X. Hou, F. Wu, L. Yang, S. B. Wu, and Q. Chen, “Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces,” Appl. Opt. 45(15), 3442–3455 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Comparison of annular wavefront interpretation with Zernike circle polynomials and annular polynomials,” Appl. Opt. 45(35), 8893–8901 (2006).

[CrossRef]
[PubMed]

F. Granados-Agustín, J. F. Escobar-Romero, and A. Cornejo-Rodríguez, “Testing parabolic surfaces with annular subaperture interferograms,” Opt. Rev. 11, 82–86 (2004).

[CrossRef]

P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

T. D. Raymond, D. R. Neal, D. M. Topa, and T. L. Schmitz, “High-speed noninterferometric nanotopographic characterization of Si wafer surfaces,” Proc. SPIE 4809, 208–216 (2002).

[CrossRef]

M. Otsubo, K. Okada, and J. Tsujiuchi, “Measurement of large plane surface shapes by connecting small-aperture interferograms,” Opt. Eng. 33(2), 608–613 (1994).

[CrossRef]

M. Melozzi, L. Pezzati, and A. Mazzoni, “Testing aspheric surfaces using multiple annular interferograms,” Opt. Eng. 32(5), 1073–1079 (1993).

[CrossRef]

T. W. Stuhlinger, “Subaperture optical testing: experimental verification,” Proc. SPIE 656, 118–127 (1986).

X. Hou, F. Wu, L. Yang, and Q. Chen, “Experimental study on measurement of aspheric surface shape with complementary annular subaperture interferometric method,” Opt. Express 15(20), 12890–12899 (2007).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Comparison of annular wavefront interpretation with Zernike circle polynomials and annular polynomials,” Appl. Opt. 45(35), 8893–8901 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, S. B. Wu, and Q. Chen, “Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces,” Appl. Opt. 45(15), 3442–3455 (2006).

[CrossRef]
[PubMed]

F. Granados-Agustín, J. F. Escobar-Romero, and A. Cornejo-Rodríguez, “Testing parabolic surfaces with annular subaperture interferograms,” Opt. Rev. 11, 82–86 (2004).

[CrossRef]

P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

F. Granados-Agustín, J. F. Escobar-Romero, and A. Cornejo-Rodríguez, “Testing parabolic surfaces with annular subaperture interferograms,” Opt. Rev. 11, 82–86 (2004).

[CrossRef]

P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

F. Granados-Agustín, J. F. Escobar-Romero, and A. Cornejo-Rodríguez, “Testing parabolic surfaces with annular subaperture interferograms,” Opt. Rev. 11, 82–86 (2004).

[CrossRef]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Experimental study on measurement of aspheric surface shape with complementary annular subaperture interferometric method,” Opt. Express 15(20), 12890–12899 (2007).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Comparison of annular wavefront interpretation with Zernike circle polynomials and annular polynomials,” Appl. Opt. 45(35), 8893–8901 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, S. B. Wu, and Q. Chen, “Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces,” Appl. Opt. 45(15), 3442–3455 (2006).

[CrossRef]
[PubMed]

J. G. Thunen and O. Y. Kwon, “Full aperture testing with subaperture test optics,” Proc. SPIE 351, 19–27 (1982).

M. Melozzi, L. Pezzati, and A. Mazzoni, “Testing aspheric surfaces using multiple annular interferograms,” Opt. Eng. 32(5), 1073–1079 (1993).

[CrossRef]

M. Melozzi, L. Pezzati, and A. Mazzoni, “Testing aspheric surfaces using multiple annular interferograms,” Opt. Eng. 32(5), 1073–1079 (1993).

[CrossRef]

P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

T. D. Raymond, D. R. Neal, D. M. Topa, and T. L. Schmitz, “High-speed noninterferometric nanotopographic characterization of Si wafer surfaces,” Proc. SPIE 4809, 208–216 (2002).

[CrossRef]

M. Otsubo, K. Okada, and J. Tsujiuchi, “Measurement of large plane surface shapes by connecting small-aperture interferograms,” Opt. Eng. 33(2), 608–613 (1994).

[CrossRef]

M. Otsubo, K. Okada, and J. Tsujiuchi, “Measurement of large plane surface shapes by connecting small-aperture interferograms,” Opt. Eng. 33(2), 608–613 (1994).

[CrossRef]

M. Melozzi, L. Pezzati, and A. Mazzoni, “Testing aspheric surfaces using multiple annular interferograms,” Opt. Eng. 32(5), 1073–1079 (1993).

[CrossRef]

T. D. Raymond, D. R. Neal, D. M. Topa, and T. L. Schmitz, “High-speed noninterferometric nanotopographic characterization of Si wafer surfaces,” Proc. SPIE 4809, 208–216 (2002).

[CrossRef]

T. D. Raymond, D. R. Neal, D. M. Topa, and T. L. Schmitz, “High-speed noninterferometric nanotopographic characterization of Si wafer surfaces,” Proc. SPIE 4809, 208–216 (2002).

[CrossRef]

T. W. Stuhlinger, “Subaperture optical testing: experimental verification,” Proc. SPIE 656, 118–127 (1986).

J. G. Thunen and O. Y. Kwon, “Full aperture testing with subaperture test optics,” Proc. SPIE 351, 19–27 (1982).

T. D. Raymond, D. R. Neal, D. M. Topa, and T. L. Schmitz, “High-speed noninterferometric nanotopographic characterization of Si wafer surfaces,” Proc. SPIE 4809, 208–216 (2002).

[CrossRef]

P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

M. Otsubo, K. Okada, and J. Tsujiuchi, “Measurement of large plane surface shapes by connecting small-aperture interferograms,” Opt. Eng. 33(2), 608–613 (1994).

[CrossRef]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Experimental study on measurement of aspheric surface shape with complementary annular subaperture interferometric method,” Opt. Express 15(20), 12890–12899 (2007).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Comparison of annular wavefront interpretation with Zernike circle polynomials and annular polynomials,” Appl. Opt. 45(35), 8893–8901 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, S. B. Wu, and Q. Chen, “Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces,” Appl. Opt. 45(15), 3442–3455 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Experimental study on measurement of aspheric surface shape with complementary annular subaperture interferometric method,” Opt. Express 15(20), 12890–12899 (2007).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, S. B. Wu, and Q. Chen, “Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces,” Appl. Opt. 45(15), 3442–3455 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Comparison of annular wavefront interpretation with Zernike circle polynomials and annular polynomials,” Appl. Opt. 45(35), 8893–8901 (2006).

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X. Hou, F. Wu, L. Yang, S. B. Wu, and Q. Chen, “Full-aperture wavefront reconstruction from annular subaperture interferometric data by use of Zernike annular polynomials and a matrix method for testing large aspheric surfaces,” Appl. Opt. 45(15), 3442–3455 (2006).

[CrossRef]
[PubMed]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Comparison of annular wavefront interpretation with Zernike circle polynomials and annular polynomials,” Appl. Opt. 45(35), 8893–8901 (2006).

[CrossRef]
[PubMed]

M. Melozzi, L. Pezzati, and A. Mazzoni, “Testing aspheric surfaces using multiple annular interferograms,” Opt. Eng. 32(5), 1073–1079 (1993).

[CrossRef]

M. Otsubo, K. Okada, and J. Tsujiuchi, “Measurement of large plane surface shapes by connecting small-aperture interferograms,” Opt. Eng. 33(2), 608–613 (1994).

[CrossRef]

X. Hou, F. Wu, L. Yang, and Q. Chen, “Experimental study on measurement of aspheric surface shape with complementary annular subaperture interferometric method,” Opt. Express 15(20), 12890–12899 (2007).

[CrossRef]
[PubMed]

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[CrossRef]
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P. Murphy, G. Forbes, J. Fleig, P. Dumas, and M. Tricard, “Stitching interferometry: a flexible solution for surface metrology,” Opt. Photon. News 14(5), 38–43 (2003).

[CrossRef]

F. Granados-Agustín, J. F. Escobar-Romero, and A. Cornejo-Rodríguez, “Testing parabolic surfaces with annular subaperture interferograms,” Opt. Rev. 11, 82–86 (2004).

[CrossRef]

T. W. Stuhlinger, “Subaperture optical testing: experimental verification,” Proc. SPIE 656, 118–127 (1986).

T. D. Raymond, D. R. Neal, D. M. Topa, and T. L. Schmitz, “High-speed noninterferometric nanotopographic characterization of Si wafer surfaces,” Proc. SPIE 4809, 208–216 (2002).

[CrossRef]

J. G. Thunen and O. Y. Kwon, “Full aperture testing with subaperture test optics,” Proc. SPIE 351, 19–27 (1982).

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