Abstract

We present a novel color fringe projection system to obtain absolute 3D shape and color of objects simultaneously. Optimum 3-frequency interferometry is used to produce time efficient analysis of the projected fringes by encoding three fringe sets of different pitch into the primary colors of a digital light projector and recording the information on a 3-chip color CCD camera. Phase shifting analysis is used to retrieve subwavelength phase information. Absolute phase across the field is calculated using the 3-frequency method independently at each pixel. Concurrent color data is also captured via the RGB channels of the CCD. Thus full-field absolute shape (XYZ) and color (RGB) can be obtained. In this paper we present the basis of the technique and preliminary results having addressed the issue of crosstalk between the color channels.

© 2006 Optical Society of America

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  17. O. A. Skydan, M. J. Lalor, and D. R. Burton, "Technique for phase measurement and surface reconstruction by use colored structured light," Appl. Opt. 41, 6104-6117 (2002).
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    [CrossRef]
  21. P. S. Huang, C. P. Zhang, and F. P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).
    [CrossRef]

2005 (1)

C. E. Towers, D. P. Towers, and J. D. C. Jones, "Absolute fringe order calculation using optimised multi-frequency selection in full-field porfilometry," Opt. Lasers Eng. 43, 788-800 (2005).
[CrossRef]

2004 (3)

F. Blais, "Review of 20 years of range sensor development," J. Electron Imaging 13, 231-240 (2004).
[CrossRef]

X. Y. Su and W. J. Chen, "Reliability-guided phase unwrapping algorithm: a review," Opt. Lasers Eng. 42, 245-261 (2004).
[CrossRef]

C. E. Towers, D. P. Towers, and J. D.C. Jones, "Generalized frequency selection in multifrequency interferometry," Opt. Lett. 29, 1348-1450 (2004).
[CrossRef]

2003 (3)

2002 (1)

2000 (1)

F. Chen, G. M. Brown, and M. Song, "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39, 10-22 (2000).
[CrossRef]

1999 (2)

P. S. Huang, Q. Y. Hu, F. Jin, and F. P. Chiang, "Color-encoded digital fringe projection technique for high-speed three-dimensional surface contouring," Opt. Eng. 38, 1065-1071 (1999).
[CrossRef]

S. Kakunai, T. Sakamoto, and K. Iwata, "Profile measurement taken with liquid-crystal gratings," Appl. Opt. 38, 2824-2828 (1999).

1998 (1)

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

1997 (3)

1993 (3)

1983 (1)

Blais, F.

F. Blais, "Review of 20 years of range sensor development," J. Electron Imaging 13, 231-240 (2004).
[CrossRef]

Brown, G. M.

F. Chen, G. M. Brown, and M. Song, "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39, 10-22 (2000).
[CrossRef]

Burton, D. R.

Chen, F.

F. Chen, G. M. Brown, and M. Song, "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39, 10-22 (2000).
[CrossRef]

Chen, W. J.

X. Y. Su and W. J. Chen, "Reliability-guided phase unwrapping algorithm: a review," Opt. Lasers Eng. 42, 245-261 (2004).
[CrossRef]

Chiang, F. P.

P. S. Huang, C. P. Zhang, and F. P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).
[CrossRef]

P. S. Huang, Q. Y. Hu, F. Jin, and F. P. Chiang, "Color-encoded digital fringe projection technique for high-speed three-dimensional surface contouring," Opt. Eng. 38, 1065-1071 (1999).
[CrossRef]

Hausler, G.

Hu, Q. Y.

P. S. Huang, Q. Y. Hu, F. Jin, and F. P. Chiang, "Color-encoded digital fringe projection technique for high-speed three-dimensional surface contouring," Opt. Eng. 38, 1065-1071 (1999).
[CrossRef]

Huang, P. S.

P. S. Huang, C. P. Zhang, and F. P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).
[CrossRef]

P. S. Huang, Q. Y. Hu, F. Jin, and F. P. Chiang, "Color-encoded digital fringe projection technique for high-speed three-dimensional surface contouring," Opt. Eng. 38, 1065-1071 (1999).
[CrossRef]

Huntley, J. M.

Iwata, K.

Jin, F.

P. S. Huang, Q. Y. Hu, F. Jin, and F. P. Chiang, "Color-encoded digital fringe projection technique for high-speed three-dimensional surface contouring," Opt. Eng. 38, 1065-1071 (1999).
[CrossRef]

Jones, J. D. C.

C. E. Towers, D. P. Towers, and J. D. C. Jones, "Absolute fringe order calculation using optimised multi-frequency selection in full-field porfilometry," Opt. Lasers Eng. 43, 788-800 (2005).
[CrossRef]

C. E. Towers, D. P. Towers, and J. D. C. Jones, "Optimum frequency selection in multifrequency interferometry," Opt. Lett. 28, 887-889 (2003).

Jones, J. D.C.

Kakunai, S.

Lalor, M. J.

Lebedev, A.

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

Mutoh, K.

Petrov, M.

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

Pfortner, A.

Polonskiy, L.

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

Ritter, D.

Robertson, T.

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

Sakamoto, T.

Saldner, H. O.

Schwider, J.

Skydan, O. A.

Song, M.

F. Chen, G. M. Brown, and M. Song, "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39, 10-22 (2000).
[CrossRef]

Su, X. Y.

X. Y. Su and W. J. Chen, "Reliability-guided phase unwrapping algorithm: a review," Opt. Lasers Eng. 42, 245-261 (2004).
[CrossRef]

Takeda, M.

Talapov, A.

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

Towers, C. E.

Towers, D. P.

Younse, J. M.

J. M. Younse, "Mirrors on a chip," IEEE Spectrum 30, 27-31 (1993).
[CrossRef]

Zhang, C. P.

P. S. Huang, C. P. Zhang, and F. P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).
[CrossRef]

Zhilyaev, A.

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

Appl. Opt. (7)

IEEE Comput. Graph. Appl. (1)

M. Petrov, A. Talapov, T. Robertson, A. Lebedev, A. Zhilyaev, and L. Polonskiy, "Optical 3D digitizers: bringing life to the virtual world," IEEE Comput. Graph. Appl. 18, 28-37 (1998).
[CrossRef]

IEEE Spectrum (1)

J. M. Younse, "Mirrors on a chip," IEEE Spectrum 30, 27-31 (1993).
[CrossRef]

J. Electron Imaging (1)

F. Blais, "Review of 20 years of range sensor development," J. Electron Imaging 13, 231-240 (2004).
[CrossRef]

J. Opt. Soc. Am. A (1)

Meas. Sci. Technol. (1)

H. O. Saldner and J. M. Huntley, "Shape measurement by temporal phase unwrapping: comparison of unwrapping algorithms," Meas. Sci. Technol. 8, 986-992 (1997).

Opt. Eng. (3)

P. S. Huang, Q. Y. Hu, F. Jin, and F. P. Chiang, "Color-encoded digital fringe projection technique for high-speed three-dimensional surface contouring," Opt. Eng. 38, 1065-1071 (1999).
[CrossRef]

F. Chen, G. M. Brown, and M. Song, "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39, 10-22 (2000).
[CrossRef]

P. S. Huang, C. P. Zhang, and F. P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).
[CrossRef]

Opt. Lasers Eng. (2)

X. Y. Su and W. J. Chen, "Reliability-guided phase unwrapping algorithm: a review," Opt. Lasers Eng. 42, 245-261 (2004).
[CrossRef]

C. E. Towers, D. P. Towers, and J. D. C. Jones, "Absolute fringe order calculation using optimised multi-frequency selection in full-field porfilometry," Opt. Lasers Eng. 43, 788-800 (2005).
[CrossRef]

Opt. Lett. (2)

Other (2)

D. P. Towers, C. E. Towers, and J. D. C. Jones, "Phase Measuring Method and Apparatus for Multi-Frequency Interferometry," International Patent Application Number PCT/GB2003/003744.

K. Creath, "Phase measurement interferometry techniques," in Progress in Optics XXVI, E. Wolf, Ed. (North Holland Publ., Amsterdam, 1988).

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