Abstract

A transmission W/B4C multilayer has been designed and characterized which shows significant phase retardation up to a photon energy of 1 keV, when operated near the Bragg condition. This allows, for the first time, the full polarization vector of soft x-radiation to be measured up to 1 keV in a self-calibrating method. Quantitative polarimetry is now possible across the 2p edges of all the transition metals.

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  1. M. Born, and E. Wolf, Principles of Optics, 7th (expanded) edition. (Cambridge University Press, Cambridge, England. 1999)
  2. A. Gaupp and M. Mast, “First experimental experience with a VUV polarimeter at BESSY,” Rev. Sci. Instrum. 60(7), 2213–2215 (1989).
    [CrossRef]
  3. F. Schäfers, H.-C. Mertins, A. Gaupp, W. Gudat, M. Mertin, I. Packe, F. Schmolla, S. Di Fonzo, G. Soullié, W. Jark, R. Walker, X. Le Cann, R. Nyholm, and M. Eriksson, “Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light,” Appl. Opt. 38(19), 4074–4088 (1999).
    [CrossRef] [PubMed]
  4. T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
    [CrossRef]
  5. C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
    [CrossRef]
  6. T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
    [CrossRef] [PubMed]
  7. G. Rosenbaum, B. Feuerbacher, R. P. Godwin, and M. Skibowski, “Measurement of the Polarization of Extreme Ultraviolet Synchrotron Radiation with a Reflecting Polarimeter,” Appl. Opt. 7(10), 1917–1919 (1968).
    [CrossRef] [PubMed]
  8. W. R. Hunter, “Design criteria for reflection polarizers and analyzers in the vacuum ultraviolet,” Appl. Opt. 17(8), 1259–1270 (1978).
    [CrossRef] [PubMed]
  9. T. Koide, T. Shidara, and M. Yuri, “Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation,” Nucl. Instr. Meth. A. 336(1-2), 368–372 (1993).
    [CrossRef]
  10. P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
    [CrossRef]
  11. L. Nahon and C. Alcaraz, “SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuum-ultraviolet range,” Appl. Opt. 43(5), 1024–1037 (2004).
    [CrossRef] [PubMed]
  12. S. R. Naik and G. S. Lodha, “The effect of misalignment errors in optical elements of VUV polarimeter,” Nucl. Instrum. Meth. A. 560(2), 211–218 (2006).
    [CrossRef]
  13. F. Schäfers, H.-C. Mertins, F. Schmolla, I. Packe, N. N. Salashchenko, and E. A. Shamov, “Cr /sc multilayers for the soft-x-ray range,” Appl. Opt. 37(4), 719–728 (1998).
    [CrossRef] [PubMed]
  14. J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
    [CrossRef]
  15. J. B. Kortright, M. Rice, and R. Carr, “Soft-x-ray Faraday rotation at L2,3 edges,” Phys. Rev. B 51(15), 10240–10243 (1995).
    [CrossRef]
  16. J. B. Kortright, M. Rice, and K. D. Franck, “Tuneable Multilayer EUV/soft x-ray polarimeter,” Rev. Sci. Instrum. 66(2), 1567–1569 (1995).
    [CrossRef]
  17. S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
    [CrossRef]
  18. S. Di Fonzo, W. Jark, F. Schafers, H. Petersen, A. Gaupp, and J. H. Underwood, “Phase-retardation and full-polarization analysis of soft-x-ray synchrotron radiation close to the carbon K edge by use of a multilayer transmission filter,” Appl. Opt. 33(13), 2624–2632 (1994).
    [CrossRef]
  19. H.-C. Mertins, F. Schäfers, H. Grimmer, D. Clemens, P. Böni, and M. Horisberger, “W/C, W/Ti, Ni/Ti, and Ni/V multilayers for the soft-x-ray range: experimental investigation with synchrotron radiation,” Appl. Opt. 37(10), 1873–1882 (1998).
    [CrossRef] [PubMed]
  20. H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
    [CrossRef]
  21. M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
    [CrossRef] [PubMed]
  22. T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
    [CrossRef] [PubMed]
  23. J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
    [CrossRef] [PubMed]
  24. T. Imazono, and M. Koike, “Theoretical Investigation of Transmission-Type Phase Shifter Made with Muscovite Mica Crystal for 1-keV Region,” in Ninth International Conference on Synchrotron Radiation Instrumentation, J.-Y. Choi, S. Rah, eds. (AIP) AIP Conf. Proc. 879, 690–693, (2007).
  25. T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
    [CrossRef]
  26. T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
    [CrossRef]
  27. F. Schäfers, R. Pohl, A. Gaupp, and M. A. MacDonald, “A Cr/Sc Transmission Multilayer as a dual-band Quarter-Wave Plate for Soft X-Ray Polarimetry,” to be submitted.
  28. R. Pohl, (2008), Diploma thesis, Fachhochschule Münster.
  29. E. M. Gullikson, “Atomic Scatering Factors,” X-Ray Data Booklet, Center for X-ray Optics and Advanced Light Source, Lawrence Berkeley National Laboratory.
  30. A. Gaupp, F. Schäfers, and S. Braun, “W/B4C multilayers for soft x-ray polarisation analysis” BESSY Annual Report, (2005).
  31. M. Weiss, K. J. S. Sawhney, R. Follath, H.-C. Mertins, F. Schäfers, W. Frentrup, A. Gaupp, M. Scheer, J. Bahrdt, F. Senf, and W. Gudat, in P. Pianetta et al. (eds.) Proc. Synchrotron Radiation Instrumentation, Eleventh US National Conference (SRI99) American Institute of Physics, New York, 134–137 (2000).
  32. K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
    [CrossRef]
  33. R. Follath, “The versatility of collimated plane grating monochromators,” Nucl.Instr.Meth. A. 467–468, 418–425 (2001).
    [CrossRef]
  34. A. Gaupp, M. A. MacDonald, and F. Schäfers, A W/B4C Transmission Multilayer as an Achromatic Phase Shifter in the XUV: Some Experimental Aspects”, Submitted, Nucl.Instr.Meth. Special edition for SRI 2009 Conference.
  35. Computed from the atomic scattering factors from CXRO http://wwwcxro.lbl.gov and LLNL http://www-phys.llnl.gov/V_Div/scattering/asf.html (using the files included in IMD2.1).
  36. D. L. Windt, Comput. Phys., “IMD — software for modeling the optical properties of multilayer films,” 12, 360 (1998).
  37. W. B. Westerveld, K. Becker, P. W. Zetner, J. J. Corr, and J. W. McConkey, “Production and measurement of circular polarization in the VUV,” Appl. Opt. 24(14), 2256–2262 (1985).
    [CrossRef] [PubMed]

2009

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

2008

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

2006

S. R. Naik and G. S. Lodha, “The effect of misalignment errors in optical elements of VUV polarimeter,” Nucl. Instrum. Meth. A. 560(2), 211–218 (2006).
[CrossRef]

2005

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

2004

P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
[CrossRef]

L. Nahon and C. Alcaraz, “SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuum-ultraviolet range,” Appl. Opt. 43(5), 1024–1037 (2004).
[CrossRef] [PubMed]

2001

R. Follath, “The versatility of collimated plane grating monochromators,” Nucl.Instr.Meth. A. 467–468, 418–425 (2001).
[CrossRef]

1999

1998

1997

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

1996

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

1995

J. B. Kortright, M. Rice, and R. Carr, “Soft-x-ray Faraday rotation at L2,3 edges,” Phys. Rev. B 51(15), 10240–10243 (1995).
[CrossRef]

J. B. Kortright, M. Rice, and K. D. Franck, “Tuneable Multilayer EUV/soft x-ray polarimeter,” Rev. Sci. Instrum. 66(2), 1567–1569 (1995).
[CrossRef]

S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
[CrossRef]

1994

1993

T. Koide, T. Shidara, and M. Yuri, “Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation,” Nucl. Instr. Meth. A. 336(1-2), 368–372 (1993).
[CrossRef]

1992

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

1991

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

1989

A. Gaupp and M. Mast, “First experimental experience with a VUV polarimeter at BESSY,” Rev. Sci. Instrum. 60(7), 2213–2215 (1989).
[CrossRef]

1985

1978

1968

Alcaraz, C.

L. Nahon and C. Alcaraz, “SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuum-ultraviolet range,” Appl. Opt. 43(5), 1024–1037 (2004).
[CrossRef] [PubMed]

C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
[CrossRef]

Bahrdt, J.

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

Becker, K.

Binns, C.

P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
[CrossRef]

Böni, P.

Carr, R.

J. B. Kortright, M. Rice, and R. Carr, “Soft-x-ray Faraday rotation at L2,3 edges,” Phys. Rev. B 51(15), 10240–10243 (1995).
[CrossRef]

Clemens, D.

Compin, M.

C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
[CrossRef]

Corr, J. J.

De Bergevin, F.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Di Fonzo, S.

Drecher, M.

C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
[CrossRef]

Eriksson, M.

Feuerbacher, B.

Finetti, P.

P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
[CrossRef]

Follath, R.

R. Follath, “The versatility of collimated plane grating monochromators,” Nucl.Instr.Meth. A. 467–468, 418–425 (2001).
[CrossRef]

Franck, K. D.

J. B. Kortright, M. Rice, and K. D. Franck, “Tuneable Multilayer EUV/soft x-ray polarimeter,” Rev. Sci. Instrum. 66(2), 1567–1569 (1995).
[CrossRef]

Fukutani, H.

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Gaupp, A.

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

F. Schäfers, H.-C. Mertins, A. Gaupp, W. Gudat, M. Mertin, I. Packe, F. Schmolla, S. Di Fonzo, G. Soullié, W. Jark, R. Walker, X. Le Cann, R. Nyholm, and M. Eriksson, “Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light,” Appl. Opt. 38(19), 4074–4088 (1999).
[CrossRef] [PubMed]

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
[CrossRef]

S. Di Fonzo, W. Jark, F. Schafers, H. Petersen, A. Gaupp, and J. H. Underwood, “Phase-retardation and full-polarization analysis of soft-x-ray synchrotron radiation close to the carbon K edge by use of a multilayer transmission filter,” Appl. Opt. 33(13), 2624–2632 (1994).
[CrossRef]

A. Gaupp and M. Mast, “First experimental experience with a VUV polarimeter at BESSY,” Rev. Sci. Instrum. 60(7), 2213–2215 (1989).
[CrossRef]

F. Schäfers, R. Pohl, A. Gaupp, and M. A. MacDonald, “A Cr/Sc Transmission Multilayer as a dual-band Quarter-Wave Plate for Soft X-Ray Polarimetry,” to be submitted.

Giles, C.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Godwin, R. P.

Goulon, J.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Grimmer, H.

Gudat, W.

F. Schäfers, H.-C. Mertins, A. Gaupp, W. Gudat, M. Mertin, I. Packe, F. Schmolla, S. Di Fonzo, G. Soullié, W. Jark, R. Walker, X. Le Cann, R. Nyholm, and M. Eriksson, “Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light,” Appl. Opt. 38(19), 4074–4088 (1999).
[CrossRef] [PubMed]

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

Hirono, T.

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

Holland, D. M. P.

P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
[CrossRef]

Horisberger, M.

Hunter, W. R.

Imazono, T.

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Ishikawa, T.

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

Ishino, M.

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Jark, W.

Jolly, A.

C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
[CrossRef]

Kandaka, N.

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Kawachi, T.

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

Kimura, H.

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

Koide, T.

T. Koide, T. Shidara, and M. Yuri, “Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation,” Nucl. Instr. Meth. A. 336(1-2), 368–372 (1993).
[CrossRef]

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Koike, M.

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Kortright, J. B.

J. B. Kortright, M. Rice, and K. D. Franck, “Tuneable Multilayer EUV/soft x-ray polarimeter,” Rev. Sci. Instrum. 66(2), 1567–1569 (1995).
[CrossRef]

J. B. Kortright, M. Rice, and R. Carr, “Soft-x-ray Faraday rotation at L2,3 edges,” Phys. Rev. B 51(15), 10240–10243 (1995).
[CrossRef]

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

Latimer, C. J.

P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
[CrossRef]

Le Cann, X.

Lodha, G. S.

S. R. Naik and G. S. Lodha, “The effect of misalignment errors in optical elements of VUV polarimeter,” Nucl. Instrum. Meth. A. 560(2), 211–218 (2006).
[CrossRef]

MacDonald, M. A.

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

F. Schäfers, R. Pohl, A. Gaupp, and M. A. MacDonald, “A Cr/Sc Transmission Multilayer as a dual-band Quarter-Wave Plate for Soft X-Ray Polarimetry,” to be submitted.

Malgrange, C.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Mast, M.

A. Gaupp and M. Mast, “First experimental experience with a VUV polarimeter at BESSY,” Rev. Sci. Instrum. 60(7), 2213–2215 (1989).
[CrossRef]

Mayama, K.

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

McConkey, J. W.

Mertin, M.

Mertins, H.-C.

Moguiline, E.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Müller, B. R.

S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
[CrossRef]

Muramatsu, Y.

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Nahon, L.

L. Nahon and C. Alcaraz, “SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuum-ultraviolet range,” Appl. Opt. 43(5), 1024–1037 (2004).
[CrossRef] [PubMed]

C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
[CrossRef]

Naik, S. R.

S. R. Naik and G. S. Lodha, “The effect of misalignment errors in optical elements of VUV polarimeter,” Nucl. Instrum. Meth. A. 560(2), 211–218 (2006).
[CrossRef]

Neumann, C.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Nikitin, V.

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

Nyholm, R.

Packe, I.

Petersen, H.

Pohl, R.

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

F. Schäfers, R. Pohl, A. Gaupp, and M. A. MacDonald, “A Cr/Sc Transmission Multilayer as a dual-band Quarter-Wave Plate for Soft X-Ray Polarimetry,” to be submitted.

Poole, I. B.

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

Quinn, F. M.

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

Rice, M.

J. B. Kortright, M. Rice, and R. Carr, “Soft-x-ray Faraday rotation at L2,3 edges,” Phys. Rev. B 51(15), 10240–10243 (1995).
[CrossRef]

J. B. Kortright, M. Rice, and K. D. Franck, “Tuneable Multilayer EUV/soft x-ray polarimeter,” Rev. Sci. Instrum. 66(2), 1567–1569 (1995).
[CrossRef]

Rogalev, A.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Rosenbaum, G.

Saitoh, Y.

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Salashchenko, N. N.

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

F. Schäfers, H.-C. Mertins, F. Schmolla, I. Packe, N. N. Salashchenko, and E. A. Shamov, “Cr /sc multilayers for the soft-x-ray range,” Appl. Opt. 37(4), 719–728 (1998).
[CrossRef] [PubMed]

Sano, K.

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Sawhney, K. J. S.

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

Schaefers, F.

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

Schafers, F.

Schäfers, F.

F. Schäfers, H.-C. Mertins, A. Gaupp, W. Gudat, M. Mertin, I. Packe, F. Schmolla, S. Di Fonzo, G. Soullié, W. Jark, R. Walker, X. Le Cann, R. Nyholm, and M. Eriksson, “Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light,” Appl. Opt. 38(19), 4074–4088 (1999).
[CrossRef] [PubMed]

F. Schäfers, H.-C. Mertins, F. Schmolla, I. Packe, N. N. Salashchenko, and E. A. Shamov, “Cr /sc multilayers for the soft-x-ray range,” Appl. Opt. 37(4), 719–728 (1998).
[CrossRef] [PubMed]

H.-C. Mertins, F. Schäfers, H. Grimmer, D. Clemens, P. Böni, and M. Horisberger, “W/C, W/Ti, Ni/Ti, and Ni/V multilayers for the soft-x-ray range: experimental investigation with synchrotron radiation,” Appl. Opt. 37(10), 1873–1882 (1998).
[CrossRef] [PubMed]

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
[CrossRef]

F. Schäfers, R. Pohl, A. Gaupp, and M. A. MacDonald, “A Cr/Sc Transmission Multilayer as a dual-band Quarter-Wave Plate for Soft X-Ray Polarimetry,” to be submitted.

Scheer, M.

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

Schmolla, F.

Senf, F.

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

Shamov, E. A.

Shidara, T.

T. Koide, T. Shidara, and M. Yuri, “Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation,” Nucl. Instr. Meth. A. 336(1-2), 368–372 (1993).
[CrossRef]

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Skibowski, M.

Soullié, G.

Suzuki, Y.

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

Tamenori, Y.

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

Underwood, J. H.

S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
[CrossRef]

S. Di Fonzo, W. Jark, F. Schafers, H. Petersen, A. Gaupp, and J. H. Underwood, “Phase-retardation and full-polarization analysis of soft-x-ray synchrotron radiation close to the carbon K edge by use of a multilayer transmission filter,” Appl. Opt. 33(13), 2624–2632 (1994).
[CrossRef]

Vettier, C.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Walker, R.

Westerveld, W. B.

Windt, D. L.

D. L. Windt, Comput. Phys., “IMD — software for modeling the optical properties of multilayer films,” 12, 360 (1998).

Yamaguchi, K.

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Yamamoto, M.

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

Yanagihara, M.

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

Yuri, M.

T. Koide, T. Shidara, and M. Yuri, “Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation,” Nucl. Instr. Meth. A. 336(1-2), 368–372 (1993).
[CrossRef]

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Zetner, P. W.

Appl. Opt.

F. Schäfers, H.-C. Mertins, A. Gaupp, W. Gudat, M. Mertin, I. Packe, F. Schmolla, S. Di Fonzo, G. Soullié, W. Jark, R. Walker, X. Le Cann, R. Nyholm, and M. Eriksson, “Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light,” Appl. Opt. 38(19), 4074–4088 (1999).
[CrossRef] [PubMed]

G. Rosenbaum, B. Feuerbacher, R. P. Godwin, and M. Skibowski, “Measurement of the Polarization of Extreme Ultraviolet Synchrotron Radiation with a Reflecting Polarimeter,” Appl. Opt. 7(10), 1917–1919 (1968).
[CrossRef] [PubMed]

W. R. Hunter, “Design criteria for reflection polarizers and analyzers in the vacuum ultraviolet,” Appl. Opt. 17(8), 1259–1270 (1978).
[CrossRef] [PubMed]

L. Nahon and C. Alcaraz, “SU5: a calibrated variable-polarization synchrotron radiation beam line in the vacuum-ultraviolet range,” Appl. Opt. 43(5), 1024–1037 (2004).
[CrossRef] [PubMed]

F. Schäfers, H.-C. Mertins, F. Schmolla, I. Packe, N. N. Salashchenko, and E. A. Shamov, “Cr /sc multilayers for the soft-x-ray range,” Appl. Opt. 37(4), 719–728 (1998).
[CrossRef] [PubMed]

S. Di Fonzo, W. Jark, F. Schafers, H. Petersen, A. Gaupp, and J. H. Underwood, “Phase-retardation and full-polarization analysis of soft-x-ray synchrotron radiation close to the carbon K edge by use of a multilayer transmission filter,” Appl. Opt. 33(13), 2624–2632 (1994).
[CrossRef]

H.-C. Mertins, F. Schäfers, H. Grimmer, D. Clemens, P. Böni, and M. Horisberger, “W/C, W/Ti, Ni/Ti, and Ni/V multilayers for the soft-x-ray range: experimental investigation with synchrotron radiation,” Appl. Opt. 37(10), 1873–1882 (1998).
[CrossRef] [PubMed]

W. B. Westerveld, K. Becker, P. W. Zetner, J. J. Corr, and J. W. McConkey, “Production and measurement of circular polarization in the VUV,” Appl. Opt. 24(14), 2256–2262 (1985).
[CrossRef] [PubMed]

Appl. Phys. Lett.

J. B. Kortright, H. Kimura, V. Nikitin, K. Mayama, M. Yamamoto, and M. Yanagihara, “Soft x-ray (97eV) phase retardation using transmission multilayers,” Appl. Phys. Lett. 60(24), 2963–2965 (1992).
[CrossRef]

J. Electron Spectrosc. Relat. Phenom.

H. Kimura, T. Hirono, Y. Tamenori, Y. Saitoh, N. N. Salashchenko, and T. Ishikawa, “Transmission type Sc/Cr multilayer as a quarter-wave plate for near 400 eV,” J. Electron Spectrosc. Relat. Phenom. 144, 1079–1081 (2005).
[CrossRef]

J. Synchrotron Radiat.

J. Goulon, C. Malgrange, C. Giles, C. Neumann, A. Rogalev, E. Moguiline, F. De Bergevin, and C. Vettier, “Design of an X-ray Phase-Plate Analyzer to Measure the Circular Polarization Rate of a Helical Undulator Source,” J. Synchrotron Radiat. 3(Pt), 272–281 (1996).
[CrossRef] [PubMed]

Nucl. Instr. Meth. A.

T. Koide, T. Shidara, and M. Yuri, “Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation,” Nucl. Instr. Meth. A. 336(1-2), 368–372 (1993).
[CrossRef]

Nucl. Instr. Meth. B.

P. Finetti, D. M. P. Holland, C. J. Latimer, and C. Binns, “Polarisation analysis of VUV synchrotron radiation emitted from a bending magnet source in the energy range 20–50 eV: A comparison between measurements and theoretical predictions,” Nucl. Instr. Meth. B. 215(3-4), 565–576 (2004).
[CrossRef]

Nucl. Instrum. Meth. A.

S. R. Naik and G. S. Lodha, “The effect of misalignment errors in optical elements of VUV polarimeter,” Nucl. Instrum. Meth. A. 560(2), 211–218 (2006).
[CrossRef]

Nucl. Instrum. Methods Phys. Res. A

T. Koide, T. Shidara, M. Yuri, N. Kandaka, K. Yamaguchi, and H. Fukutani, “Elliptical-polarization analyses of synchrotron radiation in the 5-80-eV region with a reflection polarimeter,” Nucl. Instrum. Methods Phys. Res. A 308(3), 635–644 (1991).
[CrossRef]

Nucl.Instr.Meth. A.

K. J. S. Sawhney, F. Senf, M. Scheer, F. Schäfers, J. Bahrdt, A. Gaupp, and W. Gudat, “A novel undulator-based PGM beamline for circularly polarised synchrotron radiation at BESSY II,” Nucl.Instr.Meth. A. 390(3), 395–402 (1997).
[CrossRef]

R. Follath, “The versatility of collimated plane grating monochromators,” Nucl.Instr.Meth. A. 467–468, 418–425 (2001).
[CrossRef]

Phys. Rev. B

J. B. Kortright, M. Rice, and R. Carr, “Soft-x-ray Faraday rotation at L2,3 edges,” Phys. Rev. B 51(15), 10240–10243 (1995).
[CrossRef]

Proc. SPIE

C. Alcaraz, M. Compin, A. Jolly, M. Drecher, and L. Nahon, “First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO,” Proc. SPIE 3773, 250 (1999).
[CrossRef]

Rev. Sci. Instrum.

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

J. B. Kortright, M. Rice, and K. D. Franck, “Tuneable Multilayer EUV/soft x-ray polarimeter,” Rev. Sci. Instrum. 66(2), 1567–1569 (1995).
[CrossRef]

S. Di Fonzo, B. R. Müller, W. Jark, A. Gaupp, F. Schäfers, and J. H. Underwood, “Multilayer transmission phase shifters for the carbon K edge and water window,” Rev. Sci. Instrum. 66(2), 1513–1516 (1995).
[CrossRef]

A. Gaupp and M. Mast, “First experimental experience with a VUV polarimeter at BESSY,” Rev. Sci. Instrum. 60(7), 2213–2215 (1989).
[CrossRef]

M. A. MacDonald, F. Schaefers, R. Pohl, I. B. Poole, A. Gaupp, and F. M. Quinn, “A W: B4C multilayer phase retarder for broadband polarization analysis of soft x-ray radiation,” Rev. Sci. Instrum. 79(2), 025108 (2008).
[CrossRef] [PubMed]

T. Imazono, K. Sano, Y. Suzuki, T. Kawachi, and M. Koike, “Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis,” Rev. Sci. Instrum. 80(8), 085109 (2009).
[CrossRef] [PubMed]

T. Imazono, M. Ishino, M. Koike, H. Kimura, T. Hirono, and K. Sano, “Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880 eV evaluated by the rotating-analyzer method,” Rev. Sci. Instrum. 76(12), 023104 (2005).
[CrossRef]

T. Imazono, T. Hirono, H. Kimura, Y. Saitoh, Y. Muramatsu, M. Ishino, M. Koike, and K. Sano, “Performance of a reflection-type polarizer by use of muscovite mica crystal in the soft x-ray region of 1 keV,” Rev. Sci. Instrum. 76, 126106 (2005).
[CrossRef]

Other

F. Schäfers, R. Pohl, A. Gaupp, and M. A. MacDonald, “A Cr/Sc Transmission Multilayer as a dual-band Quarter-Wave Plate for Soft X-Ray Polarimetry,” to be submitted.

R. Pohl, (2008), Diploma thesis, Fachhochschule Münster.

E. M. Gullikson, “Atomic Scatering Factors,” X-Ray Data Booklet, Center for X-ray Optics and Advanced Light Source, Lawrence Berkeley National Laboratory.

A. Gaupp, F. Schäfers, and S. Braun, “W/B4C multilayers for soft x-ray polarisation analysis” BESSY Annual Report, (2005).

M. Weiss, K. J. S. Sawhney, R. Follath, H.-C. Mertins, F. Schäfers, W. Frentrup, A. Gaupp, M. Scheer, J. Bahrdt, F. Senf, and W. Gudat, in P. Pianetta et al. (eds.) Proc. Synchrotron Radiation Instrumentation, Eleventh US National Conference (SRI99) American Institute of Physics, New York, 134–137 (2000).

A. Gaupp, M. A. MacDonald, and F. Schäfers, A W/B4C Transmission Multilayer as an Achromatic Phase Shifter in the XUV: Some Experimental Aspects”, Submitted, Nucl.Instr.Meth. Special edition for SRI 2009 Conference.

Computed from the atomic scattering factors from CXRO http://wwwcxro.lbl.gov and LLNL http://www-phys.llnl.gov/V_Div/scattering/asf.html (using the files included in IMD2.1).

D. L. Windt, Comput. Phys., “IMD — software for modeling the optical properties of multilayer films,” 12, 360 (1998).

T. Imazono, and M. Koike, “Theoretical Investigation of Transmission-Type Phase Shifter Made with Muscovite Mica Crystal for 1-keV Region,” in Ninth International Conference on Synchrotron Radiation Instrumentation, J.-Y. Choi, S. Rah, eds. (AIP) AIP Conf. Proc. 879, 690–693, (2007).

M. Born, and E. Wolf, Principles of Optics, 7th (expanded) edition. (Cambridge University Press, Cambridge, England. 1999)

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Figures (4)

Fig. 1
Fig. 1

Normal incidence transmission of the W/B4C multilayer recorded between photon energies of 500 eV and 1100 eV. The black line shows the measured data and the red line shows and calculation

Fig. 2
Fig. 2

Absolute reflectivity of the transmission multilayer measured at a) 720 eV, b) 820 eV, c) 920 eV and d) 1020 eV using both s- and p- polarized light. The black lines show measured data and the red lines show modeled results. Solid lines are for s- polarization and dashed lines are for p- polarization. The reflectivity scale for each graph runs from 0 to 0.2, while the angular range of each graph is 1.0°.

Fig. 3
Fig. 3

The phase retardance (δp - δs) of the transmission multilayer polarizer as modeled and as measured at a) 720 eV, b) 820 eV, c) 920 eV and d) 1020 eV photon energies. The points marked in circles are where the data was cross-calibrated with linear polarized radiation. The phase retardance scale on each frame runs from 30° to +5°, while the angular range of each graph is 2°.

Fig. 4
Fig. 4

The polarizance (Tp/Ts) of the transmission multilayer as modeled and as measured at a) 720 eV, b) 820 eV, c) 920 eV and d) 1020 eV photon energies. The points marked in circles are where the data was cross-calibrated with linear polarized radiation. The vertical scale on each frame is identical while the angular range of each frame is 2°.

Tables (1)

Tables Icon

Table 1 The output Stokes parameters of Beamline UE56/2 PGM2 at BESSY, with the undulator set to produce elliptical or linear light. The total polarization P=√(S1 2+S2 2+S3 2) is also shown. The estimated uncertainty in each Stokes parameter is ±0.02. The values given are from the results of the fits described above and are not constrained to be less than or equal to 1. The data are rounded to two decimal places, with P being calculated from the more precise values before rounding.

Equations (1)

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I ( S 0 , S 1 , S 2 , S 3 , ψ 1 , ψ 2 , Δ , α , β ) = ( S 0 S 1 ) [ 1 + cos 2 ψ 1 cos 2 ψ 2 cos ( 2 α 2 β ) ] + ( S 1 S 0 ) [ cos 2 ψ 1 cos 2 α + 1 2 ( 1 + sin 2 ψ 1 cos Δ ) cos 2 ψ 2 cos 2 β + 1 2 ( 1 sin 2 ψ 1 cos Δ ) cos 2 ψ 2 cos ( 4 α 2 β ) ] + ( S 2 S 0 ) [ cos 2 ψ 1 cos 2 α + 1 2 ( 1 + sin 2 ψ 1 cos Δ ) cos 2 ψ 2 sin 2 β + 1 2 ( 1 sin 2 ψ 1 cos Δ ) cos 2 ψ 2 sin ( 4 α 2 β ) ] + ( S 3 S 0 ) [ sin 2 ψ 1 cos 2 ψ 2 sin Δ sin ( 2 α 2 β ) ]

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