Abstract

A correlation algorithm to recover the phase in phase-shifting interferometry is presented. We make numerical simulations to test the proposed algorithm and apply it to real interferograms with satisfactory results.

© 2004 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]

Appl. Opt. (6)

European Southern Observatory Conf. Proc (1)

J. R. P. Angel and P. L. Wizinowich, �??A method of Phase Shifting in the Presence of Vibration,�?? European Southern Observatory Conf. Proc. 30, 561 (1988).

Exp. Tech. (1)

Y. Morimoto and M. Fujisawa, �??Fringe-Pattern Analysis by phase-shifting Method using extraction of characteristic,�?? Exp. Tech. 20(4), 25-29 (1996).

Opt. Eng. (2)

J. E. Greivenkamp, �??Generalized Data Reduction for Heterodyne Interferometry,�?? Opt. Eng. 23, 350-352 (1984).

L. Salas, E. Luna, J. Salinas, V. García, and M. Servín, �??Profilometry by fringe projections,�?? Opt. Eng. 42, 3307-3315 (2003).
[CrossRef]

Opt. Lett. (2)

Optical Shop Testing (1)

Creath, K. and Morales, A. �??Contact and noncontac profiles,�?? in Optical Shop Testing 2nd. ed. D. Malacara (Ed. Wiley, New York), Chap. 17, 687 (1992).

Progress in Optics (1)

K. Creath, �??Phase Measurement Interferometry Techniques,�?? in Progress in Optics, Vol. XXVI, E. Wolf, Ed. Elsevier Science Publishers, Amsterdan, pp. 349-393(1988).

SPIE (1)

P. L. Wizinowich, �??System for Phase Shifting Interferometry in the Presence of Vibration,�?? SPIE 1164, 25-32 (1989).

Other (2)

J. E. Gallagher and D. R. Herriott, �??Wave front Measurement,�?? U.S. Patent 3,694,088 (1972/1972).

D. Malacara, M. Servín, and Z. Malacara, Interferogram Analysis for Optical Testing, ISBN 0-8247-9940-2 Marcel Dekker Inc., New York, (1998).

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