Abstract

White light interferometry has been adopted to measure distributed polarization coupling in high-birefringence waveguides. Since the coupling mode is weak compared to the exciting mode, the contrast ratio of the interferogram is very low. This will increase the difficulty of direct detection of the polarization coupling intensity. By rotating the angle between the polarization eigenmodes and the principal axis of the linear polarizer from 45° to 85°, the contrast ratio of the interferogram can be improved more than 10 times. As a result, the measurement sensitivity can be improved more than 100 times.

© 2002 Optical Society of America

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References

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IEEE Photonics Technol. Lett. (1)

Kazuo Hotate, Xueliang Song, and Zuyuan He, ???Stress-location measurement along an optical fiber by synthesis of triangle-shaped optical coherence function,??? IEEE Photonics Technol. Lett. 13, 233-235 (2001)
[CrossRef]

J. Lightwave Technol. (1)

J. of Lightwave Technol. (1)

Tomasz R Wolinski, Wojtek J Bock, ???Simultaneous twist and pressure effects in highly birefringent singlemode Bow-Tie fibers,??? J. of Lightwave Technol. 11, 389-394 (1993)
[CrossRef]

Opt. Commun. (1)

Ju-Yi Lee, Der-Chin Su, ???Central fringe identification by phase quadrature interferometric technique and tunable laser-diode,??? Opt. Commun. 198, 333-337 (2001)
[CrossRef]

Opt. Express (2)

Opt. Lett. (4)

Proc. SPIE (1)

P Martin, G Le Boudec, H C Lefevre, ???Test apparatus of distributed polarization coupling in fiber gyro coils using white light interferometry,??? in Fiber Optic Gyros: 15th Anniversary Conference, Shaoul Ezekiel, Eric Udd, eds., Proc. SPIE 1585, pp. 173-179 (1991)

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Figures (3)

Fig. 1
Fig. 1

Structure of the white light interferometer

Fig. 2
Fig. 2

Relationship between the normalized minimum detectable h-parameter and the rotation angle

Fig. 3
Fig. 3

Relationship between the relative measurement error and the rotation angle

Equations (27)

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E x 0 = A e ( t ) exp ( i φ 0 )
E y 0 = A c ( t ) exp ( i φ 0 ) ,
E x 1 = A e ( t ) exp { i ( φ 0 + k x l ) } = A e ( t ) exp { i ( φ 0 + k 0 n x l ) }
E y 1 = A c ( t ) exp { i ( φ 0 + k y l ) } = A c ( t ) exp { i ( φ 0 + k 0 n x l + k Δ n b l ) } ,
E xy 0 = A e ( t ) exp [ i ( φ 0 + Δ φ 1 + k x l ) ] cos α + A c ( t ) exp [ i ( φ 0 + Δ φ 1 + k y l ) ] sin α ,
E xy 1 = E xy 2
= 2 2 { A e ( t ) exp [ i ( φ 0 + Δ φ 1 + Δ φ 2 + k x l ) ] cos α + A c ( t ) exp [ i ( φ 0 + Δ φ 1 + Δ φ 2 + k y l ) ] sin α }
E xyr 1 = 1 2 { A e ( t ) exp [ i ( φ 0 + Δ φ 1 + Δ φ 2 + k x l + k 0 δ 0 + k 0 Δ s ) ] cos α
+ A c ( t ) exp [ i ( φ 0 + Δ φ 1 + Δ φ 2 + k y l + k 0 δ 0 + k 0 Δ s ) ] sin α } ,
E xyr 2 = 1 2 { A e ( t ) exp [ i ( φ 0 + Δ φ 1 + Δ φ 2 + k x l + k 0 δ 0 ) ] cos α
+ A c ( t ) exp [ i ( φ 0 + Δ φ 1 + Δ φ 2 + k y l + k 0 δ 0 ) ] sin α }
E int = E xyr 1 + E xyr 2 .
I tatal = R 0 E int · E int * = I 1 + I 2 + I 3 + I 4 + I 5 ,
I 1 = 1 4 R 0 [ A e 2 ( t ) + A c 2 ( t ) ] · 2 cos 2 α
I 2 = 1 4 R 0 A e ( t ) A c ( t ) cos ( k 0 Δ n b l k 0 Δ s ) sin ( 2 α )
I 3 = 1 4 R 0 [ A e 2 ( t ) + A c 2 ( t ) ] cos ( k 0 Δ s ) · 2 cos 2 α .
I 4 = 1 4 R 0 2 A e ( t ) A c ( t ) cos ( k 0 Δ n b l ) sin ( 2 α )
I 5 = 1 4 R 0 A e ( t ) A c ( t ) cos ( k 0 Δ n b l + k 0 Δ s ) sin ( 2 α )
I total I 1 + I 2 ,
h = I c I e = E y 0 · E y 0 * E x 0 · E x 0 * = A c 2 ( t ) A e 2 ( t ) ,
I 2 I 1 = A e ( t ) A c ( t ) cos ( k 0 Δ n b l k 0 Δ s ) sin ( 2 α ) A e 2 ( t ) + A c 2 ( t ) · 2 cos 2 α ,
h 1 2 f ( k 0 Δ n b l k 0 Δ s ) tan α
h ( l ) max l ( I 2 I 1 ) 2 cot 2 α , Δ n b l Δ s L c
R ( l ) = 2 I 2 , max I 1 + I 2 , max ,
2 h 1 / 2 ( l ) tan α
h min R min 2 4 cos 2 α .
Err = cot 2 ( α ) cot 2 ( α + Δ α ) cot 2 ( α + Δ α ) .

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