Abstract

We present a pulsed THz Imaging System with a line focus intended to speed up measurements. A balanced 1-D detection scheme working with two industrial line-scan cameras is used. The instrument is implemented without the need for an amplified laser system, increasing the industrial applicability. The instrumental characteristics are determined.

© 2010 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
    [CrossRef]
  2. K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
    [CrossRef]
  3. F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
    [CrossRef]
  4. H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
    [CrossRef]
  5. S. Islam, M. Herrmann, and R. Beigang, "A THz triangulation and imaging system and its applications," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 498-499 (2007).
  6. M. Herrmann, S. Islam, and R. Beigang, "THz Triangulation," in International Workshop on Optical Terahertz Science and Technology 2007, p. ME7 (Optical Society of America, 2007).
  7. M. Herrmann, S. Islam, and R. Beigang, "Refractive index measurement with a THz triangulator and radar," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 762-763 (2007).
  8. T. Yasui, K. Sawanaka, A. Ihara, E. Abraham, M. Hashimoto and T. Araki, "Real-time terahertz color scanner for moving objects," Opt. Express 16(2), 1208-1221 (2008).
    [CrossRef] [PubMed]
  9. Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
    [CrossRef]
  10. J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
    [CrossRef]
  11. Z. Jiang, X. G. Xu, and X.-C. Zhang, "Improvement of terahertz imaging with a dynamic subtraction technique," Appl. Opt. 39, 2982-2987 (2000).
    [CrossRef]
  12. D. M. Mittleman, S. Hunsche, L. Boivin, and M. C. Nuss, "T-ray tomography," Opt. Lett. 22(12), 904-906 (1997).
    [CrossRef] [PubMed]
  13. B. Ferguson, S. Wang, D. Gray, D. Abbot, and X.-C. Zhang, "T-ray computed tomography," Opt. Lett. 27, 1312-1314 (2002).
    [CrossRef]

2009 (1)

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

2008 (1)

2004 (1)

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

2002 (2)

B. Ferguson, S. Wang, D. Gray, D. Abbot, and X.-C. Zhang, "T-ray computed tomography," Opt. Lett. 27, 1312-1314 (2002).
[CrossRef]

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

2000 (1)

1997 (1)

1996 (1)

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

1995 (1)

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

1982 (1)

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Abbot, D.

Abraham, E.

Araki, T.

Bauer, T.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Boivin, L.

Czasch, S.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Ferguson, B.

Gabel, C. W.

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Gray, D.

Hangyo, M.

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Hashimoto, M.

Hewitt, T. D.

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

Hunsche, S.

Ihara, A.

Jiang, Z.

Kitahara, H.

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

Leonhardt, R.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Löffler, T.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Mittleman, D. M.

Miyamaru, F.

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Mourou, G.

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Nuss, M. C.

Quast, H.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Roskos, H. G.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Sawanaka, K.

Siebert, K. J.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Tani, M.

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Thomson, M.

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Valdmanis, J. A.

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Wang, S.

Wu, Q.

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Xu, X. G.

Yasui, T.

Yonera, T.

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Zhang, X.-C.

B. Ferguson, S. Wang, D. Gray, D. Abbot, and X.-C. Zhang, "T-ray computed tomography," Opt. Lett. 27, 1312-1314 (2002).
[CrossRef]

Z. Jiang, X. G. Xu, and X.-C. Zhang, "Improvement of terahertz imaging with a dynamic subtraction technique," Appl. Opt. 39, 2982-2987 (2000).
[CrossRef]

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. Lett. (5)

H. Kitahara, M. Tani, and M. Hangyo, "Two-dimensional electro-optic sampling of terahertz radiation using high-speed complementary metal-oxide semiconductor camera combined with arrayed polarizer," Appl. Phys. Lett. 94, 091,119 (2009).
[CrossRef]

Q. Wu, T. D. Hewitt, and X.-C. Zhang, "Two-dimensional electro-optic imaging of THz beams," Appl. Phys. Lett. 69, 1026 (1996).
[CrossRef]

K. J. Siebert, H. Quast, R. Leonhardt, T. Löffler, M. Thomson, T. Bauer, H. G. Roskos, and S. Czasch, "Continuous-wave all-optoelectronic terahertz imaging," Appl. Phys. Lett. 80, 3003-3005 (2002).
[CrossRef]

Q. Wu and X.-C. Zhang, "Free-space electro-optic sampling of terahertz beams," Appl. Phys. Lett. 67, 3523 (1995).
[CrossRef]

J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett. 41, 211 (1982).
[CrossRef]

Jpn. J. Appl. Phys. (1)

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, "Terahertz Two-Dimensional Electrooptic Sampling Using High Speed Complementary Metal-Oxide Semiconductor Camera," Jpn. J. Appl. Phys. 43, L489-L491 (2004).
[CrossRef]

Opt. Express (1)

Opt. Lett. (2)

Other (3)

S. Islam, M. Herrmann, and R. Beigang, "A THz triangulation and imaging system and its applications," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 498-499 (2007).

M. Herrmann, S. Islam, and R. Beigang, "THz Triangulation," in International Workshop on Optical Terahertz Science and Technology 2007, p. ME7 (Optical Society of America, 2007).

M. Herrmann, S. Islam, and R. Beigang, "Refractive index measurement with a THz triangulator and radar," in The Joint 32nd International Conference on Infrared and Millimetre Waves and 15th International Conference on Terahertz Electronics, pp. 762-763 (2007).

Supplementary Material (1)

» Media 1: MPEG (3313 KB)     

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (6)

Fig. 1.
Fig. 1.

Setup.

Fig. 2.
Fig. 2.

(a) 2-D Parabolic Mirror, (b) ZEMAX-Simulation.

Fig. 3.
Fig. 3.

Detection Scheme.

Fig. 4.
Fig. 4.

TDS measurement. For display simplification, the picture is rotated by 90°.

Fig. 5.
Fig. 5.

“T-shaped” PTFE Sample.

Fig. 6.
Fig. 6.

(a) Spatially resolved THz Electric Field Amplitude in Time Domain (Media 1). (b) Spatially resolved THz Spectral Amplitude. (c) Example for a measured THz waveform at position x = 18.9mm. (d) Fourier transformation of the waveform plotted in (c). One can see that the bandwidth goes up to 2.5THz. However, due to the imperfect purging, water absorption lines around 1.4THz and 1.6THz and between 2.2THz and 2.3THz are seen.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

F n , m x x { A , B } ; n = 1 , , 500 ; m = 1 , , 2048
F n , m ́ x = { f k , m ́ x = ( F i , m x + F i + 1 , m x ) / 2 f l , m ́ x = ( F i , m x F i + 1 , m x ) / 2
x { A , B } ; k = 1 , , 250 ; l = 251 , , 500 ; m = 1 , , 2048 ; i = 1,3,5 , , 499
F n , m ́́ = ( F n , m ́ B F n , m ́ A ) / 2 n = 1 , , 500 ; m = 1 , , 2048 .

Metrics