G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
P. Y. Liang, J. P. Ding, Z. Jin, C. S. Guo, and H. T. Wang, “Two-dimensional wave-front reconstruction from lateral shearing interferograms,” Opt. Express 14, 625–634 (2006).
[Crossref]
[PubMed]
F. J. Casillas, A. Davila, S. J. Rothberg, and G. Garnica, “Small amplitude estimation of mechanical vibrations using electronic speckle shearing pattern interferometry,” Opt. Eng. 43, 880–887 (2004).
[Crossref]
P. Ferraro, S. De Nicola, A. Finizio, and G. Pierattini, “Reflective grating interferometer: a folded reversal and shearing wave-front interferometer,” Appl. Opt. 41, 342–347 (2002).
[Crossref]
[PubMed]
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “Two-beam interferometer for measuring aberrations of optical components with axial symmetry,” Appl. Opt. 40, 1631–1636 (2001)
[Crossref]
J. Villa, G. Garcia, and G. Gomez, “Wavefront recovery in shearing interferometry with variable magnitude and direction shear,” Opt. Commun. 195, 85–91(2001).
[Crossref]
F. Chen, “Digital shearography: state of the art and some applications,” J. Electron. Imaging 10, 240–250 (2001).
[Crossref]
A. Davila, M. Servin, and M. Facchini, “Fast phase-map recovery from large shears in an electronic speckle shearing pattern interferometer using a Fourier least-squares estimation,” Opt. Eng. 39, 2487–2494 (2000).
[Crossref]
C. Elster, “Exact two-dimensional wave-front reconstruction from lateral shearing interferograms with large shears,” Appl. Opt. 39, 5353–5359 (2000).
[Crossref]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
J. A. Quiroga and A. Gonzalez-Cano, “Stress separation from photoelastic data by a multigrid method,” Meas. Sci. Technol. 9, 1204–1210 (1998).
[Crossref]
S. W. Kim, W. J. Cho, and B. C. Kim, “Lateral-shearing interferometer using square prisms for optical testing of aspheric lenses,” Meas. Sci. Technol. 9, 1129–1136 (1998).
[Crossref]
S. Loheide, “Innovative evaluation method for shearing interferograms,” Opt. Commun. 141, 254–258 (1997).
[Crossref]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
F. J. Casillas, A. Davila, S. J. Rothberg, and G. Garnica, “Small amplitude estimation of mechanical vibrations using electronic speckle shearing pattern interferometry,” Opt. Eng. 43, 880–887 (2004).
[Crossref]
F. Chen, “Digital shearography: state of the art and some applications,” J. Electron. Imaging 10, 240–250 (2001).
[Crossref]
S. W. Kim, W. J. Cho, and B. C. Kim, “Lateral-shearing interferometer using square prisms for optical testing of aspheric lenses,” Meas. Sci. Technol. 9, 1129–1136 (1998).
[Crossref]
F. J. Casillas, A. Davila, S. J. Rothberg, and G. Garnica, “Small amplitude estimation of mechanical vibrations using electronic speckle shearing pattern interferometry,” Opt. Eng. 43, 880–887 (2004).
[Crossref]
A. Davila, M. Servin, and M. Facchini, “Fast phase-map recovery from large shears in an electronic speckle shearing pattern interferometer using a Fourier least-squares estimation,” Opt. Eng. 39, 2487–2494 (2000).
[Crossref]
P. Ferraro, S. De Nicola, A. Finizio, and G. Pierattini, “Reflective grating interferometer: a folded reversal and shearing wave-front interferometer,” Appl. Opt. 41, 342–347 (2002).
[Crossref]
[PubMed]
S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “Two-beam interferometer for measuring aberrations of optical components with axial symmetry,” Appl. Opt. 40, 1631–1636 (2001)
[Crossref]
A. Davila, M. Servin, and M. Facchini, “Fast phase-map recovery from large shears in an electronic speckle shearing pattern interferometer using a Fourier least-squares estimation,” Opt. Eng. 39, 2487–2494 (2000).
[Crossref]
P. Ferraro, S. De Nicola, A. Finizio, and G. Pierattini, “Reflective grating interferometer: a folded reversal and shearing wave-front interferometer,” Appl. Opt. 41, 342–347 (2002).
[Crossref]
[PubMed]
S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “Two-beam interferometer for measuring aberrations of optical components with axial symmetry,” Appl. Opt. 40, 1631–1636 (2001)
[Crossref]
P. Ferraro, S. De Nicola, A. Finizio, and G. Pierattini, “Reflective grating interferometer: a folded reversal and shearing wave-front interferometer,” Appl. Opt. 41, 342–347 (2002).
[Crossref]
[PubMed]
S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “Two-beam interferometer for measuring aberrations of optical components with axial symmetry,” Appl. Opt. 40, 1631–1636 (2001)
[Crossref]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
J. Villa, G. Garcia, and G. Gomez, “Wavefront recovery in shearing interferometry with variable magnitude and direction shear,” Opt. Commun. 195, 85–91(2001).
[Crossref]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
F. J. Casillas, A. Davila, S. J. Rothberg, and G. Garnica, “Small amplitude estimation of mechanical vibrations using electronic speckle shearing pattern interferometry,” Opt. Eng. 43, 880–887 (2004).
[Crossref]
J. Villa, G. Garcia, and G. Gomez, “Wavefront recovery in shearing interferometry with variable magnitude and direction shear,” Opt. Commun. 195, 85–91(2001).
[Crossref]
J. A. Quiroga and A. Gonzalez-Cano, “Stress separation from photoelastic data by a multigrid method,” Meas. Sci. Technol. 9, 1204–1210 (1998).
[Crossref]
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
S. W. Kim, W. J. Cho, and B. C. Kim, “Lateral-shearing interferometer using square prisms for optical testing of aspheric lenses,” Meas. Sci. Technol. 9, 1129–1136 (1998).
[Crossref]
H. J. Lee and S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 6, 1041–1047 (1999).
[Crossref]
S. W. Kim, W. J. Cho, and B. C. Kim, “Lateral-shearing interferometer using square prisms for optical testing of aspheric lenses,” Meas. Sci. Technol. 9, 1129–1136 (1998).
[Crossref]
H. J. Lee and S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 6, 1041–1047 (1999).
[Crossref]
S. Loheide, “Innovative evaluation method for shearing interferograms,” Opt. Commun. 141, 254–258 (1997).
[Crossref]
G. Paez, M. Strojnik, and M. MantravadiD. Malacara, “Shearing Interferometry,” Optical Shop Testing, ed., (2007).
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
G. Paez, M. Strojnik, and M. MantravadiD. Malacara, “Shearing Interferometry,” Optical Shop Testing, ed., (2007).
P. Ferraro, S. De Nicola, A. Finizio, and G. Pierattini, “Reflective grating interferometer: a folded reversal and shearing wave-front interferometer,” Appl. Opt. 41, 342–347 (2002).
[Crossref]
[PubMed]
S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “Two-beam interferometer for measuring aberrations of optical components with axial symmetry,” Appl. Opt. 40, 1631–1636 (2001)
[Crossref]
J. A. Quiroga and A. Gonzalez-Cano, “Stress separation from photoelastic data by a multigrid method,” Meas. Sci. Technol. 9, 1204–1210 (1998).
[Crossref]
F. J. Casillas, A. Davila, S. J. Rothberg, and G. Garnica, “Small amplitude estimation of mechanical vibrations using electronic speckle shearing pattern interferometry,” Opt. Eng. 43, 880–887 (2004).
[Crossref]
A. Davila, M. Servin, and M. Facchini, “Fast phase-map recovery from large shears in an electronic speckle shearing pattern interferometer using a Fourier least-squares estimation,” Opt. Eng. 39, 2487–2494 (2000).
[Crossref]
M. Servin, D. Malacara, and J. L. Marroquin, “Wavefront recovery from two orthogonal sheared interferometers,” Appl. Opt. 35, 4343–4348 (1996).
[Crossref]
[PubMed]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
G. Paez, M. Strojnik, and M. MantravadiD. Malacara, “Shearing Interferometry,” Optical Shop Testing, ed., (2007).
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
J. Villa, G. Garcia, and G. Gomez, “Wavefront recovery in shearing interferometry with variable magnitude and direction shear,” Opt. Commun. 195, 85–91(2001).
[Crossref]
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
C. Elster and I. Weingartner, “Solution to the shearing problem,” Appl. Opt. 38, 5024–5031 (1999).
[Crossref]
M. Servin, D. Malacara, and J. L. Marroquin, “Wavefront recovery from two orthogonal sheared interferometers,” Appl. Opt. 35, 4343–4348 (1996).
[Crossref]
[PubMed]
C. Elster, “Exact two-dimensional wave-front reconstruction from lateral shearing interferograms with large shears,” Appl. Opt. 39, 5353–5359 (2000).
[Crossref]
S. Okuda, T. Nomura, K. Kamiya, H. Miyashiro, K. Yoshikawa, and H. Tashiro, “High-precision analysis of a lateral shearing interferogram by use of the integration method and polynomials,” Appl. Opt. 39, 5179–5186 (2000).
[Crossref]
S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “Two-beam interferometer for measuring aberrations of optical components with axial symmetry,” Appl. Opt. 40, 1631–1636 (2001)
[Crossref]
P. Ferraro, S. De Nicola, A. Finizio, and G. Pierattini, “Reflective grating interferometer: a folded reversal and shearing wave-front interferometer,” Appl. Opt. 41, 342–347 (2002).
[Crossref]
[PubMed]
T. Nomura, S. Okuda, K. Kamiya, H. Tashiro, and K. Yoshikawa, “Improved Saunders method for the analysis of lateral shearing interferograms,” Appl. Opt. 41, 1954–1961 (2002).
[Crossref]
[PubMed]
C. Falldorf, Y. Heimbach, C. von Kopylow, and W. Juptner, “Efficient reconstruction of spatially limited phase distributions from their sheared representation,” Appl. Opt. 46, 5038–5043 (2007).
[Crossref]
[PubMed]
F. Chen, “Digital shearography: state of the art and some applications,” J. Electron. Imaging 10, 240–250 (2001).
[Crossref]
J. A. Quiroga and A. Gonzalez-Cano, “Stress separation from photoelastic data by a multigrid method,” Meas. Sci. Technol. 9, 1204–1210 (1998).
[Crossref]
S. W. Kim, W. J. Cho, and B. C. Kim, “Lateral-shearing interferometer using square prisms for optical testing of aspheric lenses,” Meas. Sci. Technol. 9, 1129–1136 (1998).
[Crossref]
S. Loheide, “Innovative evaluation method for shearing interferograms,” Opt. Commun. 141, 254–258 (1997).
[Crossref]
G. Garcia-Torales, G. Paez, M. Strojnik, J. Villa, J. L. Flores, and A. G. Alvarez, “Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity,” Opt. Commun. 257, 16–26 (2006).
[Crossref]
J. Villa, G. Garcia, and G. Gomez, “Wavefront recovery in shearing interferometry with variable magnitude and direction shear,” Opt. Commun. 195, 85–91(2001).
[Crossref]
F. J. Casillas, A. Davila, S. J. Rothberg, and G. Garnica, “Small amplitude estimation of mechanical vibrations using electronic speckle shearing pattern interferometry,” Opt. Eng. 43, 880–887 (2004).
[Crossref]
A. Davila, M. Servin, and M. Facchini, “Fast phase-map recovery from large shears in an electronic speckle shearing pattern interferometer using a Fourier least-squares estimation,” Opt. Eng. 39, 2487–2494 (2000).
[Crossref]
H. J. Lee and S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 6, 1041–1047 (1999).
[Crossref]
G. Paez, M. Strojnik, and M. MantravadiD. Malacara, “Shearing Interferometry,” Optical Shop Testing, ed., (2007).