Abstract

We present a pulsed THz Imaging System with a line focus intended to speed up measurements. A balanced 1-D detection scheme working with two industrial line-scan cameras is used. The instrument is implemented without the need for an amplified laser system, increasing the industrial applicability. The instrumental characteristics are determined.

© 2010 Optical Society of America

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  1. Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
    [CrossRef]
  2. K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
    [CrossRef]
  3. F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
    [CrossRef]
  4. H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
    [CrossRef]
  5. S. Islam, M. Herrmann, and R. Beigang, "A THz triangulation and imaging system and its applications," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 498-499 (2007).
  6. M. Herrmann, S. Islam, and R. Beigang, "THz Triangulation," in International Workshop on Optical Terahertz Science and Technology 2007, p. ME7 (Optical Society of America, 2007).
  7. M. Herrmann, S. Islam, and R. Beigang, "Refractive index measurement with a THz triangulator and radar," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 762-763 (2007).
  8. T. Yasui, K. Sawanaka, A. Ihara, E. Abraham, M. Hashimoto and T. Araki, "Real-time terahertz color scanner for moving objects," Opt. Express 16(2), 1208-1221 (2008).
    [CrossRef]
  9. Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
    [CrossRef]
  10. J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
    [CrossRef]
  11. Z. Jiang, X. G. Xu, and X.-C. Zhang, "Improvement of terahertz imaging with a dynamic subtraction technique," Appl. Opt. 39, 2982-2987 (2000).
    [CrossRef]
  12. D. M. Mittleman, S. Hunsche, L. Boivin, and M. C. Nuss, "T-ray tomography," Opt. Lett. 22(12), 904-906 (1997).
    [CrossRef]
  13. B. Ferguson, S. Wang, D. Gray, D. Abbot, and X.-C. Zhang, "T-ray computed tomography," Opt. Lett. 27, 1312-1314 (2002).
    [CrossRef]

2009 (1)

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

2008 (1)

2004 (1)

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

2002 (2)

B. Ferguson, S. Wang, D. Gray, D. Abbot, and X.-C. Zhang, "T-ray computed tomography," Opt. Lett. 27, 1312-1314 (2002).
[CrossRef]

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

2000 (1)

1997 (1)

1996 (1)

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

1995 (1)

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

1982 (1)

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Abbot, D.

Abraham, E.

Araki, T.

Bauer, T.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Boivin, L.

Czasch, S.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Ferguson, B.

Gabel, C. W.

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Gray, D.

Hangyo, M.

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Hashimoto, M.

Hewitt, T. D.

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

Hunsche, S.

Ihara, A.

Jiang, Z.

Kitahara, H.

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

Leonhardt, R.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Löffler, T.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Mittleman, D. M.

Miyamaru, F.

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Mourou, G.

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Nuss, M. C.

Quast, H.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Roskos, H. G.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Sawanaka, K.

Siebert, K. J.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Tani, M.

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Thomson, M.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Valdmanis, J. A.

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Wang, S.

Wu, Q.

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Xu, X. G.

Yasui, T.

Yonera, T.

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Zhang, X.-C.

B. Ferguson, S. Wang, D. Gray, D. Abbot, and X.-C. Zhang, "T-ray computed tomography," Opt. Lett. 27, 1312-1314 (2002).
[CrossRef]

Z. Jiang, X. G. Xu, and X.-C. Zhang, "Improvement of terahertz imaging with a dynamic subtraction technique," Appl. Opt. 39, 2982-2987 (2000).
[CrossRef]

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (5)

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Jpn. J. Appl. Phys. (1)

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Opt. Express (1)

Opt. Lett. (2)

Other (3)

S. Islam, M. Herrmann, and R. Beigang, "A THz triangulation and imaging system and its applications," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 498-499 (2007).

M. Herrmann, S. Islam, and R. Beigang, "THz Triangulation," in International Workshop on Optical Terahertz Science and Technology 2007, p. ME7 (Optical Society of America, 2007).

M. Herrmann, S. Islam, and R. Beigang, "Refractive index measurement with a THz triangulator and radar," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 762-763 (2007).

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