Wideband four-level transmission gratings with flattened spectral efficiency

S. H. Kong, D. D. L. Wijngaards, and R. F. Wolffenbuttel, “Infrared micro-spectrometer based on diffraction gratings,” Sensors and Actuators A 92, 88–95 (2001).
[Crossref]

K. Blomstedt, E. Noponen, and J. Turunen, “Surface-profile optimization of diffractive imaging lenses,” J. Opt. Soc. Am. A 18, 521–525 (2001).
[Crossref]

P. Laakkonen, M. Kuittinen, J. Simonen, and J. Turunen, “Electron-beam-fabricated asymmetric transmission gratings for microspectrometry,” Appl. Opt. 39, 3187–3191 (2000).
[Crossref]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

C. David “Fabrication of stair-case profiles with high aspect ratios for blazed diffractive optical elements,”Microelectron. Eng. 53, 677–680 (2000).
[Crossref]

T. Hyvarinen, E. Herrala, and A. Dall’Ava, “Direct sight imaging spectrograph: a unique add-on component brings spectral imaging to industrial applications,” in Digital Solid State Cameras: Design and Applications, G. M. Williams, ed., Proc. SPIE 3302, 165–175 (1998).
[Crossref]

R. O. Green, “Spectral calibration requirement for Earth-looking imaging spectrometers in the solar-reflected spectrum,” Appl. Opt. 37, 683–690 (1998).
[Crossref]

P. Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex grating types for concentric imaging spectrometers,” Appl. Opt. 37, 7200–7208 (1998).
[Crossref]

D. E. Battey and J. B. Slater, “Compact holographic imaging spectrograph for process control applications,” in Optical Methods for Chemical Process Control, S. Farquharson, ed., Proc. SPIE 2069, 60–64 (1997).
[Crossref]

L. Li, “Use of Fourier series in the analysis of discontinuous periodic structures,” J. Opt. Soc. Am. A 13, 1870–1876 (1996).
[Crossref]

E. Herrala and J. Okkonen, “Imaging spectrograph and camera solutions for industrial applications,” Int. J. Pattern Recogn. Artif. Intellig. 10, 43–54 (1996).
[Crossref]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

E. Noponen and J. Turunen, “Binary high-frequency-carrier diffractive optical elements: electromagnetic theory” J. Opt. Soc. Am. A 11, 1097–1109 (1994).
[Crossref]

E. Noponen, J. Turunen, and A. Vasara, “Electromagnetic theory and design of diffractive-lens arrays,” J. Opt. Soc. Am. A 10, 434–443 (1993).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

E. Noponen, A. Vasara, and J. Turunen, “Parametric optimization of multilevel diffractive optical elements by electromagnetic theory,” Appl. Opt. 31, 5910–5912 (1992).
[Crossref] [PubMed]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

D. E. Battey and J. B. Slater, “Compact holographic imaging spectrograph for process control applications,” in Optical Methods for Chemical Process Control, S. Farquharson, ed., Proc. SPIE 2069, 60–64 (1997).
[Crossref]

K. Blomstedt, E. Noponen, and J. Turunen, “Surface-profile optimization of diffractive imaging lenses,” J. Opt. Soc. Am. A 18, 521–525 (2001).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

T. Hyvarinen, E. Herrala, and A. Dall’Ava, “Direct sight imaging spectrograph: a unique add-on component brings spectral imaging to industrial applications,” in Digital Solid State Cameras: Design and Applications, G. M. Williams, ed., Proc. SPIE 3302, 165–175 (1998).
[Crossref]

C. David “Fabrication of stair-case profiles with high aspect ratios for blazed diffractive optical elements,”Microelectron. Eng. 53, 677–680 (2000).
[Crossref]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

R. O. Green, “Spectral calibration requirement for Earth-looking imaging spectrometers in the solar-reflected spectrum,” Appl. Opt. 37, 683–690 (1998).
[Crossref]

T. Hyvarinen, E. Herrala, and A. Dall’Ava, “Direct sight imaging spectrograph: a unique add-on component brings spectral imaging to industrial applications,” in Digital Solid State Cameras: Design and Applications, G. M. Williams, ed., Proc. SPIE 3302, 165–175 (1998).
[Crossref]

E. Herrala and J. Okkonen, “Imaging spectrograph and camera solutions for industrial applications,” Int. J. Pattern Recogn. Artif. Intellig. 10, 43–54 (1996).
[Crossref]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

T. Hyvarinen, E. Herrala, and A. Dall’Ava, “Direct sight imaging spectrograph: a unique add-on component brings spectral imaging to industrial applications,” in Digital Solid State Cameras: Design and Applications, G. M. Williams, ed., Proc. SPIE 3302, 165–175 (1998).
[Crossref]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

K. Jefimovs, Ph.D. Thesis (University of Joensuu, 2003).

F. Salem and M. Kafatos, “Hyperspectral image analysis for oil spilling mitigation,”, in Proceedings of 22nd Asian Conference on Remote Sensing, (CRISP, Singapore, 2001) pp. 748–753.

S. H. Kong, D. D. L. Wijngaards, and R. F. Wolffenbuttel, “Infrared micro-spectrometer based on diffraction gratings,” Sensors and Actuators A 92, 88–95 (2001).
[Crossref]

P. Laakkonen, M. Kuittinen, J. Simonen, and J. Turunen, “Electron-beam-fabricated asymmetric transmission gratings for microspectrometry,” Appl. Opt. 39, 3187–3191 (2000).
[Crossref]

J. Turunen, M. Kuittinen, and F. Wyrowski, “Diffractive optics: electromagnetic approach,” in Progress in Optics, E. Wolf, ed., vol. XL, chap. V (Elsevier, Amsterdam, 2000).

P. Laakkonen, M. Kuittinen, J. Simonen, and J. Turunen, “Electron-beam-fabricated asymmetric transmission gratings for microspectrometry,” Appl. Opt. 39, 3187–3191 (2000).
[Crossref]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

L. Li, “Use of Fourier series in the analysis of discontinuous periodic structures,” J. Opt. Soc. Am. A 13, 1870–1876 (1996).
[Crossref]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

P. Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex grating types for concentric imaging spectrometers,” Appl. Opt. 37, 7200–7208 (1998).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

P. Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex grating types for concentric imaging spectrometers,” Appl. Opt. 37, 7200–7208 (1998).
[Crossref]

P. Mouroulis, “Spectral and spatial uniformity in pushbroom imaging spectrometers,” in Imaging Spectrometry VJ. B. Rafert, W. J. Slough, C. A. Rohde, A. Pilant, L. J. Otten, A. D. Meigs, A. Jones, and E. W. Butler, eds. Proc. SPIE3753, 133–141 (1999).
[Crossref]

P. Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex grating types for concentric imaging spectrometers,” Appl. Opt. 37, 7200–7208 (1998).
[Crossref]

K. Blomstedt, E. Noponen, and J. Turunen, “Surface-profile optimization of diffractive imaging lenses,” J. Opt. Soc. Am. A 18, 521–525 (2001).
[Crossref]

E. Noponen and J. Turunen, “Binary high-frequency-carrier diffractive optical elements: electromagnetic theory” J. Opt. Soc. Am. A 11, 1097–1109 (1994).
[Crossref]

E. Noponen, J. Turunen, and A. Vasara, “Electromagnetic theory and design of diffractive-lens arrays,” J. Opt. Soc. Am. A 10, 434–443 (1993).
[Crossref]

E. Noponen, A. Vasara, and J. Turunen, “Parametric optimization of multilevel diffractive optical elements by electromagnetic theory,” Appl. Opt. 31, 5910–5912 (1992).
[Crossref] [PubMed]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

E. Herrala and J. Okkonen, “Imaging spectrograph and camera solutions for industrial applications,” Int. J. Pattern Recogn. Artif. Intellig. 10, 43–54 (1996).
[Crossref]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

F. Salem and M. Kafatos, “Hyperspectral image analysis for oil spilling mitigation,”, in Proceedings of 22nd Asian Conference on Remote Sensing, (CRISP, Singapore, 2001) pp. 748–753.

P. Laakkonen, M. Kuittinen, J. Simonen, and J. Turunen, “Electron-beam-fabricated asymmetric transmission gratings for microspectrometry,” Appl. Opt. 39, 3187–3191 (2000).
[Crossref]

D. E. Battey and J. B. Slater, “Compact holographic imaging spectrograph for process control applications,” in Optical Methods for Chemical Process Control, S. Farquharson, ed., Proc. SPIE 2069, 60–64 (1997).
[Crossref]

K. Blomstedt, E. Noponen, and J. Turunen, “Surface-profile optimization of diffractive imaging lenses,” J. Opt. Soc. Am. A 18, 521–525 (2001).
[Crossref]

P. Laakkonen, M. Kuittinen, J. Simonen, and J. Turunen, “Electron-beam-fabricated asymmetric transmission gratings for microspectrometry,” Appl. Opt. 39, 3187–3191 (2000).
[Crossref]

E. Noponen and J. Turunen, “Binary high-frequency-carrier diffractive optical elements: electromagnetic theory” J. Opt. Soc. Am. A 11, 1097–1109 (1994).
[Crossref]

E. Noponen, J. Turunen, and A. Vasara, “Electromagnetic theory and design of diffractive-lens arrays,” J. Opt. Soc. Am. A 10, 434–443 (1993).
[Crossref]

E. Noponen, A. Vasara, and J. Turunen, “Parametric optimization of multilevel diffractive optical elements by electromagnetic theory,” Appl. Opt. 31, 5910–5912 (1992).
[Crossref] [PubMed]

J. Turunen, M. Kuittinen, and F. Wyrowski, “Diffractive optics: electromagnetic approach,” in Progress in Optics, E. Wolf, ed., vol. XL, chap. V (Elsevier, Amsterdam, 2000).

E. Noponen, J. Turunen, and A. Vasara, “Electromagnetic theory and design of diffractive-lens arrays,” J. Opt. Soc. Am. A 10, 434–443 (1993).
[Crossref]

E. Noponen, A. Vasara, and J. Turunen, “Parametric optimization of multilevel diffractive optical elements by electromagnetic theory,” Appl. Opt. 31, 5910–5912 (1992).
[Crossref] [PubMed]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

S. H. Kong, D. D. L. Wijngaards, and R. F. Wolffenbuttel, “Infrared micro-spectrometer based on diffraction gratings,” Sensors and Actuators A 92, 88–95 (2001).
[Crossref]

P. Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex grating types for concentric imaging spectrometers,” Appl. Opt. 37, 7200–7208 (1998).
[Crossref]

S. H. Kong, D. D. L. Wijngaards, and R. F. Wolffenbuttel, “Infrared micro-spectrometer based on diffraction gratings,” Sensors and Actuators A 92, 88–95 (2001).
[Crossref]

J. Turunen, M. Kuittinen, and F. Wyrowski, “Diffractive optics: electromagnetic approach,” in Progress in Optics, E. Wolf, ed., vol. XL, chap. V (Elsevier, Amsterdam, 2000).

R. O. Green, “Spectral calibration requirement for Earth-looking imaging spectrometers in the solar-reflected spectrum,” Appl. Opt. 37, 683–690 (1998).
[Crossref]

P. Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex grating types for concentric imaging spectrometers,” Appl. Opt. 37, 7200–7208 (1998).
[Crossref]

P. Laakkonen, M. Kuittinen, J. Simonen, and J. Turunen, “Electron-beam-fabricated asymmetric transmission gratings for microspectrometry,” Appl. Opt. 39, 3187–3191 (2000).
[Crossref]

E. Noponen, A. Vasara, and J. Turunen, “Parametric optimization of multilevel diffractive optical elements by electromagnetic theory,” Appl. Opt. 31, 5910–5912 (1992).
[Crossref] [PubMed]

E. Herrala and J. Okkonen, “Imaging spectrograph and camera solutions for industrial applications,” Int. J. Pattern Recogn. Artif. Intellig. 10, 43–54 (1996).
[Crossref]

K. Blomstedt, E. Noponen, and J. Turunen, “Surface-profile optimization of diffractive imaging lenses,” J. Opt. Soc. Am. A 18, 521–525 (2001).
[Crossref]

E. Noponen and J. Turunen, “Binary high-frequency-carrier diffractive optical elements: electromagnetic theory” J. Opt. Soc. Am. A 11, 1097–1109 (1994).
[Crossref]

E. Noponen, J. Turunen, and A. Vasara, “Electromagnetic theory and design of diffractive-lens arrays,” J. Opt. Soc. Am. A 10, 434–443 (1993).
[Crossref]

L. Li, “Use of Fourier series in the analysis of discontinuous periodic structures,” J. Opt. Soc. Am. A 13, 1870–1876 (1996).
[Crossref]

C. David “Fabrication of stair-case profiles with high aspect ratios for blazed diffractive optical elements,”Microelectron. Eng. 53, 677–680 (2000).
[Crossref]

E. Cianci, V. Foglietti, F. Vitali, D. Lorenzetti, A. Notargiacomo, and E. Giovine “Micromachined silicon grisms: high resolution spectroscopy in the near infrared,” Microelectron. Eng. 53, 543–546 (2000).
[Crossref]

B. Braam, J. Okkonen, M. Aikio, K. Makisara, and J. Bolton, “Design and first test results of the Finnish airborne imaging spectrometer for different applications, AISA”, in Imaging Spectrometry of the Terrestial Environment, G. Vane, ed., Proc. SPIE 1937, 142–151 (1993).
[Crossref]

T. Hyvarinen, E. Herrala, and A. Dall’Ava, “Direct sight imaging spectrograph: a unique add-on component brings spectral imaging to industrial applications,” in Digital Solid State Cameras: Design and Applications, G. M. Williams, ed., Proc. SPIE 3302, 165–175 (1998).
[Crossref]

E. Herrala, J. Okkonen, T. Hyvarinen, M. Aikio, and J. Lammasniemi, “Imaging spectrometer for process industry applications,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 33–40 (1994).
[Crossref]

D. E. Battey and J. B. Slater, “Compact holographic imaging spectrograph for process control applications,” in Optical Methods for Chemical Process Control, S. Farquharson, ed., Proc. SPIE 2069, 60–64 (1997).
[Crossref]

S. H. Kong, D. D. L. Wijngaards, and R. F. Wolffenbuttel, “Infrared micro-spectrometer based on diffraction gratings,” Sensors and Actuators A 92, 88–95 (2001).
[Crossref]

F. Salem and M. Kafatos, “Hyperspectral image analysis for oil spilling mitigation,”, in Proceedings of 22nd Asian Conference on Remote Sensing, (CRISP, Singapore, 2001) pp. 748–753.

P. Mouroulis, “Spectral and spatial uniformity in pushbroom imaging spectrometers,” in Imaging Spectrometry VJ. B. Rafert, W. J. Slough, C. A. Rohde, A. Pilant, L. J. Otten, A. D. Meigs, A. Jones, and E. W. Butler, eds. Proc. SPIE3753, 133–141 (1999).
[Crossref]

H. P. Herzig, ed., Micro-optics: Elements, Systems and Applications (Taylor & Francis, London, 1997).

J. Turunen and F. Wyrowski, eds., Diffractive Optics for Industrial and Commercial Applications (Wiley-VCH, Berlin, 1997).

M. C. Hutley, Diffraction Gratings (Academic Press, Orlando, 1982).

R. Petit, ed., Electromagnetic Theory of Gratings (Springer, Berlin, 1980).
[Crossref]

J. Turunen, M. Kuittinen, and F. Wyrowski, “Diffractive optics: electromagnetic approach,” in Progress in Optics, E. Wolf, ed., vol. XL, chap. V (Elsevier, Amsterdam, 2000).

K. Jefimovs, Ph.D. Thesis (University of Joensuu, 2003).