In this paper we propose contact lens central thickness measurement with a low coherence interferometry technique using either a SLED source or a broadband continuum generated in air-silica Microstructured Optical Fiber (MOF) pumped with a picosecond microchip laser. Each of these sources associated with the interferometer provides, at the
same time, good measurement resolution and quick signal recording without moving any optical elements and without need of a Fourier Transform operation. Signal improvement is performed afterwards by a numerical treatment for optimal correlation peaks detection leading to central thickness value of several contact lenses.
©2009 Optical Society of America
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