Fig. 1. (a). Noise measurement from two independent 250 × 250 pixel areas of the CMOS chip (, where the second area plot has been offset) shows the possibility to increase the S/N ratio of the camera using an online background reference from a non-illuminated part of the chip. (b) Measurement of the noise dependence from the area size (the 1000 frames statistics): for single signal area (purple) and for signal area after a background subtraction of the 250 × 250 pixel reference area (green). Red line shows the theoretical limit in the case of purely random pixel-to- pixel noise.

Fig. 2. Experimental setup for the (a) scanning autocorrelator and (b) single-shot autocorrelator: CL - cylindrical lens, BS - beam splitter, M - mirror, BBO - nonlinear crystal, I - iris, W - wedge, L - lens, F - filters (ND, BG39).

Fig. 3. (a). Using a 1° uncoated wedge a signal replica with an intensity decrease of a factor of 0.0018 is created. (b) CMOS camera image (of the single-shot autocorrelator) showing the three areas used for the signal retrieval.

Fig. 4. Autocorrelation signals of the scanning autocorrelator (averaged over 10 frames) for three different detection schemes: (green) the signal is retrieved from a single pixel, (blue) the signal is averaged over a 250 × 250 pixel area, (red) the full detection scheme is used.

Fig. 5. Autocorrelation signal of the single-shot autocorrelator using the full detection scheme. The sharp edge on the right shows clearly a cut off caused by the limited crystal size.