Abstract

The beam errors of an 11 bar laser diode stack fitted with fast-axis collimator lenses have been corrected by a single refractive plate, produced by laser cutting and polishing. The so-called smile effect is virtually eliminated and collimator aberration greatly reduced, improving the fast-axis beam quality of each bar by a factor of up to 5. The single corrector plate for the whole stack ensures that the radiation from all the laser emitters is parallel to a common axis. Beam-pointing errors of the bars have been reduced to below 0.7 mrad.

© 2006 Optical Society of America

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References

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  1. U. Brauch, P. Loosen, and H. Opower, "High-power diode lasers for direct applications," in High Power Diode Lasers, R. Diehl, ed., (Springer-Verlag Berlin Heidelberg, 2000), pp. 303-368.
    [CrossRef]
  2. I. Ghozeil, "Hartmann and other screen tests," in Optical Shop Testing, D. Malacara, ed., (Wiley, 1992), pp. 367-396.
  3. K. M. Nowak, H. J. Baker, and D. R. Hall, "Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator," in Laser Micromachining for Optoelectronic Device Fabrication, A. Ostendorf, ed., Proc. SPIE, 4941, 107-112 (2002).
    [CrossRef]
  4. G. A. J. Markillie, H. J. Baker, F. J. Villarreal, and D. R. Hall, "Effect of vaporization and melt ejection on laser machining of silica glass micro-optical components," Appl. Opt. 41, 5660-5667 (2002).
    [CrossRef] [PubMed]
  5. K. M. Nowak, H. J. Baker, and D. R. Hall, "Efficient laser polishing of silica micro-optic components," Appl. Opt. 45, 162-171 (2006).
    [CrossRef] [PubMed]
  6. T. Jitsuno, K. Tokumura, N. Nakashima, and M. Nakatsuka, "Laser ablative shaping of plastic optical components for phase control," Appl. Opt. 38, 3338-3342 (1999).
    [CrossRef]
  7. A. R. Holdsworth, H. J. Baker, "Assessment of micro-lenses for diode bar collimation," in Laser Diode and LED Applications III, K. J. Linden, ed., Proc. SPIE 3000, 209-214 (1997).
  8. N. U. Wetter, "Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature," Opt. Laser Technol. 33, 181-187 (2001).
    [CrossRef]

2006

2002

2001

N. U. Wetter, "Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature," Opt. Laser Technol. 33, 181-187 (2001).
[CrossRef]

1999

Baker, H. J.

Hall, D. R.

Jitsuno, T.

Markillie, G. A. J.

Nakashima, N.

Nakatsuka, M.

Nowak, K. M.

Tokumura, K.

Villarreal, F. J.

Wetter, N. U.

N. U. Wetter, "Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature," Opt. Laser Technol. 33, 181-187 (2001).
[CrossRef]

Appl. Opt.

Opt. Laser Technol.

N. U. Wetter, "Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature," Opt. Laser Technol. 33, 181-187 (2001).
[CrossRef]

Other

U. Brauch, P. Loosen, and H. Opower, "High-power diode lasers for direct applications," in High Power Diode Lasers, R. Diehl, ed., (Springer-Verlag Berlin Heidelberg, 2000), pp. 303-368.
[CrossRef]

I. Ghozeil, "Hartmann and other screen tests," in Optical Shop Testing, D. Malacara, ed., (Wiley, 1992), pp. 367-396.

K. M. Nowak, H. J. Baker, and D. R. Hall, "Pulsed-laser machining and polishing of silica micro-optical components using a laser and an acousto-optic modulator," in Laser Micromachining for Optoelectronic Device Fabrication, A. Ostendorf, ed., Proc. SPIE, 4941, 107-112 (2002).
[CrossRef]

A. R. Holdsworth, H. J. Baker, "Assessment of micro-lenses for diode bar collimation," in Laser Diode and LED Applications III, K. J. Linden, ed., Proc. SPIE 3000, 209-214 (1997).

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Figures (6)

Fig. 1.
Fig. 1.

Experimental setup used to measure beam properties of individual bars.

Fig. 2.
Fig. 2.

Slow-axis image, fast-axis far-field at 2 metres for each diode bar in the stack. (a) As delivered by manufacturer. (b) After a correction has been applied.

Fig. 3.
Fig. 3.

Corrective surface for bar 1. Calculated from the wavefront data.

Fig. 4.
Fig. 4.

Example of the fast-axis wavefront correction for one emitter in bar 1.

Fig. 5.
Fig. 5.

Fast-axis intensity profiles of uncorrected and corrected beams, taken after propagation of 2 metres. (a) Profile of a single emitter from bar 6. (b) Bar-averaged profile of bar 6.

Fig. 6.
Fig. 6.

Power in the bucket curves for (a) Bar 6 uncorrected and corrected. (b) The combined beams from the whole stack uncorrected and corrected.

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