, and J. C. H. Spence, “X-ray image reconstruction from a diffraction pattern alone,” Phys. Rev. B 68(14), 140101 (2003).
[CrossRef]

Phys. Rev. Lett.

J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett. 98(3), 034801 (2007).
[CrossRef] [PubMed]

I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pfeifer, and J. A. Pitney, “Reconstruction of the shapes of gold nanocrystals using coherent x-ray diffraction,” Phys. Rev. Lett. 87(19), 195505 (2001).
[CrossRef] [PubMed]

J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, “High resolution 3D x-ray diffraction microscopy,” Phys. Rev. Lett. 89(8), 088303 (2002).
[CrossRef] [PubMed]

Precis. Eng.

A. Taguchi, T. Miyoshi, Y. Takaya, and S. Takahashi, “Optical 3D profilometer in- process measurement of microsurface based on phase retrieval technique,” Precis. Eng. 28(2), 152–163 (2004).
[CrossRef]

Proc. Natl. Acad. Sci. U.S.A.

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, “Biological imaging by soft x-ray diffraction microscopy,” Proc. Natl. Acad. Sci. U.S.A. 102(43), 15343–15346 (2005).
[CrossRef] [PubMed]

Science

P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, “High-resolution scanning x-ray diffraction microscopy,” Science 321(5887), 379–382 (2008).
[CrossRef] [PubMed]

Other

M. Born, and E. Wolf, Principles of Optics (Cambridge University press, 1999),7th Edition.

J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill Companies, Inc., 1996), 2nd ed.

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Figures (7)

Fig. 1
Fig. 1

Schematic of the reflection geometry used in this experiment.

Fig. 2
Fig. 2

Schematic diagram of the experimental setup. A He-Ne laser beam passing through a 500µm aperture illuminates the sample defined by another 500µm aperture. The reflected light is collected by a biconvex lens that focuses the beam on to a CCD. A microscope image of the first test sample is also illustrated.

Fig. 3
Fig. 3

Reflection pattern obtained at 15°, 30°, 45° incident angles respectively. Each of the diffraction patterns were generated by combining 30, 70, 200, 400, 800, 1500 msec, exposures. As the incident angle is increased, the diffraction pattern is elongated in the Qx direction.

Fig. 4
Fig. 4

Reconstructed amplitudes (a,b,c) and phases (d,e,f) at 15°, 30°, 45° incident angles. The images are obtained using shrinkwrap+HIO algorithm. Each image was generated by adding 11 different reconstructed amplitude/phase reconstructions starting from a random initial phase value and multiplied by the support constraint. Images are multiplied with the oblique factor of 1/cosθ i on to x scale.

Fig. 5
Fig. 5

(a) 3D rendering of the reconstructed phase map for the data obtained at an incident angle of 15°. In this 3D plotting, the phase value outside the central 70 pixels (in radius) was set to zero to illustrate the variation in phase value clearly. (b) Non-linear least squares fit for the line profile across center of phase map for the 15° incidence. The line profiles were fit to a series of step functions whose edges are smoothened by an error function. (c) Ratio of the phase error to the phase difference at the top and bottom layers.

Fig. 6
Fig. 6

Optical microscope image of a Cr letter patterned on an AR coated substrate using UV lithography.

Fig. 7
Fig. 7

Measured diffraction patterns (a,b,c) and the reconstructed amplitudes (d,e,f) and phases (g,h,i) from the sample ‘2’on an anti-reflection coated substrate at 15°, 30°, and 45° incident angles. As the angle of incidence is increased, the diffraction pattern is elongated in the Qx direction. Plotted reconstructed image size is 301x301 pixels. Image is multiplied by the support. We also multiplied the reconstructed image by the oblique factor 1/cosθ i in the x direction.

Equations (3)

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ψ r ( x , y ) = ψ 0 exp [ i k ( x sin θ i z ( x , y ) cos θ i ) ]   r ( x , y )
ψ ( X , Y ) = i k e i k ( d + X 2 + Y 2 2 d ) 2 π ψ r ( x , y ) e i k x sin θ i e i k z ( cos θ i X sin θ i d ) e i k Y y + X x cos θ i d d x d y  
ψ ( X , Y ) = i k e i k ( d + X 2 + Y 2 2 d ) 2 π ψ 0 e 2 i k z ( x , y ) cos θ i r ( x , y ) e i k Y y + X x cos θ i d d x d y   .

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