Abstract

An integrated setup allowing high resolution photothermal microscopy and laser damage measurements at the same wavelength has been implemented. The microscope is based on photothermal deflection of a transmitted probe beam : the probe beam (633 nm wavelength) and the CW pump beam (1.06 µm wavelength) are collinear and focused through the same objective. In-situ laser irradiation tests are performed thanks to a pulsed beam (1.06 µm wavelength and 6 nanosecond pulse). We describe this new facility and show that it is well adapted to the detection of sub-micronic absorbing defects, that, once located, can be precisely aimed and irradiated. Photothermal mappings are performed before and after shot, on metallic inclusions in dielectric. Results obtained on gold inclusions of about 600 nm in diameter embedded in silica are presented.

© 2003 Optical Society of America

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  1. N. Bloembergen, “Role of cracks, pores, and absorbing inclusions on laser induced damage threshold at surfaces of transparent dielectrics,” Appl. Opt. 12, 661–664 (1973).
    [Crossref] [PubMed]
  2. M.R. Kozlowski and R. Chow, “The role of defects in laser damage of multilayer coatings,” in Laser-induced damage in optical materials: 1993, H.E. Bennett, L. Chase, A.H. Guenther, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2114, 640–649 (1994).
    [Crossref]
  3. J. Dijon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers : A key point in laser damage of thin films,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 315–325 (1997).
    [Crossref]
  4. F.Y. Genin, A. Salleo, T.V. Pistor, and L.L. Chase, “Role of light intensification by cracks in optical breakdown on surfaces,” J. Opt. Soc. Am. A 18, 2607–2616 (2001).
    [Crossref]
  5. J.Y. Natoli, L. Gallais, H. Akhouayri, and C. Amra, “Laser induced damage of materials in bulk, thin films and liquid forms,” Appl. Opt. 41, 3156–3166 (2002).
    [Crossref] [PubMed]
  6. M. Commandré and P. Roche, “Characterization of optical coatings by photothermal deflection,” Appl. Opt. 35, 5021–5034 (1996).
    [Crossref] [PubMed]
  7. E. Welsch and M. Reichling, “Micrometer resolved photothermal displacement inspection of optical coatings,” J. Mod. Opt. 40, 1455–1475 (1993).
    [Crossref]
  8. M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
    [Crossref]
  9. A. Gatto and M. Commandré, “Multiscale mapping technique for the simultaneous estimation of absorption and partial scattering in optical coatings,” Appl. Opt. 41, 225–234 (2002).
    [Crossref] [PubMed]
  10. A. During, C. Fossati, and M. Commandré, “Multi-wavelength imaging of defects in UV optical materials,” Appl. Opt. 41, 3118–3126 (2002).
    [Crossref] [PubMed]
  11. A. During, C. Fossati, and M. Commandré, “Development of a photothermal deflection microscope for multiscale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4679, 400–409 (2002).
    [Crossref]
  12. D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
    [Crossref] [PubMed]
  13. A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
    [Crossref]
  14. A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
    [Crossref]
  15. A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, and S. Falabella, “Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy,” in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, and M.J. Soileau, eds., Proc. SPIE4347, 53–61 (2001).
    [Crossref]
  16. M. Reichling, A. Bodemann, and N. Kaiser, “Defect induced laser damage in oxide multilayer coatings for 248 nm,” Thin Solid Films 320, 264–279 (1998).
    [Crossref]
  17. E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
    [Crossref]

2002 (4)

2001 (1)

1998 (1)

M. Reichling, A. Bodemann, and N. Kaiser, “Defect induced laser damage in oxide multilayer coatings for 248 nm,” Thin Solid Films 320, 264–279 (1998).
[Crossref]

1996 (1)

1994 (1)

M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
[Crossref]

1993 (1)

E. Welsch and M. Reichling, “Micrometer resolved photothermal displacement inspection of optical coatings,” J. Mod. Opt. 40, 1455–1475 (1993).
[Crossref]

1988 (1)

E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
[Crossref]

1973 (1)

Akhouayri, H.

Albrand, G.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Amra, C.

J.Y. Natoli, L. Gallais, H. Akhouayri, and C. Amra, “Laser induced damage of materials in bulk, thin films and liquid forms,” Appl. Opt. 41, 3156–3166 (2002).
[Crossref] [PubMed]

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Bercegol, H.

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

Bernardino, D.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Bloembergen, N.

Bodemann, A.

M. Reichling, A. Bodemann, and N. Kaiser, “Defect induced laser damage in oxide multilayer coatings for 248 nm,” Thin Solid Films 320, 264–279 (1998).
[Crossref]

Bouchut, P.

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

Boyer, D.

D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
[Crossref] [PubMed]

Chase, L.L.

Chow, R.

M.R. Kozlowski and R. Chow, “The role of defects in laser damage of multilayer coatings,” in Laser-induced damage in optical materials: 1993, H.E. Bennett, L. Chase, A.H. Guenther, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2114, 640–649 (1994).
[Crossref]

Commandré, M.

A. Gatto and M. Commandré, “Multiscale mapping technique for the simultaneous estimation of absorption and partial scattering in optical coatings,” Appl. Opt. 41, 225–234 (2002).
[Crossref] [PubMed]

A. During, C. Fossati, and M. Commandré, “Multi-wavelength imaging of defects in UV optical materials,” Appl. Opt. 41, 3118–3126 (2002).
[Crossref] [PubMed]

M. Commandré and P. Roche, “Characterization of optical coatings by photothermal deflection,” Appl. Opt. 35, 5021–5034 (1996).
[Crossref] [PubMed]

A. During, C. Fossati, and M. Commandré, “Development of a photothermal deflection microscope for multiscale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4679, 400–409 (2002).
[Crossref]

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Cordillot, C.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Desrumaux, C.

J. Dijon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers : A key point in laser damage of thin films,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 315–325 (1997).
[Crossref]

Dijon, J.

J. Dijon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers : A key point in laser damage of thin films,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 315–325 (1997).
[Crossref]

Duparré, A.

M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
[Crossref]

During, A.

A. During, C. Fossati, and M. Commandré, “Multi-wavelength imaging of defects in UV optical materials,” Appl. Opt. 41, 3118–3126 (2002).
[Crossref] [PubMed]

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

A. During, C. Fossati, and M. Commandré, “Development of a photothermal deflection microscope for multiscale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4679, 400–409 (2002).
[Crossref]

Escoubas, L.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Falabella, S.

A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, and S. Falabella, “Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy,” in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, and M.J. Soileau, eds., Proc. SPIE4347, 53–61 (2001).
[Crossref]

Fornier, A.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Fossati, C.

A. During, C. Fossati, and M. Commandré, “Multi-wavelength imaging of defects in UV optical materials,” Appl. Opt. 41, 3118–3126 (2002).
[Crossref] [PubMed]

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

A. During, C. Fossati, and M. Commandré, “Development of a photothermal deflection microscope for multiscale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4679, 400–409 (2002).
[Crossref]

Gallais, L.

Gatto, A.

Genin, F.Y.

Kaiser, N.

M. Reichling, A. Bodemann, and N. Kaiser, “Defect induced laser damage in oxide multilayer coatings for 248 nm,” Thin Solid Films 320, 264–279 (1998).
[Crossref]

Kozlowski, M.R.

M.R. Kozlowski and R. Chow, “The role of defects in laser damage of multilayer coatings,” in Laser-induced damage in optical materials: 1993, H.E. Bennett, L. Chase, A.H. Guenther, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2114, 640–649 (1994).
[Crossref]

Lam, O.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Loomis, G.E.

A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, and S. Falabella, “Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy,” in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, and M.J. Soileau, eds., Proc. SPIE4347, 53–61 (2001).
[Crossref]

Loumis, B.

D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
[Crossref] [PubMed]

Maali, A.

D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
[Crossref] [PubMed]

Matthias, E.

M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
[Crossref]

Natoli, J.Y.

J.Y. Natoli, L. Gallais, H. Akhouayri, and C. Amra, “Laser induced damage of materials in bulk, thin films and liquid forms,” Appl. Opt. 41, 3156–3166 (2002).
[Crossref] [PubMed]

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

Orrit, M.

D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
[Crossref] [PubMed]

Papandrew, A.B.

A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, and S. Falabella, “Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy,” in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, and M.J. Soileau, eds., Proc. SPIE4347, 53–61 (2001).
[Crossref]

Pistor, T.V.

Poiroux, T.

J. Dijon, T. Poiroux, and C. Desrumaux, “Nano absorbing centers : A key point in laser damage of thin films,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 315–325 (1997).
[Crossref]

Reichling, M.

M. Reichling, A. Bodemann, and N. Kaiser, “Defect induced laser damage in oxide multilayer coatings for 248 nm,” Thin Solid Films 320, 264–279 (1998).
[Crossref]

M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
[Crossref]

E. Welsch and M. Reichling, “Micrometer resolved photothermal displacement inspection of optical coatings,” J. Mod. Opt. 40, 1455–1475 (1993).
[Crossref]

Roche, P.

Roussel, A.

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

Rullier, J.L.

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

Salleo, A.

Schafer, D.

E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
[Crossref]

Stolz, C.J.

A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, and S. Falabella, “Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy,” in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, and M.J. Soileau, eds., Proc. SPIE4347, 53–61 (2001).
[Crossref]

Tamarat, P.

D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
[Crossref] [PubMed]

Walther, H.G.

E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
[Crossref]

Welsch, E.

M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
[Crossref]

E. Welsch and M. Reichling, “Micrometer resolved photothermal displacement inspection of optical coatings,” J. Mod. Opt. 40, 1455–1475 (1993).
[Crossref]

E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
[Crossref]

Wolf, R.

E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
[Crossref]

Wu, Z.L.

A.B. Papandrew, C.J. Stolz, Z.L. Wu, G.E. Loomis, and S. Falabella, “Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy,” in Laser-induced damage in optical materials: 2000, G.J. Exarhos, A.H. Guenther, M.R. Kozlowski, K.L. Lewis, and M.J. Soileau, eds., Proc. SPIE4347, 53–61 (2001).
[Crossref]

Appl. Opt. (5)

J. Mod. Opt. (1)

E. Welsch and M. Reichling, “Micrometer resolved photothermal displacement inspection of optical coatings,” J. Mod. Opt. 40, 1455–1475 (1993).
[Crossref]

J. Opt. Soc. Am. A (1)

Opt. Eng. (1)

M. Reichling, E. Welsch, A. Duparré, and E. Matthias, “Photothermal absorption microscopy of defects in ZrO2 and MgF2 single layer films,” Opt. Eng. 33, 1334–1342 (1994).
[Crossref]

Science (1)

D. Boyer, P. Tamarat, A. Maali, B. Loumis, and M. Orrit, “Photothermal imaging of nanometer-sized metal particles among scaterrers,” Science 297, 1160–1163 (2002).
[Crossref] [PubMed]

Thin Solid Films (2)

M. Reichling, A. Bodemann, and N. Kaiser, “Defect induced laser damage in oxide multilayer coatings for 248 nm,” Thin Solid Films 320, 264–279 (1998).
[Crossref]

E. Welsch, H.G. Walther, D. Schafer, and R. Wolf, “Measurement of optical losses and damage resistance of ZnS-Na3/AlF6 and TiO2 laser mirrors depending on coatings design,” Thin Solid Films 152, 433–442 (1988).
[Crossref]

Other (6)

A. During, M. Commandré, C. Fossati, J.Y. Natoli, J.L. Rullier, H. Bercegol, and P. Bouchut, “Development of a photothermal deflection microscope for multi-scale studies of defects,” in Laser-induced damage in optical materials: 2001, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, and C. J. Stolz, eds., Proc. SPIE4932, 374–384 (2003).
[Crossref]

A. Fornier, C. Cordillot, D. Bernardino, O. Lam, A. Roussel, C. Amra, L. Escoubas, G. Albrand, and M. Commandré, “Characterization of optical coatings: damage threshold/local absorption correlation,” in Laser-induced damage in optical materials: 1996, H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, and M.J. Soileau, eds., Proc. SPIE2966, 292–305 (1997).
[Crossref]

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[Crossref]

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Figures (4)

Fig. 1.
Fig. 1.

Experimental setup.

Fig. 2.
Fig. 2.

Studied samples scheme.

Fig. 3.
Fig. 3.

Sample topography by AFM measurement.

Fig. 4.
Fig. 4.

Photothermal (top) and refraction (bottom) measurement of the same gold inclusion before shot (a.), after shot at 2 J/cm2 (b.) and after shot at 10 J/cm2 (c.), mapped area: 20 µm×20 µm.

Tables (1)

Tables Icon

Table 1. Photothermal values corresponding to Fig. 4, in arbitrary units.

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