Abstract

Recently terahertz imaging using two-dimensional E-O sampling has attracted much interest because it can acquire real-time terahertz images unlike a conventional raster scan method. We are applying this technique to the non-destructive measurement of opaque materials in a visible range. We acquired 10-fps consecutive terahertz transmission images: dripping water in a plastic pipe and metal included in a piece of gum. Since the obtained images were confirmed to be proportional to the electric field of the terahertz waves, the images in the present paper are useful for quantitative analysis. We also showed the signal-to-noise ratio of the terahertz images.

© 2007 Optical Society of America

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References

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2007 (1)

2005 (1)

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

2004 (2)

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, “Terahertz two-dimensional electrooptic sampling using high speed complementary metal-oxide semiconductor camera,” Jpn. J. Appl. Phys. 43, L489–L491 (2004).
[Crossref]

F. Miyamaru and M. Hangyo, “Finite size effect of transmission property for metal hole arrays in subterahertz region,” Appl. Phys. Lett. 84, 2742–2744 (2004).
[Crossref]

2000 (1)

1996 (1)

Q. Wu, T. D. Hewitt, and X.-C. Zhang, “Two-dimensional electro-optic imaging of THz beams,” Appl. Phys. Lett. 69, 1026–1028 (1996).
[Crossref]

1995 (1)

1990 (1)

Chicklis, E. P.

Creeden, D.

Exter, M.

Fattinger, Ch.

Grischkowsky, D.

Hangyo, M.

F. Miyamaru and M. Hangyo, “Finite size effect of transmission property for metal hole arrays in subterahertz region,” Appl. Phys. Lett. 84, 2742–2744 (2004).
[Crossref]

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, “Terahertz two-dimensional electrooptic sampling using high speed complementary metal-oxide semiconductor camera,” Jpn. J. Appl. Phys. 43, L489–L491 (2004).
[Crossref]

Hewitt, T. D.

Q. Wu, T. D. Hewitt, and X.-C. Zhang, “Two-dimensional electro-optic imaging of THz beams,” Appl. Phys. Lett. 69, 1026–1028 (1996).
[Crossref]

Hu, B. B.

Ihori, A.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Jiang, Z.

Keiding, S.

Ketteridge, P. A.

Komiak, J. J.

Kurashina, T.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

McCarthy, J. C.

Miyamaru, F.

F. Miyamaru and M. Hangyo, “Finite size effect of transmission property for metal hole arrays in subterahertz region,” Appl. Phys. Lett. 84, 2742–2744 (2004).
[Crossref]

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, “Terahertz two-dimensional electrooptic sampling using high speed complementary metal-oxide semiconductor camera,” Jpn. J. Appl. Phys. 43, L489–L491 (2004).
[Crossref]

Mizuno, S.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Mukozaka, N.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Nakamura, Y.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Nuss, M. C.

Schunemann, P. G.

Southward, T.

Sugiyama, Y.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Takumi, M.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Tani, M.

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, “Terahertz two-dimensional electrooptic sampling using high speed complementary metal-oxide semiconductor camera,” Jpn. J. Appl. Phys. 43, L489–L491 (2004).
[Crossref]

Tonbe, T.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Toyoda, H.

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

Wu, Q.

Q. Wu, T. D. Hewitt, and X.-C. Zhang, “Two-dimensional electro-optic imaging of THz beams,” Appl. Phys. Lett. 69, 1026–1028 (1996).
[Crossref]

Xu, X. G.

Yonera, T.

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, “Terahertz two-dimensional electrooptic sampling using high speed complementary metal-oxide semiconductor camera,” Jpn. J. Appl. Phys. 43, L489–L491 (2004).
[Crossref]

Zhang, X.-C.

Z. Jiang, X. G. Xu, and X.-C. Zhang, “Improvement of terahertz imaging with a dynamic subtraction technique,” Appl. Opt. 39, 2982–2987 (2000).
[Crossref]

Q. Wu, T. D. Hewitt, and X.-C. Zhang, “Two-dimensional electro-optic imaging of THz beams,” Appl. Phys. Lett. 69, 1026–1028 (1996).
[Crossref]

Appl. Opt. (1)

Appl. Phys. Lett. (2)

F. Miyamaru and M. Hangyo, “Finite size effect of transmission property for metal hole arrays in subterahertz region,” Appl. Phys. Lett. 84, 2742–2744 (2004).
[Crossref]

Q. Wu, T. D. Hewitt, and X.-C. Zhang, “Two-dimensional electro-optic imaging of THz beams,” Appl. Phys. Lett. 69, 1026–1028 (1996).
[Crossref]

IEEE J. Solid-State Circuits, (1)

Y. Sugiyama, M. Takumi, H. Toyoda, N. Mukozaka, A. Ihori, T. Kurashina, Y. Nakamura, T. Tonbe, and S. Mizuno, “A high-speed CMOS image sensor with profile data acquiring function,” IEEE J. Solid-State Circuits, 40, 2816–2823 (2005).
[Crossref]

J. Opt. Soc. Am. B (1)

Jpn. J. Appl. Phys. (1)

F. Miyamaru, T. Yonera, M. Tani, and M. Hangyo, “Terahertz two-dimensional electrooptic sampling using high speed complementary metal-oxide semiconductor camera,” Jpn. J. Appl. Phys. 43, L489–L491 (2004).
[Crossref]

Opt. Express (1)

Opt. Lett. (1)

Supplementary Material (2)

» Media 1: MOV (529 KB)     
» Media 2: MOV (336 KB)     

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Figures (11)

Fig. 1.
Fig. 1.

Experimental setup for real-time THz imaging.

Fig. 2.
Fig. 2.

Relationship between attenuation ratio of measurement and corrected values.

Fig. 3.
Fig. 3.

Probe pulse without THz pulse and circle area shows ghost image.

Fig. 4.
Fig. 4.

Probe pulse without ghost image.

Fig. 5.
Fig. 5.

Sample photo: Al tape cut in shape of HPK on plastic substrate.

Fig. 6.
Fig. 6.

“H” - shaped THz image of Fig. 5.

Fig. 7.
Fig. 7.

Profile extracted at 116 pixels of vertical axis in Fig. 6: THz signal in region from 100 to 180 pixels.

Fig. 8.
Fig. 8.

Optical image of sample: dripping water into a pipe whose inside is opaque in a visible range.

Fig. 9.
Fig. 9.

(529 KB) THz movie of water dropping into a pipe (10 fps). [Media 1]

Fig. 10.
Fig. 10.

Gum stuck with a staple.

Fig. 11.
Fig. 11.

(336 KB) THz movie of state in which gum was moving (10 fps). [Media 2]

Metrics