Abstract

Materials used for hard x-ray-free-electron laser (XFEL) optics must withstand high-intensity x-ray pulses. The advent of the Linac Coherent Light Source has enabled us to expose candidate optical materials, such as bulk B4C and SiC films, to 0.83 keV XFEL pulses with pulse energies between 1 μJ and 2 mJ to determine short-pulse hard x-ray damage thresholds. The fluence required for the onset of damage for single pulses is around the melt fluence and slightly lower for multiple pulses. We observed strong mechanical cracking in the materials, which may be due to the larger penetration depths of the hard x-rays.

©2010 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser

Takahisa Koyama, Hirokatsu Yumoto, Yasunori Senba, Kensuke Tono, Takahiro Sato, Tadashi Togashi, Yuichi Inubushi, Tetsuo Katayama, Jangwoo Kim, Satoshi Matsuyama, Hidekazu Mimura, Makina Yabashi, Kazuto Yamauchi, Haruhiko Ohashi, and Tetsuya Ishikawa
Opt. Express 21(13) 15382-15388 (2013)

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser

Fredrik Uhlén, Daniel Nilsson, Anders Holmberg, Hans M. Hertz, Christian G. Schroer, Frank Seiboth, Jens Patommel, Vivienne Meier, Robert Hoppe, Andreas Schropp, Hae Ja Lee, Bob Nagler, Eric Galtier, Jacek Krzywinski, Harald Sinn, and Ulrich Vogt
Opt. Express 21(7) 8051-8061 (2013)

Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source

K. Tiedtke, A. A. Sorokin, U. Jastrow, P. Juranić, S. Kreis, N. Gerken, M. Richter, U. Arp, Y. Feng, D. Nordlund, R. Soufli, M. Fernández-Perea, L. Juha, P. Heimann, B. Nagler, H. J. Lee, S. Mack, M. Cammarata, O. Krupin, M. Messerschmidt, M. Holmes, M. Rowen, W. Schlotter, S. Moeller, and J. J. Turner
Opt. Express 22(18) 21214-21226 (2014)

More Recommended Articles

References

  • View by:
  • Article Order
  • |
  • Year
  • |
  • Author
  • |
  • Publication
  1. Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
    [Crossref] [PubMed]
  2. S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
    [Crossref]
  3. S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
    [Crossref]
  4. J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
    [Crossref]
  5. S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
    [Crossref]
  6. S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
    [Crossref] [PubMed]
  7. K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
    [Crossref]
  8. R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
    [Crossref]
  9. J. M. Liu, “Simple technique for measurements of pulsed Gaussian-beam spot sizes,” Opt. Lett. 7(5), 196–198 (1982).
    [Crossref] [PubMed]
  10. J. Krzywinski, et al., Focused beam properties in the High-Field AMO chamber, unpublished.
  11. B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: Photoabsorption, scattering, transmission and reflection at E = 50–30000 eV, Z-1–92,” At. Data Nucl. Data Tables 54(2), 181–342 (1993).
    [Crossref]
  12. NIST Chemistry WebBook, http://webbook.nist.gov/chemistry/
  13. S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
    [Crossref]
  14. D. C. Joy, Monte-Carlo Modeling for Electron Microscopy and Microanalysis, Oxford University Press, USA (1995).
  15. B. Ziaja, R. A. London, and J. Hajdu, “Unified model of secondary electron cascades in diamond,” J. Appl. Phys. 97(6), 064905 (2005).
    [Crossref]
  16. S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
    [Crossref] [PubMed]
  17. D. Broek, Elementary Engineering Fracture Mechanics, Springer, USA (1982).

2010 (1)

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

2009 (5)

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

2008 (2)

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

2007 (2)

S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

2005 (1)

B. Ziaja, R. A. London, and J. Hajdu, “Unified model of secondary electron cascades in diamond,” J. Appl. Phys. 97(6), 064905 (2005).
[Crossref]

1993 (1)

B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: Photoabsorption, scattering, transmission and reflection at E = 50–30000 eV, Z-1–92,” At. Data Nucl. Data Tables 54(2), 181–342 (1993).
[Crossref]

1982 (1)

Ables, E.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Altapova, V.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Azima, A.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Bajt, S.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

Baker, S. L.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Bergh, M.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
[Crossref] [PubMed]

Bionta, R.

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

Bionta, R. M.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Bittner, L.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Bonfigt, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Brachmann, A.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Burian, T.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Caleman, C.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Chalupsky, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Chalupský, J.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

Chapman, H. N.

S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
[Crossref] [PubMed]

Cihelka, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Davis, J. C.

B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: Photoabsorption, scattering, transmission and reflection at E = 50–30000 eV, Z-1–92,” At. Data Nucl. Data Tables 54(2), 181–342 (1993).
[Crossref]

Decker, F.-J.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Ding, Y.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Dowell, D.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Düsterer, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Emma, P.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Faatz, B.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Feldhaus, J.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Frisch, J.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Frühling, U.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Gaudin, J.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Gensch, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Gerth, Ch.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Gilevich, S.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Gleeson, A. J.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Guerassimova, N.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Gullikson, E. M.

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: Photoabsorption, scattering, transmission and reflection at E = 50–30000 eV, Z-1–92,” At. Data Nucl. Data Tables 54(2), 181–342 (1993).
[Crossref]

Hahn, U.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Hajdu, J.

B. Ziaja, R. A. London, and J. Hajdu, “Unified model of secondary electron cascades in diamond,” J. Appl. Phys. 97(6), 064905 (2005).
[Crossref]

Hajkova, V.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Hájková, V.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

Hans, T.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Hau-Riege, S. P.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
[Crossref] [PubMed]

Hays, G.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Henke, B. L.

B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: Photoabsorption, scattering, transmission and reflection at E = 50–30000 eV, Z-1–92,” At. Data Nucl. Data Tables 54(2), 181–342 (1993).
[Crossref]

Hering, Ph.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Hesse, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Honkavaar, K.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Huang, Z.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Iverson, R.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Jastrow, U.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Juha, L.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Juranic, P.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Jurek, M.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Kapitzki, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Keitel, B.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Kishiyama, K. I.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Klinger, D.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

Kracht, T.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Krasa, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Krása, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

Krzywinski, J.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Kuba, J.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Kuhlmann, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Li, W. B.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Liu, J. M.

London, R. A.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

B. Ziaja, R. A. London, and J. Hajdu, “Unified model of secondary electron cascades in diamond,” J. Appl. Phys. 97(6), 064905 (2005).
[Crossref]

Loos, H.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Martins, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

McCarville, T. J.

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

McKernan, M. A.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

McMahon, D. H.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Messerschmidt, M.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Miahnahri, A.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Nataraj, P.

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

Nietubyc, R.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Nuhn, H.-D.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Nuñez, T.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Pelka, J. B.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Pivovaroff, M. J.

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

Plönjes, E.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Ratner, D.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Redlin, H.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Robinson, J. C.

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

Ryutov, D.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

Ryutov, D. D.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
[Crossref]

Saldin, E. L.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Schneider, J. R.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Schneidmiller, E. A.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Schreiber, S.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Shen, S.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Shirk, M.

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

Sinn, H.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Smith, P. M.

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

Sobierajski, R.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Sokolowski-Tinten, K.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Soufli, R.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

Stefan, P.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

Stojanovic, N.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Störmer, M.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Tavella, F.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Tiedtke, K.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Timneanu, N.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

Toleikis, S.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Treusch, R.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Tschentscher, Th.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Turner, J.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Velyhan, A.

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

von Bargen, N.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Vyšín, L.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

Wabnitz, H.

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Weigelt, H.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Welch, J.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Wellhöfer, M.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

White, W.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Wu, J.

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

Yurkov, M. V.

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Zastrau, U.

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

Ziaja, B.

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

B. Ziaja, R. A. London, and J. Hajdu, “Unified model of secondary electron cascades in diamond,” J. Appl. Phys. 97(6), 064905 (2005).
[Crossref]

Appl. Phys. Lett. (4)

S. P. Hau-Riege, R. A. London, R. M. Bionta, D. Ryutov, R. Soufli, S. Bajt, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, D. Klinger, J. B. Pelka, M. Jurek, L. Juha, J. Chalupský, J. Cihelka, V. Hájková, A. Velyhan, J. Krása, K. Tiedtke, S. Toleikis, H. Wabnitz, M. Bergh, C. Caleman, and N. Timneanu, “Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation,” Appl. Phys. Lett. 95(11), 111104 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, M. A. McKernan, S. L. Baker, J. Krzywinski, R. Sobierajski, R. Nietubyc, J. B. Pelka, M. Jurek, L. Juha, J. Chalupsky, J. Cihelka, V. Hajkova, A. Velyhan, J. Krasa, J. Kuba, K. Tiedtke, S. Toleikis, Th. Tschentscher, H. Wabnitz, M. Bergh, C. Caleman, K. Sokolowski-Tinten, N. Stojanovic, and U. Zastrau, “Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength,” Appl. Phys. Lett. 90(17), 173128 (2007).
[Crossref]

J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin, “Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle,” Appl. Phys. Lett. 95(3), 031111 (2009).
[Crossref]

S. P. Hau-Riege, R. A. London, R. M. Bionta, R. Soufli, D. Ryutov, M. Shirk, S. L. Baker, P. M. Smith, and P. Nataraj, “Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser,” Appl. Phys. Lett. 93(20), 201105 (2008).
[Crossref]

At. Data Nucl. Data Tables (1)

B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: Photoabsorption, scattering, transmission and reflection at E = 50–30000 eV, Z-1–92,” At. Data Nucl. Data Tables 54(2), 181–342 (1993).
[Crossref]

J. Appl. Phys. (2)

B. Ziaja, R. A. London, and J. Hajdu, “Unified model of secondary electron cascades in diamond,” J. Appl. Phys. 97(6), 064905 (2005).
[Crossref]

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, and J. Krzywinski, “Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas,” J. Appl. Phys. 103(5), 053306 (2008).
[Crossref]

N. J. Phys. (1)

K. Tiedtke, A. Azima, N. von Bargen, L. Bittner, S. Bonfigt, S. Düsterer, B. Faatz, U. Frühling, M. Gensch, Ch. Gerth, N. Guerassimova, U. Hahn, T. Hans, M. Hesse, K. Honkavaar, U. Jastrow, P. Juranic, S. Kapitzki, B. Keitel, T. Kracht, M. Kuhlmann, W. B. Li, M. Martins, T. Nuñez, E. Plönjes, H. Redlin, E. L. Saldin, E. A. Schneidmiller, J. R. Schneider, S. Schreiber, N. Stojanovic, F. Tavella, S. Toleikis, R. Treusch, H. Weigelt, M. Wellhöfer, H. Wabnitz, M. V. Yurkov, and J. Feldhaus, “The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations,” N. J. Phys. 11(2), 023029 (2009).
[Crossref]

Opt. Lett. (1)

Phys. Rev. E Stat. Nonlin. Soft Matter Phys. (1)

S. P. Hau-Riege, R. A. London, H. N. Chapman, and M. Bergh, “Soft-x-ray free-electron-laser interaction with materials,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 76(4), 046403 (2007).
[Crossref] [PubMed]

Phys. Rev. Lett. (2)

Y. Ding, A. Brachmann, F.-J. Decker, D. Dowell, P. Emma, J. Frisch, S. Gilevich, G. Hays, Ph. Hering, Z. Huang, R. Iverson, H. Loos, A. Miahnahri, H.-D. Nuhn, D. Ratner, J. Turner, J. Welch, W. White, and J. Wu, “Measurements and simulations of ultralow emittance and ultrashort electron beams in the linac coherent light source,” Phys. Rev. Lett. 102(25), 254801 (2009).
[Crossref] [PubMed]

S. P. Hau-Riege, R. M. Bionta, D. D. Ryutov, R. A. London, E. Ables, K. I. Kishiyama, S. Shen, M. A. McKernan, D. H. McMahon, M. Messerschmidt, J. Krzywinski, P. Stefan, J. Turner, and B. Ziaja, “Near-ultraviolet luminescence of N2 irradiated by short X-ray pulses,” Phys. Rev. Lett. 105(4), 043003 (2010).
[Crossref] [PubMed]

Proc. SPIE (1)

R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. P. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” Proc. SPIE 7361, 73610U (2009).
[Crossref]

Other (4)

J. Krzywinski, et al., Focused beam properties in the High-Field AMO chamber, unpublished.

D. Broek, Elementary Engineering Fracture Mechanics, Springer, USA (1982).

NIST Chemistry WebBook, http://webbook.nist.gov/chemistry/

D. C. Joy, Monte-Carlo Modeling for Electron Microscopy and Microanalysis, Oxford University Press, USA (1995).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

SEM pictures of bulk B4C exposed to single XFEL pulses at 0.83 keV and peak fluences of (a) 2.6, (b) 5.4, (c) 7.0, (d) 11.4, (e) 19.6, and (f) 90.5 J/cm2.

Download Full Size | PPT Slide | PDF

Fig. 2
Fig. 2

Damage area as a function of the logarithm of the beam energy for bulk B4C exposed at a photon energy of 0.83 keV. Only the data points plotted as solid squares are included in the linear fit since at high pulse energies (open squares) fracture in the sample leads to significantly larger damage areas.

Download Full Size | PPT Slide | PDF

Fig. 3
Fig. 3

Single and multiple-pulse damage threshold of bulk B4C. Open symbols indicate observed surface damage, and closed symbols indicate that no damage was found in SEM images. The star symbol indicates single-pulse damage.

Download Full Size | PPT Slide | PDF

Fig. 4
Fig. 4

SEM pictures of a SiC film exposed to single XFEL pulses at 0.83 keV and peak fluences of (a) 1.0, (b) 1.6, (c) 2.9, (d) 5.8, (e) 14.8, and (f) 57.5 J/cm2.

Download Full Size | PPT Slide | PDF

Metrics