A self–consistent model based on the classical field-susceptibilities formalism has been developed to simulate recent experiments where metallic particle chain waveguides are addressed locally by the tip of a Scanning Near-Field Optical Microscope (SNOM) . This approach which accounts for the actual optical response of the particles leads to a reliable description of both near–field transmittances and losses of this kind of integrated devices.
© 2004 Optical Society of America
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