Abstract

The authors report what is, to our best knowledge, the first observation of second-harmonic generation (SHG) directly from the crystalline particles in Ge-doped SiO2 (Ge:SiO2) glass films. Ge:SiO2 glass films with approximately 5 µm thickness were fabricated by chemical vapor-phase deposition. X-ray diffraction (XRD) peaks at around 2θ=22° in thermally crystallized Ge:SiO2 films were observed, and obtained XRD patterns are exactly the same as those in ultraviolet-laser-poled Ge:SiO2 glasses. Using SHG microscopic technique with a Nd:YAG laser, it has been successfully found that SH emitting with 532 nm wavelength is observed directly from the crystalline particles induced in the crystallized films.

© 2003 Optical Society of America

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References

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Appl. Phys. Lett. (2)

C. Cabrillo, F. J. Bermejo, J. M. Gibson, J. A. Johnson, D. Faccio, V. Pruneri, and P. G. Kazansky, �??Thermally poled silica samples are structurally heterogeneous: Electron diffraction evidence of partial crystallization,�?? Appl. Phys. Lett. 78, 1991-1993 (2001).
[CrossRef]

T. Honma, Y. Benino, T. Fujiwara, T. Komatsu, and R. Sato, �??Nonlinear optical crystal-line writing in glass by yttrium aluminum garnet laser irradiation,�?? Appl. Phys. Lett. 82, 892-894 (2003).
[CrossRef]

Electron. Lett. (1)

T. Fujiwara, D. Wong, Y. Zhao, S. Fleming, S. Poole, and M. Sceats, �??Electro-optic modulation in a germanosilicate fibre with UV-excited poling," Electron. Lett. 31, 573-575 (1995).
[CrossRef]

J. Appl. Phys. (2)

S. Matsumoto, T. Fujiwara, Y. Seno, Y. Hirose, M. Ohama, and A. J. Ikushima, "Crystallization and optical nonlinearity in GeO2-SiO2 glass poled with ArF excimer-laser irradiation," J. Appl. Phys. 88, 6993-6996 (2000).
[CrossRef]

S. Kurimura and Y. Uesu, �??Application of the second harmonic generation microscope to nondestructive observation of periodically poled ferroelectric domains in quasi-phase-matched wavelength converters,�?? J. Appl. Phys. 81, 369-375 (1997).
[CrossRef]

J. Ceram. Soc. Jpn. (1)

T. Fujiwara, H. Nagata, Y. Benino, and T. Komatsu, "Crystallization behaviors with pre-treatments of thermal annealing and ultraviolet laser irradiation in Ge-doped SiO2 glass fiber preforms," J. Ceram. Soc. Jpn. 111, 8-10 (2003).
[CrossRef]

J. Non-Cryst. Solids (1)

T. Fujiwara, S. Matsumoto, M. Ohama, and A. J. Ikushima,"Origin and properties of second-order optical nonlinearity in UV-poled glass," J. Non-Cryst. Solids 273, 203-208 (2000).
[CrossRef]

Opt. Lett. (2)

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Figures (5)

Fig. 1.
Fig. 1.

XRD patterns of crystallized CVD glass films with a composition of 33GeO2-67SiO2 with powder XRD peak positions and intensities of α-crystobalite as reference.

Fig. 2.
Fig. 2.

Expanded XRD patterns at 2θ=21°–23°, and Gaussian deconvolution to three components denoted by “peak 1”, “peak 2”, and “peak 3”, at 2θ=21.6°, 21.8°, and 22.0°, respectively.

Fig. 3.
Fig. 3.

Photographs of crystallized glass films obtained under (a) polarization optical microscope, and (b) differential interference microscope.

Fig. 4.
Fig. 4.

GeO2–concentration dependence of 2θ angles in XRD peaks for “peak 1”, “peak 2”, and “peak 3”. Broken lines are drawn as guides to the eye.

Fig. 5.
Fig. 5.

Photographs of optical microscopes, (a) SHG, (b) crossed-polarizers, and (c) opened-polarizers for the same area in crystallized CVD glass films. Scale bar stated in (b) is applicable for all photos.

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