Abstract

The fractal dimension Df and the critical parameter v of the sputtered percolation Ag island films are measured to be about 1.57 and 1.15, respectively. A modified Z-scan method including both transmittance Z-scan and reflection Z-scan is proposed to measure the pure nonlinear absorption of the semi-continuous Ag films near the percolation threshold. As the microstructure of the sputtered Ag films varies from the discontinuous to the continuous, the linear absorbance decreases from 0.97 to 0.58 while the nonlinear absorption coefficient changes from -1.4×10-5m/W to -4.6×10-6m/W at the wavelength of 800nm. The largest nonlinear absorption coefficient β of the sputtered Ag films is obtained in the discontinuous film near the percolation threshold, which is mainly contributed by the large enhancement of local field of dis-continuous Ag particles.

© 2006 Optical Society of America

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    [CrossRef]
  5. H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
    [CrossRef]
  6. A. Heilmann, A. Kiesow, M. Gruner and U. Kreibig, "Optical and electrical properties of embedded silver nanoparticles at low temperatures," Thin Solid Films. 343-344, 175-178 (1999).
    [CrossRef]
  7. W. P. Cai, H. Hofmeister, and T. Rainer, "Surface effect on the size evolution of surface plasmon resonances of Ag and Au nanoparticles dispersed within mesoporous silica," Physica E. 11, 339-344 (2001).
    [CrossRef]
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    [CrossRef]
  12. W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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  22. Y. Yagil, M. Yosefin, D. J. Bergman and G. Deutscher, "Scaling theory for the optical properties of semicontinuous metal films," Phys. Rev. B 43, 11342-11352 (1991).
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    [CrossRef]

2004

G. Yang, D. Y. Guan, W. T. Wang, W. D. Wu, and Z. H. Chen, "The inherent optical nonlinearities of thin silver films," Opt. Mater. 25, 439-443 (2004).
[CrossRef]

L. Grinberg, and A. M. Rappe, "Silver solid solution piezoelectrics," Appl. Phys. Lett. 85, 1760-1762 (2004).
[CrossRef]

T. L. Alford, M. M. Mitan, R. Govindasamy, and J. W. Mayer, "Ion beam analysis of silver thin films on cobalt silicides," NIM B 219-220, 897-901 (2004).
[CrossRef]

2003

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
[CrossRef]

2001

W. P. Cai, H. Hofmeister, and T. Rainer, "Surface effect on the size evolution of surface plasmon resonances of Ag and Au nanoparticles dispersed within mesoporous silica," Physica E. 11, 339-344 (2001).
[CrossRef]

1999

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

A. Heilmann, A. Kiesow, M. Gruner and U. Kreibig, "Optical and electrical properties of embedded silver nanoparticles at low temperatures," Thin Solid Films. 343-344, 175-178 (1999).
[CrossRef]

1998

S. Banerjee and D. Chakravorty, "Optical absorption of composites of nanocrystalline silver prepared by electrodeposition," Appl. Phys. Lett. 72, 1027-1029 (1998).
[CrossRef]

H. B. Liao, R. F. Xiao, J. S. Fu, H. Wang, K. S. Wong, and G. K. L. Wong, "Origin of third-order optical nonlinearity in Au:SiO2 composite films on femtosecond and picosecond time scales," Opt. Lett. 23, 388-390 (1998)
[CrossRef]

1997

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
[CrossRef]

C.S. Chang, J. T. Lue, "Optical second harmonic generation from thin silver films," Surface Science 393, 231-239 (1997).
[CrossRef]

1992

Y. Yagil, P. Gadenne, C. Julien and G. Deutscher, "Optical properties of thin semicontinuous gold films over a wavelength range of 2.5 to 500 μm," Phys. Rev. B. 46, 2503-2511 (1992).
[CrossRef]

1991

C. A. Davis, D. R. McKenzie and R. C. McPhedren, "Optical properties and microstructure of thin silver films," Opt. Commun. 85, 70-82 (1991).
[CrossRef]

Y. Yagil, M. Yosefin, D. J. Bergman and G. Deutscher, "Scaling theory for the optical properties of semicontinuous metal films," Phys. Rev. B 43, 11342-11352 (1991).
[CrossRef]

1990

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, "Sensitive Measurement of Optical Nonlinearities Using a Single Beam," IEEE. J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

1989

TH. Robin and B. Souillard, "Long-Wavelength behaviour of granular metal-insulator films: the optical transition and the reflection properties," Europhys. Lett. 8, 753-758 (1989).
[CrossRef]

1987

Y. Yagil and G. Deutscher, "Transmittance of thin metal films near the percolation threshold," Thin Solid Films. 152, 465-471 (1987).
[CrossRef]

1985

1981

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

1977

1974

R. H. Stolen, J. E. Bjorkholm and A. Ashkin, "Phase-matched three-wave mixing in silica fiber optical waveguides," Appl. Phys. Lett. 24, 308-310 (1974).
[CrossRef]

Alford, T. L.

T. L. Alford, M. M. Mitan, R. Govindasamy, and J. W. Mayer, "Ion beam analysis of silver thin films on cobalt silicides," NIM B 219-220, 897-901 (2004).
[CrossRef]

Ashkin, A.

R. H. Stolen, J. E. Bjorkholm and A. Ashkin, "Phase-matched three-wave mixing in silica fiber optical waveguides," Appl. Phys. Lett. 24, 308-310 (1974).
[CrossRef]

Banerjee, S.

S. Banerjee and D. Chakravorty, "Optical absorption of composites of nanocrystalline silver prepared by electrodeposition," Appl. Phys. Lett. 72, 1027-1029 (1998).
[CrossRef]

Bergman, D. J.

Y. Yagil, M. Yosefin, D. J. Bergman and G. Deutscher, "Scaling theory for the optical properties of semicontinuous metal films," Phys. Rev. B 43, 11342-11352 (1991).
[CrossRef]

Bergman, J. G.

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

Bjorkholm, J. E.

R. H. Stolen, J. E. Bjorkholm and A. Ashkin, "Phase-matched three-wave mixing in silica fiber optical waveguides," Appl. Phys. Lett. 24, 308-310 (1974).
[CrossRef]

Bouwen, W.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Cai, W. P.

W. P. Cai, H. Hofmeister, and T. Rainer, "Surface effect on the size evolution of surface plasmon resonances of Ag and Au nanoparticles dispersed within mesoporous silica," Physica E. 11, 339-344 (2001).
[CrossRef]

Chakravorty, D.

S. Banerjee and D. Chakravorty, "Optical absorption of composites of nanocrystalline silver prepared by electrodeposition," Appl. Phys. Lett. 72, 1027-1029 (1998).
[CrossRef]

Chang, C.S.

C.S. Chang, J. T. Lue, "Optical second harmonic generation from thin silver films," Surface Science 393, 231-239 (1997).
[CrossRef]

Chen, Z. H.

G. Yang, D. Y. Guan, W. T. Wang, W. D. Wu, and Z. H. Chen, "The inherent optical nonlinearities of thin silver films," Opt. Mater. 25, 439-443 (2004).
[CrossRef]

Davis, C. A.

C. A. Davis, D. R. McKenzie and R. C. McPhedren, "Optical properties and microstructure of thin silver films," Opt. Commun. 85, 70-82 (1991).
[CrossRef]

Deutscher, G.

Y. Yagil, P. Gadenne, C. Julien and G. Deutscher, "Optical properties of thin semicontinuous gold films over a wavelength range of 2.5 to 500 μm," Phys. Rev. B. 46, 2503-2511 (1992).
[CrossRef]

Y. Yagil, M. Yosefin, D. J. Bergman and G. Deutscher, "Scaling theory for the optical properties of semicontinuous metal films," Phys. Rev. B 43, 11342-11352 (1991).
[CrossRef]

Y. Yagil and G. Deutscher, "Transmittance of thin metal films near the percolation threshold," Thin Solid Films. 152, 465-471 (1987).
[CrossRef]

Flytzanis, C.

Fu, J. S.

H. B. Liao, R. F. Xiao, J. S. Fu, H. Wang, K. S. Wong, and G. K. L. Wong, "Origin of third-order optical nonlinearity in Au:SiO2 composite films on femtosecond and picosecond time scales," Opt. Lett. 23, 388-390 (1998)
[CrossRef]

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
[CrossRef]

Gadenne, P.

Y. Yagil, P. Gadenne, C. Julien and G. Deutscher, "Optical properties of thin semicontinuous gold films over a wavelength range of 2.5 to 500 μm," Phys. Rev. B. 46, 2503-2511 (1992).
[CrossRef]

Glass, A. M.

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

Gong, Q. H.

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
[CrossRef]

Govindasamy, R.

T. L. Alford, M. M. Mitan, R. Govindasamy, and J. W. Mayer, "Ion beam analysis of silver thin films on cobalt silicides," NIM B 219-220, 897-901 (2004).
[CrossRef]

Grinberg, L.

L. Grinberg, and A. M. Rappe, "Silver solid solution piezoelectrics," Appl. Phys. Lett. 85, 1760-1762 (2004).
[CrossRef]

Gruner, M.

A. Heilmann, A. Kiesow, M. Gruner and U. Kreibig, "Optical and electrical properties of embedded silver nanoparticles at low temperatures," Thin Solid Films. 343-344, 175-178 (1999).
[CrossRef]

Guan, D. Y.

G. Yang, D. Y. Guan, W. T. Wang, W. D. Wu, and Z. H. Chen, "The inherent optical nonlinearities of thin silver films," Opt. Mater. 25, 439-443 (2004).
[CrossRef]

Hagan, D. J.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, "Sensitive Measurement of Optical Nonlinearities Using a Single Beam," IEEE. J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

Heilmann, A.

A. Heilmann, A. Kiesow, M. Gruner and U. Kreibig, "Optical and electrical properties of embedded silver nanoparticles at low temperatures," Thin Solid Films. 343-344, 175-178 (1999).
[CrossRef]

Hellwarth, R. W.

Heritage, J. P.

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

Hofmeister, H.

W. P. Cai, H. Hofmeister, and T. Rainer, "Surface effect on the size evolution of surface plasmon resonances of Ag and Au nanoparticles dispersed within mesoporous silica," Physica E. 11, 339-344 (2001).
[CrossRef]

Julien, C.

Y. Yagil, P. Gadenne, C. Julien and G. Deutscher, "Optical properties of thin semicontinuous gold films over a wavelength range of 2.5 to 500 μm," Phys. Rev. B. 46, 2503-2511 (1992).
[CrossRef]

Kiesow, A.

A. Heilmann, A. Kiesow, M. Gruner and U. Kreibig, "Optical and electrical properties of embedded silver nanoparticles at low temperatures," Thin Solid Films. 343-344, 175-178 (1999).
[CrossRef]

Kim, H. C.

H. C. Kim, N. D. Theodore, and T. L. Alford J, "Comparison of texture evolution in Ag and Ag(Al) alloy thin films on amorphous SiO2," J. Appl. Phys. 95, 5180-5188 (2004).
[CrossRef]

Kreibig, U.

A. Heilmann, A. Kiesow, M. Gruner and U. Kreibig, "Optical and electrical properties of embedded silver nanoparticles at low temperatures," Thin Solid Films. 343-344, 175-178 (1999).
[CrossRef]

Kunnen, E.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Liao, H. B.

H. B. Liao, R. F. Xiao, J. S. Fu, H. Wang, K. S. Wong, and G. K. L. Wong, "Origin of third-order optical nonlinearity in Au:SiO2 composite films on femtosecond and picosecond time scales," Opt. Lett. 23, 388-390 (1998)
[CrossRef]

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
[CrossRef]

Liao, P. F.

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

Lievens, P.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Liu, W. M.

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
[CrossRef]

Lue, J. T.

C.S. Chang, J. T. Lue, "Optical second harmonic generation from thin silver films," Surface Science 393, 231-239 (1997).
[CrossRef]

Mayer, J. W.

T. L. Alford, M. M. Mitan, R. Govindasamy, and J. W. Mayer, "Ion beam analysis of silver thin films on cobalt silicides," NIM B 219-220, 897-901 (2004).
[CrossRef]

McKenzie, D. R.

C. A. Davis, D. R. McKenzie and R. C. McPhedren, "Optical properties and microstructure of thin silver films," Opt. Commun. 85, 70-82 (1991).
[CrossRef]

McPhedren, R. C.

C. A. Davis, D. R. McKenzie and R. C. McPhedren, "Optical properties and microstructure of thin silver films," Opt. Commun. 85, 70-82 (1991).
[CrossRef]

Mitan, M. M.

T. L. Alford, M. M. Mitan, R. Govindasamy, and J. W. Mayer, "Ion beam analysis of silver thin films on cobalt silicides," NIM B 219-220, 897-901 (2004).
[CrossRef]

Qlson, D. H.

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

Rainer, T.

W. P. Cai, H. Hofmeister, and T. Rainer, "Surface effect on the size evolution of surface plasmon resonances of Ag and Au nanoparticles dispersed within mesoporous silica," Physica E. 11, 339-344 (2001).
[CrossRef]

Rappe, A. M.

L. Grinberg, and A. M. Rappe, "Silver solid solution piezoelectrics," Appl. Phys. Lett. 85, 1760-1762 (2004).
[CrossRef]

Ricard, D.

Robin, TH.

TH. Robin and B. Souillard, "Long-Wavelength behaviour of granular metal-insulator films: the optical transition and the reflection properties," Europhys. Lett. 8, 753-758 (1989).
[CrossRef]

Roussignol, P.

Said, A. A.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, "Sensitive Measurement of Optical Nonlinearities Using a Single Beam," IEEE. J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

Sheik-Bahae, M.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, "Sensitive Measurement of Optical Nonlinearities Using a Single Beam," IEEE. J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

Sheng, P.

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
[CrossRef]

Silverans, R. E.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Souillard, B.

TH. Robin and B. Souillard, "Long-Wavelength behaviour of granular metal-insulator films: the optical transition and the reflection properties," Europhys. Lett. 8, 753-758 (1989).
[CrossRef]

Stolen, R. H.

R. H. Stolen, J. E. Bjorkholm and A. Ashkin, "Phase-matched three-wave mixing in silica fiber optical waveguides," Appl. Phys. Lett. 24, 308-310 (1974).
[CrossRef]

Temst, K.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Theodore, N. D.

H. C. Kim, N. D. Theodore, and T. L. Alford J, "Comparison of texture evolution in Ag and Ag(Al) alloy thin films on amorphous SiO2," J. Appl. Phys. 95, 5180-5188 (2004).
[CrossRef]

Thoen, P.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Van Bael, M. J.

W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

Van Stryland, E. W.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, "Sensitive Measurement of Optical Nonlinearities Using a Single Beam," IEEE. J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

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M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, "Sensitive Measurement of Optical Nonlinearities Using a Single Beam," IEEE. J. Quantum Electron. 26, 760-769 (1990).
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W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
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[CrossRef]

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Wu, J. L.

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
[CrossRef]

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G. Yang, D. Y. Guan, W. T. Wang, W. D. Wu, and Z. H. Chen, "The inherent optical nonlinearities of thin silver films," Opt. Mater. 25, 439-443 (2004).
[CrossRef]

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H. B. Liao, R. F. Xiao, J. S. Fu, H. Wang, K. S. Wong, and G. K. L. Wong, "Origin of third-order optical nonlinearity in Au:SiO2 composite films on femtosecond and picosecond time scales," Opt. Lett. 23, 388-390 (1998)
[CrossRef]

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
[CrossRef]

Xue, Z. Q.

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
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G. Yang, D. Y. Guan, W. T. Wang, W. D. Wu, and Z. H. Chen, "The inherent optical nonlinearities of thin silver films," Opt. Mater. 25, 439-443 (2004).
[CrossRef]

Yosefin, M.

Y. Yagil, M. Yosefin, D. J. Bergman and G. Deutscher, "Scaling theory for the optical properties of semicontinuous metal films," Phys. Rev. B 43, 11342-11352 (1991).
[CrossRef]

Yu, P.

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
[CrossRef]

Zhang, Q. F.

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
[CrossRef]

Appl. Phys. Lett.

Q. F. Zhang, W. M. Liu, Z. Q. Xue, J. L. Wu, S. F. Wang, D. L. Wang, and Q. H. Gong, "Ultrafast optical Kerr effect of Ag-BaO composite thin films," Appl. Phys. Lett. 82, 958-960 (2003).
[CrossRef]

H. B. Liao, R. F. Xiao, J. S. Fu, P. Yu, G. K. L. Wong, and P. Sheng, "Large third-order optical nonlinearity in Au:SiO2 composite films near the percolation threshold," Appl. Phys. Lett. 70, 1-3 (1997).
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[CrossRef]

Phys. Rev. B

Y. Yagil, M. Yosefin, D. J. Bergman and G. Deutscher, "Scaling theory for the optical properties of semicontinuous metal films," Phys. Rev. B 43, 11342-11352 (1991).
[CrossRef]

A. Wokaun, J. G. Bergman, J. P. Heritage, A. M. Glass, P. F. Liao, and D. H. Qlson, "Surface second-harmonic generation from metal island films and microlithographic structures," Phys. Rev. B 24, 849-856 (1981).
[CrossRef]

Phys. Rev. B.

Y. Yagil, P. Gadenne, C. Julien and G. Deutscher, "Optical properties of thin semicontinuous gold films over a wavelength range of 2.5 to 500 μm," Phys. Rev. B. 46, 2503-2511 (1992).
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W. Bouwen, E. Kunnen, K. Temst, P. Thoen, M. J. Van Bael, F. Vanhoutte, H. Weidele, P. Lievens, and R. E. Silverans, "Characterization of granular Ag films grown by low-energy cluster beam deposition," Thin Solid Films 354, 87-92 (1999).
[CrossRef]

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[CrossRef]

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Figures (6)

Fig. 1.
Fig. 1.

Z-scan experimental setup. L-lens of 190 mm, S-sample, D1 and D2-detectors, PC-personal computer.

Fig. 2.
Fig. 2.

The normalized conductivity σ as a function of normalized deposition time tN .

Fig. 3.
Fig. 3.

(a) The transmittance spectrum of Ag films of different normalized deposition time tN . (b) The relationship between ln|T - Tc | versus lnλ.

Fig. 4.
Fig. 4.

Normalized transmittance Z-scans and the fitting line of the Ag film at tC . The open-circles are the Z-scans, and the solid line is the fitting curve. I0 =0.44GW/cm2.

Fig. 5.
Fig. 5.

(a) Absorbance of sputtered Ag films at 800 nm with different normalized deposition time tN . (b) The peak value of normalized transmittance T in Z-scans versus tN .

Fig. 6.
Fig. 6.

The AFM image of sputtered Ag island films with a deposition time of 90s (tN =0.3).

Tables (1)

Tables Icon

Table 1. Measured and theoretical values of the percolation parameters

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