M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
V. E. Cosslett and W.C. Nixon, X-ray Microscopy, (Cambridge Univ. Press, London, 1960).
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
H. R. F. Horn and H. G. Waltinger, “How to obtain and use X-ray projection microscopy in the SEM.” Scanning 1, 100–108 (1978).
[Crossref]
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
L. Marton, “Internal Report.” RCA Laboratories, Princeton, NJ (1939).
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
W. C. Nixon, “Improved resolution with the X-ray projection microscope,” Nature 175, 1078–1079 (1955).
[Crossref]
[PubMed]
V. E. Cosslett and W.C. Nixon, X-ray Microscopy, (Cambridge Univ. Press, London, 1960).
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
J. C. Russ, “The image processing handbook”, (CRC Press, Boca Raton, 1995).
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
M. von Ardenne, “Zur Leistungsfahigkeit des Elektronen-Schattenmikroskopes und uber ein Rontgenstrahlen-Schattenmilkroskop,” Naturwiss. 27, 485–486 (1939).
[Crossref]
H. R. F. Horn and H. G. Waltinger, “How to obtain and use X-ray projection microscopy in the SEM.” Scanning 1, 100–108 (1978).
[Crossref]
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
S. W. Wilkins, “High Resolution X-ray Imaging of Very Small Objects,” Australia Patent. Patent number: PO6041 (Apr. 8, 1997); United States Patent. Patent number: 6163590 (Dec. 19, 2000).
S. C. Mayo, P. R. Miller, S. W. Wilkins, T. J. Davis, D. Gao, T. E. Gureyev, D. Paganin, D. J. Parry, A. Pogany, and A. W. Stevenson, “Quantitative X-ray projection microscopy: phase-contrast and multi-spectral imaging,” J. Microsc. 207, 79–96 (2002).
[Crossref]
[PubMed]
W. C. Nixon, “Improved resolution with the X-ray projection microscope,” Nature 175, 1078–1079 (1955).
[Crossref]
[PubMed]
M. von Ardenne, “Zur Leistungsfahigkeit des Elektronen-Schattenmikroskopes und uber ein Rontgenstrahlen-Schattenmilkroskop,” Naturwiss. 27, 485–486 (1939).
[Crossref]
S. C. Mayo, T. J. Davis, T. E. Gureyev, P. R. Miller, D. Paganin, A. Pogany, A. W. Stevenson, and S. W. Wilkins, “X-ray Phase-Contrast Microscopy and Microtomography,” Opt. Express 11, 2289–2302 (2003).
[Crossref]
[PubMed]
H. R. F. Horn and H. G. Waltinger, “How to obtain and use X-ray projection microscopy in the SEM.” Scanning 1, 100–108 (1978).
[Crossref]
L. Marton, “Internal Report.” RCA Laboratories, Princeton, NJ (1939).
V. E. Cosslett and W.C. Nixon, X-ray Microscopy, (Cambridge Univ. Press, London, 1960).
S. W. Wilkins, “High Resolution X-ray Imaging of Very Small Objects,” Australia Patent. Patent number: PO6041 (Apr. 8, 1997); United States Patent. Patent number: 6163590 (Dec. 19, 2000).
J. C. Russ, “The image processing handbook”, (CRC Press, Boca Raton, 1995).
M. R. Howells, T Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, J. Miao, D. Sayre, D. A. Shapiro, and J. C. H. Spence, physics/0502059, Feb 11, 2005, arxiv/pdf/physics/0502059.