R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
R. Soufli, A. L. Aquila, F. Salmassi, M. Fernández-Perea, and E. M. Gullikson, “Optical constants of magnetron sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV,” Appl. Opt. 47, 4633–4639 (2008).
[Crossref]
[PubMed]
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961 (1996).
[Crossref]
[PubMed]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
T. J. McCarville, P. M. Stefan, B. Woods, R. M. Bionta, R. Soufli, and M. J. Pivovaroff, “Opto-mechanical design considerations for the Linac Coherent Light Source X-ray mirror system,” Proc. SPIE 7077, 70770E (2008).
[Crossref]
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
M. Pivovaroff, R. M. Bionta, T. J. Mccarville, R. Soufli, and P. M. Stefan, “Soft X-ray mirrors for the Linac Coherent Light Source,” Proc. SPIE 6705, 670500 (2007).
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
M. Born and E. WolfPrinciples of Optics, 7th expanded ed. (Cambridge University Press, Cambridge, 2003).
H. M. Quiney, A. G. Peele, Z. Cai, D. Patterson, and K. A. Nugent “Diffractive imaging of highly focused X-ray fields,” Nat. Phys. 2, 101 (2006).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961 (1996).
[Crossref]
[PubMed]
R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).
R. Soufli, A. L. Aquila, F. Salmassi, M. Fernández-Perea, and E. M. Gullikson, “Optical constants of magnetron sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV,” Appl. Opt. 47, 4633–4639 (2008).
[Crossref]
[PubMed]
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961 (1996).
[Crossref]
[PubMed]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J.E. Harvey, E.C. Moran, and W.P. Zmek “Transfer function characterization of grazing incidence optical systems,” Appl. Opt. 8, 1527 (1988).
[Crossref]
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
T. J. McCarville, P. M. Stefan, B. Woods, R. M. Bionta, R. Soufli, and M. J. Pivovaroff, “Opto-mechanical design considerations for the Linac Coherent Light Source X-ray mirror system,” Proc. SPIE 7077, 70770E (2008).
[Crossref]
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
M. Pivovaroff, R. M. Bionta, T. J. Mccarville, R. Soufli, and P. M. Stefan, “Soft X-ray mirrors for the Linac Coherent Light Source,” Proc. SPIE 6705, 670500 (2007).
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
J.E. Harvey, E.C. Moran, and W.P. Zmek “Transfer function characterization of grazing incidence optical systems,” Appl. Opt. 8, 1527 (1988).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
H. M. Quiney, A. G. Peele, Z. Cai, D. Patterson, and K. A. Nugent “Diffractive imaging of highly focused X-ray fields,” Nat. Phys. 2, 101 (2006).
[Crossref]
K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961 (1996).
[Crossref]
[PubMed]
H. Nuhn, “FEL simulations for the LCLS,” Nucl. Instrum. Methods Phys. Res. A 429, 249–256 (1999).
[Crossref]
K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea “Quantitative Phase Imaging Using Hard X Rays,” Phys. Rev. Lett. 77, 2961 (1996).
[Crossref]
[PubMed]
H. M. Quiney, A. G. Peele, Z. Cai, D. Patterson, and K. A. Nugent “Diffractive imaging of highly focused X-ray fields,” Nat. Phys. 2, 101 (2006).
[Crossref]
H. M. Quiney, A. G. Peele, Z. Cai, D. Patterson, and K. A. Nugent “Diffractive imaging of highly focused X-ray fields,” Nat. Phys. 2, 101 (2006).
[Crossref]
J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
[Crossref]
M. Pivovaroff, R. M. Bionta, T. J. Mccarville, R. Soufli, and P. M. Stefan, “Soft X-ray mirrors for the Linac Coherent Light Source,” Proc. SPIE 6705, 670500 (2007).
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
T. J. McCarville, P. M. Stefan, B. Woods, R. M. Bionta, R. Soufli, and M. J. Pivovaroff, “Opto-mechanical design considerations for the Linac Coherent Light Source X-ray mirror system,” Proc. SPIE 7077, 70770E (2008).
[Crossref]
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
H. M. Quiney, A. G. Peele, Z. Cai, D. Patterson, and K. A. Nugent “Diffractive imaging of highly focused X-ray fields,” Nat. Phys. 2, 101 (2006).
[Crossref]
R. Soufli, M. J. Pivovaroff, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, P. M. Stefan, A. L. Aquila, J. Ayers, M. A. McKernan, and R. M. Bionta, “Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser,” Proc. SPIE 7077, 707716-1 (2008).
R. Soufli, S. L. Baker, J. C. Robinson, E. M. Gullikson, T. J. McCarville, M. J. Pivovaroff, P. Stefan, S. Hau-Riege, and R. Bionta, “Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors,” to be published in Proc. SPIE7361 (2009).
[Crossref]
E. L. Saldin, E. A. Schneidmiller, and M. V. Yurkov, “Coherence properties of the radiation from X-ray free electron laser,” Opt. Commun. 281, 1179–1188 (2008).
[Crossref]
E. L. Saldin, E. A. Schneidmiller, and M. V. Yurkov, The Physics of Free Electron Lasers (Springer, New York, 1999).
R. W. Gerchberg and W. O. Saxton, “A practical algorithm for the determination of phase from image and diffraction plane pictures,” Optik 35, 237–246 (1972).
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T. J. McCarville, P. M. Stefan, B. Woods, R. M. Bionta, R. Soufli, and M. J. Pivovaroff, “Opto-mechanical design considerations for the Linac Coherent Light Source X-ray mirror system,” Proc. SPIE 7077, 70770E (2008).
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M. Pivovaroff, R. M. Bionta, T. J. Mccarville, R. Soufli, and P. M. Stefan, “Soft X-ray mirrors for the Linac Coherent Light Source,” Proc. SPIE 6705, 670500 (2007).
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J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
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J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
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J. Chalupský, L. Juha, J. Kuba, J. Cihelka, V. Hájková, S. Koptyaev, J. Krása, A. Velyhan, M. Bergh, C. Caleman, J. Hajdu, R. M. Bionta, H. Chapman, S. P. Hau-Riege, R. A. London, M. Jurek, J. Krzywinski, R. Nietubyc, J. B. Pelka, R. Sobierajski, J. Meyer-ter-Vehn, A. Tronnier, K. Sokolowski-Tinten, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, H. Wabnitz, and U. Zastrau “Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids,” Opt. Express 15, 6026 (2007).
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