Abstract

The beam errors of an 11 bar laser diode stack fitted with fast-axis collimator lenses have been corrected by a single refractive plate, produced by laser cutting and polishing. The so-called smile effect is virtually eliminated and collimator aberration greatly reduced, improving the fast-axis beam quality of each bar by a factor of up to 5. The single corrector plate for the whole stack ensures that the radiation from all the laser emitters is parallel to a common axis. Beam-pointing errors of the bars have been reduced to below 0.7 mrad.

© 2006 Optical Society of America

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References

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  1. U. Brauch , P. Loosen , and H. Opower , “ High-power diode lasers for direct applications ,” in High Power Diode Lasers , R. Diehl ed., ( Springer-Verlag Berlin Heidelberg , 2000 ), pp. 303 – 368 .
    [Crossref]
  2. I. Ghozeil , “ Hartmann and other screen tests ,” in Optical Shop Testing , D. Malacara ed., ( Wiley , 1992 ), pp. 367 – 396 .
  3. K. M. Nowak , H. J. Baker , and D. R. Hall , “ Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator ,” in Laser Micromachining for Optoelectronic Device Fabrication , A. Ostendorf ed., Proc. SPIE ,   4941 , 107 – 112 ( 2002 ).
    [Crossref]
  4. G. A. J. Markillie , H. J. Baker , F. J. Villarreal , and D. R. Hall , “ Effect of vaporization and melt ejection on laser machining of silica glass micro-optical components ,” Appl. Opt.   41 , 5660 – 5667 ( 2002 ).
    [Crossref] [PubMed]
  5. K. M. Nowak , H. J. Baker , and D. R. Hall , “ Efficient laser polishing of silica micro-optic components ,” Appl. Opt.   45 , 162 – 171 ( 2006 ).
    [Crossref] [PubMed]
  6. T. Jitsuno , K. Tokumura , N. Nakashima , and M. Nakatsuka , “ Laser ablative shaping of plastic optical components for phase control ,” Appl. Opt.   38 , 3338 – 3342 ( 1999 ).
    [Crossref]
  7. A. R. Holdsworth and H. J. Baker , “ Assessment of micro-lenses for diode bar collimation ,” in Laser Diode and LED Applications III , K. J. Linden ed., Proc. SPIE 3000 , 209 – 214 ( 1997 ).
  8. N. U. Wetter , “ Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature ,” Opt. Laser Technol.   33 , 181 – 187 ( 2001 ).
    [Crossref]

2006 (1)

2002 (2)

G. A. J. Markillie , H. J. Baker , F. J. Villarreal , and D. R. Hall , “ Effect of vaporization and melt ejection on laser machining of silica glass micro-optical components ,” Appl. Opt.   41 , 5660 – 5667 ( 2002 ).
[Crossref] [PubMed]

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator ,” in Laser Micromachining for Optoelectronic Device Fabrication , A. Ostendorf ed., Proc. SPIE ,   4941 , 107 – 112 ( 2002 ).
[Crossref]

2001 (1)

N. U. Wetter , “ Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature ,” Opt. Laser Technol.   33 , 181 – 187 ( 2001 ).
[Crossref]

1999 (1)

Baker, H. J.

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Efficient laser polishing of silica micro-optic components ,” Appl. Opt.   45 , 162 – 171 ( 2006 ).
[Crossref] [PubMed]

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator ,” in Laser Micromachining for Optoelectronic Device Fabrication , A. Ostendorf ed., Proc. SPIE ,   4941 , 107 – 112 ( 2002 ).
[Crossref]

G. A. J. Markillie , H. J. Baker , F. J. Villarreal , and D. R. Hall , “ Effect of vaporization and melt ejection on laser machining of silica glass micro-optical components ,” Appl. Opt.   41 , 5660 – 5667 ( 2002 ).
[Crossref] [PubMed]

A. R. Holdsworth and H. J. Baker , “ Assessment of micro-lenses for diode bar collimation ,” in Laser Diode and LED Applications III , K. J. Linden ed., Proc. SPIE 3000 , 209 – 214 ( 1997 ).

Brauch, U.

U. Brauch , P. Loosen , and H. Opower , “ High-power diode lasers for direct applications ,” in High Power Diode Lasers , R. Diehl ed., ( Springer-Verlag Berlin Heidelberg , 2000 ), pp. 303 – 368 .
[Crossref]

Ghozeil, I.

I. Ghozeil , “ Hartmann and other screen tests ,” in Optical Shop Testing , D. Malacara ed., ( Wiley , 1992 ), pp. 367 – 396 .

Hall, D. R.

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Efficient laser polishing of silica micro-optic components ,” Appl. Opt.   45 , 162 – 171 ( 2006 ).
[Crossref] [PubMed]

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator ,” in Laser Micromachining for Optoelectronic Device Fabrication , A. Ostendorf ed., Proc. SPIE ,   4941 , 107 – 112 ( 2002 ).
[Crossref]

G. A. J. Markillie , H. J. Baker , F. J. Villarreal , and D. R. Hall , “ Effect of vaporization and melt ejection on laser machining of silica glass micro-optical components ,” Appl. Opt.   41 , 5660 – 5667 ( 2002 ).
[Crossref] [PubMed]

Holdsworth, A. R.

A. R. Holdsworth and H. J. Baker , “ Assessment of micro-lenses for diode bar collimation ,” in Laser Diode and LED Applications III , K. J. Linden ed., Proc. SPIE 3000 , 209 – 214 ( 1997 ).

Jitsuno, T.

Loosen, P.

U. Brauch , P. Loosen , and H. Opower , “ High-power diode lasers for direct applications ,” in High Power Diode Lasers , R. Diehl ed., ( Springer-Verlag Berlin Heidelberg , 2000 ), pp. 303 – 368 .
[Crossref]

Markillie, G. A. J.

Nakashima, N.

Nakatsuka, M.

Nowak, K. M.

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Efficient laser polishing of silica micro-optic components ,” Appl. Opt.   45 , 162 – 171 ( 2006 ).
[Crossref] [PubMed]

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator ,” in Laser Micromachining for Optoelectronic Device Fabrication , A. Ostendorf ed., Proc. SPIE ,   4941 , 107 – 112 ( 2002 ).
[Crossref]

Opower, H.

U. Brauch , P. Loosen , and H. Opower , “ High-power diode lasers for direct applications ,” in High Power Diode Lasers , R. Diehl ed., ( Springer-Verlag Berlin Heidelberg , 2000 ), pp. 303 – 368 .
[Crossref]

Tokumura, K.

Villarreal, F. J.

Wetter, N. U.

N. U. Wetter , “ Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature ,” Opt. Laser Technol.   33 , 181 – 187 ( 2001 ).
[Crossref]

Appl. Opt. (3)

Opt. Laser Technol. (1)

N. U. Wetter , “ Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature ,” Opt. Laser Technol.   33 , 181 – 187 ( 2001 ).
[Crossref]

Proc. SPIE (1)

K. M. Nowak , H. J. Baker , and D. R. Hall , “ Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator ,” in Laser Micromachining for Optoelectronic Device Fabrication , A. Ostendorf ed., Proc. SPIE ,   4941 , 107 – 112 ( 2002 ).
[Crossref]

Other (3)

A. R. Holdsworth and H. J. Baker , “ Assessment of micro-lenses for diode bar collimation ,” in Laser Diode and LED Applications III , K. J. Linden ed., Proc. SPIE 3000 , 209 – 214 ( 1997 ).

U. Brauch , P. Loosen , and H. Opower , “ High-power diode lasers for direct applications ,” in High Power Diode Lasers , R. Diehl ed., ( Springer-Verlag Berlin Heidelberg , 2000 ), pp. 303 – 368 .
[Crossref]

I. Ghozeil , “ Hartmann and other screen tests ,” in Optical Shop Testing , D. Malacara ed., ( Wiley , 1992 ), pp. 367 – 396 .

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Figures (6)

Fig. 1.
Fig. 1.

Experimental setup used to measure beam properties of individual bars.

Fig. 2.
Fig. 2.

Slow-axis image, fast-axis far-field at 2 metres for each diode bar in the stack. (a) As delivered by manufacturer. (b) After a correction has been applied.

Fig. 3.
Fig. 3.

Corrective surface for bar 1. Calculated from the wavefront data.

Fig. 4.
Fig. 4.

Example of the fast-axis wavefront correction for one emitter in bar 1.

Fig. 5.
Fig. 5.

Fast-axis intensity profiles of uncorrected and corrected beams, taken after propagation of 2 metres. (a) Profile of a single emitter from bar 6. (b) Bar-averaged profile of bar 6.

Fig. 6.
Fig. 6.

Power in the bucket curves for (a) Bar 6 uncorrected and corrected. (b) The combined beams from the whole stack uncorrected and corrected.

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